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本文(ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT DIGITAL CMOS LOGIC ARRAY MONOLITHIC SILICON《铁制硅互补金属氧化物半导体制数字集成电路》.pdf)为本站会员(outsidejudge265)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT DIGITAL CMOS LOGIC ARRAY MONOLITHIC SILICON《铁制硅互补金属氧化物半导体制数字集成电路》.pdf

1、I INCH-POUND 1 MIL-1-48634 (AR) AMENDMENT 3 SUPERSE31 NG AMENDMENT 2 05 May 1993 20 February 1989 MILITARY SPECIFICATION INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITSIC SILICON This Amendment forms a part of Military Specification MIL-1-48634 (AR), dated 31 July 1986, and is approved for us

2、e within the rJ.S. Army Armament Munitions and Chemical Command, and is available for use by all Departments and Agencies of the Department of Defense. PAGE 1 1.1: Change “M718Ei/M741Elw to “M718A1/Y741AlW, 2.1.1: under Specification, MILITARY, Add MI-48078: Ammunition, standard Quality Assurance Pr

3、ovisions, General Specification For. PAGE 3 3.2.5: Delete in its entirety and suhstikute: “Pin Assignments. Pin assignments shall be as shown 7 in Figure 2. PAGE 5 FIGURE 2: Delete “GD“ and substitute “NC“ on Pin 4. PAGE 6 3.4.1: Change “OC“ to “OF“ under Unit. HEADER: Delete “MIL-1-48643 (AR)“ and

4、subst.itutt;. “MIL-1-48634 (AR)“. TABLE I: Delekt: “OF“ and substitute “OC“ under Unit. 3.4.3.2, third lint: down: Delete “VOD“ and substitute “JDD“. AMSC N/A 1 of 5 FSC 1375 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproductio

5、n or networking permitted without license from IHS-,-,-* * MIL-1-48634 (3) 9999906 1856273 538 MIL-1-48634 (AR) AMENDMENT 3 PAGE 7 3.4.3.3, sixth line down: Delete “3 VDD“ and substitute “2 VDD“. PAGE a TABLE II: Delete in its entirety and add new TABLE II included. PAGE 6 3.3.3, Delete paragraph in

6、 its entirety. PAGE 41 3.5.2, last sentence: Delete “3.5.15“ and substitute “3.4.3.3“. PAGE 42 3.5.5, second line down: Delete “15 cycles“ and substitute “15 cycles“. Delete “3.5.15“ and substitute “3.4.3.3“. 3.5.6, last sentence: Delete “3.5.15“ arid substitute “3.4.3.3“. PAGE 43 4.3.5, last senten

7、ce: Delete “(see paragraph 5.3)“ and substitute “(see paragraph 5.3.1)“. PAGE 44 Add the following paragraph: “4.6 Screening. Screening shall be in accordance with MIL-STD-883, method 5004 with the exception of the following: Screen Burn-In Test Post Burn-In Method 1015 at 125OC for 160 hours 1015 a

8、t 25OC all electrical parameter per Table II. 4.4.28 last line, Delete “design activity“ and substitute “technical agency“. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- r, NIL-I-48b34 (3) 9999906 lt85bZ7V 474 O MIL-1-48634 (AR) AMENDMENT 3 TABL

9、E II. PERFORMANCE CHARACTERISTICS: TA = 25 OC OUTPUT OUTPUT PINS CLOCK P AR AM E T E R T E S T CON D I T I UNS NO. CYCLE MIN MAX UNITS VOH VDD = 5.0V 1, 2, 9, 17 88466 IOH = 9.1 mA 10 O 4.6 N/A VOLTS Connect. a 46.4K 11 2051 resistor to VSs 8 2052 - 3 Note 1 VDD = 19.0 V 1, 2, 9, 17 88466 IOH = 0.1

10、mA 10 O Connect a 95.3K 11 2051 9.5 N/A voLm resistor to vss 8 2052 3 Note 1 V9L VDD = 5.0 V 8, 9, 11 O 0.40 VOLTS IOL = 9.2 mA 10 88466 Connect a 23.7 K 3 Note 1 resiskor to VDD VDD = 10.9 V 8, 9, 11 O IOL, = 0.2 TIA 10 a8466 0.50 voLm Connect a 47.5 K 3 Note 1 resistor to VDD VDD = 5.0 V IOL = 0.4

11、 mA 1, 2, 17 O 0.40 VOLTS Connect a ll.S K resistor to VDD VDD = 10.0 V IOL = 0.4 mA 1, 2, 17 O 0.50 VOLTS Connect a 23.7 K resistor to VDD NOTE 1: This output (PTB) is not reset by T/O (Pine 18). PTB stays high for 64 clock cycles and low for 320 clock cycles and may be measured at any clock count

12、which achieves the desired state. 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-1-48634 (3) 9999906 1856275 300 ho MI,-1-48634 (AR) AMENDMENT 3 TABLE II. (CONTD) OUTPUT PINS PAKAMEI: E H T E ST CON Il i i I ONS NO NIN MAX UNITS VI H VDD = 0.5

13、 V 6, 7, 16, ia 3.5 VOLTS VDD = 10.9 V 7.0 VIL VDD = 5.9 v 6, 7, 16, 18 1.5 voLm JDD = 10.0 V 3.0 IIH VIN = 5.0 v 6, 7, 16, ia 0.1 UA JDD = 5 v VIN = 10.9 V 0.2 VDD = 10.0 V IIL JIN = 0.2 v 6, 7, 16, 18 -0.1 UA VDD = 5.0 V VDD = 10.0 V VIN = 0.5 V -0.2 STAT SC All inputs VIL, outputs u n 1 oa d e (3

14、 5 DYNAMIC Input. Pattern of Table III 1 KFiZ Clock Rate 10 UA 100 UA TPD and Compliance with paragraph 3.4 VDD = 5.0 Volts other kilning and CLK = 1.0 KHz (pin 7) shall constitute pa r arnet er s verification that internal propagation delay and timing parameters satisfy the requirements of this spe

15、cification. 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-I-4b34 (3) 9999906 1856276 247 = MIL-1-48634 (AR) AMENDMENT 3 PAGE 48 Add the following figure: FIGURE 3. LEAKAGE CURRENT TEST. PAGE 50 * 6.4, Delete “ammunitions data cards“ in 2 plac

16、es. The margins of this amendment are marked with an asterisk or vertical line to indicate where changes (additions, modifications, corrections, deletions) from the previous amendment were made. This was done as a convenience only and the Government assumes no liability whatsoever for any inaccuraci

17、es in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespective of the marginal notations and relationship to the last previous amendment. Custodian: Army-AR Preparing Activity: Army-AR (Project 1375-A507) 5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

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