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本文(ARMY MIL-M-48647-1986 MICROCIRCUIT DIGITAL DECODER LOGIC ARRAY《逻辑阵列解码器的数字化微电路》.pdf)为本站会员(inwarn120)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ARMY MIL-M-48647-1986 MICROCIRCUIT DIGITAL DECODER LOGIC ARRAY《逻辑阵列解码器的数字化微电路》.pdf

1、MIL-M-4b47 13 7777706 032277b 5 _= 7- 51 v2.3 MIL-M-48647 (AR) 20 OCTOBER 1986 MILITARY SPECIFICATION MICROCIRCUIT, DIGITAL, DECODER, LOGIC ARRAY This specification is approved for use within the U.S. Army Armament, Munitions and Chemical Command, and is available for use by all Departments and Agen

2、cies of the Department of Defense. 1. SCOPE I 1.1 Scope. Thls specification covers the detail requirements for a Class B, Monolithic, Silicon, CMOS, Decoder, Logic Array, Programmable, Dig ita1 Microcircuit . v 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications and standards. Unl

3、ess otherwise specified, the following specifications and standards of the issue listed in that issue of Department of Defense Index of Specifications and Standards (DODSIS) specified in the solicitation, form a part of this specification to the extent specified herein. SPECIFICATIONS e MILITARY MIL

4、-M-38510 - Microcircuits, General Specification For. MIL-A-48078 - Ammunition, Standard Quality Assurance Provisions, General Specification for. MIL-M-55565 - Microcircuits, Packaging of. STANDARDS MILITARY MIL-STD-105 - Sampling Procedures and Tables For Inspection by Attributes MIL-STD-130 - Ident

5、ification marking of U.S. Military Property MIL-STD-883 - Test Methods and Procedures for Microelectronics Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improv- ing this document should be addressed to: Commander, U.S. Army Armament, Muniti

6、ons and Chemical Command, Attn: AMSMC-QA. Dover, New Jersey 07801-5001 by using the self-addressed Standardization Document Improve- ment Proposal (DD Form 1426) appearing at the end of this document or by letter. THIS DOCUMENT CONTAINS I 8 PAGES? AMSC N/A - FSC 1345 DISTRIBIITION STATEMENT A. Appro

7、ved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-48647(AR) 2.1.2 Other Government documents, drawinqs, and publications. The following other Government documents form a part of this specificatio

8、n to the extent herein. DRAWINGS U.S. ARMY ARMAMENT RESEARCH, DEVELOPMENT AND ENGINEERING CENTER ( ARDEC) PRODUCT AND PACKAGING DRAWINGS 9333602 - Microcircuit, Digital, Decoder, Logic Array 9355161 - Test Specifications 1900096-201 - Decoder, Logic Array Schematic Diagram (Secret) (Copies of specif

9、ications, standards, drawings and publications required by the suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer) 2.1.3 Order of precedence. In the event of a conflict between the text of this specific

10、ation and the references dated herein, the text of this specification shall take precedence. 3. REQUIREMENTS 3.1 Device classification. The microcircuit (device) shall conform to the product assurance level Class B of MIL-M-38510 and as specified on drawing. 3.2 Device. The device shall comply with

11、all requirements specified on Drawing 1900096-201 and with all requirements specified in applicable specifications and standards and as specified herein. design, processing, manufacturing equipment and materials instructions in accordance with MIL-M-38510, Appendix A, as well as rebonding and rework

12、 criteria in accordance with applicable paragraph of MIL-STD-38510 are subject to review and approval by the procuring activity. Paragraphs of MIL-M-38510 concerning (a) line certification, (b) product assurance program plan, and (c) initial and periodic qualification, are not applicable. 3.2.1 Desi

13、gn and manufacturing. Suppliers implementation of 3.2.2 Desiqn and construction. (1) Physical dimensions shall be in accordance with drawing 9333602. (2) Pin assignments shall be as shown in Figure 1. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

14、-_- - MIL-U-98647 13 9999906 0322798 7 MILrM-48647 (AR) N/C .1 N/C 2 - N/C 3 - L2 4 - I L1 5 6 DD - N/C - 7 N/C 8 - DATA 9 - DCL 10 - 11 FCL - - 22 N/C - 21 C/M - 20 N/C - 19 RT - 18 N/C - - 17 HWDEP 16 RF/HW - l5 vss - 14 ADATA 13 ADDVER - 12 CBITS - FIGURE 1. PIN ASSIGNMENTS 3 Provided by IHSNot f

15、or ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-4b47 13 777770b 0322777 O m MIL-M-48647 (AR) (3) Lead Finish: A, B or C in accordance with MIL-M-38510. (4) Electrostatic Sensitive (ESD) Protection: Pins 4, 5, *CAUTION: These items are susceptible to breakdown resu

16、lting from Electrostatic Discharge. Every precaution should be taken during parts handling, installing, and testing to prevent static charge buildups. 9, 10, 11, 16, 17, 19, and 21 shall be internally protected. 3.3 Inputs/outputs. The component pin numbers are related to the inputs/outputs mneumani

17、cs as shown in Figure 1. 3.3.1 Function descriptions of pin assiqnments. Function description of pin assignments are described in Dwg. 9333602. 3.4 Environmental and mechanical. Devices to be delivered under this specification shall be capable of meeting the following MIL-STD-883 environmental and m

18、echanical tests when the devices are subjected to these tests in accordance with this specification. Environmental Tests Method Cond it io- Moisture resistance 1004 Steady state life 1005 D, 1000 hrs 125% Temperature cycling 1010 C, 10 cycles Seal (Fine and Gross) 1014 (A or B h C) Burn-in 1015 D, 1

19、68 hours 125OC High temperature storage 1008 C respectively Mechanical Tests Method Conditions Constant acceleration Mechanical shock Solder ab i 1 i ty Lead integrity Resistance to solvents Vibration, variable frequency External visual Internal visual Bond strength Physical dimensions 4 2001 E, Y1

20、orientation only 2002 B 2003 2004 B2 2015 2007 A 2009 2010 B 2011 D 2016 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-qAh47 13 79?7790h 0322800 3 E - MIL-M-48647 (AR) 3.5 Electrical performance requirements. The device shall have 3.5.1 Absol

21、ute maximum ratinqs. The component absolute maximum the following electrical characteristics. ratings shall be in accordance with value specified in Table I. TABLE I. Maximum Ratings DC Supply Voltage, 8.0 VDC Pin 6 with respect to Pin 15, VDD Input Voltage Range -0.5 to VDD All Inputs except Pins 4

22、 and 5, VI 4-0.5 Oper at ing Temper ature Range , -370 to +57oc Storage Temp. Range, TSTG -55 to +1250C Input Current Pins DC Supply Voltage Range-Component 4 and 5, II - +10 mA Operational, VDD +4.5 to 7.0 VDC 3.5.2 Operatinq conditions (Inputs). The components shall be operational in the condition

23、s specified in Table II of Dwg. 9333602. TABLE II. Operating Conditions see Dwg. 9333602 3.5.3 Electrical performance characteristics. The component shall meet the electrical performance characteristics specified in Table III. TABLE III. Electrical Performance Characteristics L/ PARAMETER CONDITIONS

24、 VALUES .UNITS MIN MAX Input Current vDD=7.0 VI = VDD 1 UA All Inputs Except Pin 16,17,19 Island- Arsenal, Picatinny Arsenal or ARRADCOM drawings. Technical data originally prepared by these activities is now under cognizance of ARDEC. 6.6 Subject term (key word) listing. Conformance Testing Electri

25、cal Performance Characteristics Environmental Testing First Article Testing Mechanical Testing Microcircuit, Digital, Decoder, Logic Array Quality Assurance Quality Conformance Inspection Screening Custodian: Army-AR Preparing activity: Army-AR (Project 1345-A345) 18 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

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