ARMY MIL-PRF-55514 G-2013 CAPACITORS FIXED PLASTIC (OR METALLIZED PLASTIC) DIELECTRIC DC OR DC-AC IN NONMETAL CASES NON-ESTABLISHED AND ESTABLISHED RELIABILITY GENERAL SPECIFICATIO.pdf

1、AMSC N/A FSC 5910 MIL-PRF-55514G 6 September 2013 SUPERSEDING MIL-PRF-55514F 15 December 2005 PERFORMANCE SPECIFICATION CAPACITORS, FIXED, PLASTIC (OR METALLIZED PLASTIC) DIELECTRIC, DC OR DC-AC, IN NONMETAL CASES, NON-ESTABLISHED AND ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR This specificat

2、ion is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the general requirements for established reliability (ER) and non-established reliability (non-ER), (product level C), plastic (or metallized plastic) dielectric, fixed

3、 capacitors, enclosed in nonmetal cases intended primarily, in view of the limited long term moisture resistant characteristics, for use in potted or encapsulated systems, in blocking, filter, and by-pass applications (see 6.4). ER capacitors covered by this specification have failure rate levels (M

4、, P, R, and S) ranging from 1.0 percent to 0.001 percent per 1,000 hours. These failure rates (FR) are established at a 90-percent confidence level and maintained at a 10-percent producers risk and based on life tests performed at +85C or +105C, whichever is applicable. An acceleration factor of 5:1

5、 has been used to relate life test data obtained at 125 percent, or 140 percent of rated voltage at +85C or +105C, whichever is applicable, to rated voltage at +85C or +105C, whichever is applicable. The product levels are based on catastrophic failures and failures occurring outside the degradation

6、 limits. 1.2 Classification. Capacitors covered by this specification are classified by style (see 1.2.1.1 and 3.1). 1.2.1 Part or Identifying Number (PIN). The term Part or Identifying Number (PIN) is equivalent to the term (part number, identification number, and type designator) that was previous

7、ly used in this specification. The PIN is in the following form and as specified (see 3.1). CFR02 A M C 682 J M Style Terminal Characteristic Rated Capacitance Capacitance Product (1.2.1.1) Symbol (1.2.1.3) voltage (1.2.1.5) tolerance level (1.2.1.2) (1.2.1.4) (1.2.1.6) designator (1.2.1.7) 1.2.1.1

8、Style. The style is identified by the three-letter symbol “CFR“ followed by a two-digit number; the letters identify ER and non-ER, plastic dielectric fixed capacitors in nonmetal cases. INCH-POUND Comments, suggestions, or questions on this document should be addressed to: US Army Communications-El

9、ectronics Command, ATTN: RDER-PRQ-QE, Aberdeen Proving Ground, MD 21015 or e-mailed to usarmy.APG.cerdec.mbx.standardization-crxmail.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.dla.mil. P

10、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-55514G 2 1.2.1.2 Terminal symbol. The terminal is identified by a single letter as shown in table I. TABLE I. Terminal symbol. Symbol Terminal A Axial wire-lead R Radial wire-lead L Lugs 1.2.1.3

11、Characteristic. The characteristic is identified by a single letter as shown in table II. TABLE II. Characteristic. Characteristic Construction Operating temperature range Dielectric material Electrode K Polypropylene Foil -55C to +105C L Polypropylene Metallized polypropylene -55C to +105C M Polyet

12、hylene terephthalate Foil -55C to + 85C N Polyethylene terephthalate Metallized polyethylene terephthalate -55C to + 85C Q Polycarbonate Foil -55C to +125C 1/ R Polycarbonate Metallized polycarbonate -55C to +125C 1/ U Polyphenylene sulfide Metallized polyphenylene sulfide -55C to +125C 1/ V Polyphe

13、nylene sulfide Foil -55C to +125C 1/ 1/ For operation at +125C, characteristics Q, R, U and V capacitors are voltage derated (see table III). 1.2.1.4 Rated voltage. The rated voltage is identified by a single symbol as shown in table III. TABLE III. Voltage rating. Symbol DC voltage rating at +85C 1

14、/ Characteristics Q and V DC voltage rating at +125C Characteristics R and U DC voltage rating at +125C A 50 33.3 25 B 100 66.7 50 C 200 133.3 100 D 300 200.0 150 E 400 266.7 200 F 600 400.0 300 G 75 50.0 37.5 H 150 100.0 75 J 25 16.7 12.5 K 250 166.7 125 L 800 533.3 400 1/ DC voltage rating for cha

15、racteristics K and L at +105C are the same as those at +85C. 1.2.1.5 Capacitance. The nominal capacitance value, expressed in picofarads (pF), is identified by a three-digit number; the first two digits represent significant figures and the last digit specifies the number of zeros to follow. NOTE: T

16、abulated capacitance values expressed in microfarads (F) are given for information only (see 3.1). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-55514G 3 1.2.1.6 Capacitance tolerance. The capacitance tolerance is identified by a single let

17、ter as shown in table IV. TABLE IV. Capacitance tolerance. Symbol Capacitance tolerance percent () F 1 G 2 J 5 K 10 M 20 1.2.1.7 Product level designator. The product level designator is identified by a single letter as shown in table V. TABLE V. Failure rate level (FRL) (established at a 90-percent

18、 confidence level). Symbol FRL C non-ER M 1.0 1/ P 0.1 1/ R 0.01 1/ S 0.001 1/ 1/ FRL (percent per 1,000 hours). 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other s

19、ections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this specification, whe

20、ther or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

21、solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS (See supplement 1 for list of associated specification sheets.) DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods for Electronics and Electrical Component Parts MIL-STD-690 - Failure Rate Sampling Plans and Procedures MIL-STD-79

22、0 - Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications MIL-STD-810 - Environmental Engineering Considerations and Laboratory Tests MIL-STD-1276 - Leads for Electronic Component Parts MIL-STD-1285 - Marki

23、ng of Electrical and Electronic Parts (Copies of these documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) Provided by IHSNot for ResaleNo reproduction or networking permitted wit

24、hout license from IHS-,-,-MIL-PRF-55514G 4 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. TECHAMERICA EIA-554-1 - Assessme

25、nt of Average Outgoing Quality Levels in Parts Per Million (PPM) EIA-557 - Statistical Process Control Systems (Copies of these documents are available from http:/www.techamerica.org or from TechAmerica, 601 Pennsylvania Ave. NW, North Building Ste. 600, Washington DC, 20004-2650.) 2.4 Order of prec

26、edence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein (except for related specification sheets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws

27、and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the applicable specification sheet. In the event of any conflict between the requirements of this specificatio

28、n and the specification sheet, the latter shall govern. 3.2 Qualification. Capacitors furnished under this specification shall be products which are authorized by the qualifying activity for listing on the applicable qualified products list (QPL) before contract award (see 4.4 and 6.3). In addition,

29、 the manufacturer shall obtain certification from the qualifying activity that the reliability assurance requirements of 4.1 have been met and are being maintained. Authorized distributors which are approved to MIL-STD-790 distributor requirements by the QPL manufacturers are listed in the QPL. 3.3

30、QPL system. The manufacturer shall establish and maintain a QPL system for parts covered by this specification. Requirements for this system are specified in MIL-STD-790 and MIL-STD-690 (ER only). In addition the manufacturer shall also establish a SPC and PPM system that meets the requirements as d

31、etailed in 3.3.1 and 3.3.2 respectively. The following MIL-STD-790 exceptions are allowed: a. Under “Description of production processes and controls“, the procedure for identification of each production lot shall include only “the manufacturer shall as a minimum be able to identify the time period

32、during which the final production operation was performed on each item of product prior to final test. The date or lot code marked on each part shall be identified to a production lot.“ b. “Traceability“ of materials shall not apply. 3.3.1 SPC system. As part of the overall MIL-STD-790 QPL system, t

33、he manufacturer shall establish an SPC system that meets the requirements of EIA-557. 3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a ppm system of assessing the average outgoing quality of lots in accordance with EIA-554-1. Data exclusion, in acco

34、rdance with EIA-554-1 may be used with approval of the qualifying activity. The ppm system shall identify the ppm rate at the end of each month and shall be based on a 6-month moving average. Style reporting may include both ER and non-ER style combinations. 3.4 Materials. Materials shall be as spec

35、ified herein. However, when a definite material is not specified, a material shall be used which will enable the capacitors to meet the performance requirements of this specification. Acceptance or approval of any constituent material shall not be construed as a guaranty of the acceptance of the fin

36、ished product. 3.4.1 Insulating and sealing materials. Compounds and films used in the insulating and sealing of capacitors shall be chemically inactive with respect to the capacitor element. The material, either in state of original application or as a result of having aged, shall have no adverse e

37、ffect on the performance of the capacitors. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-55514G 5 3.4.2 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin content of capacitor

38、 components and solder shall not exceed 97 percent. Tin shall be alloyed with a minimum of 3 percent lead (see 6.8). Lead-free, tin alloy high temperature solders may be used where high temperature solder is necessary with the approval of the qualifying activity. The tin content of lead-free high te

39、mperature solders shall not exceed 97 percent, by mass. 3.5 Interface and physical dimensions requirements. Capacitors shall meet the interface requirements and physical dimensions specified (see 3.1). 3.5.1 Case. Each capacitor shall be enclosed in a nonmetal case which will protect the capacitor e

40、lement from moisture, impregnant leakage, and mechanical damage under the test conditions specified herein. Cardboard shall not be used for insulating purposes. 3.5.2 Terminals. Terminals shall be of a solid conductor, of the length and diameter specified (see 3.1), and shall be suitably treated to

41、facilitate soldering. When a coating containing tin is used, the tin content shall range between 40 percent and 70 percent. 3.5.2.1 Solder dip (retinning) leads. Only the manufacturer (or his authorized category B or category C distributor) may solder dip/retin the leads of product supplied to this

42、specification provided the solder dip process has been approved by the qualifying activity. 3.5.2.2 Qualifying activity approval. Approval of the solder dip process shall be based on one of the following options: a. When the original lead finish qualified was hot solder dip lead finish 52 of MIL-STD

43、-1276 (NOTE: The 200 microinch maximum thickness is not applicable.), the manufacturer shall use the same solder dip process for retinning as is used in the original manufacture of the product. b. When the lead originally qualified was not hot solder dip lead finish 52 of MIL-STD-1276, as prescribed

44、 in 3.5.2.2a, approval for the process to be used for solder dip shall be based on the following test procedure: (1) Thirty samples of any capacitance value for each style and lead finish are subjected to the manufacturers solder dip process. Following the solder dip process, the capacitors are subj

45、ect to the capacitance, dissipation factor, insulation resistance, dielectric withstanding voltage, and equivalent series resistance measurements (as applicable). No defects are allowed. (2) Ten of the 30 samples are then subjected to the solderability test. No defects are allowed. (3) The remaining

46、 20 samples are subjected to the resistance to solder heat test. No defects are allowed. (NOTE: Solder dip of gold plated leads is not allowed.) 3.5.2.3 Solder dip/retinning options. The manufacturer (or authorized category C distributor) may solder dip/retin as follows: a. As a corrective action if

47、 the lot fails the group A solderability test. b. After the group A inspection has been completed, following the solder dip/retinning process, the capacitance, dissipation factor, insulation resistance, dielectric withstanding voltage, and equivalent series resistance measurements (as applicable) sh

48、all be performed on 100 percent of the lot. The percent defective allowable (PDA) for the electrical measurements shall be as for the subgroup 1 tests. Following these tests, the manufacturer shall submit the lot to the group A solderability test as specified in 4.8.16. 3.6 Resistance to solvents. W

49、hen capacitors are tested as specified in 4.8.2, markings shall remain legible and shall not smear. 3.7 Preconditioning. When tested as specified in 4.8.3, capacitors shall withstand the test conditions specified without evidence of unwrapping of the capacitor case or sleeve or other damage to the case. Provided by IHSNot for ResaleNo reproduction or networking permitted withou