ASQ D61070-1997 Compliance Test Procedures for Steady-State Availability (T82E)《稳态可用性验证试验方法T82》.pdf

1、ANSI/IEC/ASQ D61070-1997 Compliance test procedures for steady-state availability Approved as an American National Standard by: American Society for Quality ANSI/IEC/ASQ D61070-1997 MERICAN IO Approved as an American National Standard by: American Society for Quality An American National Standard Ap

2、proved on September 16, 1997 American National Standards: An American National Standard implies a consensus of those substantially concerned with its scope and provisions. An American National Standard is intended as a guide to aid the manufacturer, the consumer, and the general public. The existenc

3、e of an American National Standard does not in any respect preclude anyone, whether he or she has approved the standard or not, from manufacturing, purchasing, or using products, processes, or procedures not conforming to the standard. American National Standards are subject to periodic review and u

4、sers are cautioned to obtain the latest edition. Caution Notice: This American National Standard may be revised or withdrawn at any time. The procedures of the American National Standards Institute require that action be taken to reaffirm, revise, or withdraw this standard no later than five years f

5、rom the date of publication. Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Institute. 01991 by IEC Copyright Protection Notice for the ANSI/IEC/ASQ D61070- 1997 Standard. This standard is subject to co

6、pyright claims of IEC, ANSI and ASQ. Not for resale. Nlo part of this publication may be reproduced in any form, including an electronic retrieval system, without the prior written permission of ASQ. All requests pertaining to the ANSI/IEC/ASQ D61070-1997 standard should be submitted to ASQ. Note: A

7、s used in the document, the term “International Standard refers to the American National Standard adoption of this and other International Standards. ASQ Mission: To facilitate continuous improvement and increase customer satisfac- tion by identifying, communicating, and promoting the use of quality

8、 principles, cori- cepts, and technologies; and thereby be recognized throughout the world as the leading authority on, and champion for, quality. 1098 7 65432 1 Printed in the United States of America Printed on acid-free paper Published by: American Society for Quality Quality Press 61 1 East Wisc

9、onsin Avenue Milwaukee, Wisconsin 53201 -3005 Web site http:/www.asq.org 800-248-1946 I/%EC/ASQ D61070-1997 Contents Foreword Introduction . Clause 1 2 3 4 5 6 7 8 9 10 Scope Normative references . Definitions Symbols . . . . . . . Conditions for availability performance testing 5.1 Dependability ma

10、nagement and specification 5.2 Statistical process conditions . . 5.3 Definition of states., . 5.4 Classification of times . . 5.5 Classification of failures . 5.6 Test conditions . . Data collection., . Time distributions 7.1 Distribution assumptions 7.2 Trend test . 7.3 Decision alternatives in ca

11、se of non-validity of assumptions Compliance testing planning Compliance test plans . 9.1 9.2 9.3 9.4 Test plan 1-Fixed number of failures . Test plan 2-Fixed time longer than 15 mean up times . Test plan %Fixed time (U U, where U, = 6 -,(2pn,2n) x U0 / (1 - U,) Accept otherwise. 9.2 Test plan 2-Fix

12、ed tirne longer than 15 mean up times This test plan may be applied if up times are exponentially distributed, down times are modelled with a gamma distribution, and the test time is longer than 15 multiples of mean up time, mu. It is based on a normal distribution approximation of the steady-state

13、availability. The test is designed to have a duration of r* time units, where r* is determined using the expression: Values for u1 -a and u1 - p are found in table A.2. Decision rule: Reject if Y / (Y + 7) U, where: u,-aD(l - U,) + ul-pdE(1 - DU,) Ul-,(I - U,) + u1- p.IE(l - DU,) U, = U, x Accept ot

14、herwise. 9.3 Test plan 3-Fixed time (U U,im where U, is taken as a function of the test time, F, from table A.3. Accept otherwise. 9.4 Test plan - item name; - name of manufacturer; - item type; - serial numbers of the test items. ANSI/IEC/ASQ D61070-1997 2) Chronological recording for each observat

15、ion and action: - date and time; - operating conditions; - environmental conditions; - performance parameter values; - comments on out-of-specification conditions; -time meter reading; - names of personnel involved. 3) General comments. 10.2 Failure reports One report should be made on each failure,

16、 containing the description of the failure, the result of the fail- ure analysis, and the actions taken concerning the item (and its components or parts). Originators and detailed contents should be as listed below: 10.2.1 From the test operator 1) Failure identification: - date and calendar time of

17、 the failure; - serial number of the test item; - assembly, subassembly and component or part involved; - operating conditions at failure; - environmental conditions at failure; -time meter reading; - name of test operator. 2) Fault symptom: - nature of any partial or complete fault; - values of par

18、ameters exceeding specified limits; - instruments used for indicating the fault. 3) References to related failure reports. 4) Opinion concerning the classification of the fault. 5) Recommended corrective action. 6) General comments. 10.2.2 From the maintenance personnel 1) Fault confirmation: - meth

19、od and instruments used; - observations and comments. 2) Maintenance description: - actions taken; - operating time of the equipment during the repair (where possible); - date, time and duration of all corrective maintenance related times; - organization and name of repair personnel. 16 3) Replaceme

20、nt identification: For each component or part replaced: - location or circuit position; - name of the component or part; - type designation and characteristics; - name of manufacturer. 4) Opinion concerning the cause and classification of the failure. 5) Recommended corrective action or authorized m

21、odification introduced to remedy the fault. 6) General comments. 10.2.3 From the failure analysis personnel 1) Analysis of the replaced components or parts: - visual examination and initial measurements; - analysis description (physical, chemical, etc.); - results; - date of analysis; - organization

22、 and name of analysis personnel. 2) Analysis of conditions influencing the failure. 3) Cause and classification of the failure. 4) Recommended corrective action. 5) General comments. 10.3 Failure summary record This single document should contain summarized information on all failures. Failure data

23、and relevant test time should be traceable to the originating test log and failure reports. Contents: 1) General information: - equipment identification; - reference to the detailed availability test specification 2) Chronological summary of all the relevant failures: - failure date and time; - fail

24、ure classification; - reference to failure report; -test item serial number; - accumulated number of relevant failures; - accumulated relevant test time. 3) Summary of all non-relevant failures: - failure classification; - reference to failure report. 4) Down time information. ANSI/IEC/ASQ D61070-19

25、97 10.4 Replacement units and spare parts inventory (optional) This inventory should give information about the intensity of replacement of units and spare parts and is intended for maintenance planning. Contents: 1) General information: - equipment identification; - reference to the detailed availa

26、bility test specification. 2) Inventory: For each replacement unit and spare part: - identification; - conditions of use during the test; -total number in the equipment; -total number failed; -total accumulated relevant test time. 10.5 Final report The final report resulting from the availability co

27、mpliance testing should contain: - failure summary record; - plots and values presenting the results of the statistical treatment; - final conclusions and proposed actions to be taken, if applicable. 18 S%/IEC/ASQ D61070-1997 Annex A (normative) Tabice A.1-F distribution 0.80 fractiles u1 2 4 6 8 10

28、 20 30 40 60 120 2 4.00 4.24 4.32 4.36 4.38 4.43 4.45 4.46 4.46 4.47 4 2.47 2.48 2.47 2.47 2.46 2.44 2.44 2.44 2.43 2.43 6 2.13 2.09 2.06 2.04 2.03 2.00 1.98 1.98 1.97 1.96 8 1.98 1.92 1.88 1.86 1.84 1.80 1.78 1.77 1.76 I .75 10 1.90 1.83 1.78 1.75 1.73 1.68 1.66 1.65 1.64 1.63 12 1.85 1.77 1.72 1.6

29、9 1.66 1.61 1.59 1.58 1.56 1.55 14 1.81 1.73 1.67 1.65 1.62 1.56 1.53 1.52 1.51 1.49 16 1.78 1.70 1.64 1.61 1.58 1.52 1.49 1.48 1.47 1.45 18 1.76 1.67 1.62 1.58 1.55 1.49 1.46 1.45 1.43 1.42 20 1.75 1.65 1.60 1.56 1.53 1.47 1.44 1.42 1.41 1.39 30 1.70 1.60 I .54 1.50 1.47 1.39 1.36 1.35 1.33 1.31 40

30、 1.68 1.57 1.51 1.47 1.44 1.36 1.33 1.31 1.29 1.26 60 1.65 1.55 1.48 1.44 1.41 1.32 1.29 1.27 1.24 1.22 120 1.63 1.52 1.45 1.41 1.37 1.29 1.25 1.23 1.20 1.17 u2 0.90 fractiles u4 2 4 6 8 10 20 30 40 60 120 U2 2 9.00 4 4.32 6 3.46 8 3.1 1 10 2 92 12 2.81 14 2.73 16 2.67 18 2.62 20 2.59 30 2 49 40 2 4

31、4 60 2.39 I 20 2.35 9.24 4.1 1 3.18 2.81 2.61 2.48 2.39 2.33 2.29 2.25 2.14 2.09 2.04 1.99 9.33 9.37 4.01 3.96 3.05 2.98 2.67 2.59 2.46 2.38 2.33 2.24 2.24 2.15 2.18 2.09 2.13 2.04 2.09 2.00 1.98 1.88 1.93 1.83 1.87 1.77 1.82 1.72 0.95 fractiles u1 2 4 6 8 u2 2 19.00 19.25 19.33 19.37 4 6.94 6.39 6.

32、16 6.04 6 5.14 4.53 4.28 4.15 8 4.46 3.84 3.58 3.44 10 4.10 3.48 3.22 3.07 12 3.89 3.26 3.00 2.85 14 3.74 3.11 2.85 2.70 16 3.63 3.01 2.74 2.59 18 3.55 2.93 2.66 2.51 20 3.49 2.87 2.60 2.45 30 3.32 2.69 2.42 2.27 40 3.23 2.61 2.34 2.18 60 3.15 2.53 2.25 2.10 120 3.07 2.45 2.17 2.02 9.39 3.92 2.94 2.

33、54 2.32 2.19 2.10 2.03 1.98 1.94 1.82 1.76 1.71 1.65 10 9.44 3.84 2.84 2.42 2.20 2.06 1.96 1 .89 1.84 1.78 1.67 1.61 1.54 I .48 20 9.46 3.82 2.80 2.38 2.16 2.01 1.91 1.84 1.78 1.74 1.61 1.54 1.48 1.41 30 9.47 3.80 2.78 2.36 2.13 1.99 1.89 1 .81 1.75 1.71 1.57 1.51 1.44 I .37 40 9.47 9.48 3.79 3.78 2

34、.76 2.74 2.34 2.32 2.1 1 2.08 1.96 I .93 1.86 1.83 1.78 1.75 1.72 1.69 1.68 1.64 1.54 1.50 I .47 1.42 1.40 1.35 1.32 1.26 60 120 19.40 5.96 4.06 3.35 2.98 2.75 2.60 2.49 2.41 2.35 2.16 2.08 1.99 1.91 19.45 5.80 3.87 3.15 2.77 2.54 2.39 2.28 2.19 2.12 1.93 1.84 1.75 1.66 19.46 5.75 3.81 3.08 2.70 2.4

35、7 2.31 2.19 2.1 1 2.04 1.84 1.74 1.65 1.55 19.47 5.72 3.77 3.04 2.66 2.43 2.27 2.15 2.06 1.99 1.79 1.69 1.59 1.50 19.48 19.49 5.69 5.66 3.74 3.71 3.01 2.97 2.62 2.58 2.38 2.34 2.22 2.18 2.1 1 2.06 2.02 1.97 1.95 1.90 1.74 1.68 1.64 1.58 1.53 1.47 1.43 1.35 ANSI/IEC/ASQ D61070-I997 Table A.2-Standard

36、ized normal distribution 1 -a 4 -p 0.80 0.90 0.95 0.842 1.282 1.645 Table A.3-Discrimination ratio (D) and rejection limit (Uiim) for test plan 3 In the table, the test time (7) is expressed in multiples of the predicted mean up time (mu) of the spec- ified acceptable value of the steady-state unava

37、ilability (U,). Guidelines on the selection of the sha.pe parameter p are given in 7.1. The risk levels (a and ) are dealt with in clause 8. Details on test plan 3 are given in 9.3. Tlm, 1 .o 1.2 1.4 1.6 1.8 2.0 2.5 3.0 3.5 4.0 5.0 6.0 7.0 8.0 9.0 10.0 15.0 20.0 CL = = 0.05 D 24.72 20.01 16.88 14.66

38、 13.01 11.73 9.52 8.12 7.15 6.44 5.46 4.82 4.36 4.02 3.75 3.53 2.88 2.53 3.92 3.64 3.42 3.24 3.10 2.98 2.75 2.58 2.45 2.34 2.19 2.07 1.99 1.92 1.86 1.81 1.65 1.56 p=l a. = = 0.10 D 15.01 12.39 10.64 9.38 8.44 7.70 6.42 5.59 5.01 4.58 3.98 3.58 3.29 3.07 2.90 2.76 2.33 2.10 2.91 2.75 2.63 2.52 2.44 2

39、.36 2.22 2.1 1 2.03 1.96 1.86 1.78 1.72 1.67 1.63 1.60 1.49 1.42 a = = 0.20 D 7.37 6.30 5.56 5.03 4.63 4.31 3.74 3.37 3.10 2.90 2.61 2.42 2.28 2.17 2.08 2.01 1.78 1.65 1.86 1.83 1.80 1.77 1.74 1.71 1.65 1.61 1.57 1.54 1.49 1.45 1.42 1.40 1.37 1.36 1.29 1.26 20 1 .o 1.2 1.4 1.6 1.8 2.0 2.5 3.0 3.5 4.

40、0 5.0 6.0 7.0 8.0 9.0 10.0 15.0 20.0 D 18.94 15.43 13.1 1 11.45 10.22 9.26 7.62 6.56 5.83 5.29 4.54 4.05 3.70 3.43 3.22 3.06 2.54 2.26 p=2 a = = 0.10 I a = = 0.20 D D 3.47 3.22 3.04 2.89 2.77 2.67 2.47 2.33 2.22 2.13 2.00 1.91 1.84 1.78 1.73 1.69 1.56 1.48 11.74 9.78 8.46 7.52 6.80 6.25 5.28 4.65 4.

41、20 3.87 3.40 3.09 2.87 2.70 2.56 2.45 2.10 1.92 2.69 2.54 2.42 2.33 2.25 2.18 2.06 1.96 1.89 1.83 1.74 1.67 1.62 I .58 1.54 1.51 1.42 1.36 6.01 5.19 4.63 4.22 3.91 3.66 3.22 2.93 2.72 2.56 2.33 2.17 2.06 1.97 1.90 1.84 1.65 1.55 1.87 1.81 1.76 1.72 I .69 1.66 1.60 1.55 1.51 1.48 1.44 1.40 1.37 1.35

42、1.33 1.31 1.26 1.22 p=5 CL = = 0.05 a = = 0.10 a = = 0.20 Tlrn, D D D 1 .o 1.2 1.4 1.6 1.8 2.0 2.5 3.0 3.5 4.0 5.0 6.0 7.0 8.0 9.0 10.0 15.0 20.0 15.37 12.72 10.87 9.54 8.55 7.78 6.47 5.62 5.03 4.59 3.98 3.58 3.29 3.07 2.90 2.76 2.32 2.09 3.14 2.93 2.77 2.64 2.54 2.45 2.28 2.16 2.07 1.99 1.88 1.80 1

43、.73 1.68 1.64 1.61 1.49 1.42 9.64 8.19 7.15 6.38 5.80 5.36 4.57 4.06 3.70 3.43 3.04 2.79 2.60 2.46 2.34 2.25 1.96 1.80 2.52 2.38 2.27 2.19 2.11 2.05 1.94 1.85 1.79 1.73 1.65 1.60 1.55 1.51 1.48 1.46 1.37 1.32 5.05 4.48 4.04 3.71 3.45 3.25 2.89 2.65 2.47 2.34 2.15 2.02 1.92 1.84 1.78 1.73 1.57 1.48 1

44、.83 1.77 1.72 1.68 1.61 1.61 1.55 1.51 1.47 1.44 1.40 1.36 1.34 1.32 1.30 1.28 1.23 1.20 21 ANSI/IEC/ASQ D61070-1997 a = = 0.10 Table A.4-Acceptance (Ac) and rejection (Re) limits for test plan 4 Guidelines on the selection of the shape parameter p are given in 7.1. The risk levels (a and ) are deal

45、t with in clause 8. Details on test plan 4 are given in 9.4. - a = = 0.20 D=2 p=l Rer) INF INF INF 9.68 3.84 3.21 2.84 2.60 2.42 2.30 2.20 2.12 2.05 2.00 1.96 1.92 1.88 1.86 1.83 5.17 a = = 0.05 Ac(r) 0.00 0.35 0.56 0.71 0.89 0.95 0.99 1 .O3 1 .O6 1 .o9 1.12 1.14 1.15 1.17 1.18 1.20 1.21 1.22 1.23 o

46、.ai a = = 0.10 a = = 0.20 r 1 2 3 4 5 6 7 9 10 11 12 13 14 15 16 17 19 20 a ia 0.00 0.00 0.00 0.00 0.1 1 0.24 0.34 0.43 0.50 0.57 0.62 0.67 0.71 0.75 0.79 0.82 0.84 0.87 0.89 0.91 INF* INF INF INF 17.69 8.39 5.85 4.67 3.98 3.53 3.22 2.99 2.66 2.55 2.45 2.37 2.30 2.24 2.19 2.81 0.00 0.00 0.00 0.16 0.

47、31 0.43 0.53 0.61 0.67 0.73 0.78 0.82 0.86 0.89 0.92 0.94 0.97 0.99 1 .o1 1 .o2 INF INF INF 12.41 6.39 4.63 3.79 3.30 2.97 2.74 2.57 2.44 2.34 2.25 2.12 2.07 2.03 1.99 1.95 2.18 0.00 0.00 0.47 0.60 0.70 0.28 0.78 0.84 0.98 0.90 0.94 1 .o1 1 .O3 1 .O6 1.10 1.11 1.13 1.14 1.15 I .o8 INF INF 7.17 4.29

48、3.33 2.56 2.37 2.23 2.13 2.05 1.99 1.93 2.85 i .a9 i .a5 i .a2 i .ao 1.77 1.75 1.73 CC = = 0.05 I 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 19 20 ia 0.00 0.00 0.17 0.32 0.44 0.53 0.61 0.68 0.73 0.78 0.82 0.86 0.89 0.92 0.95 0.97 0.99 1 .o1 1 .O3 1 .O5 INP INF INF INF 13.64 6.66 4.76 3.35 3.02 2.61 2

49、.47 2.36 2.20 2.14 2.09 2.04 2.01 3.87 2.78 2.28 0.00 0.11 0.32 0.47 0.59 0.75 0.81 0.91 0.94 0.97 1 .o0 1 .O3 1 .O5 1 .O7 1 .o9 1.10 1.12 1.13 0.68 0.86 INF INF 5.75 2.86 2.50 2.29 2.14 2.04 1.96 1.90 1.82 1.76 1.73 1.71 1.69 1.68 1.66 3.58 i .a5 i .78 *INF signifies no rejection possible for this case. 22 VBECIASQ D61070-1997 Ac(r) 0.12 0.37 0.55 0.76 0.84 0.94 0.98 1 .o2 1 .O5 1 .O7 1 .o9 1.11 1.13 1.15 0.67 0.89 1.16 1.17 1.19 1.20 Rer) INF INF INF 4.43 3.37 2.57 2.37 2.24 2.13 2.05 1.99 1.94 1.90 1.86 8.04 2.87 i .a3 i .ao i .7a 1.76 0