ASTM B808-2010 Standard Test Method for Monitoring of Atmospheric Corrosion Chambers by Quartz Crystal Microbalances《水晶微量天平监测大气腐蚀室的标准试验方法》.pdf

1、Designation: B808 10Standard Test Method forMonitoring of Atmospheric Corrosion Chambers by QuartzCrystal Microbalances1This standard is issued under the fixed designation B808; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the y

2、ear of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method monitors the reactivity of a gaseoustest environment in which metal surfaces (for example, ele

3、c-trical contacts, assembled printed wiring boards, and so forth)and other materials subject to pollutant gas attack undergoaccelerated atmospheric corrosion testing. This test method isapplicable to the growth of adherent corrosion films whosetotal corrosion film thickness ranges from a few atomicm

4、onolayers to approximately a micrometre.1.2 The test method provides a dynamic, continuous, in-situ, procedure for monitoring the corrosion rate in corrosionchambers; the uniformity of corrosion chambers; and thecorrosion rate on different surfaces. Response time in the orderof seconds is possible.1

5、.3 With the proper samples, the quartz crystal microbal-ance (QCM) test method can also be used to monitor theweight loss from a surface as a result of the desorption ofsurface species (that is, reduction of an oxide in a reducingatmosphere). (Alternative names for QCM are quartz crystaloscillator,

6、piezoelectric crystal oscillator, or thin-film evapora-tion monitor.)1.4 This test method is not sufficient to specify the corrosionprocess that may be occurring in a chamber, since a variety ofpollutant gases and environments may cause similar weightgains.1.5 This test method is generally not appli

7、cable to testenvironments in which solid or liquid particles are deposited onthe surface of the quartz crystal.1.6 The values stated in SI units are to be regarded asstandard. The values in parentheses are for information only.1.7 This standard does not purport to address all of thesafety concerns,

8、if any, associated with its use. It is theresponsibility of the user of this standard to become familiarwith all hazards including those identified in the appropriateMaterial Safety Data Sheet (MSDS) for this product/materialas provided by the manufacturer, to establish appropriatesafety and health

9、practices, and determine the applicability ofregulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2B810 Test Method for Calibration of Atmospheric Corro-sion Test Chambers by Change in Mass of Copper Cou-pons3. Summary of Test Method3.1 A single crystal of quartz has various

10、 natural resonantfrequencies depending on the crystals size and shape. Thedecrease in natural frequency is linearly proportional to thecrystal mass and the mass of well-bonded surface films. Forcrystals with reactive metal films on the surface (usuallydriving electrodes), the mass of the crystal/met

11、al film increasesas the metal oxidizes or forms other compounds with gasesadsorbed from the atmosphere.3,4Thus, by measuring the rateof resonant frequency change, a rate of corrosion is measured.Non-adherent corrosion films, particles, and droplets yieldambiguous results.Areview of theory and applic

12、ations is givenin Lu and Czanderna.5See Appendix X1 for discussion of thequantitative relationship between frequency change and masschange.3.2 The chamber environmental uniformity and corrosionrate can be measured by placing matching quartz crystals withmatching reactive metal films at various locat

13、ions in thechamber. If the chamber and corrosion rate have been stan-dardized, the corrosion rate on various surface materials thathave been deposited on the quartz crystal can be determined.4. Significance and Use4.1 Corrosion film growth with thicknesses varying from amonolayer of atoms up to 1 m

14、can readily be measured on acontinuous, real-time, in-situ, basis with QCMs.1This test method is under the jurisdiction of ASTM Committee B02 onNonferrous Metals and Alloys and is the direct responsibility of SubcommitteeB02.11 on Electrical Contact Test Methods.Current edition approved Oct. 1, 2010

15、. Published October 2010. Originallyapproved in 1997. Last previous edition approved in 2005 as B808 05. DOI:10.1520/B0808-10.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information,

16、 refer to the standards Document Summary page onthe ASTM website.3King, W. H. Jr., Analytical Chemistry, Vol 36, 1964, p. 173.4Karmarkar, K. H. and Guilbaut, G. G., Analytical Chemistry Acta, Vol 75,1975, p. 111.5Lu, C. and Czanderna, A. W. Eds., Applications of Piezoelectric QuartzCrystal Microbala

17、nces, Elsevier, c 1984.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.4.2 The test results obtained for this test method areinfluenced by various factors, including geometrical effects,temperature, humidity, film thickness, film mat

18、erials, electrodeconditions, gases in the corrosion chamber, atmospheric pres-sure, and so forth. Calibration of coated crystals and instru-mentation and reproducible crystal operating conditions arenecessary for consistent results.5. Apparatus5.1 Apparatus can be a simple series circuit of crystal

19、(withelectrodes and sensing film), oscillator (typically 6 MHz) andfrequency counter (610-Hz accuracy and stability), as sche-matically shown in Fig. 1.5.2 Commercial, Thin-Film Monitors,6incorporating thosefunctions that read out thicknesses or weight gain are alsoavailable and acceptable after the

20、y have been calibrated.5.3 Microbalance, with an accuracy of 62 g is needed forcalibration procedures.5.4 Recording Devices or Computers are needed for real-time, continuous measurements.76. Materials6.1 Crystals shall be of the AT5cut variety with a resonantfrequency in the MHz range and matched to

21、 the frequencymeasuring apparatus used. Quartz crystal surfaces shall bepolished to a surface finish with an arithmetical mean devia-tion, Ra, of less than 0.1 m. With this surface finish, the crystalappears optically transparent to the human eye.86.2 Electrodes, used to drive the crystals resonant

22、fre-quency, can be made from any electrically conducting materialand usually are a metal film evaporated on the quart crystalsurface. The material under study or being used to calibrate thesystem may be the same as or different than the electrodematerial. If the two materials are different, the pote

23、ntialcorrosion of the electrodes shall be accounted for during thedesign and subsequent experiments. Depending on the materi-als under test, the QCMs can have copper, silver, nickel, zinc,gold, etc. electrodes. The preferred method of deposition is byevaporation for a high purity, smooth surface. If

24、 sublayers areused to enhance the adhesion of the final electrode, they shouldbe covered by the final electrode material so that less than 1 %of the metallic area is of exposed sublayer material. Because ofthe fragility of the metal electrode there should be multiple(three or more), spring-loaded co

25、ntacts between the crystal andelectronics.6.3 After metallization of the crystals, they should be storedin desiccators. After two years storage or if the metallizationshows discoloration or staining, the crystals shall be discarded.Crystal surfaces should not be chemically or mechanicallycleaned bef

26、ore use in the corrosion chamber. They should beblown clean with inert compressed gas. Chilling and conden-sation on the surface, as can occur with the use of pressurizedfluorocarbons, shall be avoided. Care shall be exercised so thatthe crystals are only handled by clean tweezers or tongs andnever

27、touched by hands.7. Calibration7.1 QCMs and its electronics shall be calibrated initially ina given corrosion system and thereafter on an annual basis.Calibration shall be performed with the same shape and size ofcrystal holder to be used during operation. Recalibration shallbe performed if the crys

28、tal holder geometry is changed.Calibration can be done by comparison to a standard such asactual gravimetric weighing on a microbalance (62 g). Use asample of the same material as the sensing film with aminimum area of 5 cm2and a thickness of 0.1 to 0.6 mm (seeTest Method B810). Foil surface roughne

29、ss should be within620 % of the QCM sensing film roughness. The procedure forthe generation (that is, evaporation) and cleaning of thegravimetric sample should be the same as used for the sensingfilms. The age and storage of the gravimetric sample should becomparable to the age of the QCM sensing fi

30、lm. Allow the foilto equilibrate with the microbalance atmosphere for 0.5 h, thenweigh the sample with 62-g accuracy before exposure.Suspend the weighed gravimetric sample between two simi-larly treated QCMs spaced 20 cm apart with the large surfacearea dimension of the samples parallel to the air f

31、low. Aftersufficient exposure, as determined in the paragraph below,remove the sample from the corrosion chamber, equilibrate itwith the balance atmosphere, and reweigh. The gravimetricallymeasured, foil weight gain per unit area should be within610 % of the calculated weight gain, found on the acti

32、ve areaof the QCM.7.2 A weight gain of the metal foil of 50 g is sufficient fora microbalance with 62-g reproducibility and is sufficient forcalibration. (If the reproducibility of the microbalance is poorerthan 62 g, proportionally greater weight gain shall be used.)If the sensing material was copp

33、er and the corrosion film wasCu2O, 50 g/5 cm2would correspond to a film thickness of 149nm if the density of Cu2O was 6 g/cm3and the percentage ofoxygen in the film was 11 % (16/143). For improved accuracy,greater weight gain may be used. However, the calculatedthickness of the corrosion film should

34、 not exceed 50 % of theelectrode thickness.8. Procedure8.1 All metal surfaces that are not being used in themeasurement should be shrouded or coated with a nonreactivematerial to protect the surfaces from unwanted corrosion (thatis, clear nail polish, Q-dope, heat shrink TFE-fluorocarbon, andso fort

35、h). It is especially important to protect any electrical6Instruments of this type are used in semiconductor manufacture and may befound by searching for deposition thickness monitors.7Schubert, R. “ASecond GenerationAcceleratedAtmospheric Corrosion Cham-ber,” ASTM STP 965, 1988, p. 374.8Most instrum

36、ent suppliers of thin film monitors also sell crystals with variouscoatings and roughness.FIG. 1 Schematic of QCM and Related ElectronicsB808 102connections that are being used for measurements or providingpower from the corrosive atmosphere under investigation.8.2 Do not handle the crystals by hand

37、 or with anything thatleaves a residue after evaporation on the crystal electrodes. Usecaution in all handling to avoid scratching the sensing filmsurface.8.3 One QCM with a sensing film inert to the test environ-ment should be in the system to monitor changes in the amountof relative humidity in th

38、e system, adsorbed hydrocarbons, andso forth. (A gold-coated QCM is usually a good choice for thisapplication.) At the end of the chamber exposure when all thepollutant gases have been removed and the humidity has beenreturned to its initial value, the frequency of this QCM shouldstill be at its ini

39、tial value. (This is not meant to replace arelative humidity meter, rather it verifies the system electronicsstability.)8.4 For determining the chambers spatial uniformity ofpollutant gas, QCMs should be located uniformly at variouslocations around a chamber to confirm that the corrosion rate isthe

40、same (610 %) at all locations. A typical distribution is onesensor per every 7 L of volume or 4 sensors/ft3for a cubicchamber of 28-L (1-ft3) volume. See Test Method B810 fortypical distribution schemes of QCM. This density can beincreased or decreased depending on the chamber shape,chamber loading,

41、 and chamber airflow.8.5 It is preferable that the monitoring QCMs shall beoriented with the sensing surface perpendicular to and facingthe air flow. If another orientation to the air flow is used, themonitors orientation relative to the air flow shall be reported inthe test report.9. Report9.1 Reco

42、rded data should include the following:9.1.1 Types and concentrations of the corrosive gases in thecorrosion chamber, relative humidity, temperature, and air flowcharacteristics (for example, direction, velocity, turbulence,and exchange rate).9.1.2 Sensing material(s), weight gain(s), versus time an

43、ddate for the QCMs, and their location in the chamber.9.1.3 Description of the samples in the chamber during theexperiments, including the material, surface area, and locationin the chamber.10. Precision and Bias10.1 PrecisionThe precision of this test method has beendetermined to be 610 % using cop

44、per QCMs. This experimentis reported in the open literature.9However, as a result ofvariations in fixturing, film composition, film smoothness, andair flow characteristics, all QCM measurements should becompared to total corrosion rates as determined by TestMethod B810 and described previously.10.2

45、BiasCrystal fixturing may produce large variabilityin chamber-to-chamber results. Since there is no acceptablereference suitable for determining the bias for QCMs, bias hasnot been determined.11. Keywords11.1 corrosion monitor; piezoelectric crystals, sensors, thin-film monitorAPPENDIX(Nonmandatory

46、Information)X1. SAUERBREY EQUATION RELATING FREQUENCY CHANGE OF A QUARTZ CRYSTAL MICROBALANCE (QCM) TOMASS CHANGE IN AN ATMOSPHERIC CORROSION TESTX1.1 A piezoelectric quartz crystal utilizes the ConversePiezoelectric Effect to determine mass changes as a result offrequency change of the crystal. Mat

47、erial such as copper iscoated onto the crystal that bonds with a material from theatmosphere. When the gaseous material bonds to the materialon the crystal surface, its added mass lowers the crystalfrequency. The Sauerbrey equation10relates the frequencychange to the mass change. One form of the Sau

48、erbreyequation is given as follows:Df 52Dmdf2/rqvq(X1.1)where:Df = change in frequency of the crystal,Dmd= change in mass surface density (md, mass per unitof surface area),f2= square of the frequency of the crystal,rq= density of quartz (2650 kg m-3), andvq= velocity of propagation of sound inquart

49、z (3340 m s-1).9Schubert, R. and Neuburger, G. G., Journal of the Electrochemical Society,Vol 137, No. 4, 1990, p. 1048.10Sauerbrey, G. Z., Z. Phys., 1959, 133, 206.B808 103X1.1.1 For small changes in mass of the crystal and relatedsmall changes in frequency, the relation:Df 52K Dmd(X1.2)is adequate for purposes of this test method where Kincorporates the square of the initial frequency and the materialconstants. Since a frequency change of one part in 107isreadily detected with common instrumentation, when onecalculates the related change in mass one finds that a ma