1、Designation: B808 10 (Reapproved 2015)Standard Test Method forMonitoring of Atmospheric Corrosion Chambers by QuartzCrystal Microbalances1This standard is issued under the fixed designation B808; the number immediately following the designation indicates the year oforiginal adoption or, in the case
2、of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method monitors the reactivity of a gaseoustest environment in which metal surfaces
3、 (for example, elec-trical contacts, assembled printed wiring boards, and so forth)and other materials subject to pollutant gas attack undergoaccelerated atmospheric corrosion testing. This test method isapplicable to the growth of adherent corrosion films whosetotal corrosion film thickness ranges
4、from a few atomicmonolayers to approximately a micrometre.1.2 The test method provides a dynamic, continuous, in-situ, procedure for monitoring the corrosion rate in corrosionchambers; the uniformity of corrosion chambers; and thecorrosion rate on different surfaces. Response time in the orderof sec
5、onds is possible.1.3 With the proper samples, the quartz crystal microbal-ance (QCM) test method can also be used to monitor theweight loss from a surface as a result of the desorption ofsurface species (that is, reduction of an oxide in a reducingatmosphere). (Alternative names for QCM are quartz c
6、rystaloscillator, piezoelectric crystal oscillator, or thin-film evapora-tion monitor.)1.4 This test method is not sufficient to specify the corrosionprocess that may be occurring in a chamber, since a variety ofpollutant gases and environments may cause similar weightgains.1.5 This test method is g
7、enerally not applicable to testenvironments in which solid or liquid particles are deposited onthe surface of the quartz crystal.1.6 The values stated in SI units are to be regarded asstandard. The values in parentheses are for information only.1.7 This standard does not purport to address all of th
8、esafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to become familiarwith all hazards including those identified in the appropriateSafety Data Sheet (SDS) for this product/material as providedby the manufacturer, to establish appropriate safety an
9、d healthpractices, and determine the applicability of regulatory limi-tations prior to use.2. Referenced Documents2.1 ASTM Standards:2B810 Test Method for Calibration ofAtmospheric CorrosionTest Chambers by Change in Mass of Copper Coupons3. Summary of Test Method3.1 A single crystal of quartz has v
10、arious natural resonantfrequencies depending on the crystals size and shape. Thedecrease in natural frequency is linearly proportional to thecrystal mass and the mass of well-bonded surface films. Forcrystals with reactive metal films on the surface (usuallydriving electrodes), the mass of the cryst
11、al/metal film increasesas the metal oxidizes or forms other compounds with gasesadsorbed from the atmosphere.3,4Thus, by measuring the rateof resonant frequency change, a rate of corrosion is measured.Non-adherent corrosion films, particles, and droplets yieldambiguous results.Areview of theory and
12、applications is givenin Lu and Czanderna.5See Appendix X1 for discussion of thequantitative relationship between frequency change and masschange.3.2 The chamber environmental uniformity and corrosionrate can be measured by placing matching quartz crystals withmatching reactive metal films at various
13、 locations in thechamber. If the chamber and corrosion rate have beenstandardized, the corrosion rate on various surface materialsthat have been deposited on the quartz crystal can be deter-mined.1This test method is under the jurisdiction of ASTM Committee B02 onNonferrous Metals and Alloys and is
14、the direct responsibility of SubcommitteeB02.11 on Electrical Contact Test Methods.Current edition approved Oct. 1, 2015. Published October 2015. Originallyapproved in 1997. Last previous edition approved in 2010 as B808 10. DOI:10.1520/B0808-10R15.2For referenced ASTM standards, visit the ASTM webs
15、ite, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3King, W. H. Jr., Analytical Chemistry, Vol 36, 1964, p. 173.4Karmarkar, K. H. and Guilbaut, G. G., Analytical C
16、hemistry Acta, Vol 75, 1975,p. 111.5Lu, C. and Czanderna,A. W. Eds., Applications of Piezoelectric Quartz CrystalMicrobalances, Elsevier, c1984.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States14. Significance and Use4.1 Corrosion film
17、growth with thicknesses varying from amonolayer of atoms up to 1 m can readily be measured on acontinuous, real-time, in-situ, basis with QCMs.4.2 The test results obtained for this test method areinfluenced by various factors, including geometrical effects,temperature, humidity, film thickness, fil
18、m materials, electrodeconditions, gases in the corrosion chamber, atmosphericpressure, and so forth. Calibration of coated crystals andinstrumentation and reproducible crystal operating conditionsare necessary for consistent results.5. Apparatus5.1 Apparatus can be a simple series circuit of crystal
19、 (withelectrodes and sensing film), oscillator (typically 6 MHz) andfrequency counter (610-Hz accuracy and stability), as sche-matically shown in Fig. 1.5.2 Commercial, Thin-Film Monitors,6incorporating thosefunctions that read out thicknesses or weight gain are alsoavailable and acceptable after th
20、ey have been calibrated.5.3 Microbalance, with an accuracy of 62 g is needed forcalibration procedures.5.4 Recording Devices or Computers are needed for real-time, continuous measurements.76. Materials6.1 Crystals shall be of the AT5cut variety with a resonantfrequency in the MHz range and matched t
21、o the frequencymeasuring apparatus used. Quartz crystal surfaces shall bepolished to a surface finish with an arithmetical meandeviation, Ra, of less than 0.1 m. With this surface finish, thecrystal appears optically transparent to the human eye.86.2 Electrodes, used to drive the crystals resonantfr
22、equency, can be made from any electrically conductingmaterial and usually are a metal film evaporated on the quartcrystal surface. The material under study or being used tocalibrate the system may be the same as or different than theelectrode material. If the two materials are different, thepotentia
23、l corrosion of the electrodes shall be accounted forduring the design and subsequent experiments. Depending onthe materials under test, the QCMs can have copper, silver,nickel, zinc, gold, etc. electrodes. The preferred method ofdeposition is by evaporation for a high purity, smooth surface.If subla
24、yers are used to enhance the adhesion of the finalelectrode, they should be covered by the final electrodematerial so that less than 1 % of the metallic area is of exposedsublayer material. Because of the fragility of the metal elec-trode there should be multiple (three or more), spring-loadedcontac
25、ts between the crystal and electronics.6.3 After metallization of the crystals, they should be storedin desiccators. After two years storage or if the metallizationshows discoloration or staining, the crystals shall be discarded.Crystal surfaces should not be chemically or mechanicallycleaned before
26、 use in the corrosion chamber. They should beblown clean with inert compressed gas. Chilling and conden-sation on the surface, as can occur with the use of pressurizedfluorocarbons, shall be avoided. Care shall be exercised so thatthe crystals are only handled by clean tweezers or tongs andnever tou
27、ched by hands.7. Calibration7.1 QCMs and its electronics shall be calibrated initially ina given corrosion system and thereafter on an annual basis.Calibration shall be performed with the same shape and size ofcrystal holder to be used during operation. Recalibration shallbe performed if the crystal
28、 holder geometry is changed.Calibration can be done by comparison to a standard such asactual gravimetric weighing on a microbalance (62 g). Use asample of the same material as the sensing film with aminimum area of 5 cm2and a thickness of 0.1 to 0.6 mm (seeTest Method B810). Foil surface roughness
29、should be within620 % of the QCM sensing film roughness. The procedure forthe generation (that is, evaporation) and cleaning of thegravimetric sample should be the same as used for the sensingfilms. The age and storage of the gravimetric sample should becomparable to the age of the QCM sensing film.
30、 Allow the foilto equilibrate with the microbalance atmosphere for 0.5 h, thenweigh the sample with 62-g accuracy before exposure.Suspend the weighed gravimetric sample between two simi-larly treated QCMs spaced 20 cm apart with the large surfacearea dimension of the samples parallel to the air flow
31、. Aftersufficient exposure, as determined in the paragraph below,remove the sample from the corrosion chamber, equilibrate itwith the balance atmosphere, and reweigh. The gravimetricallymeasured, foil weight gain per unit area should be within610 % of the calculated weight gain, found on the active
32、areaof the QCM.7.2 A weight gain of the metal foil of 50 g is sufficient fora microbalance with 62-g reproducibility and is sufficient forcalibration. (If the reproducibility of the microbalance is poorerthan 62 g, proportionally greater weight gain shall be used.)If the sensing material was copper
33、and the corrosion film wasCu2O, 50 g/5 cm2would correspond to a film thickness of 149nm if the density of Cu2O was 6 g/cm3and the percentage ofoxygen in the film was 11 % (16/143). For improved accuracy,greater weight gain may be used. However, the calculatedthickness of the corrosion film should no
34、t exceed 50 % of theelectrode thickness.6Instruments of this type are used in semiconductor manufacture and may befound by searching for deposition thickness monitors.7Schubert, R. “A Second Generation Accelerated Atmospheric CorrosionChamber,” ASTM STP 965, 1988, p. 374.8Most instrument suppliers o
35、f thin film monitors also sell crystals with variouscoatings and roughness.FIG. 1 Schematic of QCM and Related ElectronicsB808 10 (2015)28. Procedure8.1 All metal surfaces that are not being used in themeasurement should be shrouded or coated with a nonreactivematerial to protect the surfaces from u
36、nwanted corrosion (thatis, clear nail polish, Q-dope, heat shrink TFE-fluorocarbon, andso forth). It is especially important to protect any electricalconnections that are being used for measurements or providingpower from the corrosive atmosphere under investigation.8.2 Do not handle the crystals by
37、 hand or with anything thatleaves a residue after evaporation on the crystal electrodes. Usecaution in all handling to avoid scratching the sensing filmsurface.8.3 One QCM with a sensing film inert to the test environ-ment should be in the system to monitor changes in the amountof relative humidity
38、in the system, adsorbed hydrocarbons, andso forth. (A gold-coated QCM is usually a good choice for thisapplication.) At the end of the chamber exposure when all thepollutant gases have been removed and the humidity has beenreturned to its initial value, the frequency of this QCM shouldstill be at it
39、s initial value. (This is not meant to replace arelative humidity meter, rather it verifies the system electronicsstability.)8.4 For determining the chambers spatial uniformity ofpollutant gas, QCMs should be located uniformly at variouslocations around a chamber to confirm that the corrosion rate i
40、sthe same (610 %) at all locations. A typical distribution is onesensor per every 7 L of volume or 4 sensors/ft3for a cubicchamber of 28-L (1-ft3) volume. See Test Method B810 fortypical distribution schemes of QCM. This density can beincreased or decreased depending on the chamber shape,chamber loa
41、ding, and chamber airflow.8.5 It is preferable that the monitoring QCMs shall beoriented with the sensing surface perpendicular to and facingthe air flow. If another orientation to the air flow is used, themonitors orientation relative to the air flow shall be reported inthe test report.9. Report9.1
42、 Recorded data should include the following:9.1.1 Types and concentrations of the corrosive gases in thecorrosion chamber, relative humidity, temperature, and air flowcharacteristics (for example, direction, velocity, turbulence,and exchange rate).9.1.2 Sensing material(s), weight gain(s), versus ti
43、me anddate for the QCMs, and their location in the chamber.9.1.3 Description of the samples in the chamber during theexperiments, including the material, surface area, and locationin the chamber.10. Precision and Bias10.1 PrecisionThe precision of this test method has beendetermined to be 610 % usin
44、g copper QCMs. This experimentis reported in the open literature.9However, as a result ofvariations in fixturing, film composition, film smoothness, andair flow characteristics, all QCM measurements should becompared to total corrosion rates as determined by TestMethod B810 and described previously.
45、10.2 BiasCrystal fixturing may produce large variabilityin chamber-to-chamber results. Since there is no acceptablereference suitable for determining the bias for QCMs, bias hasnot been determined.11. Keywords11.1 corrosion monitor; piezoelectric crystals, sensors, thin-film monitorAPPENDIX(Nonmanda
46、tory Information)X1. SAUERBREY EQUATION RELATING FREQUENCY CHANGE OF A QUARTZ CRYSTAL MICROBALANCE (QCM) TOMASS CHANGE IN AN ATMOSPHERIC CORROSION TESTX1.1 A piezoelectric quartz crystal utilizes the ConversePiezoelectric Effect to determine mass changes as a result offrequency change of the crystal
47、. Material such as copper iscoated onto the crystal that bonds with a material from theatmosphere. When the gaseous material bonds to the materialon the crystal surface, its added mass lowers the crystalfrequency. The Sauerbrey equation10relates the frequencychange to the mass change. One form of th
48、e Sauerbreyequation is given as follows:f 52mdf2/rqvq(X1.1)where:f = change in frequency of the crystal,md= change in mass surface density (md, mass per unitof surface area),f2= square of the frequency of the crystal,rq= density of quartz (2650 kg m-3), andvq= velocity of propagation of sound inquar
49、tz (3340 m s-1).X1.1.1 For small changes in mass of the crystal and relatedsmall changes in frequency, the relation:f 52K md(X1.2)is adequate for purposes of this test method where Kincorporates the square of the initial frequency and the materialconstants. Since a frequency change of one part in 107is9Schubert, R. and Neuburger, G. G., Journal of the Electrochemical Society,Vol137, No. 4, 1990, p. 1048.10Sauerbrey, G. Z., Z. Phys., 1959, 133, 206.B808 10 (2015)3readily detected with common instrumentation, when onecalculates the related change in mass one find
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