ASTM D3004-2008 Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting Conductor and Insulation Shielding Materials《挤制热固性和热塑性半导体和绝缘屏蔽的标准规范》.pdf

1、Designation: D 3004 08An American National StandardStandard Specification forCrosslinked and Thermoplastic Extruded Semi-Conducting,Conductor and Insulation Shielding Materials1This standard is issued under the fixed designation D 3004; the number immediately following the designation indicates the

2、year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope*1.1 This specification covers crosslinked and thermopla

3、sticextruded semi-conducting, conductor and insulation shieldingmaterials for electrical wires and cables.1.2 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.3 In many instances, the electrical properties of theshielding mater

4、ial are strongly dependent on processing con-ditions. For this reason, in this specification the material issampled from cable. Therefore, tests are done on shielded wirein this standard solely to determine the relevant property of theshielding material and not to test the conductor or completedcabl

5、e.2. Referenced Documents2.1 ASTM Standards:2D 257 Test Methods for DC Resistance or Conductance ofInsulating MaterialsD 1711 Terminology Relating to Electrical InsulationD 2647 Specification for Crosslinkable Ethylene PlasticsD 3182 Practice for RubberMaterials, Equipment, andProcedures for Mixing

6、Standard Compounds and Prepar-ing Standard Vulcanized SheetsD 3183 Practice for RubberPreparation of Product Piecesfor Test Purposes from ProductsD 4496 Test Method for D-C Resistance or Conductance ofModerately Conductive MaterialsD 4703 Practice for Compression Molding ThermoplasticMaterials into

7、Test Specimens, Plaques, or SheetsD 6095 Test Method for Longitudinal Measurement of Vol-ume Resistivity for Extruded Crosslinked and Thermoplas-tic Semiconducting Conductor and Insulation ShieldingMaterials3. Terminology3.1 Definitions: For definitions of terms used in this speci-fication, refer to

8、 Terminology D 1711.3.2 Definitions of Terms Specific to This Standard:3.2.1 aging (act of), nthe exposure of materials to anenvironment for an interval of time.3.2.2 longitudinal volume resistivity, nan electrical resis-tance multiplied by a factor calculated from the geometry of aspecimen volume b

9、etween electrodes in contact with one, andonly one, surface of the specimen.3.2.2.1 DiscussionIn normal wire and cable usage, thelongitudinal volume resistivity is simply referred to as “volumeresistivity.” This usage is at variance with terminology in TestMethods D 257, Terminology D 1711, and Test

10、 MethodD 4496.3.2.3 semi-conducting, adjmoderately conductive; seeTerminology D 1711 and Test Method D 4496.4. Physical Properties4.1 The shielding material, when processed into moldedslabs, in accordance with Procedure C in the Annex of PracticeD 4703, the Sampling Section of Specification D 2647,

11、andPractices D 3182 and D 3183, depending on the type ofmaterial being tested, shall conform to the requirements forphysical properties specified in Table 1.5. Electrical Requirements5.1 Logitudinal Volume ResistivityWhen the extrudedconductor and insulation shielding is sampled and tested inaccorda

12、nce with Test Method D 6095, the volume resistivity at1This specification is under the jurisdiction of ASTM Committee D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.18 on Solid Insulations, Non-Metallic Shieldings and Coveringsfor Electrical

13、and Telecommunication Wires and Cables.Current edition approved May 1, 2008. Published June 2008. Originallyapproved in 1971. Last previous edition approved in 2002 as D 3004 02.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org.

14、For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1*A Summary of Changes section appears at the end of this standard.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.th

15、e rated temperature of the insulation shall be not greater than100 000 Vcm for conductor shielding and 50 000 Vcm forinsulation shielding.6. Sampling6.1 Sample the semi-conducting materials in accordancewith 4.1.7. Test Methods7.1 Test the semi-conducting materials in accordance with4.1 and Test Met

16、hod D 6095.8. Keywords8.1 conductor shielding material; insulation shielding mate-rial; semicon; semi-conducting shielding material; volumeresistivitySUMMARY OF CHANGESCommittee D09 has identified the location of selected changes to this specification since the last issue,D 3004 02, that may impact

17、the use of this specification. (Approved May 1, 2008)(1) Revised the document throughout, including the title.ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised

18、 that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either rea

19、pproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If yo

20、u feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual

21、 reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org).TABLE 1 Physical Properties for Semi-conducting ShieldingMaterialsBrittle point (Test Method A) 10 C, maxAging requirements:AElongation at rupture, min, % 100AThermoplastic materials, aged 48 h at 100 6 1 C. Crosslinked materials, aged168 h at 121 6 1C.D3004082