ASTM D3004-2008(2013) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting Conductor and Insulation Shielding Materials《挤制热固性和热塑性半导体和绝缘屏蔽的标准规范》.pdf

1、Designation: D3004 08 (Reapproved 2013) An American National StandardStandard Specification forCrosslinked and Thermoplastic Extruded Semi-Conducting,Conductor and Insulation Shielding Materials1This standard is issued under the fixed designation D3004; the number immediately following the designati

2、on indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope*1.1 This specification covers crosslin

3、ked and thermoplasticextruded semi-conducting, conductor and insulation shieldingmaterials for electrical wires and cables.1.2 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.3 In many instances, the electrical properties of t

4、heshielding material are strongly dependent on processing con-ditions. For this reason, in this specification the material issampled from cable. Therefore, tests are done on shielded wirein this standard solely to determine the relevant property of theshielding material and not to test the conductor

5、 or completedcable.2. Referenced Documents2.1 ASTM Standards:2D257 Test Methods for DC Resistance or Conductance ofInsulating MaterialsD1711 Terminology Relating to Electrical InsulationD2647 Specification for Crosslinkable Ethylene PlasticsD3182 Practice for RubberMaterials, Equipment, and Pro-cedu

6、res for Mixing Standard Compounds and PreparingStandard Vulcanized SheetsD3183 Practice for RubberPreparation of Pieces for TestPurposes from ProductsD4496 Test Method for D-C Resistance or Conductance ofModerately Conductive MaterialsD4703 Practice for Compression Molding ThermoplasticMaterials int

7、o Test Specimens, Plaques, or SheetsD6095 Test Method for Longitudinal Measurement of Vol-ume Resistivity for Extruded Crosslinked and Thermo-plastic Semiconducting Conductor and Insulation Shield-ing Materials3. Terminology3.1 Definitions: For definitions of terms used in thisspecification, refer t

8、o Terminology D1711.3.2 Definitions of Terms Specific to This Standard:3.2.1 aging (act of), nthe exposure of materials to anenvironment for an interval of time.3.2.2 longitudinal volume resistivity, nan electrical resis-tance multiplied by a factor calculated from the geometry of aspecimen volume b

9、etween electrodes in contact with one, andonly one, surface of the specimen.3.2.2.1 DiscussionIn normal wire and cable usage, thelongitudinal volume resistivity is simply referred to as “volumeresistivity.” This usage is at variance with terminology in TestMethods D257, Terminology D1711, and Test M

10、ethod D4496.3.2.3 semi-conducting, adjmoderately conductive; seeTerminology D1711 and Test Method D4496.4. Physical Properties4.1 The shielding material, when processed into moldedslabs, in accordance with Procedure C in the Annex of PracticeD4703, the Sampling Section of Specification D2647, andPra

11、ctices D3182 and D3183, depending on the type of materialbeing tested, shall conform to the requirements for physicalproperties specified in Table 1.5. Electrical Requirements5.1 Logitudinal Volume ResistivityWhen the extrudedconductor and insulation shielding is sampled and tested inaccordance with

12、 Test Method D6095, the volume resistivity atthe rated temperature of the insulation shall be not greater than100 000 cm for conductor shielding and 50 000 cm forinsulation shielding.6. Sampling6.1 Sample the semi-conducting materials in accordancewith 4.1.1This specification is under the jurisdicti

13、on of ASTM Committee D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.18 on Solid Insulations, Non-Metallic Shieldings and Coveringsfor Electrical and Telecommunication Wires and Cables.Current edition approved Nov. 1, 2013. Published December

14、2013. Originallyapproved in 1971. Last previous edition approved in 2008 as D3004 08. DOI:10.1520/D3004-08R13.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the st

15、andards Document Summary page onthe ASTM website.*A Summary of Changes section appears at the end of this standardCopyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States17. Test Methods7.1 Test the semi-conducting materials in accordance with

16、4.1 and Test Method D6095.8. Keywords8.1 conductor shielding material; insulation shielding mate-rial; semicon; semi-conducting shielding material; volumeresistivitySUMMARY OF CHANGESCommittee D09 has identified the location of selected changes to this specification since the last issue,D3004 02, th

17、at may impact the use of this specification. (Approved May 1, 2008)(1) Revised the document throughout, including the title.ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are exp

18、ressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revis

19、ed, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may

20、 attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United Stat

21、es. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be

22、secured from the ASTM website (www.astm.org/COPYRIGHT/).TABLE 1 Physical Properties for Semi-conducting ShieldingMaterialsBrittle point (Test Method A) 10C, maxAging requirements:AElongation at rupture, min, % 100AThermoplastic materials, aged 48 h at 100 1C. Crosslinked materials, aged168hat1211C.D3004 08 (2013)2