ASTM D3380-2014 Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《高分子基微波电路基材的相对介电率 (介电常数) 和电.pdf

1、Designation: D3380 10D3380 14Standard Test Method forRelative Permittivity (Dielectric Constant) and DissipationFactor of Polymer-Based Microwave Circuit Substrates1This standard is issued under the fixed designation D3380; the number immediately following the designation indicates the year oforigin

2、al adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope*1.1 This test method permits the rapid measurement of apparent relat

3、ive permittivity and loss tangent (dissipation factor) ofmetal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).1.2 This test method is suitable for testing PTFE (polytetrafluorethylene) impregnated glass cloth or random-oriented fiber mats,glass fiber-reinforced polystyrene, poly

4、phenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimenthickness of 116 in. (1.6 mm). in. (1.6 mm). The materials listed in the preceding sentence have been used in commercialapplications at nominal frequency of 9.6 GHz. 9.6 GHz.NOTE 1See Appendix X1 for additional i

5、nformation about range of permittivity, thickness other than 1.6 mm, 1.6 mm, and tests at frequencies otherthan 9.6 GHz. 9.6 GHz.1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematicalconversions to SI units that are provided for inf

6、ormation only and are not considered standard.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the applicability of regula

7、torylimitations prior to use.2. Referenced Documents2.1 ASTM Standards:2D150 Test Methods for AC Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical InsulationD1711 Terminology Relating to Electrical InsulationD2520 Test Methods for Complex Permittivity (Dielectric Consta

8、nt) of Solid Electrical Insulating Materials at MicrowaveFrequencies and Temperatures to 1650CD6054 Practice for Conditioning Electrical Insulating Materials for Testing (Withdrawn 2012)32.2 IPC Standards:4IPC-TM-650 Test Methods Manual Method 2.5.5.5.IPC-MF-4562 Metal Foil for Printed Wiring Applic

9、ations.2.3 IEEE Standards:5Standard No. 488.1No. 488.1 Standard Digital Interface for Programmable Instrumentation.Standard No. 488.2No. 488.2 Standards, Codes, Formats, Protocols and Common Commands for useUse with ANSI and IEEEStandard 488.1.3. Terminology3.1 DefinitionsSee Terminology D1711 for t

10、he definitions of terms used in this test method. See also Test Methods D2520,D150, and IPC TM-650 for additional information regarding the terminology.1 This test method is under the jurisdiction of ASTM Committee D09 on Electrical and Electronic Insulating Materials and is the direct responsibilit

11、y of SubcommitteeD09.12 on Electrical Tests.Current edition approved Jan. 1, 2010Nov. 1, 2014. Published February 2010November 2014. Originally approved in 1975. Last previous edition approved in 20032010as D338090(2003).D3380 10. DOI: 10.1520/D3380-10.10.1520/D3380-14.2 For referencedASTM standards

12、, visit theASTM website, www.astm.org, or contactASTM Customer Service at serviceastm.org. For Annual Book of ASTM Standardsvolume information, refer to the standards Document Summary page on the ASTM website.3 The last approved version of this historical standard is referenced on www.astm.org.4 Ava

13、ilable from IPC, 3000 Lakeside Drive, Suite 309S, Bannockburn, IL 60015.5 Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE), 445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-1331, http:/www.ieee.org.This document is not an ASTM standard and is intended only to provide th

14、e user of an ASTM standard an indication of what changes have been made to the previous version. Becauseit may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current versionof the standa

15、rd as published by ASTM is to be considered the official document.*A Summary of Changes section appears at the end of this standardCopyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States13.2 Definitions of Terms Specific to This Standard:3.2.

16、1 Da symbol used in this test method for the dissipation factor.3.2.2 La correction factor associated with length which corrects for the fringing capacitance at the ends of the resonatorelement.3.2.3 symbol used in this test method to denote relative permittivity.3.2.3.1 DiscussionThe preferred symb

17、ol for permittivity is Greek kappa prime, but some persons use other symbols to denote this property such asDK, SIC, or R.3.2.4 microstrip lineline, na microwave transmission line employing a flat strip conductor bonded to one surface of adielectric board or sheet, the other surface of which is clad

18、 with, or bonded to, a continuous conductive foil or plate which issubstantially wider than the strip.3.2.4.1 DiscussionMicrostrip provides easier accessibility than stripline for attaching components and devices to the strip circuitry.3.2.5 microwave substratesubstrate, na board or sheet of low-los

19、s dielectric material that is clad with metal foil either onone,one or both,both surfaces, from which all metal is removed by etching prior to testing.3.2.6 striplinestripline, nmicrowave transmission line using a flat strip conductor clamped, or bonded, between twosubstantially wider dielectric boa

20、rds.3.2.6.1 DiscussionThe outer surfaces of both boards are bonded to, or in intimate contact with, conducting foils or plates (ground planes). Picturea stripline as a flattened version of cylindrical coaxial cable.3.2.7 stripline resonatorresonator, na disconnected section of stripline loosely coup

21、led at each end by capacitative gaps tofeed or probe lines.3.2.7.1 DiscussionThe strip becomes resonant at those frequencies at which the strip length, increased by an increment due to the fringing fields atthe ends, is equal to an integral multiple of half-wavelengths in the dielectric.As frequency

22、 varies gradually, the power transmittedfrom the input to the output feed lines becomes maximum at resonance, and falls off sharply to essentially zero at frequencieswhich are a few parts per thousand above and below resonance.4. Summary of Test Method4.1 Substrate specimens, with metal cladding rem

23、oved, become the supporting dielectric spacers of a microwave striplineresonator when properly positioned and clamped in the test fixture. The measured values of resonant frequency of the striplineresonator and the half-power frequencies are used to compute the relative permittivity (dielectric cons

24、tant or ) and the dissipationfactor (D) of the test specimen. The test specimen consists of one or more pairs of test cards.5. Significance and Use5.1 Permittivity and dissipation factor are fundamental design parameters for design of microwave circuitry. Permittivity playsa principal role in determ

25、ining the wavelength and the impedance of transmission lines. Dissipation factor (along with copperlosses) influence attenuation and power losses.5.2 This test method is suitable for polymeric materials having permittivity in the order of two to eleven. Such materials arepopular in applications of s

26、tripline and microstrip configurations used in the 1 to 18 GHz range.5.3 This test method is suitable for design, development, acceptance specifications, and manufacturing quality control.NOTE 2See Appendix X1 for additional information regarding significance of this test method and the application

27、of the results.6. Apparatus6.1 The preferred assembly fixture shown in Fig. 1Figs. 1-3, Fig. 2, and Fig. 3is hereby designated Fixture A. This design oftest specimen fixture provides advantages over the design of Fixture B, shown in Fig. 4Figs. 4-7, Fig. 5, Fig. 6, and Fig. 7.D3380 1426.1.1 The Fixt

28、ure B design has been included since this fixture has been, and still is, in service in numerous laboratories.6.1.2 The Fixture B design relies upon close control of the room temperature in the laboratory for control of the test specimentemperature.6.1.3 Changing of test pattern cards in the Fixture

29、 B design is less convenient than with the Fixture A design.6.1.4 For FixtureA, the preferred assembly for Resonator Card and Specimen uses a Lap Conductor Joint. See Fig. 3 for details.6.2 Fixture AThe elements of the fixture include the following:6.2.1 Resonator Pattern Card (see Fig. 8),6.2.2 Bas

30、e Stripline Board (see Fig. 9),6.2.3 Base Cover Board (see Fig. 10),6.2.4 End-Launcher Bodies, adapted (see Fig. 11),FIG. 1 Face View of Fixture AssemblyFIG. 2 Exploded Side View of AssemblyFIG. 3 Enlarged Exploded Side View Sectioned Through a Probe Line Showing a Lap Conductor Joint for Fixture AD

31、3380 143In. mmin. mm0.001 0.030.002 0.050.086 2.180.100 2.540.143 3.630.200 5.080.214 5.440.250 6.350.500 12.701.000 25.401.500 38.102.000 50.802.700 68.58NOTE 1Dimensions are in inches.NOTE 2Metric equivalents are given for general information only.FIG. 4 Generalized Resonator Pattern Card for Fixt

32、ure B Showing Dimensions of Table 1 and Made of Laminate Matching the NominalPermittivity of Material to be TestedFIG. 5 Test Fixture Construction, Older Design (Fixture B)D3380 1446.2.5 Aluminum Base Plates (see Fig. 12),FIG. 6 Test Fixture Construction, Older Design (Fixture B)FIG. 7 Test Fixture

33、Construction, Older Design (Fixture B)D3380 1456.2.6 Aluminum Clamping Plates (see Fig. 13),6.2.7 Aluminum Blocks, for temperature control (see Fig. 14).), and6.2.8 Sliders and Blocks (see Fig. 15), and).FIG. 8 Generalized Resonator Pattern Card for Fixture A Showing Dimensions of and Made of Lamina

34、te Matching the Nominal Permit-tivity of Materials to be TestedFIG. 9 Base Stripline Board with Copper Foil and Dielectric Matching the Nominal Permittivity of the Material to be TestedFIG. 10 Base Cover Board with Copper Foil Ground PlaneFIG. 11 Detail of the Supplied End Launcher Body Adapted by B

35、oring Out the Tapped HolesD3380 1466.3 Microwave Signal Source, capable of providing an accurate signal. An accurate signal provides a leveled power output thatfalls within a 0.1 dB range during the required time period and over the range of frequency needed to make a permittivity and lossmeasuremen

36、t, and maintains output within 5 MHz of the set value for the time required to make a measurement when the signalsource is set for a particular frequency.FIG. 12 Aluminum Base Plate for Clamping the Base Cards and Connecting Launcher Bodies to the Base CardFIG. 13 Aluminum Clamping Plate Provided wi

37、th Tapped Holes for the Pressure Block and a Thermocouple WellFIG. 14 Aluminum Block for Temperature Control and Transfer of Pressure to the Clamp Plates, Fitted with Tapped Holes for Slide, Em-bedded Steel Ball, and Tapped for Tubing Fittings for Circulating FluidD3380 1476.4 Frequency Measuring De

38、vice, having a resolution 5 MHz 5 MHz or less.6.5 Power Level Detecting Device, having a resolution of 0.1 dB or less and capable of comparing power levels within a 3-dBrange with an accuracy of 0.1 dB.6.6 Compression Force Gage,Gauge,6capable capable of measuring to 1100 lb (5000 N) with an accurac

39、y of 61 % of full scale.6.7 Vise, or a press, for exerting a controlled force of 1000 lb (4448 N) 1000 lb (4448 N) on the test fixture and having anopening of at least 5 in. (130 mm) to accept the force gagegauge and test fixture.6.8 Apparatus for Manual Test Setup:6.8.1 Sweep Frequency Generator.6,

40、76.8.2 X-Band Frequency Plug-In Unit.6,86.8.3 Frequency Meter.6,96.8.4 Crystal Detector,6,10two two required.6.8.5 Matched Load Resistor,6,11 for one of the crystal detectors.6 If you are aware of alternative suppliers, please provide this information to ASTM International Headquarters. Your comment

41、s will receive careful consideration at ameeting of the responsible technical committee,1 which you may attend.7 The sole source of supply of the Hewlett Packard (HP) 8350B or 8620C generator known to the committee at this time is Hewlett Packard. If you are aware of alternativesuppliers, please pro

42、vide this information to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsible technicalcommittee,1 which you may attend.8 The sole source of supply of the Hewlett Packard (HP) 83545A or 86251A plug-in unit known to the committee at this ti

43、me is Hewlett Packard. If you are aware ofalternative suppliers, please provide this information to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsibletechnical committee,1 which you may attend.9 The sole source of supply of the Hewlett P

44、ackard (HP) X532B meter known to the committee at this time is Hewlett Packard. If you are aware of alternative suppliers,please provide this information to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsible technical committee,1which yo

45、u may attend.10 The sole source of supply of the Hewlett Packard 423B Neg. detector known to the committee at this time is Hewlett Packard. If you are aware of alternative suppliers,please provide this information to ASTM International Headquarters. Your comments will receive careful consideration a

46、t a meeting of the responsible technical committee,1which you may attend.11 The sole source of supply of the Hewlett Packard 11523A option .001 resistor known to the committee at this time is Hewlett Packard. If you are aware of alternativesuppliers, please provide this information to ASTM Internati

47、onal Headquarters. Your comments will receive careful consideration at a meeting of the responsible technicalcommittee,1 which you may attend.FIG. 15 Slider and Block for Connecting Pressure Block and Base Plate with Allowance for Opening the FixtureD3380 1486.8.6 Standing Wave Rectified (SWR) Meter

48、,6,12 two required.6.8.7 Directional Coupler.6,136.8.8 Attenuator,6,14 rated at 10 dB.6.8.9 Semi-Rigid Coaxial Cable and Connectors.6.8.10 Adapter,6,15for for waveguide to coaxial interconnection.6.8.11 The assembly of this equipment is shown schematically in Fig. 16.6.9 Apparatus for Computer Acqui

49、sition of DataThe following alternative equipment or its equivalent, when properlyinterconnected, has the potential to be used effectively with a computer-control program for automated testing:6.9.1 Sweep Frequency Generator,6,16 see also 6.8.1.6.9.2 Radio Frequency (RF) Plug-In Unit,6,17 having a range from 0.01 to 20 GHz.NOTE 3Significant cost savings are possible if a plug-in of a narrower frequency range (in the X-band from 5.9 to 12.4 GHz) is selected.6,186.9.3 Power Splitter.6,1912 The sole source of supply of the Hewlett Packard