ASTM E161-2000(2004) Standard Specification for Precision Electroformed Sieves《精密电铸筛(方形筛孔系列)的标准规范》.pdf

1、Designation: E 161 00 (Reapproved 2004)Standard Specification forPrecision Electroformed Sieves1This standard is issued under the fixed designation E 161; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A

2、 number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This specification covers the requirements for designand construction of electroformed sieves. These sieves are usedto perform partic

3、le-size distribution analysis and in preparingnarrowly designated particle-size fractions. They may also beused as reference standards when suitably calibrated. A methodof calibrating these sieves is included in the Annex.NOTE 1Complete instructions and procedures on the use and calibra-tion of test

4、ing sieves are contained in ASTM Manual 322. This publicationalso contains a list of all published ASTM Standards on sieve analysisprocedures for specific materials or industries.1.2 The sieve analysis results from two testing sieves of thesame sieve designation may not be the same because of thevar

5、iances in sieve opening permitted by this specification. Tominimize the differences in sieve analysis results, the use oftesting sieves matched on a performance basis is suggested.NOTE 2For other types of sieves, see Specifications E 11 and E 323.1.3 The values stated in SI units shall be considered

6、standard for the dimensions of the electroformed mesh open-ings and the size of the wires in the electroformed mesh. Thevalues stated in inch units shall be considered standard withregard to the sieve frames.1.4 This standard does not purport to address all of thesafety concerns, if any, associated

7、with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:3C 430 Test Method for Fineness of Hydraulic Cement bythe 45m (No

8、. 325) SieveE 11 Specification for Wire Cloth and Sieves for TestingPurposesE 323 Specification for Perforated-Plate Sieves for TestingPurposes2.2 ISO Standard:4ISO 565 Test sievesMetal Wire Cloth, Perforated Plateand Electroformed Sheet-Nominal Aperture Sizes3. Ordering Information3.1 Orders for it

9、ems under this specification include thefollowing information as necessary:3.1.1 Name of material (Electroformed Sieve),3.1.2 ASTM designation and year of issue (SpecificationE 161 XX),3.1.3 Quantity of each item, and3.1.4 Standard sieve designation (Table 1, Column 1).3.1.5 For testing sieves in st

10、andard circular frames:3.1.5.1 Nominal sieve frame diameter, and3.1.5.2 Nominal sieve frame height.3.1.6 For sieve cloth not in frames or in non-standardframes:3.1.6.1 Lateral dimension of sieve mesh, and3.1.6.2 Description of non-standard frame.3.1.7 For sieves requiring supporting grid:3.1.7.1 Sup

11、port grid desired,3.1.7.2 Support grid mounted up or down, and3.1.8 Compatible sieve pans and covers.4. Sieve Sheet Requirements4.1 The material used in the manufacture of the sieve sheetshall be nickel or a metal suitable for electrodeposition in afirm crystalline structure. The sheet shall have sq

12、uare or roundopenings with straight uniform sides and smooth, flat surfacesexcept for a slight bevel along the edges of the openings. Thethickness of the sheet (exclusive of the supporting grid, see4.2), is governed by the method of manufacture, the size of theopenings and the width of material betw

13、een openings, but in nocase shall the thickness of material between the openings beless than 10 m (0.0004 in.).4.2 If a supporting grid is required for durability, the sievesheet shall be mounted to the supporting metal grid in such a1This specification is under the jurisdiction of ASTM Committee E2

14、9 on Particleand Spray Characterization and is the direct responsibility of subcommittee E29.01on Sieves, Sieving Methods, and Screening Media.Current edition approved Oct. 1, 2004. Published November 2004. Originallyapproved in 1960. Last previous edition approved in 2000 as E 161 00.2ASTM Manual 3

15、2, Manual on Test Sieving Methods, Available from ASTM,100 Barr Harbor Drive, West Conshohocken, PA 19428-2959.3For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the s

16、tandards Document Summary page onthe ASTM website.4Available from International Organization for Standardization (ISO), 1 rue deVaremb, Case postale 56, CH-1211, Geneva 20, Switzerland.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.

17、manner that the sheet is firmly bonded to the grid. Thesupporting grid shall be of suitable thickness and strand widthto provide adequate support to the sheet. The sheet shall bemounted on the supporting grid with the openings running inthe same direction as those of the supporting grid.4.3 The fini

18、shed and mounted sieve sheet from which thesieves are constructed, shall conform to the requirements foropening size and spacing as outlined in Table 1. Extraneousmetal formed in or near the corners which does not restrict thepassage of a spheroidal particle shall be disregarded. The meandimension o

19、f these openings as defined in Table 1 establishesthe designated size of the sieve.NOTE 3In instances where a support grid is required for durability,opening sizes smaller than the allowable tolerances will be observed. Thisoccurs where the support grid overlaps the sieve openings in such a wayas to

20、 either block a portion of the opening or to create several smalleropenings. This is an unavoidable situation and has been determined tohave little measurable effect on the sieving open area or sieve perfor-mance.4.3.1 There shall be no punctures, missing or deformedareas, or other obvious defects i

21、n the sieve sheet.5. Test Sieve Frames5.1 General RequirementsFrames for precision electro-formed sieves shall be made from non-corrosive material suchas brass or stainless steel, and constructed in such a manner asto be rigid.5.1.1 The sieve sheet shall be mounted on the frame withoutdistortion, lo

22、oseness, or waviness.5.1.2 To prevent the material being sieved from catching inthe joint between the sieve sheet and the frame, the joint shallbe filled smoothly or constructed so that the material will notbe trapped.5.2 Standard Circular FramesSieve frames shall be cir-cular, of seamless construct

23、ion, with nominal diameters of 3,3.94, 7.87, 8, and 12 in. (76.2, 100, 200, 203.2, and 304.8 mm)as may be specified. The dimensions shall conform to therequirements in Table 2.5.2.1 The bottom of the frames shall be constructed so as toprovide an easy sliding fit with any sieve frames of the samenom

24、inal diameter conforming to the specified dimensions.5.2.2 The joint or fillet at the connection of the sieve sheetto the frames will provide a minimum clear sieving surfacewith a diameter equal to the nominal diameter less 0.5 in. (13mm).5.3 Non-Standard FramesOther sieve frames may beeither square

25、, rectangular, or circular.5.3.1 The frame may have the sieve sheet permanentlyinstalled or may be designed to permit replacement.NOTE 4Refer to Test Method C 430, which contains requirements for3-in. (76.2-mm) diameter by 3-in. (76.2-mm) high sieves used in themineral industries, especially the cem

26、ent group.5.3.2 The provisions of 5.1 apply, except that the framesmay also be made of other materials.NOTE 5Exercise care to prevent loss of material when using non-standard sieve frames.TABLE 1 Nominal Dimensions, Permissible Variations and Limitsfor Precision Electroformed SievesNominalOpening Si

27、ze,mAToleranceon SieveOpenings,6 mLimits,Openings perLinear cmBLimits,Openings perLinear in.Min Max Min Max500 2.0 15.35 16.14 39 41425 2.0 17.32 18.11 44 46355 2.0 19.29 20.87 49 53300 2.0 22.83 24.41 58 62250 2.0 25.20 26.77 64 68212 2.0 31.89 33.46 81 85180 2.0 35.04 36.61 89 93150 2.0 41.34 46.0

28、6 105 117125 2.0 46.06 51.18 117 130106 2.0 47.24 59.06 120 15090 2.0 55.12 78.74 140 20075 2.0 59.06 78.74 150 20063 2.0 66.93 98.43 170 25053 2.0 78.74 110.24 200 28045 2.0 90.55 118.11 230 30038 2.0 98.43 137.80 250 35032 2.0 110.24 157.48 280 40025 2.0 118.11C196.85C300C500C20 2.0 157.48C295.28C

29、400C750C15 2.0 157.48C295.28C400C750C10 2.0 196.85C393.70C500C1000C5 2.0 196.85C590.55C500C1500CAThese nominal size openings are from the preferred number series R40/3 andR10 (Openings on apertures 32 m and less are series R10.) These standarddesignations correspond to the values for test sieve aper

30、tures recommended bythe International Standards Organization, Geneva, Switzerland in ISO/565. Otheropening sizes are not precluded.BThese limits permit at least two adjacent sieves to be formed with the samenumber of openings per cm. The percent open area must in no case be so greatthat the width of

31、 metal between openings is less than 13 m.CBecause of their greater durability in routine testing, sieves made close to theminimum limit are normally supplied. Sieves made close to the maximum limit maybe obtained only on special order but are preferable from the standpoint of logicalprogression and

32、 better test completion time.TABLE 2 Dimensions of Standard Circular FramesCurrent Nominal Diameter, In.Proposed Revision Mean DiameterComments Typical FrameANominal HeightBInside at TopCOutside on Skirt3 3.000 in. + 0.030/0.000 3.000 in. + 0.000/0.030 1 in. (25.4 mm)(76.20 mm + 0.76/0.00) (76.20 mm

33、 + 0.00/0.76)8 8.000 in. + 0.030/0.000 8.000 in. + 0.000/0.030 2 in. (50.8 mm) FHD(203.20 mm + 0.76/0.00) (203.20 mm + 0.00/0.76) 1 in. (25.4 mm) HHE12 12.00 in. + 0.030/0.000 12.00 in. + 0.000/0.030 2 in. (50.8 mm) FH(304.80 mm + 0.76/0.00) (304.80 mm + 0.00/0.76)AOther frame heights are not preclu

34、ded.BDistance from the top of the frame to the sieve cloth surface.CMeasured 0.2 in. (5 mm) below the top of the frame.DFH = Full height.EHH = Half height.E 161 00 (2004)25.4 Pans and CoversPans and covers for use with sievesshall be made so as to nest with the sieves. Pans with extendedrims (stacki

35、ng skirts) shall be furnished when specified. Thepans and covers shall conform to the dimensions in Table 2.6. Product Marking6.1 Each sieve shall bear a label marked with the followinginformation:6.1.1 This ASTM designation,6.1.2 The nominal size of the openings in micrometres,6.1.3 The mean size i

36、n m, and6.1.4 The name of the manufacturer or the responsibledistributor.7. Keywords7.1 opening; particle size; sieve; sieve analysis; sieve des-ignation; sieve sheet; test sieveANNEXES(Mandatory Information)A1. METHOD OF CALIBRATING PRECISION ELECTROFORMED SIEVESA1.1 The unique manner of forming th

37、e sieve sheet makesit easier and more precise to measure the openings rather thanthe nominal width of metal between adjacent openings as isfrequently done in the case of wire-cloth sieves. In some cases,electrodeposition produces small spurs or bulges of metalwhich project several m into the open ar

38、ea in the plane of thesheet, thereby restricting the passage of spheroidal particleswhich would go through a normally perfect opening.A1.2 Scan the entire area with a wide-angle binocularmicroscope having a magnifying power of approximately 503to determine if the sheet conforms to the specifications

39、 given in4.3, and if the edges between the sheet and frame are sealedcompletely.A1.2.1 Most microscopes will accommodate the 76.2-mm(3-in.) sieve on the existing stage without modifications. Amicroscope fitted with a 203 or 403 objective and a filarmicrometer eyepiece of 10 or 12.5 power is sufficie

40、nt for mostof the sieves.A1.2.2 Measurements must be sensitive to 0.5 m. Bottomillumination of preferably monochromatic light with essen-tially parallel rays is necessary. It is also a distinct advantage tohave vertical illumination through the objective. The magnifi-cation of the apparatus, and fil

41、ar micrometer if used, isdetermined by means of a calibrated-stage micrometre certifiedto 60.5 m for the 0.01 mm scale divisions and not greaterthan 60.5 m accumulated error for the complete scale.A1.2.3 Calibration is accomplished by focusing the micro-scope at the narrowest point of the open area,

42、 aligning the crosshair of the micrometer with the edges of the opening, andmeasuring across the opening to the opposite edge. By turningthe micrometer in only one direction any instrument backlashis avoided. Only openings with straight sides (no spurs orbulges projecting more than 1 m into the open

43、ing from thecenter portion of the side) are measured. The number ofopenings actually measured and the number of openings thatwould have been measured except for the presence of spurs orbulges are noted. It is recommended that these measurementsbe made in at least 20 fields chosen at random over the

44、area ofthe sieve. At least five actual measurements shall be made ineach field. Half of the openings shall be measured in onedirection and half in the other.A1.2.4 Sieves with openings less than 25 m in size shall bemeasured with the microscope fitted with the 403 objective.A1.2.5 It is necessary to

45、 attain considerable experience inthe use of the equipment and in making measurements beforethe desired accuracy is attained. Therefore, it is recommendedthat several operators measure a sieve several times in order todetect personal variations.A1.3 If suitable standard materials having spheroidal p

46、ar-ticles in a known size distribution are available, they may beused as a standard for calibrating sieves. Values from suchcalibrations are not as accurate as those obtained from micro-scopic measurements but will serve as an approximation of theconformance to specifications. Periodic tests on such

47、 materialwill serve to detect the presence of broken meshes that mightnot be observed by microscopical scanning. Calibrated glasssphere reference materials may be obtained from the U.S.Department of Commerce National Institute of Standards andTechnology (NIST). Currently, five glass sphere SRMs area

48、vailable from the NIST SRM Program5; they are: SRM 1003bwhich consists of glass spheres with diameters ranging from 10to 60 m; SRM 1004a glass spheres with diameters rangingfrom 40 to 170 m; SRM 1017b glass spheres with diametersranging from 100 to 400 m; SRM 1019a glass spheres withdiameters rangin

49、g from 760 to 2160 m. Detailed instructionsfor use are provided in the certificate which accompanies eachSRM unit.5Available from the NIST Standard Reference Materials (SRM) Program,Building 202, Room 204, Gaithersburg, MD 20899-0001; Att: SRM Sales Office.E 161 00 (2004)3A2. CLEANING AND REPAIRA2.1 Particles can be removed from metal framed precisionelectroformed sieves with the aid of an ultrasonic bath of milddetergent and distilled water or any other chemical recom-mended by sieve manufacturer. The sieve shall be placed in thevertical p