ASTM E161-2000(2010) 1875 Standard Specification for Precision Electroformed Sieves《精密电铸筛的标准规范》.pdf

1、Designation: E161 00 (Reapproved 2010)Standard Specification forPrecision Electroformed Sieves1This standard is issued under the fixed designation E161; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A n

2、umber in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This specification covers the requirements for designand construction of electroformed sieves. These sieves are usedto perform particle-

3、size distribution analysis and in preparingnarrowly designated particle-size fractions. They may also beused as reference standards when suitably calibrated.Amethodof calibrating these sieves is included in Annex A1.NOTE 1Complete instructions and procedures on the use and calibra-tion of testing si

4、eves are contained inASTM Manual 32.2This publicationalso contains a list of all published ASTM Standards on sieve analysisprocedures for specific materials or industries.1.2 The sieve analysis results from two testing sieves of thesame sieve designation may not be the same because of thevariances i

5、n sieve opening permitted by this specification. Tominimize the differences in sieve analysis results, the use oftesting sieves matched on a performance basis is suggested.NOTE 2For other types of sieves, see Specifications E11 and E323.1.3 The values stated in SI units shall be consideredstandard f

6、or the dimensions of the electroformed mesh open-ings and the size of the wires in the electroformed mesh. Thevalues stated in inch units shall be considered standard withregard to the sieve frames.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its u

7、se. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:3C430 Test Method for Fineness of Hydraulic Cement by the45-m (No. 325) Sie

8、veE11 Specification for Woven Wire Test Sieve Cloth and TestSievesE323 Specification for Perforated-Plate Sieves for TestingPurposes2.2 ISO Standard:4ISO 565 Test sievesMetal Wire Cloth, Perforated Plateand Electroformed Sheet-Nominal Aperture Sizes3. Ordering Information3.1 Orders for items under t

9、his specification include thefollowing information as necessary:3.1.1 Name of material (Electroformed Sieve),3.1.2 ASTM designation and year of issue (SpecificationE161 XX),3.1.3 Quantity of each item, and3.1.4 Standard sieve designation (Table 1, Column 1).3.1.5 For testing sieves in standard circu

10、lar frames:3.1.5.1 Nominal sieve frame diameter, and3.1.5.2 Nominal sieve frame height.3.1.6 For sieve cloth not in frames or in non-standardframes:3.1.6.1 Lateral dimension of sieve mesh, and3.1.6.2 Description of non-standard frame.3.1.7 For sieves requiring supporting grid:3.1.7.1 Support grid de

11、sired,3.1.7.2 Support grid mounted up or down, and3.1.8 Compatible sieve pans and covers.4. Sieve Sheet Requirements4.1 The material used in the manufacture of the sieve sheetshall be nickel or a metal suitable for electrodeposition in afirm crystalline structure. The sheet shall have square or roun

12、dopenings with straight uniform sides and smooth, flat surfacesexcept for a slight bevel along the edges of the openings. Thethickness of the sheet (exclusive of the supporting grid, see4.2), is governed by the method of manufacture, the size of theopenings and the width of material between openings

13、, but in nocase shall the thickness of material between the openings beless than 10 m (0.0004 in.).1This specification is under the jurisdiction ofASTM Committee E29 on Particleand Spray Characterization and is the direct responsibility of Subcommittee E29.01Sieves, Sieving Methods, and Screening Me

14、dia on Sieves, Sieving Methods, andScreening Media.Current edition approved May 1, 2010. Published July 2010. Originally approvedin 1960. Last previous edition approved in 2004 as E161 00 (2004). DOI:10.1520/E0161-00R10.2ASTM Manual 32, Manual on Test Sieving Methods, available from ASTM,100 Barr Ha

15、rbor Drive, West Conshohocken, PA 19428-2959.3For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.4Available from

16、International Organization for Standardization (ISO), 1, ch. dela Voie-Creuse, Case postale 56, CH-1211, Geneva 20, Switzerland, http:/www.iso.ch.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.4.2 If a supporting grid is required fo

17、r durability, the sievesheet shall be mounted to the supporting metal grid in such amanner that the sheet is firmly bonded to the grid. Thesupporting grid shall be of suitable thickness and strand widthto provide adequate support to the sheet. The sheet shall bemounted on the supporting grid with th

18、e openings running inthe same direction as those of the supporting grid.4.3 The finished and mounted sieve sheet from which thesieves are constructed, shall conform to the requirements foropening size and spacing as outlined in Table 1. Extraneousmetal formed in or near the corners which does not re

19、strict thepassage of a spheroidal particle shall be disregarded. The meandimension of these openings as defined in Table 1 establishesthe designated size of the sieve.NOTE 3In instances where a support grid is required for durability,opening sizes smaller than the allowable tolerances will be observ

20、ed. Thisoccurs where the support grid overlaps the sieve openings in such a wayas to either block a portion of the opening or to create several smalleropenings. This is an unavoidable situation and has been determined tohave little measurable effect on the sieving open area or sieve perfor-mance.4.3

21、.1 There shall be no punctures, missing or deformedareas, or other obvious defects in the sieve sheet.5. Test Sieve Frames5.1 General RequirementsFrames for precision electro-formed sieves shall be made from non-corrosive material suchas brass or stainless steel, and constructed in such a manner ast

22、o be rigid.5.1.1 The sieve sheet shall be mounted on the frame withoutdistortion, looseness, or waviness.5.1.2 To prevent the material being sieved from catching inthe joint between the sieve sheet and the frame, the joint shallbe filled smoothly or constructed so that the material will notbe trappe

23、d.5.2 Standard Circular FramesSieve frames shall be cir-cular, of seamless construction, with nominal diameters of 3,3.94, 7.87, 8, and 12 in. (76.2, 100, 200, 203.2, and 304.8 mm)as may be specified. The dimensions shall conform to therequirements in Table 2.5.2.1 The bottom of the frames shall be

24、constructed so as toprovide an easy sliding fit with any sieve frames of the samenominal diameter conforming to the specified dimensions.5.2.2 The joint or fillet at the connection of the sieve sheetto the frames will provide a minimum clear sieving surfacewith a diameter equal to the nominal diamet

25、er less 0.5 in. (13mm).5.3 Non-Standard FramesOther sieve frames may beeither square, rectangular, or circular.5.3.1 The frame may have the sieve sheet permanentlyinstalled or may be designed to permit replacement.NOTE 4Refer to Test Method C430, which contains requirements for3-in. (76.2-mm) diamet

26、er by 3-in. (76.2-mm) high sieves used in themineral industries, especially the cement group.5.3.2 The provisions of 5.1 apply, except that the framesmay also be made of other materials.TABLE 1 Nominal Dimensions, Permissible Variations and Limitsfor Precision Electroformed SievesNominalOpening Size

27、,mAToleranceon SieveOpenings,6mLimits,Openings perLinear cmBLimits,Openings perLinear in.Min Max Min Max500 2.0 15.35 16.14 39 41425 2.0 17.32 18.11 44 46355 2.0 19.29 20.87 49 53300 2.0 22.83 24.41 58 62250 2.0 25.20 26.77 64 68212 2.0 31.89 33.46 81 85180 2.0 35.04 36.61 89 93150 2.0 41.34 46.06 1

28、05 117125 2.0 46.06 51.18 117 130106 2.0 47.24 59.06 120 15090 2.0 55.12 78.74 140 20075 2.0 59.06 78.74 150 20063 2.0 66.93 98.43 170 25053 2.0 78.74 110.24 200 28045 2.0 90.55 118.11 230 30038 2.0 98.43 137.80 250 35032 2.0 110.24 157.48 280 40025 2.0 118.11C196.85C300C500C20 2.0 157.48C295.28C400

29、C750C15 2.0 157.48C295.28C400C750C10 2.0 196.85C393.70C500C1000C5 2.0 196.85C590.55C500C1500CAThese nominal size openings are from the preferred number series R40/3 andR10. (Openings on apertures 32 m and less are series R10.) These standarddesignations correspond to the values for test sieve apertu

30、res recommended bythe International Standards Organization, Geneva, Switzerland, in ISO 565. Otheropening sizes are not precluded.BThese limits permit at least two adjacent sieves to be formed with the samenumber of openings per cm. The percent open area must in no case be so greatthat the width of

31、metal between openings is less than 13 m.CBecause of their greater durability in routine testing, sieves made close to theminimum limit are normally supplied. Sieves made close to the maximum limit maybe obtained only on special order but are preferable from the standpoint of logicalprogression and

32、better test completion time.TABLE 2 Dimensions of Standard Circular FramesCurrent Nominal Diameter, in.Proposed Revision Mean DiameterComments Typical FrameANominal HeightBInside at TopCOutside on Skirt3 3.000 in. + 0.030/0.000 3.000 in. + 0.000/0.030 1 in. (25.4 mm)(76.20 mm + 0.76/0.00) (76.20 mm

33、+ 0.00/0.76)8 8.000 in. + 0.030/0.000 8.000 in. + 0.000/0.030 2 in. (50.8 mm) FHD(203.20 mm + 0.76/0.00) (203.20 mm + 0.00/0.76) 1 in. (25.4 mm) HHE12 12.00 in. + 0.030/0.000 12.00 in. + 0.000/0.030 2 in. (50.8 mm) FH(304.80 mm + 0.76/0.00) (304.80 mm + 0.00/0.76)AOther frame heights are not preclud

34、ed.BDistance from the top of the frame to the sieve cloth surface.CMeasured 0.2 in. (5 mm) below the top of the frame.DFH = Full height.EHH = Half height.E161 00 (2010)2NOTE 5Exercise care to prevent loss of material when using non-standard sieve frames.5.4 Pans and CoversPans and covers for use wit

35、h sievesshall be made so as to nest with the sieves. Pans with extendedrims (stacking skirts) shall be furnished when specified. Thepans and covers shall conform to the dimensions in Table 2.6. Product Marking6.1 Each sieve shall bear a label marked with the followinginformation:6.1.1 This ASTM desi

36、gnation,6.1.2 The nominal size of the openings in micrometres,6.1.3 The mean size in m, and6.1.4 The name of the manufacturer or the responsibledistributor.7. Keywords7.1 opening; particle size; sieve; sieve analysis; sieve des-ignation; sieve sheet; test sieveANNEXES(Mandatory Information)A1. METHO

37、D OF CALIBRATING PRECISION ELECTROFORMED SIEVESA1.1 The unique manner of forming the sieve sheet makesit easier and more precise to measure the openings rather thanthe nominal width of metal between adjacent openings as isfrequently done in the case of wire-cloth sieves. In some cases,electrodeposit

38、ion produces small spurs or bulges of metalwhich project several m into the open area in the plane of thesheet, thereby restricting the passage of spheroidal particleswhich would go through a normally perfect opening.A1.2 Scan the entire area with a wide-angle binocularmicroscope having a magnifying

39、 power of approximately 503to determine if the sheet conforms to the specifications given in4.3, and if the edges between the sheet and frame are sealedcompletely.A1.2.1 Most microscopes will accommodate the 76.2-mm(3-in.) sieve on the existing stage without modifications. Amicroscope fitted with a

40、203 or 403 objective and a filarmicrometer eyepiece of 10 or 12.5 power is sufficient for mostof the sieves.A1.2.2 Measurements must be sensitive to 0.5 m. Bottomillumination of preferably monochromatic light with essen-tially parallel rays is necessary. It is also a distinct advantage tohave vertic

41、al illumination through the objective. The magnifi-cation of the apparatus, and filar micrometer if used, isdetermined by means of a calibrated-stage micrometre certifiedto 60.5 m for the 0.01 mm scale divisions and not greaterthan 60.5 m accumulated error for the complete scale.A1.2.3 Calibration i

42、s accomplished by focusing the micro-scope at the narrowest point of the open area, aligning the crosshair of the micrometer with the edges of the opening, andmeasuring across the opening to the opposite edge. By turningthe micrometer in only one direction any instrument backlashis avoided. Only ope

43、nings with straight sides (no spurs orbulges projecting more than 1 m into the opening from thecenter portion of the side) are measured. The number ofopenings actually measured and the number of openings thatwould have been measured except for the presence of spurs orbulges are noted. It is recommen

44、ded that these measurementsbe made in at least 20 fields chosen at random over the area ofthe sieve. At least five actual measurements shall be made ineach field. Half of the openings shall be measured in onedirection and half in the other.A1.2.4 Sieves with openings less than 25 m in size shall bem

45、easured with the microscope fitted with the 403 objective.A1.2.5 It is necessary to attain considerable experience inthe use of the equipment and in making measurements beforethe desired accuracy is attained. Therefore, it is recommendedthat several operators measure a sieve several times in order t

46、odetect personal variations.A1.3 If suitable standard materials having spheroidal par-ticles in a known size distribution are available, they may beused as a standard for calibrating sieves. Values from suchcalibrations are not as accurate as those obtained from micro-scopic measurements but will se

47、rve as an approximation of theconformance to specifications. Periodic tests on such materialwill serve to detect the presence of broken meshes that mightnot be observed by microscopical scanning. Calibrated glasssphere reference materials may be obtained from the U.S.Department of Commerce National

48、Institute of Standards andTechnology (NIST). Currently, five glass sphere SRMs areavailable from the NIST SRM Program;5they are: SRM 1003bwhich consists of glass spheres with diameters ranging from 10to 60 m; SRM 1004a glass spheres with diameters rangingfrom 40 to 170 m; SRM 1017b glass spheres wit

49、h diametersranging from 100 to 400 m; SRM 1019a glass spheres withdiameters ranging from 760 to 2160 m. Detailed instructionsfor use are provided in the certificate which accompanies eachSRM unit.5Available from National Institute of Standards and Technology (NIST),Standard Reference Materials, 100 Bureau Drive, Stop 2300, Gaithersburg, MD20899-2300, http:/www.nist.gov.E161 00 (2010)3A2. CLEANING AND REPAIRA2.1 Particles can be removed from metal framed precisionelectroformed sieves with the aid of an ultrasonic bath of milddetergent and