1、Designation: E 1036 08Standard Test Methods forElectrical Performance of Nonconcentrator TerrestrialPhotovoltaic Modules and Arrays Using Reference Cells1This standard is issued under the fixed designation E 1036; the number immediately following the designation indicates the year oforiginal adoptio
2、n or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods cover the electrical performance ofphotovoltaic modules
3、and arrays under natural or simulatedsunlight using a calibrated reference cell.1.1.1 These test methods allow a reference module to beused instead of a reference cell provided the reference modulehas been calibrated using these test methods against a cali-brated reference cell.1.2 Measurements unde
4、r a variety of conditions are al-lowed; results are reported under a select set of reportingconditions (RC) to facilitate comparison of results.1.3 These test methods apply only to nonconcentrator ter-restrial modules and arrays.1.4 The performance parameters determined by these testmethods apply on
5、ly at the time of the test, and imply no past orfuture performance level.1.5 These test methods apply to photovoltaic modules andarrays that do not contain series-connected photovoltaic mul-tijunction devices; such module and arrays should be testedaccording to Test Methods E 2236.1.6 The values sta
6、ted in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.7 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety an
7、d health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E 691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test MethodE 772 Terminology Relating to Solar Energy ConversionE 927 Specificat
8、ion for Solar Simulation for PhotovoltaicTestingE 941 Test Method for Calibration of Reference Pyranom-eters With Axis Tilted by the Shading Method3E 948 Test Method for Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated SunlightE 973 Test Method for Determination of
9、 the Spectral Mis-match Parameter Between a Photovoltaic Device and aPhotovoltaic Reference CellE 1021 Test Method for Spectral Responsivity Measure-ments of Photovoltaic DevicesE 1039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells UnderGlobal Irradiatio
10、n3E 1040 Specification for Physical Characteristics of Non-concentrator Terrestrial Photovoltaic Reference CellsE 1125 Test Method for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Us-ing a Tabular SpectrumE 1328 Terminology Relating to Photovoltaic Solar EnergyCon
11、versionE 1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsE 2236 Test Methods for Measurement of Electrical Perfor-mance and Spectral Response of Nonconcentrator Multi-junction Photovoltaic Cells and ModulesG 173 Tables for Reference Solar Spectral Irradiance
12、s:Direct Normal and Hemispherical on 37 Tilted Surface3. Terminology3.1 DefinitionsDefinitions of terms used in these testmethods may be found in Terminology E 772 and TerminologyE 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 nominal operating cell temperature, NOCT, nthetemperature
13、 of a solar cell inside a module operating at anambient temperature of 20C, an irradiance of 800 Wm2, andan average wind speed of 1 ms1.1These test methods are under the jurisdiction of ASTM Committee E44 onSolar, Geothermal and Other Alternative Energy Sources and are the directresponsibility of Su
14、bcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved Nov. 1, 2008. Published December 2008. Originallyapproved in 1985. Last previous edition approved in 2007 as E 1036 02(2007).2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Custo
15、mer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Withdrawn. The last approved version of this historical standard is referencedon www.astm.org.1Copyright ASTM International, 100 Barr Harbor Drive, PO
16、 Box C700, West Conshohocken, PA 19428-2959, United States.3.2.2 reporting conditions, RC, nthe device temperature,total irradiance, and reference spectral irradiance conditionsthat module or array performance data are corrected to.3.3 Symbols:3.3.1 The following symbols and units are used in these
17、testmethods:artemperature coefficient of reference cell ISC,C1,acurrent temperature coefficient of device under test,C1,b(E)voltage temperature function of device under test,C1,Ccalibration constant of reference cell, Am2W1,C8adjusted calibration constant of reference cell,Am2W1,CfNOCT Correction fa
18、ctor,C,d(T)voltage irradiance correction function of device undertest, dimensionless,DTNOCT cell-ambient temperature difference, C,Eirradiance, Wm2,Eoirradiance at RC, Wm2,FFfill factor, dimensionless,Icurrent, A,Impcurrent at maximum power, A,Iocurrent at RC, A,Irshort-circuit current of reference
19、cell (or module, see1.1.1 and 4.3.4), A,Iscshort-circuit current, A,Mspectral mismatch parameter, dimensionless,Pelectrical power, W,Pmmaximum power, W,Ttemperature, C,Taambient temperature, C,Tctemperature of cell in module, C,Totemperature at RC, C,Trtemperature of reference cell, C,nwind speed, m
20、s1,Vvoltage, V,Vmpvoltage at maximum power, V,Vovoltage at RC, V, andVocopen-circuit voltage, V.4. Summary of Test Methods4.1 Measurement of the performance of a photovoltaicmodule or array illuminated by a light source consists ofdetermining at least the following electrical characteristics:short-c
21、ircuit current, open-circuit voltage, maximum power,and voltage at maximum power.4.2 These parameters are derived by applying the procedurein Section 8 to a set of current-voltage data pairs (I-V data)recorded with the test module or array operating in thepower-producing quadrant.4.3 Testing the per
22、formance of a photovoltaic device in-volves the use of a calibrated photovoltaic reference cell todetermine the total irradiance.4.3.1 The reference cell is chosen according to the spectraldistribution of the irradiance under which it was calibrated, forexample, the direct normal or global spectrum.
23、 These spectraare defined by Tables G 173 . The reference cell thereforedetermines to which spectrum the test module or array perfor-mance is referred.4.3.2 The reference cell must match the device under testsuch that the spectral mismatch parameter is 1.00 6 0.05, asdetermined in accordance with Te
24、st Method E 973.4.3.3 Recommended physical characteristics of referencecells are described in Specification E 1040.4.3.4 Areference module may be used instead of a referencecell throughout these test methods provided 4.3.2 is satisfiedand the short-circuit current of the reference module has beendet
25、ermined according to the procedures in these test methodsusing a reference cell.The reference module must also meet themodule package design requirements in Specification E 1040,with the exception of the electrical connector requirement.Ideally, electrical connections to an individual cell in theref
26、erence module should be provided to allow for spectralresponsivity measurement according to Test Method E 1021.4.4 The spectral response of the module or array is usuallytaken to be that of a representative cell from the module orarray tested in accordance with Test Method E 1021. Therepresentative
27、cell should be packaged such that the opticalproperties of the module or array packaging and the represen-tative cell package are similar.4.5 The tests are performed using either natural or simulatedsunlight. Solar simulation requirements are stated in Specifi-cation E 927.4.5.1 If a pulsed solar si
28、mulator is used as a light source, thetransient responses of the module or array and the referencecell must be compatible with the test equipment.4.6 The data from the measurements are translated to a setof reporting conditions (see 5.3) selected by the user of thesetest methods. The actual test con
29、ditions, the test data (ifavailable), and the translated data are then reported.5. Significance and Use5.1 It is the intent of these procedures to provide recognizedmethods for testing and reporting the electrical performance ofphotovoltaic modules and arrays.5.2 The test results may be used for com
30、parison of differentmodules or arrays among a group of similar items that might beencountered in testing a group of modules or arrays from asingle source. They also may be used to compare diversedesigns, such as products from different manufacturers. Re-peated measurements of the same module or arra
31、y may be usedfor the study of changes in device performance.5.3 Measurements may be made over a range of testconditions. The measurement data are numerically translatedfrom the test conditions to standard RC, to nominal operatingconditions, or to optional user-specified reporting conditions.Recommen
32、ded RC are defined in Table 1.TABLE 1 Reporting ConditionsTotal Irradiance,Wm2SpectralIrradianceDeviceTemperature,CStandard reporting conditions 1000 G 173 25Nominal operating conditions 800 . NOCTE10360825.3.1 If the test conditions are such that the device tempera-ture is within 62C of the RC temp
33、erature and the totalirradiance is within 65 % of the RC irradiance, the numericaltranslation consists of a correction to the measured devicecurrent based on the total irradiance during the I-V measure-ment.5.3.2 If the provision in 5.3.1 is not met, performance at RCis obtained from four separate I
34、-V measurements at tempera-ture and irradiance conditions that bracket the desired RC usinga bilinear interpolation method.45.3.2.1 There are a variety of methods that may be used tobracket the temperature and irradiance. One method involvescooling the module under test below the reference temperatu
35、reand making repeated measurements of the I-V characteristics asthe module warms up. The irradiance of pulsed light sourcesmay be adjusted by using neutral density mesh filters ofvarying transmittance. If the distance between the simulatorand the test plane can be varied then this adjustment can beu
36、sed to change the irradiance. In natural sunlight, the irradiancewill change with the time of day or if the solar incidence angleis adjusted.5.4 These test methods are based on two requirements.5.4.1 First, the reference cell (or module, see 1.1.1 and4.3.4) is selected so that its spectral response
37、is considered tobe close to the module or array to be tested.5.4.2 Second, the spectral response of a representative celland the spectral distribution of the irradiance source must beknown. The calibration constant of the reference cell is thencorrected to account for the difference between the actu
38、al andthe reference spectral irradiance distributions using the spectralmismatch parameter, which is defined in Test Method E 973.5.5 Terrestrial reference cells are calibrated with respect toa reference spectral irradiance distribution, for example, TablesG 173.5.6 A reference cell made and calibra
39、ted as described in 4.3will indicate the total irradiance incident on a module or arraywhose spectral response is close to that of the reference cell.5.7 With the performance data determined in accordancewith these test methods, it becomes possible to predict moduleor array performance from measurem
40、ents under any test lightsource in terms of any reference spectral irradiance distribu-tion.5.8 The reference conditions of 5.3.1 must be met if themeasured I-V curve exhibits “kinks” or multiple inflectionpoints.6. Apparatus6.1 Photovoltaic Reference CellA calibrated referencecell is used to determ
41、ine the total irradiance during theelectrical performance measurement.6.1.1 The reference cell shall be matched in its spectralresponse to a representative cell of the test module or arraysuch that the spectral mismatch parameter as determined byTest Method E 973 is 1.00 6 0.05.6.1.2 Specification E
42、 1040 provides recommended physicalcharacteristics of reference cells.6.1.3 Reference cells may be calibrated in accordance withTest Methods E 1039, E 1125, or E 1362, as appropriate for aparticular application.6.1.4 A current measurement instrument (see 6.7) shall beused to determine the Iscof the
43、reference cell when illuminatedwith the light source (see 6.4).6.2 Test Fixture The device to be tested is mounted on atest fixture that facilitates temperature measurement and four-wire current-voltage measurements (Kelvin probe, see 6.3).The design of the test fixture shall prevent any increase or
44、decrease of the device output due to reflections or shadowing.Arrays installed in the field shall be tested as installed. See7.2.3 for additional restrictions and reporting requirements.6.3 Kelvin ProbeAn arrangement of contacts that consistsof two pairs of wires attached to the two output terminals
45、 of thedevice under test. One pair of wires is used to conduct thecurrent flowing through the device, and the other pair is used tomeasure the voltage across the device. A schematic diagram ofan I-V measurement using a Kelvin Probe is given in Fig. 1 ofTest Method E 948.6.4 Light Source The light so
46、urce shall be either naturalsunlight or a solar simulator providing Class A, B, or Csimulation as specified in Specification E 927.6.5 Temperature Measurement EquipmentThe instrumentor instruments used to measure the temperature of both thereference cell and the device under test shall have a resolu
47、tionof at least 0.1C, and shall have a total error of less than 61Cof reading.6.5.1 Temperature sensors, such as thermocouples or ther-mistors, suitable for the test temperature range shall beattached in a manner that allows measurement of the devicetemperature. Because module and array temperatures
48、 can varyspatially under continuous illumination, multiple sensors dis-tributed over the device should be used, and the resultsaveraged to obtain the device temperature.6.5.2 When testing modules or arrays for which directmeasurement of the cell temperature inside the package is notfeasible, sensors
49、 can be attached to the rear side of the devices.The error due to temperature gradients will depend on thethermal characteristics of the packaging, especially undercontinuous illumination. Modules with glass back sheets willhave higher gradients than modules with thin polymer backs,for example.6.6 Variable Load An electronic load, such as a variableresistor, a programmable power supply, or a capacitive sweepcircuit, used to operate the device to be tested at differentpoints along its I-V characteristic.6.6.1 The variabl
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