1、Designation: E1036 15Standard Test Methods forElectrical Performance of Nonconcentrator TerrestrialPhotovoltaic Modules and Arrays Using Reference Cells1This standard is issued under the fixed designation E1036; the number immediately following the designation indicates the year oforiginal adoption
2、or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods cover the electrical performance ofphotovoltaic modules an
3、d arrays under natural or simulatedsunlight using a calibrated reference cell.1.1.1 These test methods allow a reference module to beused instead of a reference cell provided the reference modulehas been calibrated using these test methods against a cali-brated reference cell.1.2 Measurements under
4、a variety of conditions are al-lowed; results are reported under a select set of reportingconditions (RC) to facilitate comparison of results.1.3 These test methods apply only to nonconcentrator ter-restrial modules and arrays.1.4 The performance parameters determined by these testmethods apply only
5、 at the time of the test, and imply no past orfuture performance level.1.5 These test methods apply to photovoltaic modules andarrays that do not contain series-connected photovoltaic mul-tijunction devices; such module and arrays should be testedaccording to Test Methods E2236.1.6 The values stated
6、 in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.7 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and h
7、ealth practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test MethodE772 Terminology of Solar Energy ConversionE927 Specification for Solar S
8、imulation for PhotovoltaicTestingE941 Test Method for Calibration of Reference Pyranom-eters WithAxis Tilted by the Shading Method (Withdrawn2005)3E948 Test Method for Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated Sun-lightE973 Test Method for Determination of t
9、he Spectral Mis-match Parameter Between a Photovoltaic Device and aPhotovoltaic Reference CellE1021 Test Method for Spectral Responsivity Measurementsof Photovoltaic DevicesE1040 Specification for Physical Characteristics of Noncon-centrator Terrestrial Photovoltaic Reference CellsE1125 Test Method
10、for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Us-ing a Tabular SpectrumE1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsE2236 Test Methods for Measurement of Electrical Perfor-mance and Spectral Response of Nonconcentra
11、tor Multi-junction Photovoltaic Cells and ModulesG173 Tables for Reference Solar Spectral Irradiances: DirectNormal and Hemispherical on 37 Tilted Surface3. Terminology3.1 DefinitionsDefinitions of terms used in these testmethods may be found in Terminology E772.3.2 Definitions of Terms Specific to
12、This Standard:3.2.1 nominal operating cell temperature, NOCT, nthetemperature of a solar cell inside a module operating at anambient temperature of 20C, an irradiance of 800 Wm2, andan average wind speed of 1 ms1.3.2.2 reporting conditions, RC, nthe device temperature,total irradiance, and reference
13、 spectral irradiance conditionsthat module or array performance data are corrected to.1These test methods are under the jurisdiction of ASTM Committee E44 onSolar, Geothermal and Other Alternative Energy Sources and are the directresponsibility of Subcommittee E44.09 on Photovoltaic Electric Power C
14、onversion.Current edition approved Feb. 1, 2015. Published March 2015. Originallyapproved in 1985. Last previous edition approved in 2012 as E1036 12. DOI:10.1520/E1036-15.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For An
15、nual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3The last approved version of this historical standard is referenced onwww.astm.org.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. Unite
16、d States13.3 Symbols:3.3.1 The following symbols and units are used in these testmethods:rtemperature coefficient of reference cell ISC,C1,current temperature coefficient of device under test,C1,(E)voltage temperature function of device under test,C1,Ccalibration constant of reference cell, Am2W1,Ca
17、djusted calibration constant of reference cell,Am2W1,CfNOCT Correction factor,C,(T)voltage irradiance correction function of device undertest, dimensionless,TNOCT cell-ambient temperature difference, C,Eirradiance, Wm2,Eoirradiance at RC, Wm2,FFfill factor, dimensionless,Icurrent, A,Impcurrent at ma
18、ximum power, A,Iocurrent at RC, A,Irshort-circuit current of reference cell (or module, see1.1.1 and 4.3.4), A,Iscshort-circuit current, A,Mspectral mismatch parameter, dimensionless,Pelectrical power, W,Pmmaximum power, W,Ttemperature, C,Taambient temperature, C,Tctemperature of cell in module, C,T
19、otemperature at RC, C,Trtemperature of reference cell, C,wind speed, ms1,Vvoltage, V,Vmpvoltage at maximum power, V,Vovoltage at RC, V, andVocopen-circuit voltage, V.4. Summary of Test Methods4.1 Measurement of the performance of a photovoltaicmodule or array illuminated by a light source consists o
20、fdetermining at least the following electrical characteristics:short-circuit current, open-circuit voltage, maximum power,and voltage at maximum power.4.2 These parameters are derived by applying the procedurein Section 8 to a set of current-voltage data pairs (I-V data)recorded with the test module
21、 or array operating in thepower-producing quadrant.4.3 Testing the performance of a photovoltaic device in-volves the use of a calibrated photovoltaic reference cell todetermine the total irradiance.4.3.1 The reference cell is chosen according to the spectraldistribution of the irradiance under whic
22、h it was calibrated, forexample, the direct normal or global spectrum. These spectraare defined by Tables G173. The reference cell thereforedetermines to which spectrum the test module or array perfor-mance is referred.4.3.2 The reference cell must match the device under testsuch that the spectral m
23、ismatch parameter is 1.00 6 0.05, asdetermined in accordance with Test Method E973.4.3.3 Recommended physical characteristics of referencecells are described in Specification E1040.4.3.4 Areference module may be used instead of a referencecell throughout these test methods provided 4.3.2 is satisfie
24、dand the short-circuit current of the reference module has beendetermined according to the procedures in these test methodsusing a reference cell.The reference module must also meet themodule package design requirements in Specification E1040,with the exception of the electrical connector requiremen
25、t.Ideally, electrical connections to an individual cell in thereference module should be provided to allow for spectralresponsivity measurement according to Test Method E1021.4.4 The spectral response of the module or array is usuallytaken to be that of a representative cell from the module orarray
26、tested in accordance with Test Method E1021. Therepresentative cell should be packaged such that the opticalproperties of the module or array packaging and the represen-tative cell package are similar.4.5 The tests are performed using either natural or simulatedsunlight. Solar simulation requirement
27、s are stated in Specifi-cation E927.4.5.1 If a pulsed solar simulator is used as a light source, thetransient responses of the module or array and the referencecell must be compatible with the test equipment.4.6 The data from the measurements are translated to a setof reporting conditions (see 5.3)
28、selected by the user of thesetest methods. The actual test conditions, the test data (ifavailable), and the translated data are then reported.5. Significance and Use5.1 It is the intent of these procedures to provide recognizedmethods for testing and reporting the electrical performance ofphotovolta
29、ic modules and arrays.5.2 The test results may be used for comparison of differentmodules or arrays among a group of similar items that might beencountered in testing a group of modules or arrays from asingle source. They also may be used to compare diversedesigns, such as products from different ma
30、nufacturers. Re-peated measurements of the same module or array may be usedfor the study of changes in device performance.5.3 Measurements may be made over a range of testconditions. The measurement data are numerically translatedfrom the test conditions to standard RC, to nominal operatingcondition
31、s, or to optional user-specified reporting conditions.Recommended RC are defined in Table 1.5.3.1 If the test conditions are such that the device tempera-ture is within 62C of the RC temperature and the totalirradiance is within 65 % of the RC irradiance, the numericalTABLE 1 Reporting ConditionsTot
32、al Irradiance,Wm2SpectralIrradianceDeviceTemperature,CStandard reporting conditions 1000 G173 25Nominal operating conditions 800 . NOCTE1036 152translation consists of a correction to the measured devicecurrent based on the total irradiance during the I-V measure-ment.5.3.2 If the provision in 5.3.1
33、 is not met, performance at RCis obtained from four separate I-V measurements at tempera-ture and irradiance conditions that bracket the desired RC usinga bilinear interpolation method.45.3.2.1 There are a variety of methods that may be used tobracket the temperature and irradiance. One method invol
34、vescooling the module under test below the reference temperatureand making repeated measurements of the I-V characteristics asthe module warms up. The irradiance of pulsed light sourcesmay be adjusted by using neutral density mesh filters ofvarying transmittance. If the distance between the simulato
35、rand the test plane can be varied then this adjustment can beused to change the irradiance. In natural sunlight, the irradiancewill change with the time of day or if the solar incidence angleis adjusted.5.4 These test methods are based on two requirements.5.4.1 First, the reference cell (or module,
36、see 1.1.1 and4.3.4) is selected so that its spectral response is considered tobe close to the module or array to be tested.5.4.2 Second, the spectral response of a representative celland the spectral distribution of the irradiance source must beknown. The calibration constant of the reference cell i
37、s thencorrected to account for the difference between the actual andthe reference spectral irradiance distributions using the spectralmismatch parameter, which is defined in Test Method E973.5.5 Terrestrial reference cells are calibrated with respect toa reference spectral irradiance distribution, f
38、or example, TablesG173.5.6 A reference cell made and calibrated as described in 4.3will indicate the total irradiance incident on a module or arraywhose spectral response is close to that of the reference cell.5.7 With the performance data determined in accordancewith these test methods, it becomes
39、possible to predict moduleor array performance from measurements under any test lightsource in terms of any reference spectral irradiance distribu-tion.5.8 The reference conditions of 5.3.1 must be met if themeasured I-V curve exhibits “kinks” or multiple inflectionpoints.6. Apparatus6.1 Photovoltai
40、c Reference CellAcalibrated reference cellis used to determine the total irradiance during the electricalperformance measurement.6.1.1 The reference cell shall be matched in its spectralresponse to a representative cell of the test module or arraysuch that the spectral mismatch parameter as determin
41、ed byTest Method E973 is 1.00 6 0.05.6.1.2 Specification E1040 provides recommended physicalcharacteristics of reference cells.6.1.3 Reference cells may be calibrated in accordance withTest Methods E1125 or E1362, as appropriate for a particularapplication.6.1.4 A current measurement instrument (see
42、 6.7) shall beused to determine the Iscof the reference cell when illuminatedwith the light source (see 6.4).6.2 Test Fixture The device to be tested is mounted on atest fixture that facilitates temperature measurement and four-wire current-voltage measurements (Kelvin probe, see 6.3).The design of
43、the test fixture shall prevent any increase ordecrease of the device output due to reflections or shadowing.Arrays installed in the field shall be tested as installed. See7.2.3 for additional restrictions and reporting requirements.6.3 Kelvin ProbeAn arrangement of contacts that consistsof two pairs
44、 of wires attached to the two output terminals of thedevice under test. One pair of wires is used to conduct thecurrent flowing through the device, and the other pair is used tomeasure the voltage across the device. A schematic diagram ofan I-V measurement using a Kelvin Probe is given in Fig. 1 ofT
45、est Method E948.6.4 Light Source The light source shall be either naturalsunlight or a solar simulator providing Class A, B, or Csimulation as specified in Specification E927.6.5 Temperature Measurement EquipmentThe instrumentor instruments used to measure the temperature of both thereference cell a
46、nd the device under test shall have a resolutionof at least 0.1C, and shall have a total error of less than 61Cof reading.6.5.1 Temperature sensors, such as thermocouples orthermistors, suitable for the test temperature range shall beattached in a manner that allows measurement of the devicetemperat
47、ure. Because module and array temperatures can varyspatially under continuous illumination, multiple sensors dis-tributed over the device should be used, and the resultsaveraged to obtain the device temperature.6.5.2 When testing modules or arrays for which directmeasurement of the cell temperature
48、inside the package is notfeasible, sensors can be attached to the rear side of the devices.The error due to temperature gradients will depend on thethermal characteristics of the packaging, especially undercontinuous illumination. Modules with glass back sheets willhave higher gradients than modules
49、 with thin polymer backs,for example.6.6 Variable Load An electronic load, such as a variableresistor, a programmable power supply, or a capacitive sweepcircuit, used to operate the device to be tested at differentpoints along its I-V characteristic.6.6.1 The variable load should be capable of operating thedevice to be tested at an I-V point where the voltage is within1%ofVocin the power-producing quadrant.6.6.2 The variable load should be capable of operating thedevice to be tested at an I-V point where the cur
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