ASTM E1143-2005 Standard Test Method for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test Parameter《根据试验参数测定光电器件参数线性度的标准试验方法》.pdf

1、Designation: E 1143 05Standard Test Method forDetermining the Linearity of a Photovoltaic DeviceParameter with Respect To a Test Parameter1This standard is issued under the fixed designation E 1143; the number immediately following the designation indicates the year oforiginal adoption or, in the ca

2、se of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method determines the degree of linearity of aphotovoltaic device parameter wit

3、h respect to a test parameter,for example, short-circuit current with respect to irradiance.1.2 The linearity determined by this test method appliesonly at the time of testing, and implies no past or futureperformance level.1.3 This test method applies only to non-concentrator ter-restrial photovolt

4、aic devices.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2.

5、Referenced Documents2.1 ASTM Standards:2E 772 Terminology Relating to Solar Energy ConversionE 948 Test Methods for Electrical Performance of Non-Concentrator Terrestrial Photovoltaic Cells Using Refer-ence CellsE 1036 Test Methods for Testing Electrical Performance ofNonconcentrator Terrestrial Pho

6、tovoltaic Modules and Ar-rays Using Reference CellsE 1328 Terminology Relating to Photovoltaic Solar EnergyConversion3. Terminology3.1 DefinitionsFor definitions of terms used in this testmethod, see Terminologies E 772 and E 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 photovoltaic

7、 device parametera characteristic of aphotovoltaic device, such as short-circuit current or open-circuit voltage.3.2.2 test parametera characteristic of the test conditionsto which the photovoltaic device is exposed, such as irradianceor temperature.3.3 Symbols:Meaning SymbolTest parameter XDevice p

8、arameter YNumber of data pairs taken nSlope of the linear function mFit to the dataEstimated variance of the slope s24. Summary of Test Method4.1 This test method requires the measurement of theparameters in question at or near the anticipated deviceoperating conditions. The number of measurements m

9、ade mustbe sufficient to cover the range of operating conditions ex-pected.4.2 Device electrical parameters shall be measured in ac-cordance with Test Methods E 948 or Methods E 1036, which-ever is applicable.4.3 A linear function that passes through the origin is fit tothe data, and the deviation o

10、f these data from the function isused as the criterion for determining linearity.5. Significance and Use5.1 This test method is used to evaluate the applicability ofother ASTM test methods to a photovoltaic device.5.2 The procedure described in this test method is intendedto be used to determine the

11、 degree of linearity between theshort-circuit current of a photovoltaic device and the irradiancelevel incident on the device. This test method can be used forother device parameters, provided the function passes throughthe origin.6. Procedure6.1 Measure the device parameter for at least five values

12、 ofthe test parameter. Choose the values of the test parameter suchthat they span the expected operating range in approximatelyequal intervals. For determining the linearity of short-circuitcurrent with respect to irradiance, use four equally spacedirradiance intervals over the range of approximatel

13、y 750 to1100 W/m2.1This test method is under the jurisdiction of ASTM Committee E44 on Solar,Geothermal, and OtherAlternative Energy Sources and is the direct responsibility ofSubcommittee E 44.09 on Photovoltaic Electric Power Conversion.Current edition approved April 1, 2005. Published May 2005. O

14、riginallyapproved in 1987. Last previous edition approved in 1999 as E 1143-99.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page o

15、nthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.6.1.1 All applicable electrical measurements must be per-formed in accordance with Test Methods E 948 or MethodsE 1036, whichever is applicable.7. Calculation37.1 The

16、slope, m, of the linear function is calculated usingthe following equation:m 5(i 5 1nXiYi/(i 5 1nXi2(1)7.2 The estimated variance of the slope is given as follows:s25(i 5 1nYi2 mXi!2/n 2 1!(i 5 1nXi2(2)7.3 Device electrical parameters may be considered linearwith respect to the test parameter if the

17、 criterion is met asfollows:s/m #| 0.027.3.1 For other device parameters, other criteria may need tobe defined.8. Precision and Bias8.1 The precision and bias of this test method is limited bythe precision and bias of the parameter measurements. Esti-mates of the precision and bias of these electric

18、al measure-ments are given in Test Methods E 948 and Methods E 1036.8.2 The limit on s/m of 2 % will limit any electric currentmeasurement error due to a nonlinear current versus irradiancerelationship to 2 %.9. Keywords9.1 linearity; photovoltaic device; photovoltaics; testingASTM International tak

19、es no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own re

20、sponsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addres

21、sed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at th

22、e address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org).3Natrella, Mary, “Characterizing Linear Relationships Between Two Variables,”NBS Handbook, Vol 91, 1966.E1143052