1、Designation: E 1316 08aStandard Terminology forNondestructive Examinations1This standard is issued under the fixed designation E 1316; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parenthes
2、es indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.INDEX OF TERMSSectionA: Common NDT TermsB: Acoustic Emission (AE) TermsC: Electromagnetic Testing (ET) TermsD: Gamma- and X-Radiologic Testing (RT) TermsE: Leak Testi
3、ng (LT) TermsF: Liquid Penetrant Testing (PT) TermsG: Magnetic Particle Testing (MT) TermsH: Neutron Radiologic Testing (NRT) TermsI: Ultrasonic Testing (UT) TermsJ: Infrared Testing (IRT) TermsK: Holographic Testing (HT) TermsL: Visual Testing (VT) Terms1. Scope1.1 This standard defines the termino
4、logy used in thestandards prepared by the E07 Committee on NondestructiveTesting. These nondestructive testing (NDT) methods include:acoustic emission, electromagnetic testing, gamma- andX-radiology, leak testing, liquid penetrant testing, magneticparticle testing, neutron radiology and gauging, ult
5、rasonictesting, and other technical methods.1.2 Committee E07 recognizes that the terms examination,testing and inspection are commonly used as synonyms innondestructive testing. For uniformity and consistency in E07nondestructive testing standards, Committee E07 encouragesthe use of the term examin
6、ation and its derivatives whendescribing the application of nondestructive test methods.There are, however, appropriate exceptions when the term testand its derivatives may be used to describe the application ofa nondestructive test, such as measurements which produce anumeric result (for example, w
7、hen using the leak testingmethod to perform a leak test on a component, or an ultrasonicmeasurement of velocity).Additionally, the term test should beused when referring to the NDT method, that is, RadiologicTesting (RT), Ultrasonic Testing (UT), and so forth. (Example:Radiologic Testing (RT) is oft
8、en used to examine material todetect internal discontinuities.)1.3 Section A defines terms that are common to multipleNDT methods, whereas, the subsequent sections define termspertaining to specific NDT methods.1.4 As shown on the chart below, when nondestructivetesting produces an indication, the i
9、ndication is subject tointerpretation as false, nonrelevant or relevant. If it has beeninterpreted as relevant, the necessary subsequent evaluationwill result in the decision to accept or reject the material. Withthe exception of accept and reject, which retain the meaningfound in most dictionaries,
10、 all the words used in the chart aredefined in Section A.1This terminology is under the jurisdiction of Committee E07 on NondestructiveTesting and is the direct responsibility of Subcommittee E07.92 on EditorialReview.Current edition approved July 1, 2008. Published July 2008. Originally approvedin
11、1989. Last previous edition approved in 2008 as E 1316 08.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.2. Referenced Documents2.1 ASTM Standards:2NOTE 1This standard defines the terminology used in the standardsprepared by Committ
12、tee E07 on Nondestructive Testing and published inthe Annual Book of ASTM Standards, Volume 03.03.3. Significance and Use3.1 The terms found in this standard are intended to be useduniformly and consistently in all nondestructive testing stan-dards. The purpose of this standard is to promote a clear
13、understanding and interpretation of the NDT standards inwhich they are used.4. TerminologySection A: Common NDT TermsThe terms defined in Section A are the direct responsibility of Subcommittee E07.92, Editorial Review.acceptable quality levelthe maximum percent defective orthe maximum number of uni
14、ts defective per hundred unitsthat, for the purpose of sampling test, can be consideredsatisfactory as a process average.calibration, instrument, nthe comparison of an instrumentwith, or the adjustment of an instrument to, a knownreference(s) often traceable to the National Institute ofStandards and
15、 Technology (NIST). (See also standardiza-tion, instrument.)cognizant engineering organizationthe company, govern-ment agency or other authority responsible for the design, orend use, of the material or component for which nondestruc-tive testing is requiredDISCUSSIONIn addition to design personnel,
16、 the cognizant engineer-ing organization could include personnel from engineering, materialand process engineering, stress analysis, nondestructive testing, qualityassurance and others, as appropriate.defect, none or more flaws whose aggregate size, shape,orientation, location, or properties do not
17、meet specifiedacceptance criteria and are rejectable.discontinuity, na lack of continuity or cohesion; an inten-tional or unintentional interruption in the physical structureor configuration of a material or component.evaluationdetermination of whether a relevant indication iscause to accept or to r
18、eject a material or component.examination, na procedure for determining a property (orproperties) or other conditions or characteristics of a materialor component by direct or indirect means.NOTE 2Examples include utilization of X-rays or ultrasonic wavesfor the purpose of determining (directly or b
19、y calculation) flaw content,density, or (for ultrasound) modulus; or detection of flaws by induction ofeddy currents, observing thermal behavior, AE response, or utilization ofmagnetic particles or liquid penetrants.false indication, nan NDTindication that is interpreted to becaused by a condition o
20、ther than a discontinuity or imper-fection.flaw, nan imperfection or discontinuity that may be detect-able by nondestructive testing and is not necessarily reject-able.flaw characterization, nthe process of quantifying the size,shape, orientation, location, growth, or other properties, of aflaw base
21、d on NDT response.imperfection, na departure of a quality characteristic fromits intended condition.indicationthe response or evidence from a nondestructiveexamination.DISCUSSIONAn indication is determined by interpretation to berelevant, non-relevant, or false.inspection, nsee preferred term examin
22、ation.interpretationthe determination of whether indications arerelevant or nonrelevant.interpretation, nthe determination of whether indicationsare relevant, nonrelevant, or false.Nondestructive Evaluationsee Nondestructive Testing.Nondestructive Examinationsee Nondestructive Testing.Nondestructive
23、 Inspectionsee Nondestructive Testing.Nondestructive Testing (NDT), nthe development andapplication of technical methods to examine materials orcomponents in ways that do not impair future usefulness andserviceability in order to detect, locate, measure and evaluateflaws; to assess integrity, proper
24、ties and composition; and tomeasure geometrical characteristics.nonrelevant indication, nan NDT indication that is causedby a condition or type of discontinuity that is not rejectable.False indications are non-relevant.reference standard, na material or object for which allrelevant chemical and phys
25、ical characteristics are known andmeasurable, used as a comparison for, or standardization of,equipment or instruments used for nondestructive testing.(See also standardization, instrument.)relevant indication, nan NDT indication that is caused by acondition or type of discontinuity that requires ev
26、aluation.standard(1) a physical reference used as a basis for com-parison or calibration; (2) a concept that has been establishedby authority, custom, or agreement to serve as a model orrule in the measurement of quality or the establishment of apractice or procedure.standardization, instrument, nth
27、e adjustment of an NDTinstrument using an appropriate reference standard, to obtainor establish a known and reproducible response. (This isusually done prior to an examination, but can be carried outanytime there is concern about the examination or instru-ment response. (See also calibration, instru
28、ment.)test, nsee preferred term examination.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.E 1316 08a2Sectio
29、n B: Acoustic EmissionThe terms defined in Section B are the direct responsibility of Subcommittee E07.04 on Acoustic Emission Method.acoustic emission (AE)the class of phenomena wherebytransient elastic waves are generated by the rapid release ofenergy from localized sources within a material, or t
30、hetransient waves so generated. Acoustic emission is therecommended term for general use. Other terms that havebeen used in AE literature include (1) stress wave emission,(2) microseismic activity, and (3) emission or acousticemission with other qualifying modifiers.acoustic emission channelsee chan
31、nel, acoustic emission.acoustic emission count (emission count) (N)see count,acoustic emission.acoustic emission count ratesee count rate, acoustic emis-sion (emission rate or count rate) (N).acoustic emission eventsee event, acoustic emission.acoustic emission event energysee energy, acoustic event
32、.acoustic emission sensorsee sensor, acoustic emission.acoustic emission signal amplitudesee signal amplitude,acoustic emission.acoustic emission signal (emission signal)see signal, acous-tic emission.acoustic emission signature (signature)see signature,acoustic emission.acoustic emission transducer
33、see sensor, acoustic emission.acoustic emission waveguidesee waveguide, acoustic emis-sion.acousto-ultrasonics (AU)a nondestructive examinationmethod that uses induced stress waves to detect and assessdiffuse defect states, damage conditions, and variations ofmechanical properties of a test structur
34、e. The AU methodcombines aspects of acoustic emission (AE) signal analysiswith ultrasonic materials characterization techniques.adaptive locationsource location by iterative use of simu-lated sources in combination with computed location.AE activity, nthe presence of acoustic emission during atest.A
35、E amplitudesee dBAE.AE rms, nthe rectified, time averaged AE signal, measuredon a linear scale and reported in volts.AE signal durationthe time betweenAE signal start andAEsignal end.AE signal endthe recognized termination of an AE signal,usually defined as the last crossing of the threshold by that
36、signal.AE signal generatora device which can repeatedly induce aspecified transient signal into an AE instrument.AE signal rise timethe time betweenAE signal start and thepeak amplitude of that AE signal.AE signal startthe beginning of an AE signal as recognizedby the system processor, usually defin
37、ed by an amplitudeexcursion exceeding threshold.array, na group of two or more AE sensors positioned on astructure for the purposes of detecting and locating sources.The sources would normally be within the array.arrival time interval (Dtij)see interval, arrival time.attenuation, nthe decrease in AE
38、 amplitude per unit dis-tance, normally expressed in dB per unit length.average signal level, nthe rectified, time averaged AElogarithmic signal, measured on the AE amplitude logarith-mic scale and reported in dBaeunits (where 0 dBaerefers to1 V at the preamplifier input).burst emissionsee emission,
39、 burst.channel, acoustic emissionan assembly of a sensor, pream-plifier or impedance matching transformer, filters secondaryamplifier or other instrumentation as needed, connectingcables, and detector or processor.NOTE 3A channel for examining fiberglass reinforced plastic (FRP)may utilize more than
40、 one sensor with associated electronics. Channelsmay be processed independently or in predetermined groups havingsimilar sensitivity and frequency characteristics.continuous emissionsee emission, continuous.count, acoustic emission (emission count) (N)the numberof times the acoustic emission signal
41、exceeds a presetthreshold during any selected portion of a test.count, event (Ne)the number obtained by counting eachdiscerned acoustic emission event once.count rate, acoustic emission (emission rate or count rate)(N)the time rate at which emission counts occur.count, ring-downsee count, acoustic e
42、mission, the preferredterm.couplanta material used at the structure-to-sensor interfaceto improve the transmission of acoustic energy across theinterface during acoustic emission monitoring.cumulative (acoustic emission) amplitude distribution F(V)see distribution, amplitude, cumulative.cumulative (
43、acoustic emission) threshold crossing distributionFt(V)see distribution, threshold crossing, cumulative.dBAEa logarithmic measure of acoustic emission signalamplitude, referenced to 1 V at the sensor, before amplifi-cation.Signal peak amplitude dBAE! 5 dB1V at sensor! 5 20 log10A1/A0!(1)where:A0= 1
44、V at the sensor (before amplification), andA1= peak voltage of the measured acoustic emission signal(also before amplification).Acoustic Emission Reference Scale:dBAEValue Voltage at Sensor0120 10 VE 1316 08a340 100 V60 1 mV80 10 mV100 100 mVDISCUSSIONIn the case of sensors with integral preamplifie
45、rs, theAOreference is before internal amplification.dead timeany interval during data acquisition when theinstrument or system is unable to accept new data for anyreason.differential (acoustic emission) amplitude distribution F(V)see distribution, differential (acoustic emission) ampli-tude f(V).dif
46、ferential (acoustic emission) threshold crossing distributionft(V)see distribution, differential (acoustic emission)threshold crossing.distribution, amplitude, cumulative (acoustic emission)F(V)the number of acoustic emission events with signalsthat exceed an arbitrary amplitude as a function of amp
47、litudeV.distribution, threshold crossing, cumulative (acoustic emis-sion) Ft(V)the number of times the acoustic emissionsignal exceeds an arbitrary threshold as a function of thethreshold voltage (V).distribution, differential (acoustic emission) amplitudef(V)the number of acoustic emission events w
48、ith signalamplitudes between amplitudes of V and V + DV as afunction of the amplitude V. f(V) is the absolute value of thederivative of the cumulative amplitude distribution F(V).distribution, differential (acoustic emission) thresholdcrossing ft(V)the number of times the acoustic emissionsignal wav
49、eform has a peak between thresholds V and V + DV as a function of the threshold V. ft(V) is the absolute valueof the derivative of the cumulative threshold crossingdistribution Ft(V).distribution, logarithmic (acoustic emission) amplitudeg(V)the number of acoustic emission events with signalamplitudes between V and aV (where a is a constantmultiplier) as a function of the amplitude. This is a variant ofthe differential amplitude distribution, appropriate for loga-rithmically windowed data.dynam
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