ASTM E1316-2012 5053 Standard Terminology for Nondestructive Examinations《无损检测的标准术语》.pdf

1、Designation: E1316 12Standard Terminology forNondestructive Examinations1This standard is issued under the fixed designation E1316; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses

2、indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.INDEX OF TERMSSectionA: Common NDT TermsB: Acoustic Emission (AE) TermsC: Electromagnetic Testing (ET) TermsD: Gamma- and X-Radiologic Testing (RT) TermsE: Leak Testing

3、(LT) TermsF: Liquid Penetrant Testing (PT) TermsG: Magnetic Particle Testing (MT) TermsH: Neutron Radiologic Testing (NRT) TermsI: Ultrasonic Testing (UT) TermsJ: Infrared Testing (IRT) TermsK: Holographic Testing (HT) TermsL: Visual Testing (VT) Terms1. Scope1.1 This standard defines the terminolog

4、y used in thestandards prepared by the E07 Committee on NondestructiveTesting. These nondestructive testing (NDT) methods include:acoustic emission, electromagnetic testing, gamma- andX-radiology, leak testing, liquid penetrant testing, magneticparticle testing, neutron radiology and gauging, ultras

5、onictesting, and other technical methods.1.2 Committee E07 recognizes that the terms examination,testing and inspection are commonly used as synonyms innondestructive testing. For uniformity and consistency in E07nondestructive testing standards, Committee E07 encouragesthe use of the term examinati

6、on and its derivatives whendescribing the application of nondestructive test methods.There are, however, appropriate exceptions when the term testand its derivatives may be used to describe the application ofa nondestructive test, such as measurements which produce anumeric result (for example, when

7、 using the leak testingmethod to perform a leak test on a component, or an ultrasonicmeasurement of velocity).Additionally, the term test should beused when referring to the NDT method, that is, RadiologicTesting (RT), Ultrasonic Testing (UT), and so forth. (Example:Radiologic Testing (RT) is often

8、used to examine material todetect internal discontinuities.)1.3 Section A defines terms that are common to multipleNDT methods, whereas, the subsequent sections define termspertaining to specific NDT methods.1.4 As shown on the chart below, when nondestructivetesting produces an indication, the indi

9、cation is subject tointerpretation as false, nonrelevant or relevant. If it has beeninterpreted as relevant, the necessary subsequent evaluationwill result in the decision to accept or reject the material. Withthe exception of accept and reject, which retain the meaningfound in most dictionaries, al

10、l the words used in the chart aredefined in Section A.1This terminology is under the jurisdiction of Committee E07 on NondestructiveTesting and is the direct responsibility of Subcommittee E07.92 on EditorialReview.Current edition approved Dec. 1, 2012. Published December 2012. Originallyapproved in

11、 1989. Last previous edition approved in 2011 as E1316 11b. DOI:10.1520/E1316-12.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States12. Referenced Documents2.1 ASTM Standards:2NOTE 1This standard defines the terminology used in the standa

12、rdsprepared by Committtee E07 on Nondestructive Testing and published inthe Annual Book of ASTM Standards, Volume 03.03.3. Significance and Use3.1 The terms found in this standard are intended to be useduniformly and consistently in all nondestructive testing stan-dards. The purpose of this standard

13、 is to promote a clearunderstanding and interpretation of the NDT standards inwhich they are used.4. TerminologySection A: Common NDT TermsThe terms defined in Section A are the direct responsibility of Subcommittee E07.92, Editorial Review.acceptable quality levelthe maximum percent defective orthe

14、 maximum number of units defective per hundred unitsthat, for the purpose of sampling test, can be consideredsatisfactory as a process average.calibration, instrument, nthe comparison of an instrumentwith, or the adjustment of an instrument to, a knownreference(s) often traceable to the National Ins

15、titute ofStandards and Technology (NIST). (See alsostandardization, instrument.)cognizant engineering organizationthe company, govern-ment agency or other authority responsible for the design, orend use, of the material or component for which nondestruc-tive testing is requiredDISCUSSIONIn addition

16、to design personnel, the cognizant engineer-ing organization could include personnel from engineering, materialand process engineering, stress analysis, nondestructive testing, qualityassurance and others, as appropriate.defect, none or more flaws whose aggregate size, shape,orientation, location, o

17、r properties do not meet specifiedacceptance criteria and are rejectable.discontinuity, na lack of continuity or cohesion; an inten-tional or unintentional interruption in the physical structureor configuration of a material or component.evaluationdetermination of whether a relevant indication iscau

18、se to accept or to reject a material or component.examination, na procedure for determining a property (orproperties) or other conditions or characteristics of a materialor component by direct or indirect means.NOTE 2Examples include utilization of X-rays or ultrasonic waves forthe purpose of determ

19、ining (directly or by calculation) flaw content,density, or (for ultrasound) modulus; or detection of flaws by induction ofeddy currents, observing thermal behavior, AE response, or utilization ofmagnetic particles or liquid penetrants.false indication, nan NDT indication that is interpreted to beca

20、used by a condition other than a discontinuity or imper-fection.flaw, nan imperfection or discontinuity that may be detect-able by nondestructive testing and is not necessarily reject-able.flaw characterization, nthe process of quantifying the size,shape, orientation, location, growth, or other prop

21、erties, of aflaw based on NDT response.imperfection, na departure of a quality characteristic fromits intended condition.indicationthe response or evidence from a nondestructiveexamination.DISCUSSIONAn indication is determined by interpretation to berelevant, non-relevant, or false.inspection, nsee

22、preferred term examination.interpretationthe determination of whether indications arerelevant or nonrelevant.interpretation, nthe determination of whether indicationsare relevant, nonrelevant, or false.Nondestructive Evaluationsee Nondestructive Testing.Nondestructive Examinationsee Nondestructive T

23、esting.Nondestructive Inspectionsee Nondestructive Testing.Nondestructive Testing (NDT), nthe development and ap-plication of technical methods to examine materials orcomponents in ways that do not impair future usefulness andserviceability in order to detect, locate, measure and evaluateflaws; to a

24、ssess integrity, properties and composition; and tomeasure geometrical characteristics.nonrelevant indication, nan NDT indication that is causedby a condition or type of discontinuity that is not rejectable.False indications are non-relevant.reference standard, na material or object for which allrel

25、evant chemical and physical characteristics are known andmeasurable, used as a comparison for, or standardization of,equipment or instruments used for nondestructive testing.(See also standardization, instrument.)relevant indication, nan NDT indication that is caused by acondition or type of discont

26、inuity that requires evaluation.standard(1) a physical reference used as a basis for com-parison or calibration; (2) a concept that has been establishedby authority, custom, or agreement to serve as a model orrule in the measurement of quality or the establishment of apractice or procedure.2For refe

27、renced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.E1316 122standardization, instrument, nthe adjustment of an NDTinstrum

28、ent using an appropriate reference standard, to obtainor establish a known and reproducible response. (This isusually done prior to an examination, but can be carried outanytime there is concern about the examination or instru-ment response. (See also calibration, instrument.)test, nsee preferred te

29、rm examination.Section B: Acoustic EmissionThe terms defined in Section B are the direct responsibility of Subcommittee E07.04 on Acoustic Emission Method.acoustic emission (AE)the class of phenomena wherebytransient stress/displacement waves are generated by therapid release of energy from localize

30、d sources within amaterial, or the transient waves so generated.NOTE 3Acoustic emission is the recommended term for general use.Other terms that have been used in AE literature include: (1) stress waveemission, (2) microseismic activity, and (3) emission or acoustic emissionwith other qualifying mod

31、ifiers.acoustic emission channelsee channel, acoustic emission.acoustic emission count (emission count) (N)see count,acoustic emission.acoustic emission count ratesee count rate, acoustic emis-sion (emission rate or count rate) (N).acoustic emission eventsee event, acoustic emission.acoustic emissio

32、n event energysee energy, acoustic event.acoustic emission mechanism or acoustic emission sourcemechanisma dynamic process or combination of pro-cesses occurring within a material, generating acousticemission events. AE source mechanisms can be subdividedinto several categories: material and mechani

33、cal, macro-scopic and microscopic, primary and secondary.DISCUSSIONExamples of macroscopic material AE source mecha-nisms in metals are incremental crack advancements, plastic deforma-tion development and fracture of inclusions. Friction and impacts areexamples of mechanical AE. A crack advancement

34、can be considered aprimary AE mechanism while a resulting crack surface friction can beconsidered as a secondary AE mechanism.acoustic emission sensorsee sensor, acoustic emission.acoustic emission signal amplitudesee signal amplitude,acoustic emission.acoustic emission signal (emission signal)see s

35、ignal, acous-tic emission.acoustic emission signature (signature)see signature,acoustic emission.acoustic emission transducersee sensor, acoustic emission.acoustic emission waveguidesee waveguide, acoustic emis-sion.acousto-ultrasonics (AU)a nondestructive examinationmethod that uses induced stress

36、waves to detect and assessdiffuse defect states, damage conditions, and variations ofmechanical properties of a test structure. The AU methodcombines aspects of acoustic emission (AE) signal analysiswith ultrasonic materials characterization techniques.adaptive locationsource location by iterative u

37、se of simu-lated sources in combination with computed location.AE activity, nthe presence of acoustic emission during a test.AE amplitudesee dBAE.AE rms, nthe rectified, time averaged AE signal, measuredon a linear scale and reported in volts.AE signal durationthe time betweenAE signal start andAEsi

38、gnal end.AE signal endthe recognized termination of an AE signal,usually defined as the last crossing of the threshold by thatsignal.AE signal generatora device which can repeatedly induce aspecified transient signal into an AE instrument.AE signal rise timethe time betweenAE signal start and thepea

39、k amplitude of that AE signal.AE signal startthe beginning of an AE signal as recognizedby the system processor, usually defined by an amplitudeexcursion exceeding threshold.array, na group of two or more AE sensors positioned on astructure for the purposes of detecting and locating sources.The sour

40、ces would normally be within the array.arrival time interval (tij)see interval, arrival time.attenuation, nthe gradual loss of acoustic emission waveenergy as a function of distance through absorption,scattering, diffraction and geometric spreading.DISCUSSIONAttenuation can be measured as the decrea

41、se in AEamplitude or other AE signal parameter per unit distance.average signal level, nthe rectified, time averaged AElogarithmic signal, measured on the AE amplitude logarith-mic scale and reported in dBaeunits (where 0 dBaerefers to1 V at the preamplifier input).burst emissionsee emission, burst.

42、channel, acoustic emissionan assembly of a sensor, pream-plifier or impedance matching transformer, filters secondaryamplifier or other instrumentation as needed, connectingcables, and detector or processor.NOTE 4A channel for examining fiberglass reinforced plastic (FRP)may utilize more than one se

43、nsor with associated electronics. Channelsmay be processed independently or in predetermined groups havingsimilar sensitivity and frequency characteristics.continuous emissionsee emission, continuous.count, acoustic emission (emission count) (N)the numberof times the acoustic emission signal exceeds

44、 a presetthreshold during any selected portion of a test.E1316 123count, event (Ne)the number obtained by counting eachdiscerned acoustic emission event once.count rate, acoustic emission (emission rate or count rate)(N)the time rate at which emission counts occur.count, ring-downsee count, acoustic

45、 emission, the preferredterm.couplanta material used at the structure-to-sensor interfaceto improve the transmission of acoustic energy across theinterface during acoustic emission monitoring.cumulative (acoustic emission) amplitude distribution F(V)see distribution, amplitude, cumulative.cumulative

46、 (acoustic emission) threshold crossing distributionFt(V)see distribution, threshold crossing, cumulative.dBAEa logarithmic measure of acoustic emission signalamplitude, referenced to 1 V at the sensor, before amplifi-cation.Signal peak amplitude dBAE! 5 dB1V at sensor!5 20 log10A1/A0!(1)where:A0= 1

47、 V at the sensor (before amplification), andA1= peak voltage of the measured acoustic emission signal(also before amplification).Acoustic Emission Reference Scale:dBAEValue Voltage at Sensor0120 10 V40 100 V60 1 mV80 10 mV100 100 mVDISCUSSIONIn the case of sensors with integral preamplifiers, theAOr

48、eference is before internal amplification.dead timeany interval during data acquisition when theinstrument or system is unable to accept new data for anyreason.differential (acoustic emission) amplitude distribution F(V)see distribution, differential (acoustic emission) ampli-tude f(V).differential

49、(acoustic emission) threshold crossing distributionft(V)see distribution, differential (acoustic emission)threshold crossing.distribution, amplitude, cumulative (acoustic emission)F(V)the number of acoustic emission events with signalsthat exceed an arbitrary amplitude as a function of amplitudeV.distribution, threshold crossing, cumulative (acoustic emis-sion) Ft(V)the number of times the acoustic emissionsignal exceeds an arbitrary threshold as a function of thethreshold voltage (V).distrib