ImageVerifierCode 换一换
格式:PDF , 页数:2 ,大小:58.62KB ,
资源ID:529713      下载积分:5000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-529713.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(ASTM E1880-2012 Standard Practice for Tissue Cryosection Analysis with SIMS《用次级离子质谱法 (SIMS) 进行组织低温截面分析的标准实施规程》.pdf)为本站会员(孙刚)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ASTM E1880-2012 Standard Practice for Tissue Cryosection Analysis with SIMS《用次级离子质谱法 (SIMS) 进行组织低温截面分析的标准实施规程》.pdf

1、Designation: E1880 12Standard Practice forTissue Cryosection Analysis with SIMS1This standard is issued under the fixed designation E1880; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in paren

2、theses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice provides the Secondary Ion Mass Spec-trometry (SIMS) analyst with a method for analyzing tissuecryosections in the imaging mode of the i

3、nstrument. Thispractice is suitable for frozen-freeze-dried and frozen-hydratedcryosection analysis.1.2 This practice does not describe methods for optimalfreezing of the specimen for immobilizing diffusible chemicalspecies in their native intracellular sites.1.3 This practice does not describe meth

4、ods for obtainingcryosections from a frozen specimen.1.4 This practice is not suitable for any plastic embeddedtissues.1.5 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-pri

5、ate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E673 Terminology Relating to Surface Analysis (Withdrawn2012)33. Terminology3.1 Definitions:3.1.1 See Terminology E673 for definitions of terms used inSI

6、MS.4. Summary of Practice4.1 This practice describes a method for the analysis oftissue cryosections with SIMS. Tissue cryosections for SIMSanalysis need to be mounted flat on an electrically conductingsubstrate. Cryosections should remain flat and adhere well tothe substrate for SIMS analysis. This

7、 is achieved by pressingfrozen cryosections into an indium substrate. Indium, being amalleable metal (Moh hardness = 1.2, Youngs modulus = 10.6GPa), provides a “cushion” for pressing and holding the frozencryosections flat for SIMS analysis. Indium substrates areprepared by pressing sheet indium ont

8、o a polished siliconwafer.An approximately 1 m thick layer of indium (99.999 %purity) is then vapor deposited on this surface. This top layerprovides “fluffy” indium that helps in holding cryosections flatfor SIMS analysis.5. Significance and Use5.1 Pressing cryosections flat onto a conducting subst

9、ratehas been one of the most challenging problems in SIMSanalysis of cryogenically prepared tissue specimens. Frozencryosections often curl or peel off, or both, from the substrateduring freeze-drying. The curling of cryosections results in anuneven sample surface for SIMS analysis. Furthermore, iff

10、reeze-dried cryosections are not attached tightly to thesubstrate, the impact of the primary ion beam may result infurther curling and even dislodging of the cryosection from thesubstrate. These problems render SIMS analysis difficult,frustrating and time consuming. The use of indium as asubstrate f

11、or pressing cryosections flat has provided a practicalapproach for analyzing cryogenically prepared tissue speci-mens (1).45.2 The procedure described herein has been successfullyused for SIMS imaging of calcium and magnesium transportand localization of anticancer drugs in animal models (2, 3, 4,5)

12、.5.3 The procedure described here is amenable to soft tissuesof both animal and plant origin.6. Apparatus6.1 The procedure described here can be used for tissuecryosection analysis with virtually any SIMS instrument.6.2 A cold stage in the SIMS instrument is needed toanalyze frozen-hydrated specimen

13、s (6).1This practice is under the jurisdiction of ASTM Committee E42 on SurfaceAnalysis and is the direct responsibility of Subcommittee E42.06 on SIMS.Current edition approved Nov. 1, 2012. Published December 2012. Originallyapproved in 1997. Last previous edition approved in 2006 as E1880 06. DOI:

14、10.1520/E1880-12.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3The last approved version of this historica

15、l standard is referenced onwww.astm.org.4The boldface numbers in parentheses refer to a list of references at the end ofthis standard.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States17. Procedure7.1 Prepare the indium substrate by pres

16、sing sheet indiumonto polished silicon wafer pieces of approximately 15 to 25mm2surface area, which can be irregularly shaped. A simplemechanical Pellet Press5can be used effectively for pressingfor pressing sheet indium onto the surface of polished siliconwafer. Next, vapor deposit an approximately

17、 1 m thick layerof high purity (99.999 %) indium onto the pressed indiumsheet. The high purity of indium is emphasized only due to thefact that it should not impart any significant contamination tothe sample. The vapor deposition can be achieved by vacuum-based processes such as evaporation from a h

18、eated filament orsputtering from an indium target. The indium substrates arenow ready for use.7.1.1 Chill an individual indium substrate by immersing itinto liquid nitrogen prior to its use for pressing cryosections.Quickly transfer the indium substrate to the cryomicrotome andkeep at the desired te

19、mperature of cryosectioning. Place afrozen tissue cryosection on the indium substrate and gentlypress by using a new chilled silicon piece. Make sure that thepolished surface of the top silicon piece is used to press thecryosection onto indium substrate in order to avoid introducingthe irregular top

20、ography of the rough silicon surface. Removethe top silicon piece by sliding it off using chilled tweezers.The pressed frozen cryosection on the indium substrate is nowready for frozen-hydrated analysis with a cold stage in theSIMS instrument. Alternatively, the pressed cryosection on theindium subs

21、trate can be freeze-dried by transferring the indiumsubstrate to a freeze-drier.7.1.2 Upon completion of freeze-drying, the freeze-driershould be opened by introducing dry gasses (N2, Ar, etc.) inorder to avoid rehydration of tissue sections. The indiumsubstrates containing freeze-dried tissue secti

22、ons should bequickly transferred to a desiccator for storage. The freeze-driedcryosections are now ready for SIMS analysis.7.1.3 Depending on the need of a particular SIMS analysis,the freeze-dried cryosections may be analyzed directly or goldcoated to enhance electrical conductivity.7.1.4 A quick v

23、isual inspection of the cryosection surfaceshould be made prior to its insertion into the sample chamberof the SIMS instrument. A reflected light microscope can beused to observe any folds, ripples or loosely attached regions inthe section. At this stage, it is always desirable to “repress” thefreez

24、e-dried section gently into the indium with a polishedsilicon piece. It is also desirable to remove the loosely attachedpieces of tissue section from the substrate by using tweezers.7.1.5 Correlative morphological information to complementthe SIMS analysis can be made by using adjacent cryosectionsf

25、or optical microscopy and SIMS analysis (2).8. Keywords8.1 SIMSREFERENCES(1) Sod, E. W., Crooker, A. R., and Morrison, G. H., “BiologicalCryosection Preparation and Practical Ion Yield Evaluation for IonMicroscopic Analysis,” Journal of Microscopy (Oxford), Vol 160,1990, p. 55.(2) Chandra, S., Fullm

26、er, C. S., Smith, C. A., Wasserman, R. H., andMorrison, G. H. “Ion Microscopic Imaging of Calcium Transport inthe Intestinal Tissue of Vitamin D-deficient and Vitamin D-repleteChickens: A44Ca Stable Isotope Study,” Proceedings of the NationalAcademy of Sciences (USA), Vol 87, 1990, p. 5715.(3) Chand

27、ra, S., and Morrison, G. H., “Sample Preparation of AnimalTissues and Cell Cultures for Secondary Ion Mass Spectrometry(SIMS) Microscopy,” Biology of the Cell, Vol 74, 1992, p. 31.(4) Chandra, S., Bernius, M. T., and Morrison, G. H., “IntracellularLocalization of Diffusible Elements in Frozen-hydrat

28、ed BiologicalSpecimens with Ion Microscopy,” Analytical Chemistry, Vol 58, 1986,p. 493.(5) Smith, D. R., Chandra, S., Barth, R.F., Yang, W., Joel, D.D., andCoderre, J.A., “Quantitative Imagining and Microlocalization ofBoron-10 in Brain Tumors and Infiltrating Tumor Cells by SIMS IonMicroscopy: Rele

29、vance to Neutron Capture Therapy,” CancerResearch, Vol 61, 2001, p. 8179.(6) Chandra, S., Bernius, M.T., and Morrison, G.H. “Intracellular Local-ization of Diffusible Elements in Frozen-Hydrated Biological Speci-mens with Ion Microscopy,” Analytical Chemistry, Vol 58, 1986, p.493.ASTM International

30、takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own

31、 responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be add

32、ressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at

33、 the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585

34、(phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the ASTM website (www.astm.org/COPYRIGHT/).5The sole source of supply of the Pellet Press apparatus known to the committeeat this time is Parr Instrument Co., Moline, IL. If you are aware of alternativesuppliers, please provide this information to ASTM International Headquarters.Your comments will receive careful consideration at a meeting of the responsibletechnical committee,1which you may attend.E1880 122

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1