ASTM E2374-2010 Standard Guide for Acoustic Emission System Performance Verification《声发射系统性能校验标准指南》.pdf

1、Designation: E2374 10Standard Guide forAcoustic Emission System Performance Verification1This standard is issued under the fixed designation E2374; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number

2、 in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 System performance verification methods launch stresswaves into the examination article on which the sensor ismounted. The resulting stress w

3、ave travels in the examinationarticle and is detected by the sensor(s) in a manner similar toacoustic emission.1.2 This guide describes methods which can be used toverify the response of an Acoustic Emission system includingsensors, couplant, sensor mounting devices, cables and systemelectronic comp

4、onents.1.3 Acoustic emission system performance characteristics,which may be evaluated using this document, include somewaveform parameters, and source location accuracy.1.4 Performance verification is usually conducted prior tobeginning the examination.1.5 Performance verification can be conducted

5、during theexamination if there is any suspicion that the system perfor-mance may have changed.1.6 Performance verification may be conducted after theexamination has been completed.1.7 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstand

6、ard.1.8 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenc

7、ed Documents2.1 ASTM Standards:2E750 Practice for Characterizing Acoustic Emission Instru-mentationE976 Guide for Determining the Reproducibility of Acous-tic Emission Sensor ResponseE1316 Terminology for Nondestructive ExaminationsE1419 Practice for Examination of Seamless, Gas-Filled,Pressure Vess

8、els Using Acoustic EmissionE1781 Practice for Secondary Calibration of AcousticEmission Sensors3. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 examination articlethe item which is being exam-ined with AE and to which AE sensors are attached.3.1.2 velocitythe measured velocity

9、of a stress wave,traveling in the examination article, using specified AE systemparameters and components. Velocity is often used in triangu-lation calculations to determine the position of the AE source.3.1.3 auto sensor test (AST)an electronic means by whicha sensor can be fed an electronic pulse

10、to excite the examina-tion article. The resulting stress wave in the examination articlecan be measured by the same sensor or by other sensors that areon the same examination article. See 3.1.4 and 3.1.5.3.1.4 auto sensor test-self test modea means by which anAST sensor may be used to check its own

11、performance.3.1.5 auto sensor test-near neighbor modea means bywhich an AST sensor may be used to determine the sensitivityof one or more neighboring sensors on the same examinationarticle.4. Significance and Use4.1 Acoustic Emission data acquisition can be affected bynumerous factors associated wit

12、h the electronic instrumenta-tion, cables, sensors, sensor holders, couplant, the examinationarticle on which the sensor is mounted, background noise, andthe users settings of the acquisition parameters (for example,threshold).4.2 This guide is not intended to replace annual (or semi-annual) instrum

13、entation calibration (see Practice E750)orsensor recertification (see Practice E1781).4.3 This guide is not intended to replace routine electronicevaluation of AE instrumentation or routine sensitivity verifi-cation of AE sensors (see Guide E976).4.4 This guide is not intended to verify the maximump

14、rocessing capacity or speed of an AE system.1This guide is under the jurisdiction of ASTM Committee E07 on Nondestruc-tive Testing and is the direct responsibility of Subcommittee E07.04 on AcousticEmission Method.Current edition approved Jan. 1, 2010. Published February 2010. Originallyapproved in

15、2004. Last previous edition approved in 2004 as E2374 - 04. DOI:10.1520/E2374-10.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page

16、 onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.4.5 This guide does not purport to address all of the safetyconcerns, if any associated with its use. It is the responsibilityof the user of this guide to establish

17、appropriate safety andhealth practices and determine the applicability of regulatorylimitations prior to use.5. Apparatus5.1 To determine system performance a sensor must besubjected to a stress wave traveling in the examination article.Transient stress waves are launched by mechanical or electro-me

18、chanical devices that produce a waveform with fast rise-time, short duration and repeatable peak amplitude. Steadystate (continuous) stress waves are launched by mechanical orelectromechanical devices that produce a waveform with longduration constant amplitude. Various apparatus can be used asverif

19、ication sources including the following:5.1.1 Pencil Lead Break (PLB)A mechanical pencil tech-nique whereby lead is pushed against the examination articlessurface with sufficient force to break the lead. When the leadbreaks, there is a sudden release of stress on the surface. (SeeGuide E976, subsect

20、ion 4.3.3 and Fig. 4.)5.1.1.1 The distance between the PLB and the sensor mustbe specified and kept consistent.5.1.1.2 The “Hsu pencil source” uses a mechanical pencilwith a 2.5 mm lead extension, 2H hardness and 0.3 mm or 0.5mm diameter (0.3 mm is preferred).5.1.1.3 The “Nielsen shoe” can aid in br

21、eaking the leadconsistently.5.1.1.4 The pencil should be held at an angle of 30 degreesto the surface.5.1.1.5 Three to five lead breaks are generally conducted toshow a consistent result.5.1.1.6 Application standards (for example, Test MethodE1419, Table X1.2) specify the minimum signal amplitude th

22、atmust be measured by the AE instrumentation.5.1.1.7 Channels which are found to have unacceptably lowor high sensitivity can be re-coupled (that is, replace couplant),repaired (that is, replace sensor, or cable, or both), or replacedto the examination article (that is, exchanged for anotherchannel)

23、, or both.5.1.1.8 PLB can be used to determine the apparent velocityin the examination article (apparent velocity = sensor spacing/time-of-flight). “Time-of-flight” is the time required for a stresswave to travel the sensor-spacing distance5.1.2 Independent Piezoelectric PulserAn electrome-chanical

24、device held against the examination article and used inconjunction with an electronic signal or pulse generator. Theelectrical signal from the signal/pulse generator is convertedinto a mechanical displacement by the transducers crystal.(See Guide E976, subsection 4.3.1.) One significant advantageof

25、this technique is that the output of the electronic signal/pulsegenerator can be adjusted in numerous ways (for example,amplitude and repetition rate).5.1.2.1 The independent pulser can be used to excite thereceiving AE sensor before, during and after an examination asverification that there were no

26、 changes in coupling or sensorresponse. The independent pulser technique is particularlyuseful when there is limited access to the examination articlethat would preclude the use of manual techniques (for example,PLB).5.1.2.2 The independent pulser technique is particularlyuseful in continuous monito

27、ring situations where sensors willbe on the examination article for a long period of time. In thissituation the independent pulser is left in place and usedperiodically to assure system performance.5.1.3 AST Capable Integrated Pulser/SensorAn AE sen-sor that has been designed to accept an electronic

28、 signal/pulseinto its crystal. The mechanical displacement of the crystalexcites the examination article. The stress wave generated inthe examination article can be detected by other sensors on thesame examination article. With certain realizations of the ASTfunction (self test mode), it can also be

29、 detected by the excitingsensor.5.1.3.1 Auto Sensor Test: Near Neighbor ModeAn inte-grated pulser/sensor can be used to measure sensitivity andtime-of-flight (that is, the time required for a stress wave totravel the sensor-spacing distance) for neighboring sensors onthe same examination article. Th

30、e time-of-flight can be used tocalculate the apparent velocity of the stress wave (apparentvelocity = sensor spacing/time-of-flight).5.1.3.2 Auto Sensor Test: Self Test ModeAn integratedpulser/sensor can be used to verify the performance of thesensor coupling and the sensor and channel electronics t

31、owhich it is attached by establishing a baseline duration (orenergy) measured from the AST pulse using a sensor that isknown to be operating properly and mounted optimally on theexamination article. The baseline duration number (for ex-ample, 10 000 s) can then be compared with theAST durationmeasur

32、ements from each channel on the examination article.Channels, which produce AST duration measurements that arelow compared to the baseline, should be recoupled, repaired orreplaced as necessary.5.1.4 Spring Loaded Center PunchAspring loaded devicethat imparts a mechanical impact force, creating a ve

33、ry largestress wave on the examination article. The spring assures aconsistent and repeatable force.5.1.4.1 The spring-loaded center punch is of particularadvantage whenAE sensors are distributed over large distanceson an examination article, as the imparted force is so strong itcan be detected easi

34、ly.5.1.4.2 The spring-loaded center punch is readily availableand easy to apply anywhere on the examination article, at anytime.5.1.4.3 To avoid damage to the surface, it is desirable toapply the center punch through an intermediate interface suchas a thin sheet of metal or coin.5.1.5 ProjectileAn o

35、bject which is launched or projectedto impact the surface of the examination article. Examplesinclude a steel ball dropped onto the surface, a BB gun fired atthe surface or a mass at the end of a pendulum. In most casesthe energy being imparted onto the surface can be determined.5.1.6 Gas JetA gas j

36、et forces a gas through a nozzle athigh pressure onto the surface of the examination article beinginstrumented. The gas jet is controlled by an electronic valveE2374 102with the ability of being turned on momentarily to create atransient surface wave or kept on to create a continuous surfacewave.5.1

37、.6.1 The gas jet is usually used in an industrial environ-ment where compressed air or gas is readily available.5.1.6.2 The gas jet is usually used in places that areinaccessible so that system verification can be carried outremotely from the sensor.5.1.6.3 The gas jet is a good device for creating

38、a simulated,continuous leak-type, AE signal.5.1.7 Electrical Spark DischargeA spark struck betweentwo electrodes near the surface of the examination articlegenerates stress waves that propagate in a manner similar toacoustic emission. The technique can be used in a similarmanner to a pencil lead bre

39、ak or independent piezoelectricpulser. The advantage of an electrical spark discharge is itsshort duration and impulse type response, providing a wide-band frequency response.5.1.8 Mechanical CrackerA mechanically loaded devicewhich is embrittled or subjected to chemical attack (whichcauses it to cr

40、ack at a rate controlled by the applied mechanicalload). When coupled to the surface of the examination article,the device produces true AE signals of varying amplitude. Thismethod truly generates acoustic emission and is useful incharacterizing the AE system response to a brittle crack.6. Procedure

41、6.1 The procedure for accomplishing system performanceverification utilizes one of the devices listed in Section 5 toproduce a stress wave on the examination article. The sen-sor(s), mounted a specified distance from the verificationdevice detects the stress wave and the acoustic emission systemproc

42、esses the information for display and storage. The operatorof the acoustic emission system examines the data to determineif they are within the limits specified in the written testprocedure. Note that two operators may be required: one tooperate the verification device (for example, PLB) and asecond

43、 to read the data and record the results.6.1.1 Verification of Acoustic Emission transient signalparameters (or AE features)Waveform parameters/featuresthat are necessary for achieving the desired examination resultsare typically required to be measured, within a specified degreeof accuracy, during

44、system performance verification. Theseparameters and the required degree of accuracy are specified inthe written test procedure.6.1.1.1 An example of this process is provided in Table 1and Fig. 1 where peak amplitude from each sensor is used toverify system performance. The accuracy requirements use

45、d inthis example are found in Test Method E1419, Table X1.2.6.1.2 Verification of Source Location AccuracySourcelocation accuracy that is necessary for achieving the desiredexamination results are typically required to be measured,within a specified degree of accuracy, during system perfor-mance ver

46、ification. The means of determining source locationand the required degree of accuracy are specified in the writtentest procedure.6.1.2.1 An example of this process is provided in Table 2and Fig. 2 where linear source location accuracy is measured toverify system performance. The accuracy requiremen

47、ts used inthis example are typical of those used in Test Method E1419,subsection 10.6.6.1.3 Verification of System Data Acquisition RateSystemdata acquisition rate performance is influenced by systemsettings such as threshold and dead time. Generally, theoperator would like the threshold and dead-ti

48、me to be as low asthe systems data acquisition rate will allow in order to optimizethe test results. To determine if a system has sufficient data rateperformance to carry out a particular examination procedurethe operator attaches sensors to the examination article anduses the verification device at

49、 various positions. During thisprocess the dead time setting is lowered until multiple eventsare observed for a single use of the verification device. In theexample which follows Test Method E1419, Table X1.2, thisdead-time value is 10 ms. To accommodate a dead-time settingof 10 ms the AE system must have a steady state throughputrate of 100 events/second (10 mseconds/event = 0.01seconds/event, 1/0.01 seconds/event = 100 events/second) To verifythat a system is capable of achieving a steady state data rate of100 events/second an electronic pulse generator (set to