ASTM F219-1996(2002) Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps《电子器件和电灯用细圆丝和扁线的试验方法》.pdf

1、Designation: F 219 96 (Reapproved 2002)Standard Test Methods of TestingFine Round and Flat Wire for Electron Devices and Lamps1This standard is issued under the fixed designation F 219; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revisio

2、n, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods cover the testing of fine wire, flat orround, approximately 0.010 in. (0.25 mm) and

3、 smaller indiameter or thickness, used in electronic devices and lamps.1.2 The values stated in inch-pound units are to be regardedas the standard. The values given in parentheses are forinformation only.1.3 This standard does not purport to address all of thesafety concerns, if any, associated with

4、 its use. It is theresponsibility of whoever uses this standard to consult andestablish appropriate safety and health practices and deter-mine the applicability of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:B 63 Test Method for Resistivity of Metallically Conduct-i

5、ng Resistance and Contact Materials2D 374 Test Methods for Thickness of Solid ElectricalInsulation3F 16 Test Methods for Measuring Diameter or Thickness ofWire and Ribbon for Electronic Devices and Lamps4F 205 Test Method for Measuring Diameter of Fine Wire byWeighing4F 289 Specification for Molybde

6、num Wire and Rod forElectronic Applications43. Test Specimens3.1 The number of spools per shipment to be checked shallbe agreed upon by the producer and consumer. Three testspecimens from each spool to be tested shall be taken for thepurpose of each of the tests covered by these methods, exceptSecti

7、on 4, where one specimen per shipment shall be submit-ted. These specimens shall be selected sufficiently far fromeither end of the spool of wire to be free from kinks, bends, anddistortion. With the exceptions mentioned in 3.2, the specimensshall be taken from points in the length of the wire separ

8、ated byat least 1 ft (305 mm).3.2 For the edgewise curvature test, straightness test, andtension tests the specimens shall be taken from points in thelength of the wire separated by at least 3 ft (0.9 m).4. Chemical Analysis4.1 In case of disagreement between producer and consumerchemical analysis o

9、f the material shall be made in accordancewith the methods of the American Society for Testing andMaterials for the respective materials when such methods ofanalysis are available. When ASTM test methods are notavailable, the analytical procedures shall be agreed upon by theproducer and the consumer

10、.5. Dimensions5.1 Procedure A for Round WireDetermine the weight-size of round wire in accordance with Test Method F 205.5.2 Procedure B for Round WireAs an alternative method,the diameter of wire over 0.005 in. (0.13 mm) may bedetermined in accordance with Test Methods D 374.5.3 Procedure for Flat

11、Wire:5.3.1 Determine the dimensions of flat wire in accordancewith 5.1 in conjunction with width as measured in accordancewith 5.2, or if agreed upon by the manufacturer and thepurchaser, any dimension exceeding 0.005 in. may be deter-mined in accordance with 5.2 alone.5.3.2 In determining the width

12、 of flat wire, form a flatwiseloop loosely with the ends held between the fingers. The minoraxis of the loop shall be12 to34 of the diameter of themicrometer jaws. Measure the width of the ribbon with thecurve loop perpendicular to the micrometer jaws. Take care notto distort the ribbon or bend it o

13、ut of the correct plane duringmeasurement.5.4 In case of disagreement between producer and con-sumer, Test Methods F 16 shall be used as the referee method.5.5 ReportThe report shall include the average weight ofwire or ribbon in mg/200 mm to three significant figures. Theaverage measurements for di

14、ameter, width, or thickness shallbe reported to the nearest 0.0001 in. (0.002 mm).6. Out-of-Roundness6.1 ProcedureMeasure out-of-roundness on round wireover 0.005 in. (0.13 mm) in diameter in accordance withSections 3 and 4 of Test Methods D 374. For wire 0.005 in. orless in diameter the same method

15、 shall apply except a benchtype micrometer reading to 0.0001 in. (0.002 mm) shall be1These test methods are under the jurisdiction of ASTM Committee F01 onElectronics and are the direct responsibility of Subcommittee F01.03 on MetallicMaterials.Current edition approved Dec. 10, 1996. Published Febru

16、ary 1997. Originallypublished as F 219 47. Last previous edition F 219 79 (1991).2Annual Book of ASTM Standards, Vol 03.04.3Annual Book of ASTM Standards, Vol 10.01.4Annual Book of ASTM Standards, Vol 10.04.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 1942

17、8-2959, United States.used. Make the measurements by exploring a plane of crosssection of the test specimen to determine both minimum andmaximum values of diameter at the cross section. Take care tohave the specimen straight so that its normal curvature will notinfluence readings.6.2 CalculationCalc

18、ulate out-of-roundness as follows:Out2of2roundness, percent 5 A 2 B!/A# 3 100where:A = maximum diameter of the cross section, in. (or mm),andB = minimum diameter of the cross section, in. (or mm).6.3 ReportThe report shall include the average of thethree determinations of out-of-roundness reported t

19、o the near-est 1 percent.7. Edgewise Curvature of Ribbon7.1 ProcedureLay a specimen 200 mm in length on a flatglass plate. Lay a second glass plate over the ribbon to ensureits lying flat with no edgewise bending. Place in lined graph,which consists of parallel lines spaced 1.0 mm apart and isnumber

20、ed 50 mm above and below the zero line, under theglass plates. Manipulate the plates over the graph so that theends of the ribbon coincide with the zero line. Measure theextreme depth of chord.7.2 ReportThe report shall include the maximum depth ofchord reported to the nearest 0.5 mm.8. Straightness

21、 of Straightened Round Wire8.1 ProcedureHold a specimen 200 mm in length parallelto and 2 to 3 in. (51 to 76 mm) above a glass plate and allowit to fall freely onto the glass plate. Take extreme care not tostretch or distort the wire with too much tension. Manipulatethe glass plate over the graph de

22、scribed in 7.1 so that the endsof the wire coincide with the zero line. Measure the maximumdeviation from the zero line. Also measure the distance fromend to end.8.2 ReportThe report shall include the maximum devia-tion from the zero line and the apparent length of the wire tothe nearest millimetre.

23、 The readings shall be expressed as: Xmm deviation/X mm (For example, if the maximum deviationwere 25 mm and the apparent length were 165 mm, theexpression would be 25 mm deviation/165 mm).9. Tension Test9.1 ApparatusAny standard testing machine that appliesthe load at a constant rate of traverse or

24、 a machine calibratedin terms of a constant rate of traverse shall be satisfactory. Thecapacity of the testing machine shall be such that all specimensfail at greater than 40 percent of the capacity of the machine.The clamps used shall be such that there will be no slipping of,or damage to, the test

25、 specimen.9.2 ProcedureDetermine the tensile strength, yieldstrength, and elongation at room temperature. The gage lengthof the specimen shall be 10 in. (254 mm). The initial loadapplied to the specimen before making the test shall besufficient to keep the wire straight. The rate of traverse shall b

26、e1 in./min (25.4 mm/min). The yield strength shall be defined asthe stress at which the specimen exhibits an elongation of 1 %.If the specimen breaks within 0.5 in. (12.7 mm) of the clamps,repeat the test.9.3 The report shall include the averages of at least threedeterminations each of the tensile s

27、trength and yield strength5expressed in gf/(mg/200 mm) or in kgf/cm2, and the percentageof elongation in 10 in. (254 mm).NOTE 1Conversion factors are as follows:gf/mg/200 mm! 5 psi 3 0.003515/Dpsi 5 F/W 3 284.5 3Dkgf/cm25 psi 3 0.0703psi 5 kgf/cm23 14.22where:F = breaking load, gf,D = density of mat

28、erial, g/cm3, andW = weight of material, mg/200 mm (see 5.1).10. Electrical Resistivity10.1 ProcedureDetermine the electrical resistance of wireand ribbon at room temperature in accordance with TestMethod B 63. The electrical resistivity shall then be calculatedin accordance with 10.2. This test sha

29、ll be applicable to smallersizes by omitting 5.1.3 of Test Method B 63.10.2 CalculationThe electrical resistivity at 25 C may beexpressed either in terms of V cmil/ft, Vcm, or as Vmg/200mmft, calculated (Note 2) as follows:r51.640 3V/ft 3 mg/200 mm!/g/cm3!rc5 9.868 3V/ft 3 mg/200 mm!/g/cm3!rw5V/ft 3

30、 mg/200 mmwhere:r = resistivity, Vcm at 25 C,rc= resistivity, V cmil/ft at 25 C, andr2= resistivity, Vmg/200 mmft at 25 C.NOTE 2The following illustrates the derivation of the equations forcalculating weight resistivities:Using known values of:R = resistance, V/ ft, at 25 C,W = weight, mg/200 mm, an

31、dD = density, g/cm3.density, g/cm3.LetA = cross section of wire, cm2, andL = length of wire, cm.ThenW/1000 5DLA 5D20AorA 5 W/20,000DLetr = resistivity, Vcm,rc= resistivity in V cmil/ft, and5For an explanation of units used, see Specification F 289.F 2192rw= resistivity in V-mg/200 mmft.Thenr5RA/Lr51

32、.640 3V/ft 3 mg/200 mm!/g/cm3!rc5 9.868 3V/ft 3 mg/200 mm!/g/cm3!orr50.1662 rc5 1.640 rw/Drc5 6.015 r59.868 rw/Drw5 0.6096 r50.10134 rcD10.3 ReportThe report shall include the following:10.3.1 Identification of test specimen,10.3.2 Kind of material,10.3.3 Temperature of surrounding medium,10.3.4 Len

33、gth of specimen used,10.3.5 Method of obtaining cross-sectional area:10.3.5.1 If by micrometer, a record of all micrometerreadings, including average values and calculated cross-sectional area.10.3.5.2 If by weighing, a record of length, mass anddensity determinations and calculated cross-sectional

34、area.10.3.6 Method of measuring resistance,10.3.7 Value of resistance,10.3.8 Calculated value of electrical resistivity, and10.3.9 Previous mechanical and thermal treatments. (sincethe resistivity of a material usually depends upon them, theseshall be stated whenever the information is available.)11

35、. Keywords11.1 electrical resistance; electron devices; lamps; roundand flat wire; tensile testingASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determ

36、ination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or w

37、ithdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that

38、your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org).F 2193