1、Designation: E973 10Standard Test Method forDetermination of the Spectral Mismatch Parameter Betweena Photovoltaic Device and a Photovoltaic Reference Cell1This standard is issued under the fixed designation E973; the number immediately following the designation indicates the year oforiginal adoptio
2、n or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers a procedure for the determina-tion of a spectral mi
3、smatch parameter used in performancetesting of photovoltaic devices.1.2 The spectral mismatch parameter is a measure of theerror, introduced in the testing of a photovoltaic device, causedby mismatch between the spectral responses of the photovol-taic device and the photovoltaic reference cell, as w
4、ell asmismatch between the test light source and the referencespectral irradiance distribution to which the photovoltaic ref-erence cell was calibrated. Examples of reference spectralirradiance distributions are Tables E490 or G173.1.3 The spectral mismatch parameter can be used to correctphotovolta
5、ic performance data for spectral mismatch error.1.4 This test method is intended for use with linear photo-voltaic devices.1.5 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.6 This standard does not purport to address all of
6、thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E490 Standard Solar Const
7、ant and Zero Air Mass SolarSpectral Irradiance TablesE772 Terminology Relating to Solar Energy ConversionE948 Test Method for Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated SunlightE1021 Test Method for Spectral Responsivity Measure-ments of Photovoltaic DevicesE
8、1036 Test Methods for Electrical Performance of Noncon-centrator Terrestrial Photovoltaic Modules and ArraysUsing Reference CellsE1039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells UnderGlobal Irradiation3E1125 Test Method for Calibration of Primary Non
9、-Concentrator Terrestrial Photovoltaic Reference Cells Us-ing a Tabular SpectrumE1328 Terminology Relating to Photovoltaic Solar EnergyConversionE1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsG138 Test Method for Calibration of a SpectroradiometerUsing a S
10、tandard Source of IrradianceG173 Tables for Reference Solar Spectral Irradiances: Di-rect Normal and Hemispherical on 37 Tilted SurfaceSI10 Standard for Use of the International System of Units(SI): The Modern Metric System3. Terminology3.1 DefinitionsDefinitions of terms used in this testmethod may
11、 be found in Terminology E772 and TerminologyE1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 test light source, na source of illumination whosespectral irradiance will be used for the spectral mismatchcalculation.3.3 SymbolsThe following symbols and units are used inthis test method:M
12、spectral mismatch parameter,measurement error in short-circuit current,lwavelength, m or nm,Rr(l)spectral response of reference cell, AW1,Rt(l)spectral response of photovoltaic device, AW1,Eirradiance, Wm2,1This test method is under the jurisdiction of ASTM Committee E44 on Solar,Geothermal and Othe
13、rAlternative Energy Sources and is the direct responsibility ofSubcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved June 1, 2010. Published July 2010. Originally approvedin 1983. Last previous edition approved in 2005 as E973 05a. DOI: 10.1520/E0973-10.2For referenc
14、ed ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Withdrawn. The last approved version of this historical standard is refer
15、encedon www.astm.org.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.E (l)spectral irradiance, Wm2m1or Wm2nm1,andEo(l)reference spectral irradiance, Wm2m1orWm2nm1.NOTE 1Following normal SI rules for compound units (see PracticeSI10),
16、 the units for spectral irradiance, the derivative of irradiance withrespect to wavelength dE/d (l), would be Wm3. However, to avoidpossible confusion with a volumetric power density unit and for conve-nience in numerical calculations, it is common practice to separate thewavelength in the compound
17、unit. This compound unit is also used inTables G173 .4. Summary of Test Method4.1 Determination of the spectral mismatch parameter Mrequires the spectral response characteristics of the photovol-taic device and the spectral irradiance distribution of the testlight source, along with the spectral res
18、ponse and the referencespectral irradiance distribution used for the reference cellcalibration.4.2 Because all four spectral quantities appear in both thenumerator and the denominator in the calculation of thespectral mismatch parameter (see 8.1), multiplicative calibra-tion errors cancel, and there
19、fore only relative quantities areneeded, although absolute spectral quantities may be used ifavailable.5. Significance and Use5.1 The calculated error in the photovoltaic device currentdetermined from the spectral mismatch parameter can be usedto determine if a measurement will be within specified l
20、imitsbefore the actual measurement is performed.5.2 The spectral mismatch parameter also provides a meansof correcting the error in the measured device current due tospectral mismatch.5.2.1 The spectral mismatch parameter is formulated as thefractional error in the short-circuit current due to spect
21、raldifferences.4,55.2.2 Error due to spectral mismatch can be corrected bydividing the measured photovoltaic cell current by M,aprocedure used in Test Methods E948 and E1036.6. Apparatus6.1 In addition to the apparatus required by Test MethodsE1021, the following apparatus is required.6.1.1 Spectral
22、 Irradiance Measurement InstrumentAspectroradiometer, defined in Test Method G138, calibratedaccording to Test Method G138.6.1.1.1 The wavelength resolution shall be no greater than10 nm.6.1.1.2 The wavelength pass-bandwidth shall be no greaterthan 6 nm.6.1.1.3 The wavelength range shall be wide eno
23、ugh toinclude the spectral response of the photovoltaic device and thephotovoltaic reference cell.6.1.1.4 The spectral irradiance measurement instrumentmust be able to scan the required wavelength range in a timeperiod short enough such that the spectral irradiance at anywavelength does not vary mor
24、e than6 5 % during the entirescan.7. Procedure7.1 Determine the spectral response Rt(l) of the photovol-taic device using Test Methods E1021.7.2 Obtain the spectral response Rr(l) of the photovoltaicreference cell.NOTE 2Test Methods E1039, E1125, and E1362 require the spectralresponse to be provided
25、 as part of the reference cell calibration certificate.7.3 Measure the spectral irradiance E (l) of the test lightsource, using the spectral irradiance measurement instrument(see 6.1.1).7.4 Obtain the reference spectral irradiance distributionEo(l) that corresponds to the calibration of the photovol
26、taicreference cell, such as Tables E490 or G173.8. Calculation of Results8.1 Calculate the spectral mismatch parameter with:4,5M 5*l2l1El!Rtl!dl*l4l3El!Rrl!dl3*l4l3Eol!Rrl!dl*l2l1Eol!Rtl!dl(1)using a suitable numerical integration scheme such as thosedescribed in Tables G173.8.1.1 The wavelength int
27、egration limits l1 and l2 shallcorrespond to the spectral response limits of the photovoltaicdevice.8.1.2 The wavelength integration limits l3 and l4 shallcorrespond to the spectral response limits of the photovoltaicreference cell.8.2 Calculate the measurement error due to spectral mis-match using:
28、5|M 2 1|(2)9. Precision and Bias9.1 PrecisionImprecision in the spectral irradiance andthe spectral response measurements will introduce errors in thecalculated spectral mismatch parameter.9.1.1 It is not practicable to specify the precision of thespectral mismatch test method using results of an in
29、terlabora-tory study, because such a study would require circulating atleast six stable test light sources between all participatinglaboratories.9.1.2 Monte-Carlo perturbation simulations6using precisionerrors as large as 5 % in the spectral measurements have shownthat the imprecision associated wit
30、h the calculated spectralmismatch parameter is no more than 1 %.9.1.3 Table 1 lists estimated maximum limits of imprecisionthat may be associated with spectral measurements at any onewavelength.4Seaman, C., “Calibration of Solar Cells by the Reference Cell MethodTheSpectral Mismatch Problem,” Solar
31、Energy, Vol 29, 1982, pp. 291298.5Osterwald, C. R., “Translation of Device Performance Measurements toReference Conditions,” Solar Cells, Vol 18, 1986, pp. 269279.6Emery, K. A., Osterwald, C. R., and Wells, C. V., “Uncertainty Analysis ofPhotovoltaic Efficiency Measurements,” Proceedings of the 19th
32、 IEEE Photovolta-ics Specialists Conference1987 , pp. 153159, Institute of Electrical and Elec-tronics Engineers, New York, NY, 1987.E973 1029.2 BiasBias associated with the spectral measurementsused in the spectral mismatch calculation can be either inde-pendent of wavelength or can vary with wavel
33、ength.9.2.1 Numerical calculations using wavelength-independentbias errors of 2 % added to the spectral quantities show theerror introduced in the spectral mismatch parameter to be lessthan 1 %.9.2.2 Estimates of maximum bias that may be associatedwith the spectral measurements are listed in Table 2
34、. Theselimits are listed for guidance only and in actual practice willdepend on the calibration of the spectral measurements.10. Keywords10.1 cell; mismatch; photovoltaic; reference; solar; spectral;testingASTM International takes no position respecting the validity of any patent rights asserted in
35、connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the res
36、ponsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive caref
37、ul consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International
38、, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the AS
39、TM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the ASTM website (www.astm.org/COPYRIGHT/).TABLE 1 Estimated Limits of Imprecision in SpectralMeasurementsSource of Imprecision Estimated Limit, %Spectral response measurement 2.0Spectral irradiance measurement 5.0TABLE 2 Estimated Limits of Bias in Spectral MeasurementsSource of Bias Estimated Limit, %Spectral response measurement 3.0Spectral irradiance measurement 5.0E973 103
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