ASTM F410-2008(2013) Standard Test Method for Wear Layer Thickness of Resilient Floor Coverings by Optical Measurement《采用光学测量法的弹性地板覆盖物磨损层厚度的标准试验方法》.pdf

1、Designation: F410 08 (Reapproved 2013)Standard Test Method forWear Layer Thickness of Resilient Floor Coverings byOptical Measurement1This standard is issued under the fixed designation F410; the number immediately following the designation indicates the year of originaladoption or, in the case of r

2、evision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.Asuperscriptepsilon () indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the U.S. Department of Defense.1. Scope1.1 This test metho

3、d covers the determination of the thick-ness of the wear layer of resilient non-textile floor coverings, intile or sheet form, with or without felt backing or foam layer,by optical measurement.1.2 This test method is applicable for wear layers with aminimum thickness of 0.0004 in. (0.01 mm) to a max

4、imumthickness of 0.1 in. (2.54 mm), where measurements within0.0001 in. or 0.0025 mm are tolerable.1.3 The values stated in inch-pound units are to be regardedas standard. The values given in parentheses are mathematicalconversions to SI units that are provided for information onlyand are not consid

5、ered standard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2

6、. Referenced Documents2.1 ASTM Standards:2E691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test Method3. Significance and Use3.1 This test method is applicable for wear layers with aminimum thickness of 0.001 in. (0.02 mm) to a maximumthickness of 0.1 in. (2.54 mm

7、), where measurements within0.0005 in. or 0.01 mm are tolerable.4. Apparatus4.1 Compound Microscope, having a magnification of atleast 40, equipped with an eyepiece micrometer of the ruleddisk or filar type. The scale shall cover approximately 0.1 in.(2.54 mm) and each division shall be equal to app

8、roximately0.0004 in. (0.01 mm) at the object. Either a binocular orstandard microscope may be used.4.2 Vertical Illuminator (recommended), to illuminate thespecimen. If another source is used, the light should fall on thespecimen from as nearly vertical direction as possible.4.3 Stage Micrometer, fo

9、r calibrating the eyepiece microm-eter. The scale shall have the smallest division equal to 0.0004in. (0.01 mm) and shall cover at least 0.1 in. (2.54 mm). Thereference standard used for calibration shall be traceable to aNational Standard.4.4 HolderA means for holding the specimen, withoutdistortio

10、n, so that the cut edge is perpendicular to the opticalaxis of the microscope.4.5 Sharp Knife, or razor blade in a holder, for cutting thespecimen.4.6 Cutting Board of plastic, hardboard or fine-grainedhardwood.4.7 Straightedge, for guiding the cutting edge.5. Test Specimen5.1 The specimen shall be

11、cut from a properly selectedsample, representing the area to be measured. It shall beapproximately 2 in. (50 mm) long on the edge to be measuredby about 0.5 in. (13 mm) in width.6. Procedure6.1 Preparation of SpecimenPlace the sample on thecutting board with the face side up. Hold the cutting instru

12、mentso that the plane of the blade is perpendicular to the face of thesample. The cutting edge of the blade should be at an angle tothe horizontal that produces a clean cut. It is essential that thecut is perpendicular to the face of the sample. Apply sufficientpressure so that a clean cut can be ma

13、de completely through thesample in one stroke, being careful not to distort the sample or1This test method is under the jurisdiction ofASTM Committee F06 on ResilientFloor Coverings and is the direct responsibility of Subcommittee F06.20 on TestMethods - Products Construction/Materials.Current editi

14、on approved Dec. 1, 2013. Published January 2014. Originallyapproved in 1975. Last previous edition approved in 2008 as F41008. DOI:10.1520/F0410-08R13.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMSta

15、ndards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States1turn the knife from the perpendicular. The cut should bestraight, and at least 2 in. (50 mm) lo

16、ng. Make a similar cutparallel to the first cut, about 0.5 in. (13 mm) apart. Cut eachend, so the specimen can be removed from the sample.6.2 Thickness Measurement:6.2.1 Mount the specimen with the long edge up, the cutsurface perpendicular to the optical axis of the microscope (seeAppendix X1).6.2.

17、2 CalibrationCalibrate the eyepiece micrometeragainst the stage micrometer, and record the calibration factor.If a variable magnification (zoom) instrument, or one withadjustable tube length is used, be sure that these adjustmentsare not disturbed between calibration and measurement of thesample.6.2

18、.3 Measurement with Ocular MicrometerLocate thespecimen under the microscope and adjust the light source.Focus the microscope so that both edges of the wear layer aresharp. If this cannot be done, remount or recut the specimen.Measure the thickness by counting the rulings or the divisionson the rule

19、d disk in the eyepiece that cover the distance fromone edge of the wear layer to the other, and by applying theappropriate calibration factor. Then record this distance to thenearest 0.0001 in. or 0.0025 mm. Take three readings in theareas selected, at least 0.5 in. (13 mm) apart.7. Report7.1 Averag

20、e the values of the readings from the specimen tothe nearest 0.0001 in. (0.0025 mm) and record as the averagethickness of the wear layer. Also report minimum and maxi-mum readings to the nearest 0.0001 in. (0.0025 mm).8. Precision and Bias8.1 PrecisionOptical thickness measured in mils (forexample,

21、a numerical value of 18 equals 0.018 in.). Precision(characterized by repeatability, Sr, r, and reproducibility, SR,R) has been determined in Table 1 for the materials.8.1.1 This study, which used 6 laboratories, 5 materials, and25 determinations per material, meets the minimum require-ments for det

22、ermining precision prescribed in Practice E691.38.1.2 Repeatability (Sr, r)In comparing two average val-ues for the same material obtained by the same operator, usingthe same equipment, on the same day, the means should bejudged not equivalent (statistically different) if they vary bymore then the r

23、 value for that material and condition. If thedifference between the means is less than the r value for thatmaterial and condition, the averages should be consideredstatistically equivalent.8.1.3 Reproducibility (SR, R)In comparing two averagevalues of the same material obtained by different operato

24、rs,using different equipment, on different days, the means shouldbe judged not equivalent (statistically different) if they vary bymore than the R value for that material and condition. If thedifference between the means is less than the R value for thatmaterial and condition, the averages should be

25、 consideredstatistically equivalent. (This applies between different labora-tories or between different equipment within the same labora-tory.)8.1.4 The judgments in 8.1.2 and 8.1.3 will have an approxi-mate 0.95 (95 %) probability of being correct. Other materialswill give somewhat different result

26、s. For further information onthe methodology used in this section or the explanations given,consult Practice E691.8.2 Material Identification:Material A Type 1, Grade 2, Class AMaterial B Type 1, Grade 1, Class A, with HighPerformance Top CoatMaterial C Type 1, Grade 1, Class BMaterial D Type 1, Gra

27、de 3, Class AMaterial E Type 1, Grade 1, Class A, with HighPerformance Top Coat8.3 BiasThe bias of this test method was not determined,as there is no reference standard for comparison.9. Keywords9.1 measurement; optical; resilient; test; thickness; wearlayer3Supporting data have been filed at ASTM I

28、nternational Headquarters and maybe obtained by requesting Research Report: RR F061006.TABLE 1 PrecisionMaterials AverageASrBSRCrDREMaterial A 18.2147 0.5340 1.0808 1.4952 3.0261Material B 19.5567 1.2854 1.3938 3.5992 3.9028Material C 33.8173 0.5305 0.9218 1.4855 2.5811Material D 10.7353 0.3833 0.39

29、92 1.0734 1.1176Material E 21.0273 0.7411 1.306 2.0750 2.8858AAverage is the arithmetic mean of optical thickness measurements for allreplicates from all laboratories of each material.BSr is the within-laboratory standard deviation of the average.CSR is the between-laboratory standard deviation of t

30、he average.Dr = 2.83 Sr.ER=2.83SR.F410 08 (2013)2APPENDIX(Nonmandatory Information)X1. SPECIMEN MOUNTINGX1.1 The specimen may be mounted in a small vise if careis taken not to distort the specimen. It has been foundconvenient to mount the specimen on a rectangular block ofwood or plastic, 1 by 3 by5

31、8 in. (25 by 75 by 15 mm). Coverthe1by58 side with double-face pressure-sensitive tape.Mount the specimen on the pressure-sensitive tape. Fit theblock into the mechanical stage of the microscope. While amechanical stage is not essential, it makes it easy to positionthe specimen so that one edge of t

32、he wear layer is aligned witha principal division of the eyepiece micrometer, aiding accuratemeasurement.X1.2 For proper calibration technique, consult a text onmicroscopy.4ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentione

33、din this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and

34、must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of

35、theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C

36、700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the ASTM website (www.astm.org/COPYRIGHT/).4For example, Chamot and Mason, Handbook of Chemical Microscopy, Vol. I,2nd Ed., John Wiley and Sons, New York, NY.F410 08 (2013)3