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本文(ASTM F935-2000(2004) Standard Test Method for Comparing Cover-Up Correction Media《比较掩盖型修改剂的标准试验方法》.pdf)为本站会员(刘芸)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ASTM F935-2000(2004) Standard Test Method for Comparing Cover-Up Correction Media《比较掩盖型修改剂的标准试验方法》.pdf

1、Designation: F 935 00 (Reapproved 2004)Standard Test Method forComparing Cover-Up Correction Media1This standard is issued under the fixed designation F 935; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision

2、. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers information and procedures forevaluating several performance qualities of typewritercover-up correction ta

3、pes and tabs on a comparative basis forgeneral office use.1.2 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bil

4、ity of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2D 685 Practice for Conditioning Paper and Paper Productsfor TestingD 3460 Specification for White Watermarked and Unwater-marked Bond, Mimeo, Spirit Duplicator, Reprographic,and Laser Printer Cut-Sized Office Paper

5、sE 97 Test Method for Directional Reflectance Factor, 45 0of Opaque Specimens by Broad-Band Filter Reflectrom-etry3F 221 Terminology Relating to Carbon Paper and InkedRibbon Products and Images Made TherefromF 497 Practice for Use of the Electric and Electronic Type-writer as a Test Instrument2.2 AN

6、SI Standard:PH2.17 Density MeasurementsGeometric Conditons forReflection Density4PH2.18 Density MeasurementsSpectral Conditions43. Terminology3.1 For definitions of terms used in this test method, refer toTerminology F 221.4. Summary of Test Method4.1 This test method consists of testing typewriter

7、cover-upcorrection tapes and tabs under actual and simulated useconditions, using several techniques generally accepted in theinked ribbon industry. All tests should be performed under thesame conditions so that comparative results may be obtained.5. Significance and Use5.1 This test method may be u

8、sed to evaluate severalperformance characteristics of typewriter cover-up correctionmedia on a comparative basis.5.2 This test method is suitable for manufacturing controlon a limited basis, due to the length of time required for sometests.6. Apparatus and Materials6.1 Electric or Electronic Typewri

9、ter Calibrate and adjustin accordance with the manufacturers suggestions and PracticeF 497.6.2 ReflectometerMeeting the geometric conditions ofPH2.17 and the spectral conditions of PH2.18.6.3 Environmental ChamberCapable of maintaining 1206 2F (49 61C) at 40 %6 5 % relative humidity for 48 h.6.4 Mag

10、nifier33 to 53.6.5 PaperGrade 4, Type I (20 lb 17 3 22-500; SIequivalent 75 g/m2) in accordance with Specification D 3460.The felt side of the paper shall be used for the test. All testsshall be made along the machine direction of the paper.6.6 Control RibbonA single strike film, multistrike film,or

11、 fabric ribbon of known quality and performance.6.7 Cover-up Tape or TabSince this test procedure iscomparative, two or more specimens of tape or tab should beselected for evaluation.7. Test Specimens7.1 The test specimens shall be a cover-up tape or tab orportion thereof not previously used or marr

12、ed by handling.1This test method is under the jurisdiction ofASTM Committee F05 on BusinessImaging Products and is the direct responsibility of Subcommittee F05.02 on InkedTransfer Imaging Products.Current edition approved Dec. 1, 2004. Published December 2004. Originallyapproved in 1991. Last previ

13、ous edition approved in 2000 as F 935 00.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Withdrawn.4Availabl

14、e from American National Standards Institute, 25 W. 43rd St., 4thFloor, New York, NY 10036.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.8. Calibration8.1 Calibrate the electric typewriter or printer in accordancewith manufacturers

15、 instructions and Practice F 497.8.2 Calibrate and standardize the reflectometer in accor-dance with PH2.17 and PH2.18.9. Conditioning9.1 Testing should be conducted in an environment withstable conditions of temperature and humidity. Papers, controlribbon, and test samples should be conditioned for

16、 24 h in thearea in which the test will be conducted. If possible, standardconditions meeting Method D 685 should be used. These are73 6 1.8F (23 6 1C) and 50 6 2 % relative humidity.10. Procedure10.1 Creating Test Patterns:NOTE 1Great care should be taken to produce accurate test patterns.The resul

17、ts of calculations and observations depend upon carefully madetest patterns that avoid slippage of paper, mistypings, and misalignmentsof character strikes. If possible, the test typewriter should be programmedto produce the test pattern thus reducing human error.10.1.1 Standard Test PatternEach tes

18、t pattern consists ofa box 15 characters long and 15 lines deep. The advancementbetween lines should be12 line (112 in.). The preferredcharacter for producing the standard test pattern is an OCR-B10 pitch type font using an asterisk “*” character. Othercommonly used characters which may be selected

19、are “M”,“#”, or “W”.10.1.2 Producing Six Test PatternsThe following para-graphs explain how to produce A, B, C, D, E, and F testpatterns as illustrated in Fig. 1.10.1.2.1 Place the paper as described in 6.5 in the type-writer.10.1.2.2 Produce the first line of the four patterns by typingthe chosen c

20、haracter as follows: Type 15 characters, followwith three spaces, next, a second row of 15 characters, threespaces, and so forth until a series of four rows have beenproduced.10.1.2.3 Perform the following typing pattern for lines 2through 14. Type 15 characters, space three spaces, type asecond set

21、 of 15 characters, space three spaces and continueuntil four new rows have been created as above. Do notadvance line. Backspace to the second pattern (B). Placetypewriter in correction mode, and cover-up characters 2through 14 (13 characters) with the same character chosen toproduce the test pattern

22、. Repeat this cover-up procedure forpatterns (C) and (D). Next backspace to row three (C).Overtype with the chosen character producing a row ofcharacters similar to pattern A (overtype characters 2 through14). Overtype pattern (D) with a different charactera slash issuggested (/). Test pattern D thu

23、s become a retyped patternwith a different over typed character. Continue typing linesfollowing the above procedure until reaching line 15.10.1.2.4 Type line 15 the same as the first line. (See10.1.2.2.) The result of typing in accordance with 10.1.2.2,10.1.2.3, and 10.1.2.4 will be a series of four

24、 boxes as shownin Fig. 1 and now defined as:Test Pattern AOriginal image of ribbon.Test Pattern BCovered-up image of ribbonno correction.Test Pattern CRetyped imagestandard character.Test Pattern DRetyped imagenonstandard character.10.1.2.5 Test pattern for cover-up brightness measurementand overtyp

25、e reference. Advance the paper and type beneaththe series of four test patterns a fifth and sixth test pattern E andF as follows:10.1.2.6 Place the typewriter in the correction, cover-upmode. Type a series of 15 characters using only the cover-up.Advance three spaces and type a row of 15 asterisk (*

26、)characters.NOTE 2If cover-up tabs are being evaluated, produce patterns E andF by typing with cover-up tab inserted between ribbon and paper. Be sureto move tab after each strike to avoid restriking same position.10.1.2.7 Perform the following typing pattern for lines 2through 14. Type 15 character

27、s (*) with correction cover-upmode engaged. Advance three spaces. Type one asterisk (*)and then 13 characters as used to overtype in pattern D, withoutthe correction function engaged. Type one asterisk (*) as the15th character. Advance12 line and repeat the above until twoblocks of impressions 15 by

28、 14 are produced.10.1.2.8 Type line 15 the same as line 1see 10.1.2.6. Theresults of typing according to 10.1.2.5, 10.1.2.6, 10.1.2.7, and10.1.2.8 will be two additional boxes as shown in Fig. 1,defined as:Test Pattern ECover-up image only.Test Pattern FOriginal image nonstandard/character.10.2 Meas

29、urements and Evaluation:10.2.1 Measure the reflectance of the base paper and boxesA, B, C, D, E, and F according to Test Method E97, and recordresults. Record the average reflectance of the base paper as RFIG. 1 Test Pattern for Measuring Cover-Up MediaF 935 00 (2004)2and the other measurements A th

30、rough F. Take a minimum offour readings per box.10.2.2 Visually examine boxes B, C, and D with andwithout aid of a 33 to 53 magnifier, for evidence ofincomplete cover-up transfer, incomplete rewrite transfer,voids, extraneous particles, bleed-through, practical colormatch of cover-up to paper, and c

31、onsistency of rewrite inten-sity.10.3 Cover-Up Tape Flake Test:10.3.1 Clean the typewriter thoroughly (feed rolls, tape andribbon guides, aligning scales, segments, body, etc.)10.3.2 Load an unused test specimen of tape into thetypewriter transport mechanism, and advance to just beyondthe leader.10.

32、3.3 Using a robot device or programmed test pattern,type a standard series of lines incorporating corrections andrewrites until the tape is exhausted.10.3.4 Examine the typewriter for evidence of flake on feedrolls, tape and ribbon guides, aligning scale, segments body,etc., and rank according to se

33、verity (1 = best to 5 = worst).Record results.10.4 General QualitySimultaneously perform evaluationsfor salient characteristics of splices, holes, voids, or tears in thebase film or coating (to back of tape or tab), and transfer tofingers.10.5 Oven Test (Effects of High Temperatures):10.5.1 Place a

34、test specimen of the cover-up tapes in a presetenvironmental chamber 120 6 2F (49 6 1C) at 40 6 5%relative humidity (as described in 6.3) for 48 h.10.5.2 Remove the test specimen from the oven and stabi-lize for at least6htotheoriginal conditions of Section 9.Examine sample for blocking or fusion.10

35、.5.3 Repeat 10.1 through 10.3, noting in particular anydifferences from original observation. Record results.10.6 Repeat 10.1 through 10.5 for each cover-up tape or tabto be evaluated. (In 10.1 use the same lot of paper for all tests.)NOTE 3Different typewriters and type fonts may give different res

36、ultsin 10.1 and 10.2. For general, wide-acceptance testing, the use of differenttypewriters and type fonts will increase the reliability and applicability ofthe conclusions of this test method.11. Identification11.1 For identification purposes, the following is suggested:11.1.1 Tape or tab (name),11

37、.1.2 Manufacturers name and address,11.1.3 Base material (substrate),11.1.4 Color of coating,11.1.5 Nominal length, width, and thickness,11.1.6 Actual length, width, and thickness,11.1.7 Core, outside and inside diameters,11.1.8 Tape diameter (supply core),11.1.9 Leader material, seal, and length,11

38、.1.10 End warning, nature, and length,11.1.11 Trailer material, seal, and length, and11.1.12 Package description (configuration, box, identifica-tions).12. Calculation12.1 The variables used in these calculations are the reflec-tance readings taken in 10.2. For convenience, they aresummarized here a

39、nd shown in Fig. 1:A = Pattern typed on clean paper.B = Pattern, like A, covered up.C = Pattern, like B, overtyped with the same character as used in A.D = Pattern, like B, overtyped with a character other than that usedin A.E = The cover-up typed on clean paper using the same character asin A.F = P

40、attern, typed on clean paper using the same character as usedto produce pattern D.R = The reflectance of the clean paper.All the above values range from zero for black to one forwhite.12.1.1 Cover-Up CoeffcientThe cover-up coefficientcompares the whiteness of the cover-up material on plain paperwith

41、 its whiteness when covering an image. If the cover-up isoptimum the cover-up coefficient will be 100. Incomplete orinadequate cover-up will generate coefficients of less than 100.Percent cover2up 5 1 2 E 2 B!# 3 100 (1)Optimum: 100.12.1.2 Rewrite CoeffcientThree rewrite coefficient equa-tions are g

42、iven here as follows:12.1.2.1 Compare the original pattern typed on clean paperwith the same pattern overtyped on a covered-up sample usingthe same character throughout. In the ideal situation, therewrite coefficient is 100. Poorer quality is usually less than100. However values over 100 are possibl

43、e. Their meaning willdepend on interpretation of the other coefficients found inSection 12.Percent rewrite 5corrected patternoriginal pattern5C!A!3 100 (2)12.1.2.2 Compare the original pattern typed on clean paperwith the same pattern overtyped on a covered-up sample. Thiscoefficient is useful in co

44、mparing different cover-up products.Poorer quality usually has a lesser coefficient.Percent rewrite 5FE 2 C!RR 2 A!EG3 100(3)12.1.2.3 Compare a different pattern typed on clean paperwith the same pattern overtyped on a covered-up sample. In theideal situation the rewrite coefficient is 100. Poorer q

45、uality isusually less than 100. However values over 100 are possible.Their meaning will depend on interpretation of the othercoefficients found in Section 12.Percent rewrite 5E 2 D!R 2 F!RE3 100(4)Optimum = 100.12.1.3 Correction Contrast Coeffcient The cover-up con-trast coefficient compares the whi

46、teness of the paper with thewhiteness of the cover-up material. Ideal is 100, less than 100implies the paper is whiter than the cover-up, while over 100implies the cover-up material is whiter than the paper.Correction contrast coefficient 5ER3 100 (5)F 935 00 (2004)3Optimum = 100.12.1.4 Aging Coeffc

47、ientsThe aging coefficient comparesthe fresh values as taken above with a similar set of reflectancevalues taken on samples which have been aged as described in10.5. Ideally, all aging coefficients should be 100. Any depar-ture from 100 not associated with experimental variance, eitherup or down, im

48、plies change.12.1.4.1 The aging coefficient is calculated using the resultsof measurements and computations described in 12.1.1, 12.1.2,and 12.1.3.Aging coefficient 5%original!% aged!3 100 (6)Optimum = 100.13. Report13.1 Due to the subjective nature of the tests involved, withthe exception of the un

49、its obtained in Section 12, onlycomparative results can be reported.14. Precision and Bias14.1 Repeatable ranking order results or a repeatable rela-tionship to a control can be obtained with this test methodprovided that:14.1.1 The same printer or typewriter in the same conditionis operated with constant voltages,14.1.2 Sample conditioning procedures are similar, and14.1.3 Ambient conditions are similar.14.2 Repeatable ranking order between laboratories is pos-sible with proper correlation of test equipment and procedures

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