ASTM F2865-2013 Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch《灰尘和水对膜片开关浸入程度的标准指南》.pdf

1、Designation: F2865 13Standard Guide forClassifying the Degrees of Ingress of Dust and Water into aMembrane Switch1This standard is issued under the fixed designation F2865; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year o

2、f last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This guide establishes a classification system and refer-ences test methods for verifying the degrees of:1.1.1 The i

3、ngress of dust into the internal layers of amembrane switch.1.1.2 Ingress of water into the internal layers of a membraneswitch.1.1.3 Where external test methods are referenced, this guidespecifies the special conditions that shall be considered inapplying these tests to membrane switches and how th

4、e resultsare interpreted.1.2 This guide references test methods that can be used toestablish the ingress classification of a membrane switch.1.3 This guide utilizes the test methods and reportingstructure of IEC 60529 (Degrees of Protection Provided byEnclosures) modified for membrane switches.2. Re

5、ferenced Documents2.1 ASTM Standards:2F1578 Test Method for Contact Closure Cycling of a Mem-brane SwitchF1595 Practice for Viewing Conditions for Visual Inspectionof Membrane SwitchesF1680 Test Method for Determining Circuit Resistance of aMembrane SwitchF1689 Test Method for Determining the Insula

6、tion Resis-tance of a Membrane SwitchF2592 Test Method for Measuring the Force-Displacementof a Membrane Switch2.2 IEC Standard:360529 Degrees of Protection Provided by Enclosures3. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 membrane switch, na momentary switching devicein w

7、hich at least one contact is on, or made of, a flexiblesubstrate.4. Classification System4.1 The ingress classification of a membrane switch isdesignated by the MSIP code:4.1.1 MSIP 6 5 A4.1.1.1 MSIP = Membrane Switch Ingress classification.4.1.1.2 1st Numeral = Dust Protection Code (see Table 1).4.

8、1.1.3 2nd Numeral = Water (Liquid) Protection Code (seeTable 2).4.1.1.4 A = If “A” is present then method or media deviatesfrom this guide and is reported.4.1.2 The MSIP code comprises a series of numerals. Eachnumeral represents the level of ingress offered by the mem-brane switch to each contamina

9、nt. In this guide when address-ing only the 1st or 2nd numeral the other numeral is replacedwith an “X” for clarity. For example, MSIP X5 refers only totesting for water ingression. The “X” notation is not used as afinal designation. If testing is not completeda“0”isused forthat numeral (see Table 1

10、 and Table 2).4.1.3 The numeric designations for dust and water are basedon those classified under IEC 60529.5. Significance and Use5.1 Ingression protection classifications are widely used bymanufacturers for specifying the level of protection offered byenclosures.5.2 An example of such a classific

11、ation scheme is IEC60529. Membrane switch manufacturers are often asked tomeet these standards, however the test methods specifiedwithin these standards do not address considerations specific tomembrane switches.5.3 The MSIP classification system considers the membraneswitch separately from the test

12、ing and IP codes used forclassifying the enclosure when subject to similar test condi-tions.1This guide is under the jurisdiction of ASTM Committee F01 on Electronicsand is the direct responsibility of Subcommittee F01.18 on Membrane Switches.Current edition approved Jan. 1, 2013. Published January

13、2013. Originallyapproved in 2011. Last previous edition approved in 2011 as F2865-11. DOI:10.1520/F2865-13.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the stand

14、ards Document Summary page onthe ASTM website.3Available from International Electrotechnical Commission (IEC), 3, rue deVaremb, P.O. Box 131, CH-1211 Geneva 20, Switzerland, http:/www.iec.ch.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United St

15、ates15.4 Ingression testing can be useful to identify designdeficiencies.6. Interferences6.1 The membrane switch shall be tested in a mounted statespecified in this guide because this is a classification of themembrane switch only without consideration of the enclosure.6.2 The length of time between

16、 the manufacture of themembrane switch and the performance of the test.6.3 The temperature at which the test is being conducted.7. Conditioning7.1 Unless otherwise specified in a relevant productstandard, the test samples for each test shall be in a clean andnew condition, and mounted to the testing

17、 backer for 24 h.7.2 The testing backer must be a rigid transparent backer tobetter observe the ingression of dust or water into the switch.Testing backer with geometries other than flat shall be re-ported.8. Test Method for Ingress of Dust into a MembraneSwitch8.1 Apparatus:8.1.1 Dust Chamber: Refe

18、rence IEC 60529 Section 13.4.8.1.2 Dust Media:8.1.2.1 For MSIP5X and MSIP6X : Reference IEC 60529Section 13.4.8.1.2.2 MSIP5XA and MSIP6XA: Media to be specified.8.1.2.3 Mounting SurfaceThe testing backer must be rigidand transparent and compatible with the mounting adhesive.Testing backer with geome

19、tries other than flat shall be re-ported.8.2 Pre-Test Setup:8.2.1 Measurements and Process Testing should be con-ducted on switches nearest the weakest point for ingress ofdust, such as the first switch cavity adjacent to an external ventchannel.8.2.2 Measure the circuit resistance per Test Method F

20、1680.8.2.3 Measure the insulation resistance per Test MethodF1680.8.2.4 For additional setup requirement see IEC 60529 Sec-tion 13.4.8.2.5 Perform visual inspection per Practice F1595 andestablish visual baseline to establish pre-test condition.8.3 In Process Test:8.3.1 For ingress of dust, numerals

21、 5 and 6, the test iscarried out according to Category 2 (testing at atmosphericpressure) per IEC 60529 Section 13.4.TABLE 1 1st Numeral = Dust Protection CodeNumerals or Letters Degree of Ingress Requirement Summary Test Equipment0 Not tested or no ingressprevention demonstratednone N/A1,2,3,4ANot

22、applicable to membraneswitchesnone N/A5 Dust protected Ingress of dust is not totally prevented.The switch operates as declared andthe post-test circuit resistance change isless than +30 % of pre-test, and belowthe maximum circuit resistance asspecified by the manufacturer.IEC 60529 Dust ChamberCate

23、gory2Nopressure difference created in thechamber6 Dust tight No Ingress of Dust in the internal switchcavities. The switch operates as de-clared and the post-test circuit resis-tance change is less than +30 % of pre-test, and below the maximum circuitresistance as specified by the manufac-turer.IEC

24、60529 Dust ChamberCategory2Nopressure difference created in thetest chamberAIP codes 1,2,3 and 4 are not applicable to membrane switches because they indicate a level of protection for objects of 50 mm, 12 mm, 2.5 mm and 1.0 mm diameterrespectively.TABLE 2 2nd Numeral = Water (Liquid) Protection Cod

25、eNumerals or Letters Degree of Ingress Test Equipment0 Not tested or no ingress preventiondemonstratedN/A1 Vertically dripping IEC 60529 Drip Box2 Dripping (15 deg tilted) IEC 60529 Drip Box3 Spraying IEC 60529 Oscillating Tube or SprayNozzle4 Splashing IEC 60529 Oscillating Tube or SprayNozzle5 Jet

26、ting IEC 60529 Test Nozzle with 6.3 mmnozzle6 Powerful Jetting IEC 60529 Test Nozzle with 12.5 mmnozzle7 Temporary immersion IEC 60529 Complete immersion in water8 Continuous immersion IEC 60529 Complete immersion in waterF2865 1328.3.2 Cycle switch per Test Method F1578 contact closurecycling. The

27、cycling rate shall not be greater than 5 cycles persecond. The cycling may be completed without electrical load.The probe, number of cycles, cycling rate and duty cycle willbe reported.8.4 Post Test:8.4.1 Remove dust from the outside of the membraneswitch.8.4.2 Visually inspect from the outside of t

28、he membraneswitch per Test Method F1595 and record any evidence of dustor cosmetic blemishes.8.4.3 Measurements are made at the same locations used forPre-Test Setup.8.4.4 Measure the circuit resistance per Test Method F1680.8.4.5 Measure insulation resistance per Test Method F1689.8.4.6 Visually in

29、spect the inside of the membrane switch.Separate the layers of the switch for internal inspection such ascavities, vent tracks, contact surfaces, etc.8.4.7 See Table 1 for applicable MSIP rating and resultrequirement summary.9. Test Method for Ingress of Water into a MembraneSwitch9.1 Apparatus:9.1.

30、1 Water Equipment: Reference IEC 60529 Section 14.0.9.1.2 Water Media:9.1.2.1 For MSIPX1 to 8: Reference IEC 60529 Section14.0.9.1.2.2 For all MSIPX1A to 8A and media to be specified.9.1.2.3 Mounting SurfaceThe switch shall be fitted to notallow water into the enclosure except through the membranesw

31、itch. It is preferred that the switch be mounted on themanufacturers end product enclosure, however if none isprovided, use a rigid transparent backer to better observe theingression of water into the switch.9.2 Pre-Test Setup:9.2.1 Measurements and Process Testing are completed onswitches nearest t

32、he weakest point for ingress of water, such asthe first switch cavity adjacent to an external vent channel.9.2.2 Measure Fmax and Fc and any other desired charac-teristic per Test Method F2592 and record.9.2.3 Insulation Resistance per Test Method F1680.9.2.4 Reference IEC 60529 Section 14.0.9.3 In-

33、Process Test:9.3.1 Reference IEC 60529 Section 14.0.9.3.2 A switch affecting the venting to all switches in thepre-test setup group shall be cycled according to Test MethodF1578 contact closure, Paragraph 6, Procedure. The probe,number of cycles and duty cycle are declared. The cycling rateshall be

34、3 to 5 cycles per second. The cycling may becompleted with no electrical load.9.4 Post Test:9.4.1 Measurements are made at the same locations used forpre-test setup.9.4.2 Measure the circuit resistance per Test Method F1680.9.4.3 Measure insulation resistance per Test Method F1689.9.4.4 Reference IE

35、C 60529 Sections 14.2.1 thru 14.2.8 forMSIPX1 to 8 or MSIPX1A to 8A. The presence of any waterinside the membrane switch is determined in part by themeasurements indicated above. Visual inspections shall bemade where practical; the results are recorded as qualitativeobservations.9.4.5 The presence o

36、f any water inside the membrane switchis determined by opening the switch for internal inspection ofthe complete switch such as cavities, vent tracks, contactsurfaces, etc. No water is permitted.9.4.6 See Table 2 for applicable MSIP rating.9.5 Report the following information if applicable:9.5.1 Vis

37、ual cosmetic change per Practice F1595.9.5.2 Specified maximum circuit resistance.9.5.3 Mechanical Changes:9.5.3.1 Fmax, Fmin, Fc mandatory per Test Method F2592 other force displacement supporting data and curves optional.9.5.4 Electrical Characteristic Changes:9.5.4.1 Circuit resistance per Test M

38、ethod F1680, pre-testand post-test values.9.5.4.2 Insulation resistance per Test Method F1689, pre-test and post-test values.9.5.5 Test Conditions:9.5.5.1 Temperature.9.5.5.2 Humidity.9.5.6 Test Probe:9.5.6.1 Shape and material (durometer if elastic probe isused).9.5.6.2 Test probe orientation if ot

39、her than 90 degrees tosample.9.5.6.3 Location of contact point if other than center ofswitch.9.5.6.4 Duty cycle.9.5.6.5 Test rate.9.5.6.6 Number of cycles.9.5.6.7 Applied force.9.5.7 Environmental test conditions other than standardcontrol laboratory atmosphere.9.5.8 Mounting surface description (su

40、ch as material type,radius, texture, area of contact, etc.).9.5.9 Dustif tested with a different dust material thanspecified in IEC 60529.9.5.10 Waterif tested with a different liquid material thanspecified in IEC 60529.F2865 133ASTM International takes no position respecting the validity of any pat

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