1、BRITISH STANDARD BS 5424-2: 1987 Incorporating Amendment No. 1 Low-voltage controlgear Part 2: Specification for semiconductor contactors (solid state contactors) (Implementation of CENELEC HD 419.2 S1) UDC 621.316.3/.5.027.2:621.382.316.53BS5424-2:1987 The British Standard, having beenprepared unde
2、r the directionof the Power Electrical Engineering Standards Committee, was published underthe authority ofthe BoardofBSI and comes into effecton 30 November 1987 BSI 11-1999 The following BSI references relate to the work on this standard: Committee reference PEL/10 Draft announced in BSI News, Feb
3、ruary 1987 ISBN 0 580 16204 4 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Power Electrical Engineering Standards Committee (PEL/-) to Technical Committee PEL/10, upon which the following bodies were represented: ASTA Certification Se
4、rvices Association of Manufacturers Allied to the Electrical and Electronic Industry (BEAMA Ltd) British Gas plc ERA Technology Ltd Electrical Contractors Association Electrical Installation Equipment Manufacturers Association (BEAMA Ltd) Electricity Supply Industry in England and Wales Electronic C
5、omponents Industry Federation GAMBICA (BEAMA Ltd) Health and Safety Executive Institution of Electrical Engineers Amendments issued since publication Amd. No. Date of issue Comments 6445 December 1990 Indicated by a sideline in the marginBS5424-2:1987 BSI 11-1999 i Contents Page Committees responsib
6、le Inside front cover Foreword iii 1 General 1 1.1 Scope 1 1.2 Object 1 2 Definitions 1 2.1 Definitions concerning contactors and semiconductor contactors 1 2.2 Definitions concerning states, control and auxiliary circuits of a semiconductor contactor 2 3 Classification 3 4 Characteristics of semico
7、nductor contactors 3 4.1 Summary of characteristics 3 4.2 Type of semiconductor contactor 3 4.3 Rated values 3 4.4 Control circuits 7 4.5 Auxiliary circuits 8 4.6 Co-ordination with short-circuit protective devices 9 5 Nameplates 9 6 Standard conditions for operation in service 9 6.1 Normal service
8、conditions 9 7 Standard conditions for construction 9 7.1 Mechanical design 9 7.2 Enclosures 9 7.3 Temperature rise 10 7.4 Dielectric properties 10 7.5 Limiting values of operation 11 8 Tests 11 8.1 Verification of the characteristics of semiconductor contactors 11 8.2 Type tests 11 8.3 Routine test
9、s 14 8.4 Special tests 14 Appendix A Information to be given by the user when conditions for operation in service differ from the standard 20 Appendix B Clearances and creepage distances for low-voltage contactors (under consideration) 20 Appendix C Protection of a contactor by a short-circuit prote
10、ctive device (under consideration) 20 Appendix D Conventional test circuit for the verification of rated making and breaking capacities of contactors 20 Appendix E Method of presenting a load diagram 20 Appendix F Test equipment and circuits for showering arc test 22 Figure 1 8 Figure 2 8 Figure 3 S
11、howering arc test on output circuit 15 Figure 4 Showering arc test on control input circuit 16 Figure 5 Showering arc test on control voltage supply 17 Figure 6 Surge voltage test on output circuit 18BS5424-2:1987 ii BSI 11-1999 Page Figure 7 Electrical transient generator schematic diagram and part
12、s list 19 Figure E.1 Load diagram 21 Figure F.1 Electrical noise generator schematic diagram and parts list 23 Figure F.2 Cable assembly for coupling noise into signal and power circuits 24 Figure F.3 Conductor arrangement Alpha No. 1181-15 Cable (No. 22 wire) 24 Figure F.4 Typical oscillogram of co
13、ntinuous transient produced by showering arc electric noise generator 25 Figure F.5 Connection diagram and parts list for coupling cable assembly standardization 25 Figure F.6 Current pulse oscillogram for standardizing coupling cable assembly 26 Table I Utilization category 5 Table II Verification
14、of rated making and breaking capacities (see Sub-clause8.2.4) Conditions for making and breaking corresponding to the several utilization categories 6 Table III Verification of the number of on-load operating cycles Conditions for making and breaking corresponding to the several utilization categori
15、es 7 Table IV Preferred values of the rated control circuit voltage (U c ) and of the rated control supply voltage (U s ) if different from that of the main circuit 8 Table IV Temperature-rise limits for the various materials and parts 10 Publications referred to Inside back coverBS5424-2:1987 BSI 1
16、1-1999 iii Foreword This British Standard has been prepared under the direction of the Power Electrical Engineering Standards Committee and is related to IEC158-2:1982 published by the International Electrotechnical Commission (IEC). This standard is in agreement with Harmonization Document HD419.2S
17、1 published by the European Committee for Electrotechnical Standardization (CENELEC), which has introduced modifications to8.2.3.3, 8.2.9.2b) and8.2.9.3b). BS5424 consists of the following Parts: Part1:1977: Contactors; Part2:1987: Specification for semiconductor contactors (solid state contactors);
18、 Part3:1987: Additional requirements for contactors subject to certification. Terminology and conventions. For ease of reproduction, most of the text and format of IEC158-2 has been used as the basis of this British Standard. Some terminology and conventions are not identical with those in British S
19、tandards. The Technical Committee has reviewed the provisions of IEC65 and IEC147-0, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. A related British Standard to IEC65:1987 is BS415:1979. A British Standard does not purport
20、 to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard IEC 6
21、0-2:1973 BS 923 Guide on high-voltage testing techniques Part 2:1980 Test procedures (Identical) IEC 144:1963 BS 5420:1977 Specification for degrees of protection of enclosures of switchgear and controlgear for voltages up to and including1000V a.c. and1200V d.c. (Identical) IEC 158-1:1970 BS 5424 S
22、pecification for controlgear for voltages up to and including1000V a.c. and1200V d.c. Part 1:1977 Contactors (Identical) IEC 664:1980 PD 6499:1981 Guide to insulation co-ordination within low-voltage systems including clearances and creepage distances for equipment (Identical) Summary of pages This
23、document comprises a front cover, an inside front cover, pages i to iv, pages1to26, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv blankBS5
24、424-2:1987 BSI 11-1999 1 1 General 1.1 Scope This standard applies to semiconductor contactors intended for performing electrical operations by changing the state of electric circuits between on state and off state. This standard is additional to IEC Publication158-1: Low-voltage Controlgear, Part1:
25、Contactors (including Supplements A and B) which is applicable, provided it is not amended by this standard. It applies only to semiconductor contactors, the main circuit of which is intended to be connected to circuits, the rated voltage of which does not exceed1000V a.c. or1500Vd.c. NOTE 1Semicond
26、uctor contactors dealt with in this standard are not intended to provide short-circuit protection of the main circuit, but may contain short-circuit protective devices for semiconductor parts. NOTE 2Semiconductor motor-starters will be dealt with in a later publication. This standard applies also to
27、 hybrid-semiconductor contactors, which are also covered by the scope of IEC Publication158-1 as concerns their electromagnetic part. 1.2 Object See IEC Publication158-1 1) . 2 Definitions For the purpose of this standard, the following definitions shall apply: 2.1 Definitions concerning contactors
28、and semiconductor contactors 2.1.1 semiconductor switching device a switching device designed to make the current in an electric circuit by means of the controlled conductivity of a semiconductor NOTEIn a circuit where the current passes through zero (alternately or otherwise), the effect of “not ma
29、king” the current following such a zero value is equivalent to breaking the current. 2.1.2 mechanical switching device see IEC Publication158-1 2.1.3 controlgear see IEC Publication158-1 2.1.4 contactor (mechanical) see IEC Publication158-1 2.1.5 semiconductor (Sub-clause0-1.1 of IEC Publication147-
30、0 2) ) a material with resistivity usually in the range between metals and insulators, in which the electrical charge carrier concentration increases with increasing temperature over a certain temperature range 2.1.6 semiconductor contactor a device which performs the function of a contactor by util
31、izing a semiconductor switching device NOTEA semiconductor contactor may also contain mechanical switching devices. 2.1.7 hybrid semiconductor contactor a device which performs the function of a contactor by utilizing a combination of semiconductor and mechanical devices with the switching duty perf
32、ormed by a semiconductor device while the current-carrying duty is taken care of by a mechanical device 2.1.8 (Vacant) 2.1.9 (Vacant) 2.1.10 main circuit (of a semiconductor contactor) all the conductive parts of a semiconductor contactor included in the circuit it is designed to control 2.1.11 pole
33、 of a contactor see IEC Publication158-1 2.1.12 (Vacant) 2.1.13 breaking current (of a semiconductor contactor) a general term used to designate the value of current in a pole of a semiconductor contactor: a) for a.c., the r.m.s. value of the current immediately before the change from the “on-state”
34、 to the “off-state”; b) for d.c., the value of the current just before the turn-off is initiated. 1) Whenever reference is made to IEC Publication158-1, the clause with the same clause number applies, in some instances modified by the text which follows, it being understood that the word “contactor”
35、 shall be replaced by “semiconductor contactor”. 2) Essential Ratings and Characteristics of Semiconductor Devices and General Principles of Measuring Methods, Part0:General and Terminology.BS5424-2:1987 2 BSI 11-1999 2.1.14 breaking capacity (of a semiconductor contactor) for a.c., the r.m.s. value
36、 of the maximum breaking current of a semiconductor contactor which will cease to flow when the control initiating the “on-state” is removed and for d.c., the maximum current that can be turned off when the “turn off” signal is applied and the “turn on” signal is removed, at a stated value of voltag
37、e under prescribed conditions of use and behaviour 2.1.15 making capacity see IEC Publication158-1 2.1.16 Recovery voltage See IEC Publication158-1. 2.1.16.1 transient recovery voltage see IEC Publication158-1 2.1.16.2 power-frequency recovery voltage see IEC Publication158-1 2.1.17 short-time withs
38、tand current the current that a semiconductor contactor can carry in the on-state during a specified short-time under prescribed conditions of use and behaviour 2.1.18 over-current see IEC Publication158-1 2.1.19 overload see IEC Publication158-1 2.1.20 conductive part see IEC Publication158-1 2.1.2
39、1 Clearance See IEC Publication158-1. 2.1.21.1 clearance between poles see IEC Publication158-1 2.1.21.2 clearance to earth see IEC Publication158-1 2.1.21.3 (Vacant) 2.1.22 creepage distance see IEC Publication158-1 2.1.23 exposed conductive part a conductive part which can be touched readily and w
40、hich normally is not live, but which may become live under fault conditions NOTETypical exposed conductive parts are walls of enclosures, operating handles, etc. 2.1.24 ambient air temperature see IEC Publication158-1 2.1.25 maximum on-state current for one-half a cycle the peak value of the current
41、 which a semiconductor contactor can carry in the on-state for half a cycle of the supply voltage without losing its ability to perform as intended 2.1.26 off-state leakage current I L the maximum current which flows through the main circuit of a semiconductor contactor in the off-state 2.1.27 minim
42、um load current the minimum operational current in the main circuit which is necessary for correct action of a semiconductor contactor in the on-state NOTEThe minimumload current should be given as r.m.s. value. 2.2 Definitions concerning states, control and auxiliary circuits of a semiconductor con
43、tactor 2.2.1 inactive state the condition of a semiconductor contactor without any control signal 2.2.2 control circuit (of a semiconductor contactor) all the conductive parts (conductors, resistors, capacitors, coils, diodes, etc.) of a semiconductor contactor intended to be included in a circuit (
44、other than the main circuit) used to initiate the making and breaking operation of the semiconductor contactor 2.2.3 (Vacant) 2.2.4 auxiliary circuit all the conductive parts (conductors, resistors, capacitors, contacts, diodes, etc.) of a semiconductor contactor intended to be included in a circuit
45、 other than the main circuit and the control circuits of the semiconductor contactorBS5424-2:1987 BSI 11-1999 3 NOTESome auxiliary circuits serve supplementary requirements such as signalling, interlocking, cooling, etc. and, as such, they may be part of the control circuit of another switching devi
46、ce. 2.2.5 auxiliary contact a contact included in an auxiliary circuit of a semiconductor contactor and operated by the contactor 2.2.6 (Vacant) 2.2.7 (Vacant) 2.2.8 ON-state the condition of a semiconductor contactor when the conduction current can flow through its main circuit 2.2.9 OFF-state the
47、condition of a semiconductor contactor when no control signal is applied and no current exceeding the OFF-state leakage current I Lflows through the main circuit NOTESemiconductor contactors may not provide in the OFF-state a contact gap in the main circuit. Therefore, the main circuit on the load s
48、ide shall be considered to be live. 2.2.10 operation (of a semiconductor contactor) the transition from the ON-state to the OFF-state or the reverse 2.2.11 operating cycle (of a semiconductor contactor) a succession of operations from one state to the other and back to the first state NOTEA successi
49、on of operations not forming an operating cycle is referred to as an operating series. 2.2.12 making operation an operation by which the semiconductor contactor is brought from the OFF-state to the ON-state 2.2.13 breaking operation an operation by which the semiconductor contactor is brought from the ON-state to the OFF-state 3 Classification 3.1 (Vacant) 3.2 According to the cooling system, semiconductor contactors can be divided into different groups, for example natural cooling, forced air cooling, liquid cooling. The cooling sy
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