1、BRITISH STANDARD BS 6493-2.3: 1987 IEC 748-3: 1986 Incorporating Amendments Nos. 1, 2 and 3 Semiconductor devices Part 2: Integrated circuits Section 2.3 Recommendations for analogue integrated circuits ICS 31.200BS6493-2.3:1987 This British Standard, having been prepared under the directionof the E
2、lectronic Components Standards Committee, was published underthe authority of the Board ofBSI and comes into effect on 30January1987 BSI 01-2000 ISBN 0 580 15790 3 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Sta
3、ndards Committee (ECL/-) to Technical Committee ECL/17, upon which the following bodies were represented: British Broadcasting Corporation British Telecommunications plc Business Equipment Trade Association Electronic Components Industry Federation Electronic Engineering Association GAMBICA (BEAMA L
4、td) Ministry of Defence National Supervising Inspectorate Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No. Date of issue Comments 7035 July 1992 8240 August 1994 9298 February 1997 Indicated
5、 by a sideline in the marginBS6493-2.3:1987 BSI 01-2000 i Contents Page Committees responsible Inside front cover National foreword vi Chapter I: General 1 Introductory note 1 2 Purpose 1 Chapter II: Terminology and letter symbols 1 General terms 2 2 Terms related to ratings and characteristics 2 2.
6、1 Linear amplifiers 2 2.2 Voltage and current regulators 6 2.3 Analogue signal switching circuits 9 2.4 Integrated circuit microwave amplifiers (under consideration) 10 3 Letter symbols 11 3.1 Linear amplifiers 11 3.2 Voltage and current regulators 12 3.3 Analogue signal switching circuits 13 3.4 In
7、tegrated circuit microwave amplifiers 13 Figure 1 5 Figure 54 Load regulation %V O /V Oas a function of output current I O 7 Figure 2 14 Chapter III: Essential ratings and characteristics Section 1. Standard format for the presentation of published data 1 Function 15 2 Description of circuit 15 3 Ra
8、tings (limiting values) 15 4 Recommended operating conditions 15 5 Electrical characteristics 16 6 Mechanical characteristics and other data 16 7 Application data 16 Section 2. Operational amplifiers (having two inputs and one output) 1 Function 16 2 Description of circuit 17 3 Ratings (limiting val
9、ues) 17 4 Recommended operating conditions 18 5 Electrical characteristics 18 6 Mechanical characteristics and other data 22 7 Application data 22 Section 3. Audioamplifiers, videoamplifiers and multichannel amplifiers fortelecommunications 1 Function 23 2 Description of circuit 23 3 Ratings (limiti
10、ng values) 23 4 Recommended operating conditions 24 5 Electrical characteristics 24 6 Mechanical characteristics and other data 28 7 Application data 28BS6493-2.3:1987 ii BSI 01-2000 Page Section 4. R.F and I.F. amplifiers 1 Function 28 2 Description of circuit 28 3 Ratings (limiting values) 28 4 Re
11、commended operating conditions 29 5 Electrical characteristics 30 6 Mechanical characteristics and other data 32 7 Application data 32 Section 5. Voltage and current regulators 1 Function 32 2 Description of circuit 32 3 Ratings (limiting values) 32 4 Recommended operating conditions 33 5 Electrical
12、 characteristics 34 6 Mechanical characteristics and other data 36 7 Application data (under consideration) 36 Section 6. Analogue signal switching circuits 1 Functional specifications 37 2 Description of circuit 38 3 Ratings (limiting values) 38 4 Recommended operating conditions 39 5 Electrical ch
13、aracteristics 40 6 Mechanical characteristics and other data 45 7 Application data 45 Section 7. Control circuits for switch-mode power supplies 1 General 45 2 Electrical and functional description of the circuits 46 3 Ratings (limiting values), electrical and thermal 46 4 Recommended operating cond
14、itions 47 5 Electrical characteristics 48 5.1 Characteristics at ambient or case temperature of25 C 48 5.2 Effects of supply voltage or temperature variations on the essentialcharacteristics 49 6 Mechanical ratings, characteristics and other data 49 7 Handling precautions 49 8 Application data, supp
15、lementary information 49 Section 8. Dual-tone multifrequency oscillator circuits 1 Circuit identification and description 51 2 Functional specifications 51 3 Ratings (limiting values) 52 3.1 Electrical limiting values 53 3.2 Temperatures 53 4 Recommended operating conditions (within the specified op
16、erating temperature) range 53 5 Electrical characteristics 53 5.1 Static characteristics at ambient or reference-point temperature of 25 C 53 5.2 Dynamic characteristics at ambient or reference-point temperature of 25 C 55BS6493-2.3:1987 BSI 01-2000 iii Page 5.3 Effects of variation of supply voltag
17、e(s) and temperature on the essential characteristics 56 6 Mechanical characteristics and other data 56 7 Application data 56 Figure 3 Example of response times of linear amplifiers 20 Figure 4 Minimum and maximum values for gain versus frequency 26 Figure 5 Minimum and maximum values for group-dela
18、y versus frequency 26 Figure 6 38 Figure 46 Block diagram (example) 50 Figure 47 Example for terminal arrangement 52 Chapter IV: Measuring methods Section 1. General 1 Basic requirements 57 2 Specific requirements 57 3 Application matrix 57 Section 2. Linear amplifiers (including operational amplifi
19、ers) 1 Specific requirements 58 2 Power supply currents 61 3 Small-signal input impedance ? 61 4 Output impedance 65 5 Input offset voltage of a differential-input linear amplifier and bias voltage of a single-ended-input linear amplifier A B 67 6 Input offset current C 70 7 Input bias current D 73
20、8 Input offset voltage temperature coefficient E 77 9 Input offset current temperature coefficient F 78 10 Open-loop voltage amplification G 78 11 Cut-off frequency (frequencies) H 81 12 Common-mode rejection ratio I 82 13 Supply voltage rejection ratio J 87 14 Output voltage range (d.c.measurement
21、only) for differential amplifiers K 90 15 Response times O 91 16 Common-mode input voltage range R 94 17 Short-circuit output current (of an operational amplifier) S 95 18 Cross-talk attenuation (for multiple amplifiers) T 96 19 Upper limiting frequency for full output voltage swing U 97 20 Maximum
22、rate of change of the output voltage (slew rate) V 98 21 Input bias current temperature coefficient W 101 22 Cut-off frequency, unity-gain frequency _ 101 23 Admissible phase margin (against self-oscillation) j 103 Section 3. Voltage regulators, excluding two-terminal (single-port) devices 1 Specifi
23、c requirements 107 2 Input regulation coefficient and input stabilization coefficient 4 107 3 Ripple rejection ratio 5 109 4 Load regulation coefficient and load stabilization coefficient 6 109 5 Output noise voltage 7 110 6 Temperature coefficient of regulated output voltage 8 111BS6493-2.3:1987 iv
24、 BSI 01-2000 Page 7 Stand-by current (quiescent current) 9 112 8 Short-circuit current : 113 9 Reference voltage ; 113 10 Transient response to changes of input voltage 114 11 Transient response to changes of load current = 116 12 Output voltage drift 116 Section 4. Analogue signal switching circuit
25、s 1 Static on-state resistance 118 2 Control feedthrough voltage a 120 3 Off-state switch isolation b 122 4 Harmonic distortion c 123 5 Cross-talk attenuation d 125 6 Turn-on time and turn-off time 126 7 Off-state and on-state currents 128 Figure 7 Basic block diagram for automatic testing 60 Figure
26、 8 Measurement circuit with input terminals unbalanced 61 Figure 9 Measurement circuit with input terminals balanced 62 Figure 10 Equivalent circuit representation 62 Figure 11 General measurement circuit 64 Figure 12 Measurement circuit for output impedance 65 Figure 13 Equivalent circuit for outpu
27、t impedance measurement 66 Figure 14 Differential inputs 67 Figure 15 Single-ended input 67 Figure 16 General measurement circuit 69 Figure 17 Measurement circuit 70 Figure 18 General measurement circuit 72 Figure 19 Measurement circuit for differential inputs 73 Figure 20 Single-ended input 74 Figu
28、re 21 General measurement circuit 76 Figure 22 Measurement circuit 78 Figure 23 General measurement circuit 80 Figure 24 Measurement circuit 82 Figure 25 Measurement circuit 83 Figure 26 General measurement circuit 84 Figure 27 General measurement circuit 88 Figure 28 General measurement circuit 90
29、Figure 29 Measurement circuit 92 Figure 30 Example of response times 93 Figure 32 Measurement circuit 95 Figure 33 Measurement circuit for two amplifiers (A and B) of a multiple operational amplifier 96 Figure 34 Measurement circuit 97 Figure 35 Measurement circuit 99 Figure 36 Example of response t
30、imes 100 Figure 37 Measurement circuit 101 Figure 38 Typical frequency response curve 103 Figure 48 Measurement of phase margin : sand phase angle 104 Figure 49 Example of gain reduction at frequencies above cut-off 106BS6493-2.3:1987 BSI 01-2000 v Page Figure 39 Measurement circuit 108 Figure 40 Tr
31、ansient response to changes of input voltage (example) 115 Figure 41 Transient response to changes of load current (example) 118 Figure 50 Measurement of static on-state resistance of an analogue signal switching circuit 119 Figure 42 Measurement of control feedthrough voltage between control input
32、and signal output of analogue signal switching circuit 120 Figure 43 Measurement of control feedthrough voltage between control input and signal output of analogue signal switching circuit 121 Figure 44 Measurement of off-state switch isolation of a channel of ananalogue signal switching circuit 122
33、 Figure 51 Measurement of distortion, sinewave response, of an analoguesignal switching circuit 124 Figure 45 Measurement of crosstalk attenuation between channels ofananalogue signal switching circuit 125 Figure 52 127 Figure 53 Measurement of turn-on time and turn-off time of analogue signal switc
34、hing circuits 128 Figure 55 Measurement of the off-state input or output currents (of analogue signal switching circuits) 128 Figure 56 Measurement of the on-state switch input current (for analogue signal switching circuits) 129 Table I Application matrix 57 Chapter V: Acceptance and reliability Se
35、ction 1. Electrical endurance tests 1 General requirements 130 2 Specific requirements 130 Table I Failure-defining characteristics for acceptance after endurance tests 130 Table II Conditions for the endurance tests 130 Publications referred to Inside back coverBS6493-2.3:1987 vi BSI 01-2000 Nation
36、al foreword This Section of BS6493 has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication748-3:1986 “Semiconductor devices. Integrated circuits Part3:Analogue integrated circuits” incorporating amendment1:1991, amendment2:1994 and
37、 corrigendum June1996 to amendment2:1994, published by the International Electrotechnical Commission (IEC). This British Standard constitutes Section2.3 of the British Standard for semiconductor devices (BS6493). BS6493 is identical with IEC Publications747,748 and749 and will be issued in a series
38、of separately published Sections corresponding to the individual Parts of the IEC publications. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not
39、identical with those used in British Standards; attention is drawn especially to the following: Wherever page numbers are quoted, they are IEC page numbers. The Technical Committee has reviewed the provisions of IEC747-7, to which reference is made in Section6 of Chapter III, and has decided that th
40、ey are acceptable for use in conjunction with this standard. Textual error. When adopting the text of the International Standard, the textual error given below was discovered. It has been marked in the text and has been reported to IEC in a proposal to amend the text of the International Standard. I
41、n chapter III, section7, in2.1 the reference to “Figure 1” should be read as“Figure 46”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of
42、 itself confer immunity from legal obligations. Cross-references International Standards Corresponding British Standards BS 6493 Semiconductor devices: discrete devices and integrated circuits IEC 747-1:1983 Section 1.1:1984 General (Identical) IEC 748-1:1984 Section 2.1:1985 General (Identical) Sum
43、mary of pages This document comprises a front cover, an inside front cover, pagesi tovi, pages1to130, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front
44、 cover.BS6493-2.3:1987 BSI 01-2000 1 Chapter I: General 1 Introductory note As a rule, it will be necessary to use Publications747-1 and748-1 together with the present publication. In Publications747-1 and748-1, the user will find all basic information on: terminology; letter symbols; essential rati
45、ngs and characteristics; measuring methods; acceptance and reliability. The sequence of the different chapters in the present publication is in accordance with Publication747-1, Chapter III, Sub-clause 2.1. 2 Purpose The present publication gives standards on the following sub-categories of analogue
46、 integrated circuits: operational amplifiers (having two inputs and one output); audioamplifiers, videoamplifiers and multichannel amplifiers for telecommunications; R.F. and I.F. amplifiers; voltage and current regulators; analogue signal switching circuits.BS6493-2.3:1987 2 BSI 01-2000 Chapter II:
47、 Terminology and letter symbols 1 General terms 1.1 Voltage regulator An integrated circuit that operates so that the load voltage remains relatively independent of load current or input voltage fluctuations. NOTEThe range of load current can usually be extended by the use of additional external com
48、ponents. 1.2 Current regulator An integrated circuit that operates so that the load current remains relatively independent of load resistance or input voltage fluctuations. NOTEThe range of load resistance can usually be extended by the use of additional external components. 1.3 Crosstalk in data ch
49、annels, general 1.3.1 Crosstalk (signal) in a data channel An undesired signal appearing in a disturbed channel as a result of coupling from a disturbing channel. 1.3.2 Output (input) crosstalk (in a data channel) The crosstalk signal present at the input (output) of the disturbed channel. NOTEThe letter symbol consists of the letter symbol for the relevant signal carrier, to which the letter x is added as last subscript. Example: V ix ,
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