BS 9940-03 0-1983 Harmonized system of quality assessment for electronic components - Fixed resistors for use in electronic equipment - Sectional specification fixed precision resi.pdf

1、BRITISH STANDARD BS9940-03.0: 1983 IEC115-5: 1982 QC400300: 1982 Harmonized system ofquality assessment for electronic components Fixedresistors for usein electronic equipment Part03.0: Sectional specification: Fixed precision resistors IEC title: Fixed resistors for use in electronic equipment Part

2、5:Sectional specification: Fixed precision resistors UDC 621.316.8:621.38BS9940-03.0:1983 This BritishStandard, having been prepared under the directionof the Electronic Components Standards Committee, was published underthe authority of the BoardofBSI and comesintoeffecton 31October1983 BSI 01-2000

3、 The following BSI references relate to the work on this standard: Committee reference ECL/4 Draft for comment79/21297DC ISBN 0 580 13413 X Committees responsible for this standard The preparation of this BritishStandard was entrusted by the Electronic Components Standards Committee (ECL/-) to Techn

4、ical Committee ECL/4 upon which the following bodies were represented: British Telecommunications Electronic Components Industry Federation Electronic Engineering Association Ministry of Defence National Supervising Inspectorate Society of British Aerospace Companies Limited Telecommunication Engine

5、ering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No. Date of issue CommentsBS9940-03.0:1983 BSI 01-2000 i Contents Page Committees responsible Inside front cover National foreword ii Section 1. General 1 General 1 1.1 Scope 1 1.2 Object 1 1.3 Related documents 1 1.

6、4 Information to be given in a detail specification 1 Section 2. Preferred ratings, characteristics and test severities 2 Preferred ratings, characteristics and test severities 2 2.1 Preferred characteristics 2 2.2 Preferred values of ratings 3 2.3 Preferred test severities 4 Section 3. Quality asse

7、ssment procedures 3 Quality Assessment Procedures 5 3.1 Structurally Similar Components 5 3.2 Qualification Approval 5 3.3 Quality Conformance Inspection 11 Table I 3 Table II 3 Table III Test schedule for Qualification Approval 7 Table IV A 11 Table IV B 11 Publications referred to Inside back cove

8、rBS9940-03.0:1983 ii BSI 01-2000 National foreword This Part of this BritishStandard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication115-5 QC400300 “Fixed resistors for use in electronic equipment. Part5: Sectional specifica

9、tion: Fixed precision resistors”, published in 1982 by the International Electrotechnical Commission (IEC). This standard is a harmonized specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the International Standard has been

10、 approved as suitable for publication as a BritishStandard without deviation. Some terminology and certain conventions are not identical with those used in BritishStandards; attention is drawn especially to the following. For the purposes of this Part of BS99401.1 and1.2 should be regarded as consti

11、tuting the scope of the standard. Cross references The BritishStandard harmonized with QC001001 and QC001002 is BS9000 “General requirements for a system for electronic components of assessed quality” Part1:1981 “Specification of basic rules and procedures.” A British Standard does not purport to in

12、clude all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding BritishStandard IEC63:1963 BS2488:1966 Schedu

13、le of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment (Technically equivalent) IEC68 BS2011 Basic environmental testing procedures IEC68-1:1982 Part1.1:1983 General and guidance (Identical) IEC115-1:1982 (QC400000:1982) BS9940 Fixed

14、 resistors for use in electronic equipment Part0:1983 Generic specification (Identical) IEC410:1973 BS6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to1

15、2, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS9940-03.0:1983 BSI 01-2000 1 Section 1. General 1 General 1.1 Scope This standard applies

16、to fixed precision resistors for use in electronic equipment. 1.2 Object The object of this standard is to prescribe preferred ratings and characteristics and to select from IEC Publication115-1 (1982), the appropriate quality assessment procedures, tests and measuring methods and to give general pe

17、rformance requirements for this type of resistor. Test severities and requirements prescribed in detail specifications referring to this sectional specification shall be of equal or higher performance level, because lower performance levels are not permitted. 1.3 Related documents IEC publications N

18、OTEThe above references apply to the current editions except for IEC Publication68, for which the referenced edition in the applicable test clauses of the generic specification shall be used. 1.4 Information to be given in a detail specification Detail specifications shall be derived from the releva

19、nt blank detail specification. Detail specifications shall not specify requirements inferior to those of the generic, sectional or blank detail specification. When more severe requirements are included, they shall be listed in Sub-clause1.8 of the detail specification and indicated in the test sched

20、ules, for example by an asterisk. NOTEThe information given in the Sub-clauses 1.4.1 and1.4.3 may, for convenience, be presented in tabular form. The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropria

21、te clause of this sectional specification. 1.4.1 Outline drawing and dimensions There shall be an illustration of the resistor as an aid to easy recognition and for comparison of the resistor with others. Dimensions and their associated tolerances, which affect interchangeability and mounting, shall

22、 be given in the detail specification. All dimensions shall preferably be stated in millimetres, however when the original dimensions are given in inches, the converted metric dimensions in millimetres shall be added. Normally the numerical values shall be given for the length of the body, the width

23、 and height of the body and the wire spacing or, for cylindrical types, the body diameter, and the length and diameter of the terminations. When necessary, for example when in a detail specification more than one dissipation value is covered, the dimensions and their associated tolerances shall be p

24、laced in a table below the drawing. When the configuration is other than described above, the detail specification shall state such dimensional information as will adequately describe the resistor. When the resistor is not designed for use on printed boards, this shall be clearly stated in the detai

25、l specification. Publication63: (1963) Preferred Number Series for Resistors and Capacitors. Amendment No.1 (1967) Amendment No.2 (1977) Publication68: Basic Environmental Testing Procedures. Publication115-1: (1982) Fixed Resistors for Use in Electronic Equipment. Part1: Generic Specification. Publ

26、ication410: (1973) Sampling Plans and Procedures for Inspection by Attributes. Publication001001: (1981) Basic Rules of the IEC Quality Assessment System for Electronic Components (IECQ). Publication001002: (1981) Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IEC

27、Q).BS9940-03.0:1983 2 BSI 01-2000 1.4.2 Mounting The detail specification shall specify the method of mounting to be applied for normal use and for the application of the vibration and the bump or shock tests. The resistors shall be mounted by their normal means. The design of the resistor may be su

28、ch that special mounting fixtures are required in its use. In this case, the detail specification shall describe the mounting fixtures and they shall be used in the application of the vibration and bump or shock tests. 1.4.3 Style (IEC Publication115-1, Sub-clause 2.2.3) For the purpose of this stan

29、dard, the style is a combination of rated dissipation and temperature characteristic (or coefficient) of resistance. It shall be represented by a double-letter code e.g.AB, BC, CD, etc. which is arbitrarily chosen for each dissipation/temperature characteristic combination covered by a detail specif

30、ication. The style designation, therefore, has no meaning unless the number of the detail specification is also given. 1.4.4 Ratings and characteristics The ratings and characteristics shall be in accordance with the relevant clauses of this specification together with the following: 1.4.4.1 Rated r

31、esistance range See Sub-clause2.2.1. The preferred values are those of the E-series of IEC Publication63. NOTEWhen products approved to the detail specification have different ranges, the following statement should be added: “The range of values available in each style is given in the qualified prod

32、ucts list”. 1.4.5 Marking The detail specification shall specify the content of the marking on the resistor and on the package. Deviations from Sub-clause2.4 of the Generic Specification, IEC Publication115-1, shall be specifically stated. Section 2. Preferred ratings, characteristics and test sever

33、ities 2 Preferred ratings, characteristics and test severities 2.1 Preferred characteristics The values given in detail specifications shall preferably be selected from the following: 2.1.1 Preferred climatic categories The resistors covered by this specification are classified into climatic categor

34、ies according to the general rules given in IEC Publication68-1. The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following: The severities for the cold and dry heat tests are the lower and upper category temperatures respectively

35、. Because of the construction of some resistors, these temperatures will occur between two of the preferred temperatures given in IEC Publication68-2. In this event the nearest preferred temperature within the actual temperature range of the resistor shall be chosen for this severity. 2.1.2 Temperat

36、ure coefficients and temperature characteristics of resistance The preferred limits of change in resistance for the temperature characteristic of the resistance test are given in Table I. Each line in the table gives the preferred temperature coefficient and corresponding temperature characteristic

37、for20 C to70 C and limits of change in resistance for the measurement of the temperature characteristic of resistance (seeIEC Publication115-1, Sub-clause 4.8) on the basis of the category temperature ranges of Sub-clause2.1.1 of this sectional specification. Lower category temperature: 55 C,40 C,25

38、 C and10 C Upper category temperature: +85 C,+100 C,+125 C and+155 C Duration of the damp heat, steady-state test: 4,10,21 and56daysBS9940-03.0:1983 BSI 01-2000 3 Table I 2.1.3 Limits for change in resistance For each stability class the preferred limits for change in resistance for each of the test

39、s listed in the heading of Table II are as indicated. NOTEThe sub-clause numbers in the heading of Table II refer to IEC Publication115-1. Table II 2.2 Preferred values of ratings 2.2.1 Rated resistance SeeIEC Publication115-1, Sub-clause2.2.7. 2.2.2 Tolerances on rated resistance The preferred tole

40、rances on rated resistance are: 1.0%, 0.5%, 0.25%, 0.1%, 0.05%, 0.025%, 0.01% or 10m7. 2.2.3 Rated dissipation The preferred values of rated dissipation, at70 C are:0.05W,0.063W,0.1W,0.125W,0.25W,0.5W,1W, 2W and3W. Temperature coefficient Temperature characteristic 20 C/70 C Temperature characterist

41、ic of resistance (limits of percentage change in resistance) Reference temperature/lower category temperature Reference temperature/upper category temperature 10 6 / C % +20/55 +20/40 +20/25 +20/10 +20/+85 a +20/+100 +20/+125 +20/+155 25 20 15 10 5 0.125 0.1 0.075 0.05 0.025 0.188 0.15 0.113 0.075 0

42、.038 0.15 0.12 0.09 0.06 0.03 0.113 0.09 0.068 0.045 0.023 0.075 0.06 0.045 0.03 0.015 0.162 0.130 0.098 0.065 0.033 0.2 0.16 0.12 0.08 0.04 0.262 0.210 0.158 0.105 0.053 0.338 0.270 0.203 0.135 0.068 NOTEIf measurements are required at additional temperatures, these shall be specified in the detail

43、 specification. a Resistors having an upper category temperature of85 C need not be measured at70 C Long-term tests Short-term tests Stability class in % 4.23 4.24 4.25.1 4.25.3 4.13 Climatic sequence Damp heat, steady state Endurance at70 C Endurance at upper category temperature Overload 4.16 4.18

44、 4.19 4.20 4.21 4.22 Robustness of terminations Resistance to soldering heat Rapid change of temperature Bump Shock Vibration 0.5 0.25 0.1 0.05 (0.5%+0.057) (0.25%+0.057) (0.1%+0.017) (0.05%+0.017) (0.1%+0.017) (0.05%+0.017) (0.02%+0.017) (0.01%+0.017)BS9940-03.0:1983 4 BSI 01-2000 The derated value

45、s of dissipation at temperatures in excess of70 C shall be as indicated by the following curve: A larger area of operation may be given in the detail specification, provided it includes all the area given above. In this event, the detail specification shall state the maximum allowable dissipation at

46、 temperatures other than70 C. All break points on the curve shall be verified by test. 2.2.4 Limiting element voltage The preferred values of limiting element voltage are:75V,100V,150V,200V,250V,350V,500V,750V and1000V d.c. or a.c. r.m.s. 2.2.5 Insulation resistance (Only applicable for types with m

47、ounting devices and described as insulated) Unless otherwise specified in the detail specification, the insulation resistance shall be not less than1G7 after dry heat tests and100M7 after humidity tests. 2.2.6 Isolation voltage (Insulated styles only) Unless otherwise specified in the detail specifi

48、cation, the isolation voltage shall never be less than the peak voltage that could be applied to the element; it shall, therefore, be not less than1.42times the limiting element voltage. 2.3 Preferred test severities Test severities given in detail specifications shall preferably be selected from th

49、e following: 2.3.1 Drying ProcedureI of IEC Publication115-1, Sub-clause 4.3 shall be used. 2.3.2 Vibration Sub-clause 4.22 of IEC Publication115-1, with the following details: The detail specification shall prescribe the mounting method to be used. For resistors with axial leads and intended to be mounted by the leads only, the distance between the body and the mounting point shall be6 1mm. 2.3.3 Low air pressure Sub-c