BS 9940-03 01-1984 Harmonized system of quality assessment for electronic components - Fixed resistors for use in electronic equipment - Blank detail specification fixed precision .pdf

1、BRITISH STANDARD BS9940-03.01: 1984 QC400301 IEC115-5-1: 1983 Specification for Harmonized system ofquality assessment for electronic components Fixed resistors for use in electronicequipment Blankdetailspecification:Fixed precision resistors AssessmentlevelEBS9940-03.01:1984 BSI12-1999 ISBN 0 580 3

2、4152 6 Amendments issued since publication Amd. No. Date CommentsBS9940-03.01:1984 BSI 12-1999 i Contents Page National foreword ii Introduction 1 Section 1. General data 1 General data 3 1.1 Recommended method(s) of mounting 3 1.2 Dimensions, ratings and characteristics 3 1.3 Related documents 3 1.

3、4 Marking 3 1.5 Ordering information 3 1.6 Certified records of released lots 4 1.7 Additional information 4 1.8 Additional or increased severities or requirements to those specified in thegeneric and/or sectional specification 4 Section 2. Inspection requirements 2 Inspection requirements 4 2.1 Pro

4、cedures 4 Table I 3 Table II 4BS9940-03.01:1984 ii BSI 12-1999 National foreword This Part of this BritishStandard has been prepared under the direction of theElectronic Components Standards Committee. It is identical with IECPublication115-5-1 (QC400301): “Fixed resistors for use in electronic equi

5、pment. Blank detail specification: Fixed precision resistors. Assessment levelE” published by the International Electrotechnical Commission (IEC). Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a BritishStandard without deviation.

6、 Some terminology and certain conventions are not identical with those used inBritishStandards. Cross-references. The BritishStandard harmonized with QC001001 and QC001002 is BS9000 “General requirements for electronic components of assessed quality”. In adopting the IEC text as a National Standard

7、it has been noted that there is an omission from boxes2 and4 of the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). This has been drawn to the attention of the IEC TC40 Secretariat and the specification number has been inserted where necessary in this stan

8、dard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS9940-03. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS9000

9、the latter shall take precedence except that the front page layout will be in accordance with BS9000 Circular Letter No15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance w

10、ith a British Standard does not of itself confer immunity from legal obligations. International Standards Corresponding BritishStandards IEC115-1:1982 (QC400000:1982) BS9940 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment: Part0:1983

11、 Generic specification (Identical) IEC115-5:1982 (QC400300:1982) Part03.0:1983 Sectional specification: Fixed precision resistors (Identical) IEC410:1973 BS6001:1972. Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front

12、 cover, an inside front cover, pagesi andii, pages1 to9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS9940-03.01:1984 BSI 12-1999 1 Introduction Blank detail sp

13、ecification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance

14、with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on page 2 correspond to the following information which shall be inserted in the p

15、osition indicated: Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any

16、further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the resistor 5 A short description of the type of resistor. 6 Information on typical construction (wh

17、en applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or internatio

18、nal documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification

19、, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various resistor types.BS9940-03.01:19

20、84 2 BSI 12-1999 1 IEC115-5-1-XXX QC400301-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC115-5-1 QC400301 4 3 FIXED PRECISION RESISTORS 5 Outline drawing: (seeTable I) (First angle projection) 7 Insulated/non-insulated 6 (Other shapes are permitted within the dimensions give

21、n) Assessment level(s): E Stability class:.% 8 Information on the availability of components qualified to this detail specification is given in the Qualified Products List.BS9940-03.01:1984 BSI 12-1999 3 Section 1. General data 1 General data 1.1 Recommended method(s) of mounting (to be inserted) (S

22、eeSub-clause1.4.2 of IEC Publication115-5.) 1.2 Dimensions, ratings and characteristics Table I All dimensions are in millimetres or inches and millimetres. 1.2.1 Derating Resistors covered by this specification are derated according to the following curve: (A suitable curve to be included in the de

23、tail specification) NOTEThe details of the marking of the component and package shall be given in full in the detail specification. 1.3 Related documents 1.4 Marking The marking of the components and package shall be in accordance with the requirements of IECPublication115-1, Sub-clause2.4. NOTEThe

24、details of the marking of the component and package shall be given in full in the detail specification. 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated resistance. b) Tolerance on rated

25、resistance. c) Number and issue number reference of the detail specification and style reference. Style Rated dissipation at70 C (W) Temperature coefficient in10 6 / C Limiting element voltage (Vd.c.ora.c.r.m.s.) Isolation voltage (Vd.c. ora.c. peak) Maximum dimensions d nom. : L D Tol.: Resistance

26、range a .to. Tolerances on rated resistance . .% Climatic category / Low air pressure 8.5kPa(85mbar) Stability class .% Limits for change of resistance: for long-term tests (.%R +.7) for short-term tests (.%R +.7) Temperature coefficient :.10 6 / C a The preferred values are those of the E-series of

27、 IEC Publication63: Preferred Number Series for Resistors and Capacitors. Generic Specification: IEC Publication115-1(1982): Fixed Resistors for Use in Electronic Equipment, Part1: Generic Specification. Sectional Specification: IEC Publication115-5(1982): Part5: Sectional Specification: Fixed Preci

28、sion Resistors.BS9940-03.01:1984 4 BSI 12-1999 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions

29、or increased requirements should be specified only when essential. Section 2. Inspection requirements 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IEC Publication115-5, Sub-clause3.2. 2.1.2 For Qualit

30、y Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Sub-clause4.3 of the Generic Specification,

31、IEC Publication115-1, shall be used. Table II NOTE 1Sub-clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication115-1, except for resistance change requirements, which have to be selected from the Table I and Table II of the sectional specification, as

32、appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Sampling Plans and Procedures for Inspection byAttributes. NOTE 3In this table: p =periodicity (in months) n =sample size c =acceptance criterion (permitted number of defectives) D =destructive ND =non-destructive IL

33、 =inspection level IEC Publication410 AQL =acceptable quality level Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote1) (seeNote2) Group A Inspection (lot-by-lot) Sub-group A1 ND S-4 1.0% 4.4.1 Visual examination As in4.4.1 Legible m

34、arking and as specified in1.4 of this specification Sub-group A2 ND S-4 1.0% 4.4.2 Dimensions (gauging) A gauge-plate of.mm shall be used (if applicable) As specified in Table I of this specification 4.5 Resistance As in4.5.2 Group B Inspection (lot-by-lot) Sub-group B1 ND S-3 1.0% 4.7 Voltage proof

35、 (Insulated resistors only) Method:. No breakdown or flashover BS9940-03.01:1984 BSI 12-1999 5 Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote1) (seeNote2) Sub-group B2 D S-3 2.5% 4.17 Solderability Without ageing Method:.

36、 Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within.s, as applicable 4.13 Overload Test aduration Rated adissipation The applied voltage shall be2.5times the rated voltage or twice the limiting element voltage, whichever is the less s

37、evere Visual examination No visible damage Legible marking Resistance %Ru (.%R + .7) Sub-group B3 ND S-3 2.5% 4.8.4.2 Temperature coefficient of resistance This test is applicable only when a temperature coefficient of resistance of less than 50.10 6 / C is claimed. One cycle of20 C to70 C to20 C on

38、ly :.10 6 / C a SeeSub-clause2.3.4 of the sectional specification. Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Group C Inspection (periodic) Sub-group C1A Half of the sampl

39、e of Sub-group C1 D 3 10 4.16 Robustness of terminations Tensile, bending and torsion tests as applicable Visual examination No visible damage Resistance %Ru (.%R +.7)BS9940-03.01:1984 6 BSI 12-1999 Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and

40、criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c 4.18 Resistance to solderingheat Method:. Visual examination No visible damage Legible marking Resistance %Ru (.%R +.7) Sub-group C1B Other half of the sample ofSub-group C1 D 3 10 4.19 Rapid change of temperature A =Low

41、er category temperature B =Upper category temperature Visual examination Resistance No visible damage %Ru (.%R +.7) 4.20 Bump (or shock, see4.21) Method of mounting see1.1 of this specification Acceleration:390m/s 2 Number of bumps:4000 Visual examination Resistance No visible damage %Ru (.%R +.7) 4

42、.21 Shock (or bump, see4.20) Method of mounting see1.1 of this specification Acceleration:490m/s 2 Duration of pulse:11ms Pulse shape: half-sine Visual examination Resistance No visible damage %Ru (.%R +.7) 4.22 Vibration Method of mounting: see1.1 of this specification Procedure: B4 Frequency range

43、: .Hz to.Hz (see2.3.2 of the sectional specification) Amplitude:0.75mm or acceleration98m/s 2(whichever is the less severe) Total duration:6h Visual examination Resistance No visible damage %Ru (.%R +.7)BS9940-03.01:1984 BSI 12-1999 7 Table II Sub-clause number and Test (seeNote1) D or ND Conditions

44、 of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Sub-group C1 Combined sample ofspecimens of Sub-groups C1A and C1B D 3 20 1 4.23 Climatic sequence Dry heat Damp heat, cyclic, Test Db, firstcycle Cold Low air pressure 8.5kPa(85mbar)

45、Damp heat, cyclic, Test Db, remaining cycles D.C. load (for non-wire-wound types only) Visual examination Resistance Insulation resistance (Insulated resistors only) No visible damage Legible marking %Ru (.%R +.7) R W 100M7 Sub-group C2 D 3 20 1 4.25.1 Endurance at70 C Duration:1000h Examination at4

46、8h,500h and1000h: Visual examination Resistance Examination at1000h: Insulation resistance (Insulated resistors only) No visible damage %Ru (.%R +.7) R W 1G7 If required by the detail specification, the test shall be extended to8000h Examination at2000h,4000h and8000h: Resistance 12 20 %Ru (.%R +.7)

47、 (The results obtained are for information only)BS9940-03.01:1984 8 BSI 12-1999 Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Sub-group C3 ND 3 20 1 4.8 Variation of

48、 resistance with temperature Lower category temperature/20 Cu .% or :.10 6 / C 20 C/upper category temperatureu .% or :.10 6 / C Group D Inspection (periodic) Sub-group D1 D 12 20 1 4.24 Damp heat, steady state 1) Sub-clause4.24.2.1 1st group6 specimens 2nd group7 specimens 3rd group7 specimens 2) S

49、ub-clause4.24.2.2 1st group10 specimens 2nd group10 specimens Visual examination Resistance Insulation resistance (Insulated resistors only) No visible damage Legible marking %Ru (.%R +.7) R W 100M7 Sub-group D2 D 36 20 1 4.4.3 Dimensions (detail) As specified in Table I of this specification 4.25.3 Endurance at upper category temperature Duration:1000h Examination at48h,500h and1000h: Visual examination Resistance Examination at1000h: Insula