BS 9940-04 02-1984 Harmonized system of quality assessment for electronic components - Fixed resistors for use in electronic equipment - Blank detail specification fixed resistor n.pdf

1、BRITISH STANDARD BS9940-04.02: 1984 QC400402 IEC115-6-2: 1983 Specifications for Harmonized system ofquality assessment for electronic components Fixed resistors for use in electronicequipment Blankdetailspecification:Fixed resistor networks with individually measurable resistors of either different

2、resistance values or differentrated dissipations AssessmentLevelEBS9940-04.02:1984 BSI 01-2000 ISBN 0 580 34141 0 Amendments issued since publication Amd. No. Date CommentsBS9940-04.02:1984 BSI 01-2000 i Contents Page National foreword ii Introduction 1 Section 1. General data 1.1 Recommended method

3、(s) of mounting 3 1.2 Dimensions, ratings and characteristics 3 1.3 Related documents 3 1.4 Marking 3 1.5 Ordering information 4 1.6 Certified records of released lots 4 1.7 Additional information 4 1.8 Additional or increased severities or requirements to those specified in thegeneric and/or sectio

4、nal specification 4 Section 2. Inspection requirements 2.1 Procedures 4 Table I 3 Table II 4BS9940-04.02:1984 ii BSI 01-2000 National foreword This part of this BritishStandard has been prepared under the direction of theElectronic Components Standards Committee. It is identical with IECPublication1

5、15-6-2(QC400402): “Fixed resistors for use in electronic equipment. Blank detail specification: Fixed resistor networks with individually measurable resistors of either different resistance values or differentrated dissipations. Assessments level E” published by the International Electrotechnical Co

6、mmission(IEC). This standard is a harmonised specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a BritishStandard without deviation. Some terminolog

7、y and certain conventions are not identical with those used in BritishStandards. Cross-references. The BritishStandard harmonized with IECQ001001 and001002 is BS9000 “General requirements for a system for electronic components of assessed quality”. In adopting the IEC text as a National Standard it

8、has been noted that there is an omission from boxes2 and4 of the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). This has been drawn to the attention of the IEC TC40 Secretariat and the specification number has been inserted where necessary in this standar

9、d. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS9940-04. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BSE9000, t

10、he latter shall take precedence except that the front page layout will be in accordance with BS9000 Circular Letter No.15 dated October1980. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct applica

11、tion. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standards Corresponding BritishStandards IEC63:1963 BS2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equi

12、pment (Technically equivalent) IEC115-1:1982 (QC400000:1982) BS9940: Fixed resistors for use in electronic equipment Part0:1985 Generic specification (Identical) IEC115-6:1983 (QC400400:1983) BS9940: Fixed resistors for use in electronic equipment: Part04:1983 Sectional specification: Fixed resistor

13、 networks with individually measurable resistors (Identical) IEC410:1973 BS6001:1972: Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to8 and a back cover. This st

14、andard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS9940-04.02:1984 BSI 01-2000 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Secti

15、onal Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of det

16、ail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “Inte

17、rnational Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and iss

18、ue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the resistor network 5 A short description of the type of resistor network. 6 Electrical circuit showing all resistors and connections contained in the network. Terminal pin

19、numbers shall be shown. Alternatively, this drawing may be given in an appendix to the detail specification. 7 Information on typical construction (when applicable). NOTEWhen the resistor network is not designed for use in printed board applications, this shall be clearly stated in the detail specif

20、ication in this position. 8 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 9 Application or group of app

21、lications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the gr

22、ouping of the tests does not change. 10 Reference data on the most important properties, to allow comparison between the various resistor network types.BS9940-04.02:1984 2 BSI 01-2000 1 IEC115-6-2-XXX QC400402-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC115-6-2 QC400402 4

23、3 FIXED RESISTOR NETWORKS WITH INDIVIDUALLY MEASURABLE RESISTORS OF DIFFERENT RESISTANCE VALUES OR RATED DISSIPATIONS 5 Outline drawing: (seeTable I) (.angle projection) 8 6 Insulated/non-insulated 7 (Other shapes are permitted within the dimensions given) Assessment level(s): E Stability class:.% 9

24、 Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 10BS9940-04.02:1984 BSI 01-2000 3 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication115-6.) 1.2 Dimension

25、s, ratings and characteristics Table I 1.2.1 Ratings and characteristics of the resistor elements 1.2.2 Ratings and characteristics of the network 1.2.3 Derating Resistors covered by this specification are derated according to the following curve: (A suitable curve to be included in the detail speci

26、fication) NOTESee also Sub-clause2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the components and packing shall be in accordance with the requirements ofIECPublication115-6. Sub-clause1.5. NOTEThe details of the marking of the component and packing shall be g

27、iven in full in the detail specification. Style Rated network dissipation at70 C (W) Isolation voltage between elements (if applicable) (V) Dimensions All dimensions are in millimetres or inches and millimetres. Climatic category / Low air pressure 8.5kPa(85mbar) Generic Specification: IEC Publicati

28、on115-1(1982): Fixed Resistors for use in Electronic Equipment Part1: Generic Specification. Sectional Specification: IEC Publication115-6(1983): Part6: Sectional Specification: Fixed Resistor Networks with Individually Measurable Resistors.BS9940-04.02:1984 4 BSI 01-2000 1.5 Ordering information Or

29、ders for resistor networks covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated element resistances. b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified re

30、cords of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essenti

31、al. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IEC Publication115-6, Sub-clause3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, sev

32、erities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Sub-clause4.3 of the Generic Specification, IEC Publication115-1, shall be used. Table II NOTE 1Sub-clause numbers of tests and perfo

33、rmance requirements refer to the Generic Specification, IEC Publication115-1, except for resistance change requirements, which have to be selected from the Table I and Table II of the sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Samp

34、ling Plans and Procedures for Inspection byAttributes. NOTE 3In this table: p =periodicity (in months) n =sample size c =acceptance criterion (permitted number of defectives) D =destructive ND =non-destructive IL =inspection level IEC Publication410 AQL =acceptable quality level Sub-clause number an

35、d Test (seeNote1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote1) (seeNote2) Group A inspection (lot-by-lot) Sub-group A1 ND S-4 1.0 % 4.4.1 Visual examination As in4.4.1 Legible marking and as specified in1.4 of this specification BS9940-04.02:1984 BSI 01-2000 5 Tab

36、le II Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote1) (seeNote2) Sub-group A2 ND S-4 1.0 % 4.4.2 Dimensions (gauging) As specified inTable I of this specification 4.5Resistance As in4.5.2 Group B inspection (lot-by-lot)

37、Sub-group B1 ND S-3 1.0 % 4.7 Voltage proof (Insulated networks only) Method: . . . No breakdown or flashover Sub-group B2 D S-3 2.5 % 4.17 Solderability Without ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within

38、. s, as applicable 4.19 Rapid change of temperature A= Lower category temperature B =Upper category temperature Visual examination Resistance No visible damage %Ru (.%R+. 7) Sub-group B3 ND S-3 2.5 % 4.8.4.2 Temperature coefficient of resistance This test is applicable only when a temperature coeffi

39、cient of resistance of less than 50.10 6 / C is claimed. One cycle of20 C to70 C to20 C only a:.10 6 / C Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Group C Inspection (per

40、iodic) Sub-group C1A Half of the sample of Sub-group C1 D 3 5 4.16 Robustness of terminations See 2.3.9 of the sectional specification Visual examination No visible damage Resistance %Ru (.% R +. 7)BS9940-04.02:1984 6 BSI 01-2000 Table II Sub-clause number and Test (seeNote1) D or ND Conditions of t

41、est (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c 4.18 Resistance to soldering heat Method:. Visual examination No visible damage Legible marking Resistance %Ru (.% R +. 7) 4.8 Variation of resistance with temperature Lower category temper

42、ature/20 C u .% or !: .10 6 / C 20 C/upper category temperature u .% or !: .10 6 / C 4.13 Overload See 2.3.4 of the sectional specification Visual examination No visible damage Legible marking Resistance %Ru (.% R +. 7) Sub-group C1B Other half of the sample ofSub-group C1 D 3 5 4.19 Rapid change of

43、 temperature A = Lower category temperature B =Upper category temperature Visual examination Resistance No visible damage %Ru (.% R +. 7) 4.22 Vibration Method of mounting: see1.1 of this specification Procedure B4 Frequency range: 10Hzto 500Hz Amplitude:0.75mm or acceleration98m/s 2(whichever is th

44、e less severe) Total duration:6h Visual examination Resistance No visible damage %Ru (.% R +. 7) %R R - %R R -BS9940-04.02:1984 BSI 01-2000 7 Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance require

45、ments (seeNote1) p n c Sub-group C1 Combined sample ofspecimens of Sub-groups C1A andC1B D 3 10 1 4.23 Climatic sequence Dry heat Damp heat, cyclic, TestDb, firstcycle Cold Low air pressure Damp heat, cyclic TestDb, remaining cycles 8.5kPa(85mbar) Visual examination Resistance Insulation resistance

46、between resistor elements (if applicable), see also2.3.6 of the sectional specification Voltage proof between resistor elements (if applicable), see also2.3.7 of the sectional specification No visible damage Legible marking %Ru (.% R +. 7) R W 1G7 No breakdown or flashover Sub-group C2 D 3 5 1 4.25.

47、1 Endurance at70 C See also 2.3.5 of the sectional specification Duration:1000h Examination at48h,500h and1000h: Visual examination Resistance Examination at1000h: Insulation resistance between resistor elements (if applicable), see 2.3.6 of the sectional specification No visible damage %Ru (.% R +.

48、 7) R W 1G7 The test on one sample eachyear, shall be extendedto8000h Examination at2000h,4000h and8000h: Resistance 12 5 %Ru (.% R +. 7) (The results obtained are for information only)BS9940-04.02:1984 8 BSI 01-2000 Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1

49、) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Group D Inspection (periodic) Sub-group D1 D 12 12 1 4.24 Damp heat, steady state See also 2.3.8 of the sectional specification Visual examination Resistance Insulation resistance betweenresistor elements (if applicable), see also2.3.6 of the sectional specification Voltage proof betweenresistor elements (if applicable), see also2.3.7 of the section