BS 9940-05 01-1985 Harmonized system of quality assessment for electronic components - Fixed resistors for use in electronic equipment - Blank detail specification fixed resistor n.pdf

1、BRITISH STANDARD BS9940-05.01: 1985 IEC115-7-1: 1984 QC400501: 1984 Specification for Harmonized system of quality assessment forelectronic components Fixed resistors for use in electronic equipment Part05.01 Blank detail specification: Fixed resistor networks in which not all resistors are individu

2、ally measurable Assessment level EBS9940-05.01:1985 BSI02-2000 ISBN 0 580 34142 9 Amendments issued since publication Amd. No. Date CommentsBS9940-05.01:1985 BSI 02-2000 i Contents Page National foreword ii Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting 3 1.2 Dimensions

3、, ratings and characteristics 3 1.3 Related documents 4 1.4 Marking 4 1.5 Ordering information 4 1.6 Certified records of released lots 4 1.7 Additional information 4 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification 4 Section 2.

4、Inspection requirements 2.1 Procedures 5 Table I 3 Table II For qualifying test networks 5 Table III Reduced schedule for aggregated networks 10BS9940-05.01:1985 ii BSI 02-2000 National foreword This Part of this BritishStandard has been prepared under the direction of the Electronic Components Stan

5、dards Committee. It is identical with IEC Publication115-7-1 (QC400501):1984 “Fixed resistors for use in electronic equipment. Blank detail specification: Fixed resistor networks in which not all resistors are individually measurable. Assessment level E” published by the International Electrotechnic

6、al Committee (IEC). This standard is a harmonized specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a BritishStandard without deviation. Some termi

7、nology and certain conventions are not identical with those used in BritishStandards. Cross-references. The BritishStandard harmonized with QC001001 and QC001002 is BS9000 “General requirements for a system for electronic components of assessed quality Part1:1981 Specification of basic rules and pro

8、cedures”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS9940-05.00. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of

9、BS9000, the latter shall take precedence except that the front page will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance

10、 with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding BritishStandard IEC115-1:1982 (QC400000:1982) BS9940 Fixed resistors for use in electronic equipment Part0:1983 Generic specification (Identical) IEC115-7:1984 (QC400500:1984) BS9

11、940 Fixed resistors for use in electronic equipment Part05.00:1985 Sectional specification: Fixed resistor networks in which not all resistors are individually measurable (Identical) IEC410:1973 BS6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary

12、of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to11 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BS9940-05.01:1985 B

13、SI 02-2000 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall

14、not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page correspond to the follo

15、wing information which shall be inserted in the position indicated. Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of

16、 the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the resistor network 5 A short description of the ty

17、pe of resistor network. Three cases must be considered: the detail specification concerns a style of network which is not a “Qualifying test network” nor an associated one to a “qualifying test network”(seeSub-clause1.6.9 of the Sectional Specification). the detail specification concerns a style of

18、network which could be used as a “Qualifying test network”(seeSub-clause1.6.9 and Sub-clause3.1 of the Sectional Specification). This should be then stated. the detail specification concerns a style of network which could be qualified by association to a “qualifying test network”(seeSub-clause1.6.9

19、and Sub-clause3.1 of the Sectional Specification). This should be stated and the number of the detail specification of the qualifying test network given. 6 Electrical circuit drawing showing all resistors and connections contained in the network. Terminal pin number shall be shown. Individual resist

20、ors shall be marked as R 1 , R 2 , R 3 , etc. 7 Information on typical construction (when applicable). NOTEWhen the resistor network is not designed for use on printed board applications, this shall be clearly stated in the detail specification in this position. 8 Outline drawing with main dimension

21、s which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. Pin1 shall be shown for identification purposes. 9 Application or group of applications cove

22、red and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Subclause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the t

23、ests does not change. 10 Reference data on the most important properties, to allow comparison between the various network types.BS9940-05.01:1985 2 BSI 02-2000 1 IEC115-7-1-XXX QC400501-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC115-7-1 QC400501 4 3 FIXED RESISTOR NETWORK

24、S INWHICHNOT ALL RESISTORS AREINDIVIDUALLY MEASURABLE 5 Outline drawing:(seeTable I) (. angle projection) 8 6 Insulated/non-insulated 7 (Other shapes are permitted within the dimensions given) Assessment level(s): E Stability class: .% 9 Information on the availability of components qualified to thi

25、s detail specification is given in theQualified Products List. 10BS9940-05.01:1985 BSI 02-2000 3 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause1.4.2 of IEC Publication115-7). 1.2 Dimensions, ratings and characteristics Table I 1.2.1 Ratings and charact

26、eristics of the resistor elements 1.2.2 Ratings and characteristics of the network Test method for differential drift In the case of a “qualifying test network”: Range of electrical ratings and characteristics covered (seeSub-clauses1.6.9 and3.1 of the Sectional Specification) Style Rated network di

27、ssipation at70 C (W) Isolation voltage between elements (if applicable) (V) Dimensions All dimensions are in millimetres or inches and millimetres. NOTE 1Other presentations of the above information may be necessary, but the above presentation should be followed as much as possible. NOTE 2In those c

28、ases where the measurement of individual resistive elements is not appropriate, the detail specification shall instead specify the functional characteristics and the methods for their measurement. Climatic category / Low air pressure 8.5kPa(85mbar) Functional characteristics (if applicable) Differen

29、tial resistance/temperature characteristic betweenRx and Ry (if applicable) .% Tolerance on rated ratio between Rx and Ry (ifapplicable) .% Differential resistance change between Rx and Ry (ifapplicable) .%BS9940-05.01:1985 4 BSI 02-2000 1.2.3 Derating Resistors covered by this specification are der

30、ated according to the following curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the components and package shall be in accordance with the requirements of IEC Publicatio

31、n115-7, Sub-clause1.5. NOTEThe details of the marking of the component and package shall be given in full in the detail specification. 1.5 Ordering information Orders for resistor networks covered by this specification shall contain, in clear or in coded form, the following minimum information: a) R

32、ated element resistances and/or functional characteristics. b) Tolerance on rated resistance and/or functional characteristics. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional informati

33、on (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Generic Specification: IEC Publication115-1:1982: Fixed Resistors

34、for Use in Electronic Equipment. Part1: Generic Specification. Sectional Specification: IEC Publication115-7:1984: Part7: Sectional Specification: Fixed Resistor Networks in which Not All Resistors are Individually Measurable.BS9940-05.01:1985 BSI 02-2000 5 Section 2. Inspection requirements 2.1 Pro

35、cedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IECPublication115-7, Sub-clause3.2. 2.1.2 For Quality Conformance Inspection the test schedule Table II and Table III (Table II to be used in the detail specification for the Qualifying Te

36、st Network and Table III to be used in the detail specification for the specific networks) include sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Section Specification. NOTEWhen drying is called for, ProcedureI of the Generic

37、 Specification, IEC Publication115-1, Sub-clause4.3 shall be used. Table II For qualifying test networks NOTE 1Sub-clause numbers of test refer to the Generic Specification for fixed resistors, IEC Publication115-1, except for functional characteristics, resistance ratio, differential resistance/tem

38、perature characteristic which refer to the Sectional Specification. Since performance requirements depend very much on the configuration of the network, they will be given by the detail specification. When appropriate these performance requirements shall be selected from Table I and Table II of the

39、sectional specification. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = destructive ND =

40、non-destructive IL = inspection level IEC Publication410 AQL = acceptance quality level NOTE 4In those cases where the measurement of individual resistive elements is not appropriate, the detail specification shall specify which measurements shall be made. Sub-clause number and Test (see Note1) D or

41、 ND Conditions of test (see Note1) IL AQL Performance requirements (See Note1) (See Note2) Group A inspection (lot-by-lot) Sub-group A1 ND S-4 1.0% 4.4.1 Visual examination As in4.1.1 Legible marking and as specified in1.4 of this specification Sub-group A2 ND S-4 1.0% 4.4.2 Dimensions (gauging) As

42、specified in Table I of this specification 4.5 Resistance (seeNote4) As in4.5.2 1.6.8 Functional characteristics (ifapplicable) 1.6.7 Resistance ratio (ifapplicable) . .% BS9940-05.01:1985 6 BSI 02-2000Table II For qualifying test networks Sub-clause number and Test (see Note1) D or ND Conditions of

43、 test (see Note1) IL AQL Performance requirements (See Note1) (See Note2) Group B inspection (lot-by-lot) Sub-group B1 ND S-3 1.0% 4.7 Voltage proof (Insulatednetworks only) Method: . No breakdown or flashover Sub-group B2 D S-3 2.5% 4.17 Solderability Without ageing Method: . Good tinning, as evide

44、nced by free flowing of the solder with wetting of the terminations or solder shall flow within. s, as applicable 4.19 Rapid change of temperature A : Lower category temperature B : Upper category temperature Visual examination Resistance (seeNote4) No visible damage %Ru (. % R +.7) Sub-group B3 ND

45、S-3 2.5% 4.8.4.2 Temperature coefficient ofresistance This test is applicable only when a temperature coefficient of resistance of less than 50.10 6 / C is claimed. One cycle of20 C to70 C to20 C only !: .10 6 / C 1.6.3a Differential resistance/temperature characteristic (ifapplicable) Lower categor

46、y temperature/20 C 20 C/upper category temperature %R.T.C.u .% %R.T.C.u .%BS9940-05.01:1985 BSI 02-2000 7Table II For qualifying test networks Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterionof acceptability (seeNote3) Performance requirements (se

47、eNote1) p n c Group C inspection (periodic) Sub-group C1A Half of the sample of Sub-group C1 D See2.3.9 of the sectional specification Visual examination Resistance (seeNote4) 3 5 No visible damage %Ru (. %R+.7) 4.16 Robustness of terminations 4.18 Resistance to soldering heat Solder bath method1A V

48、isual examination Resistance (seeNote4) No visible damage Legible marking %Ru (. %R+.7) 4.8 4.13 Variation of resistance with temperature Overload Lower category temperature/20 C 20 C/upper category temperature See2.3.4 of the sectional specification Visual examination Resistance (seeNote4) u .% or

49、!: .10 6 / C u .% or !: .10 6 / C No visible damage Legible marking %Ru (.%R+.7) Sub-group C1B Other half of the sample ofSub-group C1 D 3 5 4.19 Rapid change of temperature A : Lower category temperature B : Upper category temperature Visual examination Resistance (seeNote4) No visible damage %Ru (.%R+.7) 4.22 Vibration Method of mounting: see1.1 of this specification Procedure B4 Frequency range: 10Hz to500Hz Amplitude:0.75mm or acceleration 98 m/s 2(whichever is