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本文(BS CECC 41302-1979 Specification for harmonized system of quality assessment for electronic components - Blank detail specification low power single turn rotary potentiometers (ass.pdf)为本站会员(medalangle361)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

BS CECC 41302-1979 Specification for harmonized system of quality assessment for electronic components - Blank detail specification low power single turn rotary potentiometers (ass.pdf

1、BRITISH STANDARD BS CECC 41302:1979 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Low power single turn rotary potentiometers (Assessment level M)BSCECC41302:1979 BSI01-2000 ISBN 0 580 35573 X Amendments issued since publication Amd. N

2、o. Date CommentsBSCECC41302:1979 BSI 01-2000 i Contents Page National foreword ii Foreword ii 1 Ratings and characteristics 2 2 Marking 3 3 Related documents 3 4 Ordering information 3 5 Certified test records 3 6 Delayed delivery 4 7 Additional information 4 8 Inspection requirements 4 Table 1 2 Ta

3、ble 2 5BSCECC41302:1979 ii BSI 01-2000 National foreword This BritishStandard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee CECC41302 “Blank detail specification: Low power single turn rotary poten

4、tiometers (assessment level M)”. This standard is a harmonized specification within the CECC system. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication, without deviation, as a BritishStandard. Some terminology and certain conventions are no

5、t identical with those used in BritishStandards. Attention is especially drawn to the following. The comma has been used throughout as a decimal marker. In BritishStandards it is current practice to use a full point on the baseline as the decimal marker. Cross references. The BritishStandard harmoni

6、zed with CECC00100 is BSE9000 “General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System” Part1 “Basic rules”. The following International Standards are referred to in the text and for each there is a corresponding BritishSt

7、andards theses are listed below: Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC41300. Detail specification layout. In the event of conflict between the requirements of this specification

8、 and the provisions of BSE9000 the latter shall take precedence except the front cover layout will be in accordance with BS9000 Circular Letter No15 dated August1977. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible

9、 for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding BritishStandard CECC41000:1976 BS CECC41000:1977 Harmonized system of quality assessment for electronic components: Generic specification

10、 for Potentiometers (Identical) CECC41300:1979 BS CECC41300:1979 Harmonized system of quality assessment for electronic components. Sectional specification: Low power single-turn rotary potentiometers (Identical) Summary of pages This document comprises a front cover, an inside front cover, pagesi a

11、ndii, theCECC title page, pageii, pages1 to11 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSCECC41302:1979 ii BSI 01-2000 Foreword The CENELEC Electronic Compon

12、ents Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmon

13、ization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This docume

14、nt has been formally approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for LOW POWER SINGLE TURN ROTARY POTENTIOMETERS (Assessment level M). It should be read in conjunction with document CECC00100: B

15、asic Rule(1974). Preface This blank detail specification was prepared by CECC Working Group4: “Resistors”. In accordance with the requirements of document CECC00100 it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission and in particular on IEC Public

16、ation393-1: Potentiometers. Part1:Terms and methods of test. The text of this blank detail specification was circulated to the CECC for voting in the documents listed below and was ratified by the CECC for printing as a CECC Specification. Document Voting date CECC(Secretariat)437 27 February 1976 C

17、ECC(Secretariat)440 27 February 1976 The text of this document contains the grammatically correct French title which was received after the covers and titles pages had been printed. Future issues of this specification will be correctly titled in French: “Potentiomtres rotatifs monotours faible dissi

18、pation”.BSCECC41302:1979 BSI 01-2000 1 Key for page2 The numbers between square brackets on page2 correspond to the following indications which should be given: Identification of the harmonized detail specification Identification of the potentiometer 1 The name of the National Standards Organization

19、 under whose authority the detail specification is drafted 2 The CECC Symbol and the number allotted to the national detail specification by the CECC General Secretariat 3 The number and issue number of the national generic and sectional specifications 4 The national number of the detail specificati

20、on, date of issue and further information required by the national system, together with any amendment numbers, if issued. 5 A short description of the type of potentiometer and type number 6 Information on typical construction (where applicable) for example: non-wirewound, single turn rotary. 7 An

21、outline drawing with main dimensions which are of importance for interchangeability. Alternatively, this drawing may be given in an appendix to the detail specification. 8 The application or group of applications covered or, preferably, the level of quality assessment covered by the blank detail spe

22、cification. 9 Brief information on the most important properties of the potentiometer to allow comparison between the various potentiometer types intended for the same, or for similar applications.BSCECC41302:1979 2 BSI 01-2000 1 CECC41302 . . . 2 Specification available from : 4 ELECTRONIC COMPONEN

23、TS OF ASSESSED QUALITY IN ACCORDANCE WITH: 3 Outline and dimensions : (First angle projection) 7 LOW POWER SINGLE TURN ROTARY POTENTIOMETERS 5 6 Terminal connections : Assessment level M 8 All dimensions in millimetres 9 Table1 Style Rated dissipation (W at70 C) Limiting element voltage (V d.c. or a

24、.c. r.m.s.) Isolation voltage (V d.c. or a.c. peak) Resistance law A Resistance laws B 0,75mm or 98m/s 2(whichever is the less) Limits of resistance change (- - -%R+- - -7) (a to c) (after1000h electrical endurance test) Starting torque - - -mN.m to - - -mN.m Switch torque (where applicable) - - -mN

25、.m to - - -mN.m Switch rating (where applicable) - - -A; - - - V - - -; Limiting slider current - - -mA Terminal resistance - - -7 Residual resistance (where applicable) - - -7 Minimum effective resistance (where applicable) - - -7BSCECC41302:1979 4 BSI 01-2000 6 Delayed delivery The provisions of3.

26、6 of CECC41000 shall apply except that the Inspection Level shall be reduced toS-2 and (except for carbon composition types) the period shall be extended to two years. The period for carbon composition types shall remain at one year. 7 Additional information (Not for inspection purposes) The detail

27、specification may include information (which is not required to be verified by the inspection procedure) such as circuit diagrams, etc., needed for the clarification of the detail specification. 8 Inspection requirements (See Table 2) 8.1 When drying is called for, ProcedureI of4.2 of CECC41000 shal

28、l be used. 8.2 When it is desired to obtain qualification approval by adopting the fixed sample size procedure, use shall be made of the test schedule given for that purpose in CECC41300. The conditions of test and the performance requirements shall be identical to those prescribed for quality confo

29、rmance inspection in the detail specification. 8.3 In the quality conformance inspection the values representative of the whole approved range shall be tested within one year (Groups A, B and C only). BSCECC41302:1979 BSI 01-2000 5 Table 2 Test (See Note1) D or ND Conditions of Test IL AQL Performan

30、ce Requirements (See Note1) (See Note2) Group A Inspection To be conducted on a sampling basis, lot-by-lot Sub-Group A1 ND S-3 4,0% 4.3.1 Visual inspection As in4.3.1 Sub-Group A2 ND S-3 1,5% 4.3.2 4.5 Marking Element resistance As in4.3.2 As in4.5.1 Sub-Group A3 ND S-3 2,5% 4.15 Rotational noise Me

31、thod A (non-wirewound types) or Method B (wirewound types) k - - - mV k - - -7 Group B Inspection To be conducted on a sampling basis, lot-by-lot Sub-Group B1 ND S-2 2,5% 4.12 4.23.1 Voltage proof Soldering Solderability (Insulated styles only) Solder bath method: Temperature:230 10 C or Soldering i

32、ron method: Soldering iron: Size B Duration:2 0,5s As in4.12.5 The terminations shall be examined for good tinning as evidence by free flowing of the solder with wetting of the terminations Sub-Group B2 ND S-2 2,5% 4.6 4.9 Terminal resistance Resistance law Resistance a to b Resistance b to c Measur

33、ement at50% rotation only k- - - 7 k- - -7 (The detail specification shall prescribe the appropriate test conditions and performance requirements from 2.1.5 of CECC41300) Notes on page 11BSCECC41302:1979 6 BSI 01-2000Table 2 Test (See Note1) D or ND Conditions of Test Sample size & criterion of acce

34、ptability (See Note3) Performance Requirements (See Note1) P n c Group C Inspection To be conducted on a sampling basis, at the periodicity given in column “P” Sub-Group C1 D 3 5 1 4.3.3 4.21 Dimension (gauging) Robustness of terminations The tests appropriate to the type of termination. Visual exam

35、ination Element resistance As specified in the detail specification As in4.21.8 1) %R:k (- - - %R+ - -7) Sub-Group C2 ND 3 5 1 4.16 4.17 Starting torque Switch torque (where applicable) Room temperature - - -mN.m to - - - mN.m As specified in the detail specification Sub-Group C3 D 6 8 1 4.30 Mechan

36、ical endurance (Potentiometers) (See Note4) Number of cycles: - - - Rate: - - - cycles per min Visual examination Element resistance Starting torque Rotational noise Method A (non-wirewound types) or Method B (wirewound types) Sealing (where appropriate) As specified in4.22.3 (Container sealed types

37、 only) As specified in4.22.2.1 NOTEIt is permissible to drill the case to enable a pressure to be applied in each direction. As in4.30.6 %R:k (- - -%R+ - -7) - - - mN.m to - - - mN.m k - - - mV k - - - 7 As in4.22.3 As in4.22.2.1 Notes on page 11BSCECC41302:1979 BSI 01-2000 7Table 2 Test (See Note1)

38、 D or ND Conditions of Test Sample size & criterion of acceptability (See Note3) Performance Requirements (See Note1) P n c 4.31 Mechanical endurance (Switches) (when fitted) (See Note4) Visual examination Switch contact resistance Switch torque Insulation resistance As in4.31.2.1 k - - -m7 Greater

39、than twice the value of starting torque measured in Sub-Group C2 and less than200m.N.m. U1G7 Sub-Group C4 D 6 8 1 4.32.2 Electrical endurance at70 C Duration:1000h Examination at168,500 and1000h Visual examination Element resistance Examination at1000h Insulation resistance (Insulated styles only) R

40、otational noise Method A (non-wirewound types) or Method B (wirewound types) As in4.32.2.6 (1) %R:k (- - -% R+- - -7) U1G7 U - - -mV U - - -7 Group D Inspection To be conducted on a sampling basis, at the periodicity given in column “P” Sub-Group D1 D 12 5 1 4.29 Damp heat, steady state Where potent

41、iometers are designed to be mounted directly on a metal chassis4.20.2.1 shall apply. The first group shall contain one specimen and the second and third groups, two specimens in each. For all other potentiometers4.29.2.2 shall apply. The first group shall contain two specimens and the second group three specimens. Notes on page 11

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