BS CECC 50008-1982 Specification for harmonized system of quality assessment for electronic components Blank detail specification ambient-rated rectifier diodes《电子元器件质量评定协调体系规范 空白详.pdf

1、BRITISH STANDARD BS CECC 50008:1982 Specification for Harmonized system of quality assessment for electronic components Blankdetail specification Ambient-rated rectifier diodesBSCECC50008:1982 BSI12-1999 ISBN 0 580 34064 3 Amendments issued since publication Amd. No. Date CommentsBSCECC50008:1982 BS

2、I 12-1999 i Contents Page National foreword ii Foreword 1 Text of CECC50008 3BSCECC50008:1982 ii BSI 12-1999 National foreword This British Standard has been prepared under the direction of the Electronic components Standard committee. It is identical with CENELEC Electronic components Committee (CE

3、CC) CECC50008 Issue2, “Harmonized system of quality assessment for electronic components. Blank detail specification: Ambient rated rectifier diodes”. It supersedes BSCECC50008:1977 and results from additions and changes which are explained in the preface to the CECC document. This standard is a har

4、monized specification within the CECC system. Theequivalent non-harmonized British Standard in the BS9300 series will eventually be superseded by this standard but, for a period, both standards will continue to exist. It is recognized that the layout proposed herein cannot be applied to all detail s

5、pecifications based on this document. For instance, it may be preferable to indicate the limiting values in the form of a table when several similar devices appear in the same detail specification. NOTETextual error. In box7, on page3, the document quoted as a reference for outlines should be IEC191

6、-2 and not IEC192-2. The error has been reported to CECC in a proposal to amend the text of the International Standard. Scope This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BSCECC50000 in any detail sp

7、ecification for these devices. Detail specification layout The front page of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS9000 Circular Letter No. 15. Terminology and conventions. The text of the CECC specification has been approved as

8、suitable for publication as a British Standard without deviation Some terminology and certain conventions are not idental with those used in British Standards; attention is especially drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current p

9、ractice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard harmonized with CECC00100 is BSE9000 “General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System” Part1 “Basic rules”.

10、The following International Standards are referred to in the text and for each there is a corresponding British Standard; these are as listed below: The Technical Committee has reviewed the provisions of IEC147-2A and IEC147-2H, to which reference is made in the text, and has decided that they are a

11、cceptable for use in conjunction with this standard. A related British Standard for these International Standards is BS9300 “Semiconductor devices of assessed quality: Generic data and methods of test”. International Standard Corresponding British Standard IEC191-2:1966 BS3934:1965 Dimensions of sem

12、iconductor devices (Technically equivalent) CECC50000:1980 BS CECC50000:1981 Harmonized system of quality assessment for electronic components: Generic specification: Discrete semiconductor devices (Identical)BSCECC50008:1982 BSI 12-1999 iii A British Standard does not purport to include all the nec

13、essary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi toiv, theCECC

14、 title page, pagesii toiv, pages1 to9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv blankCECC50008:1982 ii BSI 12-1999 Contents Page Foreword 1 1 Mechanical de

15、scription 3 2 Electrical application 3 3 Levels of quality assessment 3 4 Limiting values 3 5 Electrical characteristics 4 6 Marking 4 7 Ordering information 4 8 Test conditions and quality assessment 5 9 Additional information 9 Figure 1 Current derating curve for a rectifier diode 4 Table A 6 Tabl

16、e B 7 Table C 8 Table D 9CECC50008:1982 BSI 12-1999 iii RECORD OF AMENDMENTS ENREGISTREMENT DES MODIFICATIONS VERZEICHNIS DER NDERUNGEN AMENDMENT No MODIFICATION No NDERUNG Nr. DATE OF ISSUE DATE D EDITION AUSSTELLUNGSDATUM PAGES AFFECTED PAGES CONCERNEES BETROFFENE SEITEN EFFECTIVE DATE MISE EN APP

17、LICATION ANWENDBER AB ENTRY EFFECTUEE EINTRAGUNG DATE-LE-DATUM BY WHOM-PAR-DURCHiv blankCECC50008:1982 BSI 12-1999 1 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to

18、take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark

19、, or Certificate, of conformity. The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national

20、harmonized specifications for AMBIENT RATED RECTIFIER DIODES. It should be read in conjunction with document CECC00100: Basic Rule(1974). At the date of printing of this document the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, theNetherlands,

21、 Norway, Sweden, Switzerland, and theUnitedKingdom. Copies of it can be obtained from the addresses shown on the inside cover. Preface This blank detail specification was prepared by CECC Working Group7; “RECTIFIER DIODES AND THYRISTORS”. It is one of a series of blank detail specifications for disc

22、rete semiconductor devices, relating to the generic specification CECC50000. This Issue2 supersedes Issue1 of1977, the most important changes being: 1) the addition of a Sub-Group A2a to check non-operative devices, which will become obligatory in all existing detail specifications by1st January1981

23、. 2) the addition of requirements for controlled-avalanche diodes. 3) the addition of clauses6, 7 and9. Implementation All qualifications according to Issue1 remain technically valid, as well as all detail specifications prepared in accordance with Issue1 even if they are not completely in line with

24、 items2) and3) above. Before1st January1981, however, all detail specifications shall be amended and their issue number raised by one by any suitable means, to conform with item1). Issue1 will be withdrawn on1st January1982 Lay-out It is recognized that the lay-out proposed cannot be applied to all

25、detail specifications based on this document. For instance, it may be preferrable to indicate the limiting values in the form of a table when several similar devices appear in the same detail specification. Voting The text of this revised blank detail specification was circulated to the CECC for vot

26、ing in the documents listed below, and was ratified by the CECC Management Committee for printing as a CECC specification. Document Voting date Report on the Voting Circulation Date CECC (Secretariat) 922 February1980 CECC (Secretariat) 1021 December1980CECC50008:1982 2 BSI 12-1999 Key for page3 The

27、 numbers between square brackets on page3 correspond to the following indications which should be given: Identification of the detail specification 1 The name of National Standards Organization under whose authority the detail specification is published, and if applicable the organization from whom

28、the DS is available. 2 The CECC Symbol and the number allotted by the CECC General Secretariat to the completed detail specification. 3 The number and issue number of the CECC generic or sectional specification as relevant; also national reference if different. 4 If different from the CECC number, t

29、he national number of the detail specification, date of issue and any further information required by the national system together with any amendment numbers. Identification of the component 5 A short description of the type of component. 6 Information on typical construction (where applicable). 7 O

30、utline drawing and/or reference to the relevant document for outlines. 8 Application or group of applications covered and quality assessment levels. 9 Reference data on the most important properties, to allow comparison between the various component types. For5 and6 the text given should be suitable

31、 for an entry in CECC00200 or CECC00300.CECC50008:1982 BSI 12-1999 3 Specification available from: 1 Page: of : CECC50008 Issue2 2 Electronic component of assessed quality in accordance with 3 4 Detail specification for ambient rated rectifier diodes Type number(s): Structurally similar devices: (if

32、 appropriate) 5 Construction Semiconductor material: Silicon, germanium Encapsulation material: Metal/glass; metal/ceramic, plastic, other 6 1 Mechanical description 7 2 Electrical application 8 Outline references : Rectifying up to a current of5 A. Code A from IEC192-2: 3 Levels of Quality assessme

33、nt National : F L OR: Base and case references : Codes B and C from IEC192-2 : National : AND/OR: Outline drawing Marking: see CECC50000-2.5 Terminal identification: see CECC50000-2.5.1 4 Limiting values (Absolute maximum system) 9 These apply over the operating temperature range, unless otherwise s

34、tated. The following ratings shall be given. 4.1 Voltage: Any Qualification such as time, frequency, temperature, mounting method etc. shall be stated. 4.1.1 Crest working reverse voltage V RWM 4.1.2 Repetitive peak reverse voltage V RRM 4.1.3 Non-repetitive peak reverse voltage V RSM 4.1.4 Continuo

35、us (DC) reverse voltage (if applicable) V R 4.2 Current: Any qualification such as time, frequency, temperature, mounting method etc. shall be stated. 4.2.1 Mean forward current at the breakpoint temperature (seeFigure 1) In single phase circuits, sinusoidal130 conduction angle with resistive load.

36、I F(AV)max. 4.2.2 Repetitive peak forward current (if applicable) I FRM 4.2.3 Continuous (direct) forward current (if applicable) I F 4.2.4 Surge (non-repetitive) forward current I FSM The surge (non-repetitive) forward current corresponds normally to the maximum current permissible for a half sine

37、wave(10ms at50Hz) without reapplication of reverse voltage. The surge (non-repetitive) current rating corresponds to a current applied after continuous operation at the maximum value of the mean forward current. See the current Qualified Products List for availability of components qualified under t

38、his detail specification.CECC50008:1982 4 BSI 12-1999 Limiting values Figure 1 Current derating curve for a rectifier diode 4.3 Temperature: 4.3.1 Ambient temperature Maximum value for which the voltage ratings are specified in4.1 T amb. max. 4.3.2 Storage temperature T stg 4.4 Power: Any qualificat

39、ion such as time, frequency, temperature, mounting method etc. shall be stated. 4.4.1 Maximum peak non-repetitive surge reverse power P RSMmax. 5 Electrical characteristics See8 for inspection The following characteristics shall be given at T amb =25 C, unless otherwise stated 5.1 Forward voltage: M

40、aximum value at the peak current corresponding to ; the rated maximum mean forward current V FM 5.2 Reverse current: Maximum value of the peak reverse current I RMat the rated repetitive reverse voltage V RRM : 5.2.1 At T amb =25 C without forward dissipation I RM1 5.2.2 At T amb. max.without forwar

41、d dissipation I RM2 5.3 Recovery: 5.3.1 Recovered charge (where appropriate) Maximum value or maximum and minimum values under specified conditions Q r 5.3.2 Reverse recovery current (where appropriate) Maximum value under specified conditions I rr 5.4 Avalanche breakdown voltage: Minimum (and for c

42、ontrolled avalanche rectifier diodes maximum) value ataspecified reverse current I RM1 V (BR) 6 Marking Any particular information other than given in boxk on front page and/or2.5 of CECC50000 shall be specified here. 7 Ordering information The following minimum information is necessary to order a s

43、pecific device, unless otherwise specified: precise type number CECC reference of detail specification with issue number and/or date when relevant Level of quality assessment as defined in Appendix II A of CECC50000 and if required, screening sequence as defined in Appendix VI of CECC50000 any other

44、 particulars. example:1N000 to CECC50001-000 Issue2, level F max. min. min. max.CECC50008:1982 BSI 12-1999 5 8 Test conditions and quality assessment 8.1 Test conditions All clause references are made with respect to CECC50000, unless otherwise stated. The test conditions are given in theTable A,Tab

45、le B,Table C andTable D. The values and testconditions marked-shall be specified in the detail specification for a given type. The values and limits to be specified in the detail specification are listed in the column “LIMITS”. The post-test end points (PTE) for the various tests and characteristics

46、 are listed in the following table: Examination or Test Characteristics in: Group A Group C V FM I RM1 V (BR) I RM2 B3 max. max. - - B5 max. max. min. max. - B8 max. +10% max. +100% min.5% max.5% - C2c max. max. min. max. - C4 max. max. - - C8 max. +10% max. +100% min.5% max.5% max. +100% D2 max. ma

47、x. min. max. - 8.2 Quality assessment Formation of inspection lots shall be performed according to 10 of RP 7. For 10.4 exceptions may be permitted by agreement between the chief Inspector and the ONS as prescribed in the detail specification. 8.2.1 Delayed deliveries The maximum storage period for

48、testing and retesting before delivery as prescribed in3.5.7 of CECC50000 has been changed to two years, and the lots shall also satisfy the requirements of Sub-group A1. 8.2.2 Quality conformance inspection The tables refer to two levels of quality assessment arbitrarily designated F and L, it being

49、 understood that there may be other levels specified in other detail specifications. When using the provision for structurally similar devices,3.3 of CECC50000 shall be followed. 8.2.3 Certified Test Records (RCE) In certified test records, attributes information shall be given for the results in the following sub-groups: A1 A2 B3 B4 B5 B8 C2c C4 C8 8.2.4 Qualification approval See3.4 of CECC50000.CECC50008:1982 6 BSI 12-1999 Table A All tests are non-destructive (3.5.6 of