BS CECC 90101-1980 Specification for harmonized system of quality assessment for electronic components Family specification digital integrated TTL circuits series 54 64 74 84《电子元器件.pdf

1、BRITISH STANDARD BS CECC 90101:1980 Incorporating Amendment Nos. 1, 2 and 3 Specification for Harmonized system of quality assessment forelectronic components Family specification Digital integrated TTL circuits Series 54, 64, 74, 84BSCECC90101:1980 BSI 03-2000 ISBN 0 580 35961 1 Amendments issued s

2、ince publication Amd. No. Date of issue Comments 3945 February 1982 5198 August 1986 5616 April 1987 Indicated by a sideline in the marginBSCECC90101:1980 BSI 03-2000 i Contents Page National foreword ii Foreword iii Text of CECC 90101 1BSCECC90101:1980 ii BSI 03-2000 National foreword This British

3、Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)90101 “Family specification: Digital integrated TTL circuits Series 54, 64, 74, 84”. This standard is a harmonized specification within

4、the CECC system. Terminology and conventions. The text of the CECC specification has been accepted as suitable for publication, without deviation, as a British Standard. Certain terminology and conventions are used, however, that are not identical with those used in British Standards. Attention is p

5、articularly drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross references. The British Standard harmonized withCECC00100 is BSE9000 “General requirements for elec

6、tronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System” Part1 “Basic rules”. The following International Standards are referred to in the text and for each there is a corresponding British Standard; these are listed below. Scope. This Standard lists

7、the general information for ratings, characteristics and inspection requirements for a series of integrated circuits which shall be included as mandatory requirements in detail specifications in accordance with BSCECC90000. A British Standard does not purport to include all the necessary provisions

8、of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard CECC 90000:1976 BS CECC 90000:1977 Harmonized system of quality

9、 assessment for electronic components: Generic specification: monolithic integrated circuits (Identical) CECC 90100:1976 BS CECC 90100:1977 Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits (Identical) IEC 191-2:1966 BS

10、 3934:1965 Dimensions of semi-conductor devices (Related) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theCECC title page, pages ii to iv, pages 1 to 7 and a back cover. This standard has been updated (see copyright date) and may have had amendments

11、incorporated. This will be indicated in the amendment table on the inside front cover.BS CECC 90101:1980 ii BSI 03-2000 Contents Page Foreword iii 1 Limiting conditions of use for the family 1 2 Recommended operating conditions and associated characteristics for the family 2 3 Inspection requirement

12、s 2BS CECC 90101:1980 BSI 03-2000 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality.

13、 The object of the System is to facilitate international trade by the harmonization of specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are there

14、by accepted by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to prepare and issue detail specifications for DIGITAL INTEGRATED CIRCUITS. It should be read in conjunction

15、 with document CECC00100: Basic Rules (1974). Preface This family specification was prepared by CECC Working Group9: Integrated Circuits. It contains the general information for the TTL-series54,64,74 and84. Together with the device type detail specification, usually prepared nationally, it forms th

16、e complete detail specification for the device belonging to series54,64,74 or84. The text of this specification was circulated to the CECC for voting in the documents CECC(Secretariat)417 in September1975, CECC(Secretariat)529 in August1976 and CECC(Secretariat)625 in June1977, and was ratified by t

17、he CECC for printing as a CECC specification.iv blankBS CECC 90101:1980 BSI 03-2000 1 Page 1 of 7 CECC-Number Dateofissue ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: National Number CECC 90000: Generic specific., monolithic integrated circuits and Date of issue (if appropriate) CEC

18、C 90100: Sectional Spec., Digital monolithic integr.circuits Family Specification for TTL-Circuits, series 54, 64, 74, 84 Typical construction: Silicon monolithic bipolar cavity and non-cavity package Outline and dimensions: See detail specification for specific type Terminal connections: See detail

19、 specification for specific type Assessment levels R, S, T and V 1 Limiting conditions of use for the family (not for inspection purposes) 1.1 Maximum continuous supply voltage V CC 0,5 V + 7,0 V 1.2 Maximum input voltages 1.2.1 Max input voltage V I 0,5 V + 5,5 V (see individual detail specificatio

20、n) 1.2.2 Max input voltage betweenmultiple emittertransistor inputs V II + 5,5 V 1.3 Minimum and maximum operating ambient temperatures T amb ( C) min max 54 55 + 125 64 40 + 85 74 0 + 70 84 25 + 85 1.4 Minimum and maximum storagetemperatures T stg 65 C + 150 C min max (unless otherwise prescribed i

21、n the detail specification) See the relevant Qualified Parts List for the availability of components qualified to this detail specification.BS CECC 90101:1980 2 BSI 03-2000 2 Recommended operating conditions and associated characteristics for the family (not for inspection purposes) (see also releva

22、nt detail specification) These apply over the operating temperature range, unless otherwise prescribed. 3 Inspection requirements NOTE 1All tests shall be performed at T amb =25 C unless otherwise prescribed. NOTE 2The paragraph numbers refer to the generic specification, unless otherwise prescribed

23、. NOTE 3The following abbreviations are used: 2.1 Positive supply voltage V CC 4,5 V 5,5 V (54) 4,75 V 5,25 V (64, 74, 84) 2.2 Most negative low level input voltage at an input current I IK= 12 mA V IKB 1,5 V 2.3 Minimum value of low level input voltage V ILB 0V 2.4 Maximum value of low level input

24、voltage V ILA 0,8 V 2.5 Minimum value of high level input voltage V IHB 2V 2.6 Maximum value of high level input voltage V IHA 5,5 V 2.7 Most positive low level output voltage at an output currentof1,6mA the higher fanout (unlessotherwisespecified in the detail specification) V OLA 0,4 V 2.8 Most ne

25、gative high level output voltage at an outputcurrentof 40 4A the higher fanout V OHB 2,4 V 2.9 Most positive high level output voltage V OHA 5,5 V (54) 5,25 V(64, 74, 84) 2.10 DC noise margin at low level (V ILA V OLA ) V NL 0,4 V 2.11 DC noise margin at high level (V OHB V IHB ) V NH 0,4 V 2.12 Dyn

26、amic characteristics see relevant detail specification IL = Inspection level AQL = Acceptance Quality level n = fix sample size c = acceptance criteria D = destructive ND = non destructive P = Periodicity n.a. = not applicableBS CECC 90101:1980 BSI 03-2000 3 Examination or test D or ND Test Conditio

27、ns Assessment level Inspection requirements See Note 2 See Note 2 IL AQL Limits See Note 2 Group A Inspection These tests are contained in the detail specification for the individual device type. They comprise the following sub-groups: Sub-group A1 Visual examination 4.2 ND See relevant detail speci

28、fication R, S, T, V I 1,5 See relevant detail spec. Sub-group A2 Verification of the function ND See relevant detail specification R, S T, V II II 0,15 0,25 See relevant detail spec. Sub-group A3 Static characteristics at 25 C ND See relevant detail specification R, S, T, V II 0,65 See relevant deta

29、il spec. Sub-group A4a Static characteristics at maximum operating temperature ND See relevant detail specification R S T, V S-4 S-4 n.a. 1,0 2,5 n.a. See relevant detail spec. Sub-group A4b Static characteristics at minimum operating temperature ND See relevant detail specification R S T, V S-4 S-4

30、 n.a. 1,0 2,5 n.a. See relevant detail spec. Sub-group A5 Dynamic characteristics at25 C ND See relevant detail specification R S, T, V S-4 S-4 1,5 2,5 See relevant detail spec. Group B Inspection Sub-group B1 Dimensions 4.3 ND IEC outline (SeeIEC191-2 and see detail-spec.for specific type) R, S, T,

31、 V S-4 1,0 See relevant detail spec. Sub-group B2 Solderability 4.6.10.1 D Solder bath Noageingrequired R, S, T, V S-3 2,5 4.6.10.1 Sub-group B3 Sealing test (cavity packages) ND R, S, T, V II 1,0 Fine leak 4.6.9.1 Gross leak 4.6.9.2 4.6.9.1 Test Qk 4.6.9.2 Test Qc 4.6.9.1 4.6.9.2 Notes on page 2BS

32、CECC 90101:1980 4 BSI 03-2000 Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2 See Note 2 IL AQL Limits See Note 2 Sub-group B4 R, S, T V S-4 n.a. 2,5 n.a. Change of temperature4.6.8.1 4.6.8.1 Test Na T = T stgmin and max (See relevant detail specificat

33、ion) Endpoint tests 1) for cavity packages: Fine and gross leak test ND Test Qk 4.6.9.1 and Qc 4.6.9.2 2) for non-cavity packages: Damp heat accelerated D Test Da 4.6.3.1 Electrical tests as for sub-groups A2 and A3 as for sub-gr. A2 and A3 of detail spec. Sub-group B5 ND 168 h + 72 h R, S, T V S-4

34、n.a. 1,5 n.a. 10 Electrical endurance4.2 of CECC90100 at T amb= 125 C, unless otherwise stated in the DS but not less than the max. operating temperature. (This may result in the limiting values being exceeded. It shall be ascertained during setting up the DS, if the higher temperature is permissibl

35、e for the duration of the endurance test.) Endpoint test Electricaltest As for Sub-groups A2, A3, A5 as for sub-gr. A2, A3, A5 of detail spec. Notes on page 2BS CECC 90101:1980 BSI 03-2000 5 Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2 See Note 2 P

36、n c Limits See Note 2 Group C Inspection Sub-group C1 Dimensions 4.3 ND IEC outline All dimensions excluding those insub-gr.B1 (see detail spec.for specific type) R, S, T, V 3 18 1 See relevant detail spec. Sub-group C2 Resistance to cleaning solvents 4.4 ND Test X A R, S, T V 3 n.a. to be included

37、later Sub-group C3 Rebustness of terminations 4.6.12.2 D R, S, T, V 3 18 1 4.6.12.2 Force (see relevant detail spec.) 4.6.12.2 no broken terminations Sub-group C4 D 4.6.11 R, S, T, V 3 43 2 Resistance to soldering heat followed by change of temperature 4.6.8.1 or 4.6.8.3 T=T stg min and max (seerele

38、vant detail specification) Endpoint tests 1) for cavity packages: Fine and gross leak test Test Qk 4.6.3.1 Test Qc 4.6.9.2 2) for non-cavity packages: Damp heat accelerated Test Da 4.6.9.2 Electrical tests as for sub-groups A2 andA3 as for sub-gr. A2 and A3 of detail spec. Notes on page 2BS CECC 901

39、01:1980 6 BSI 03-2000 Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2 See Note 2 P n c Limits See Note 2 Sub-group C5 (cavity packages) D R, S, T, V 3 18 1 Shock 4.6.4 4.6.4 Peak acceleration14700 ms 2 Pulse duration 0,5 ms Vibration, swept frequency 4

40、.6.5 4.6.5 Applied in 3 mutual perpendicular axes, approximately 12 cycles in each direction Acceleration, steady state 4.6.7 4.6.7 196000 ms 2axis Y 1 , Y 2 Endpoint tests fine leak 4.6.9.1 gross leak 4.6.9.2 4.6.9.1 Test Qk 4.6.9.2 Test Qc 4.6.9.1 4.6.9.2 Electrical tests as for sub-groups A2 and

41、A3 as for sub-gr. A2 and A3 of detail spec. Sub-groups C6 (cavity packages) D R, S, T, V 3 32 2 Damp heat, steady state 4.6.2 4.6.2 Condition 1 56days Endpoint tests Electrical tests as for sub-groups A2 and A3 as for sub-gr. A2 and A3 of detail spec. Sub-group C7 (non-cavity packages) D Bias condit

42、ions, if required, see relevant detail specification R, S T, V 3 n.a. 32 n.a. 2 n.a. Damp heat, steady state 4.6.2 4.6.2 Condition 3 21days Endpoint tests Electrical tests as for sub-groups A2 and A3 as for sub-gr. A2, A3 of detail spec. Sub-group C8 Electrical endurance4.2 of CECC 90100 ND 1000h at

43、 T amb=125 C, unless otherwise stated in the DS but not less than the max.operating temperature. (This may result in the limiting values being exceeded. It shall be ascertained during setting up the DS, if the higher temperature is permissible for the duration of the endurance test.) R, S, T, V 3 43

44、 2 Endpoint tests Electrical tests as for sub-groups A2, A3 and A5 as for sub-gr. A2 and A3 and A5 of detail spec. Notes on page 2BS CECC 90101:1980 BSI 03-2000 7 Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2 See Note 2 P n c Limits See Note 2 Sub-gr

45、oup C9 ND T = T stg max (see relevant detail specification) R S, T, V 3 n.a. 18 n.a. 1 n.a. Storage at high storage temperature4.6.1.1 4.6.1.1 1000 h Endpoint tests Electrical tests As for sub-groups A2, A3 and A5 as for sub-gr. A2, A3 and A5 of detail spec. Sub-group C10 ND T = T stg min (see relev

46、ant detail specification) R S, T, V 3 n.a. 18 n.a. 1 n.a. Storage at low storage temperature 4.6.1.2 4.6.1.2 1000 h Endpoint tests Electrical tests As for sub-groups A2, A3 and A5 as for sub-gr. A2, A3 and A5 of detail spec. Sub-group C11a ND R, S, T, V 3 8 1 where appropriate, see relevant detail s

47、pec. Dynamic characteristics at max operating temperature where appropriate, see relevant detail specification T = T amb max Sub-group C11b ND where appropriate, see relevant detail specification T = T amb min R, S, T, V 3 8 1 Dynamic characteristics at min operating temperature Sub-group C12a ND T

48、= T amb max R, S T, V n.a. 3 n.a. 18 n.a. 1 as for sub-gr. A4a of detail specification Static characteristics at max operating temperature See relevant detail spec. Sub-group C12b ND T = T amb min R, S T, V n.a. 3 n.a. 18 n.a. 1 as for sub-gr. A4b of detail specification Static characteristics at mi

49、n operating temperature See relevant detail spec. Sub-group C13 D where appropriate see relevant detail specification R, S T, V 3 8 1 where appropriate see relevant detail spec. Salt mist 4.6.14 (where appropriate see relevant detail specification) Group D Inspection Sub-group D1 D R, S T, V 12 20 where appropriate see relevant detail spec. Electrical endurance 4.2 of CECC 90100 See relevant detail specification see relevant detail spec. see relevant detail spec. Notes on page 2BS CECC 90101:1980 BSI 389 Chiswick High Road