1、DRAFT FOR DEVELOPMENTDD ISO/TS 13473-4:2008Characterization of pavement texture by use of surface profiles Part 4: Spectral analysis of surface profiles ICS 17.140.30; 93.080.20g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54
2、g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58DD ISO/TS 13473-4:2008This Draft for Development was published under the authority of the Standards Policy and Strategy Committee on 29 August 2008 BSI 2008ISBN 978 0 580 63521 2National forewordThis Draft for Development i
3、s the UK implementation of ISO/TS 13473-4:2008.This publication is not to be regarded as a British Standard.It is being issued in the Draft for Development series of publications and is of a provisional nature. It should be applied on this provisional basis, so that information and experience of its
4、 practical application can be obtained.Comments arising from the use of this Draft for Development are requested so that UK experience can be reported to the international organization responsible for its conversion to an international standard. A review of this publication will be initiated not lat
5、er than three years after its publication by the international organization so that a decision can be taken on its status. Notification of the start of the review period will be made in an announcement in the appropriate issue of Update Standards.According to the replies received by the end of the r
6、eview period, the responsible BSI Committee will decide whether to support the conversion into an international Standard, to extend the life of the Technical Specification or to withdraw it. Comments should be sent to the Secretary of the responsible BSI Technical Committee at British Standards Hous
7、e, 389 Chiswick High Road, London W4 4AL.The UK participation in its preparation was entrusted by Technical Committee EH/1, Acoustics, to Subcommittee EH/1/2, Transport noise.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not p
8、urport to include all the necessary provisions of a contract. Users are responsible for its correct application.Amendments/corrigenda issued since publicationDate CommentsReference numberISO/TS 13473-4:2008(E)TECHNICAL SPECIFICATION ISO/TS13473-4First edition2008-05-01Characterization of pavement te
9、xture by use of surface profiles Part 4: Spectral analysis of surface profiles Caractrisation de la texture dun revtement de chausse partir de relevs de profils de la surface Partie 4: Analyse spectrale des profils de la surface DD ISO/TS 13473-4:2008ii iiiContents Page Foreword iv Introduction v 1
10、Scope . 1 2 Normative references . 1 3 Terms and definitions. 2 4 Basic outline of methodologies of spatial frequency analysis 6 5 Sampling of surface profiles . 8 5.1 Sampling of road sections. 8 5.2 Measurement of laboratory samples 9 6 General principles and requirements . 9 6.1 Requirements conc
11、erning profilometers .9 6.2 Conversion of spatial frequencies to temporal frequencies 9 6.3 Drop-outs. 11 6.4 Anti-aliasing filtering 12 6.5 Digital sampling 12 7 Spectral analysis in constant-percentage bandwidth bands (octave- or one-third-octave bands) by analogue filtering (Method 1). 13 8 Spect
12、ral analysis in constant-percentage bandwidth bands (octave- or one-third-octave bands) by digital filtering (Method 2) 15 9 Spectral analysis in narrow constant bandwidth bands by means of Discrete (Fast) Fourier Transform methods (Method 3) . 15 9.1 Overview of methodology 15 9.2 Slope and offset
13、suppression . 16 9.3 Windowing. 16 9.4 Discrete Fourier Transform and Power Spectral Density. 18 9.5 Wavelength resolution . 19 10 Transformation of constant bandwidth spectral data to constant-percentage bandwidth spectral data 19 11 Uncertainty of analysis results 21 12 Reporting of analysis resul
14、ts 22 Annex A (normative) Uncertainty of spectral analysis results 23 Annex B (informative) Aliasing .28 Annex C (informative) Estimation of the deviation in energy within a frequency band caused by variations in speed . 30 Annex D (informative) Compensation for speed variations during processing of
15、 the measured data. 31 Annex E (informative) Explanation of the relation between the wavelength resolution and the spatial frequency resolution 32 Annex F (informative) Spectral analysis and profile asymmetry. 33 Bibliography . 35 DD ISO/TS 13473-4:2008iv Foreword ISO (the International Organization
16、 for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has
17、the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. Intern
18、ational Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publicati
19、on as an International Standard requires approval by at least 75 % of the member bodies casting a vote. In other circumstances, particularly when there is an urgent market requirement for such documents, a technical committee may decide to publish other types of document: an ISO Publicly Available S
20、pecification (ISO/PAS) represents an agreement between technical experts in an ISO working group and is accepted for publication if it is approved by more than 50 % of the members of the parent committee casting a vote; an ISO Technical Specification (ISO/TS) represents an agreement between the memb
21、ers of a technical committee and is accepted for publication if it is approved by 2/3 of the members of the committee casting a vote. An ISO/PAS or ISO/TS is reviewed after three years in order to decide whether it will be confirmed for a further three years, revised to become an International Stand
22、ard, or withdrawn. If the ISO/PAS or ISO/TS is confirmed, it is reviewed again after a further three years, at which time it must either be transformed into an International Standard or be withdrawn. Attention is drawn to the possibility that some of the elements of this document may be the subject
23、of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO/TS 13473-4 was prepared by Technical Committee ISO/TC 43, Acoustics, Subcommittee SC 1, Noise. ISO 13473 consists of the following parts, under the general title Characterization of pavement textur
24、e by use of surface profiles: Part 1: Determination of Mean Profile Depth Part 2: Terminology and basic requirements related to pavement texture profile analysis Part 3: Specification and classification of profilometers Part 4: Spectral analysis of surface profiles Technical Specification Part 5: De
25、termination of megatexture DD ISO/TS 13473-4:2008vIntroduction Pavement texture is one of the basic road surface characteristics and as such is related to many functional characteristics, such as noise emission from tyre-road interaction, friction between tyre and road, rolling resistance and tyre w
26、ear. Spectral analysis of measured surface profiles is frequently used as a method of pavement characterization. However, recent practice has shown that the methodology of spectral analysis is not sufficiently well known in the field of pavement measurements to assure reproducible results. Improveme
27、nt of the reproducibility by offering guidance in the form of a standardization document seems therefore advisable. Although the principles of frequency analysis are used in various fields of signal processing, it seems that a tailored elaboration of these principles for the application in the field
28、 of pavement texture measurements is appropriate and will enhance the use of these methods and the quality of the results achieved. This elaboration, in the form of an ISO Technical Specification, is intended to stimulate the international exchange of knowledge and data concerning pavement character
29、istics. DD ISO/TS 13473-4:2008blank1Characterization of pavement texture by use of surface profiles Part 4: Spectral analysis of surface profiles 1 Scope This Technical Specification describes the methods that are available to perform a spectral analysis of pavement surface profile signals. It speci
30、fies three possible methods for spatial frequency analysis (or texture wavelength analysis) of two-dimensional surface profiles that describe the pavement roughness amplitude as a function of the distance along a straight or curved trajectory over the pavement. The result of the frequency analysis w
31、ill be a spatial frequency (or texture wavelength) spectrum in constant-percentage bandwidth bands of octave or one-third-octave bandwidth. This Technical Specification offers three alternative methods to obtain these spectra: 1) analogue constant-percentage bandwidth filtering; 2) digital constant-
32、percentage bandwidth filtering; 3) constant narrow bandwidth frequency analysis by means of Discrete Fourier Transform, followed by a transformation of the narrow-band spectrum to an octave- or one-third-octave-band spectrum. The objective of this Technical Specification is to standardize the spectr
33、al characterization of pavement surface profiles. This objective is pursued by providing a detailed description of the analysis methods and related requirements for those who are involved in pavement characterization, but are not familiar with general principles of frequency analysis of random signa
34、ls. These methods and requirements are generally applicable to all types of random signals, but are elaborated in this Technical Specification in a specific description aimed at their use for pavement surface profile signals. NOTE The user of this Technical Specification should be aware that spectra
35、l analysis as specified in this document cannot express all characteristics of the surface profile under study. In particular, the effects of asymmetry of the profile, e.g. the difference of certain functional qualities for “positive” and “negative” profiles cannot be expressed by the power spectral
36、 density, as it disregards any asymmetry of the signal. (See Annex F.) 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced
37、document (including any amendments) applies. ISO 13473-2:2002, Characterization of pavement texture by use of surface profiles Part 2: Terminology and basic requirements related to pavement texture profile analysis ISO 13473-3, Characterization of pavement texture by use of surface profiles Part 3:
38、Specification and classification of profilometers IEC 61260, Electroacoustics Octave-band and fractional-octave-band filters DD ISO/TS 13473-4:20082 3 Terms and definitions For the purpose of this document, the terms and definitions given in ISO 13473-2:2002 and the following apply. To assist the us
39、ers, the most relevant terms and definitions from ISO 13473-2:2002 have been copied into this Technical Specification. 3.1 (texture) wavelength quantity describing the horizontal dimension of the amplitude variations of a surface profile NOTE 1 (Texture) wavelength is normally expressed in metres (m
40、) or millimetres (mm). NOTE 2 Wavelength is a quantity commonly used and accepted in electrotechnical and signal processing vocabularies. Since many users of this Technical Specification may not be accustomed to using the term wavelength in pavement applications, and because electrical signals are o
41、ften used in the analyses of road surface profiles, there is a possibility of confusion. Hence, the expression “texture wavelength” is preferred here to make a clear distinction in relation to other applications NOTE 3 The profile may be considered as a stationary, random function of the distance al
42、ong the surface. By means of a Fourier analysis, such a function may be mathematically represented as an infinite series of sinusoidal components of various frequencies (and wavelengths), each having a given amplitude and initial phase. For typical and continuous surface profiles, a profile analysed
43、 by its Fourier components contains a continuous distribution of wavelengths. The texture wavelength in ISO 13473 is the reciprocal of the spatial frequency, the unit of which is reciprocal metre (equivalent to cycles per metre). See also 3.14. NOTE 4 The wavelengths may be represented physically as
44、 the various lengths of periodically repeated parts of the profile. 3.2 profile sampling selection of representative parts of a road surface of which the profile will be measured 3.3 profilometer device used for measuring the profile of a pavement surface NOTE Current designs of profilometers used i
45、n pavement engineering include, but are not limited to, sensors based on laser, light sectioning, needle tracer and ultrasonic technologies. 3.4 measurement speed v speed at which the profilometer sensor traverses the surface to be measured NOTE Measurement speed is normally expressed in kilometres
46、per hour (km/h) or metres per second (m/s). 3.5 digital signal sampling determination of discrete measurement values of a signal at regularly spaced data points (and the subsequent conversion of these values into digital code) NOTE In this generic definition of digital signal sampling, the regular s
47、pacing of the data points may be applied either in the time or in the spatial domain, depending on the domain (time or space) in which the signal is captured. 3.6 sampling interval distance between two adjacent data points on the surface, which is equal to the measurement speed divided by the sampli
48、ng frequency of the sensor NOTE Sampling interval is normally expressed in millimetres (mm). DD ISO/TS 13473-4:200833.7 profile measurement length lplength of an uninterrupted profile measurement NOTE Profile measurement length is normally expressed in metres (m) or millimetres (mm). 3.8 repetition
49、interval r distance between the beginning of two consecutive profile measurement lengths, the latter as defined in 3.7 NOTE Repetition interval is normally expressed in metres (m). 3.9 evaluation length l length of a sample from a profile which has been or is to be analysed NOTE 1 The evaluation length may or may not be equal to the profile measurement length (but never greater). NOTE 2 Evaluation length is normally expressed in metres (m) or millimetres (mm). 3.10 drop-out measured point (sample) on the profile which is recognized as invalid, and which i
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