BS EN 111100-1984 Harmonized system of quality assessment for electronic components sectional specification display storage tubes《电子元件质量评定协调体系 分规范 显象贮存管》.pdf

1、BRITISH STANDARD BSEN 111100:1992 Incorporating Amendment No.1 Harmonized system of quality assessment for electronic components: Sectional specification: Display storage tubes The European Standard EN111100:1991 has the status of a British StandardBSEN111100:1992 This British Standard, having been

2、prepared under the directionof the Electronic Components Standards Committee, was published underthe authority of the BoardofBSI and comes into effect on 30 November1984 BSI 10-1999 The following BSI references relate to the work on this standard: Committee reference ECL/5 Draft for comment 81/27327

3、DC ISBN 0 580 13997 2 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Committee (ECL/-) to Technical Committee ECL/5 upon which the following bodies were represented: Electronic Components Industry Federat

4、ion GAMBICA (BEAMA Ltd.) Ministry of Defence National Supervising Inspectorate UnitedKingdom Atomic Energy Authority Amendments issued since publication Amd. No. Date of issue Comments 7601 February 1993 Indicated by a sideline in the marginBSEN111100:1992 BSI 10-1999 i Contents Page Committees resp

5、onsible Inside front cover National foreword ii Foreword iii Text of CECC11100 1 Publications referred to Inside back coverBSEN111100:1992 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical wi

6、th CENELEC Electronic Components Committee (CECC)11100:1984 “Harmonized system of quality assessment for electronic components:Sectional specification:Display storage tubes”. This standard is a harmonized specification within the CECC system. Terminology and conventions. The text of the CECC specifi

7、cation has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. In1991 the CENELEC Electronic Components Committee (CECC) accepted CECC11100:1984 as European Standard EN1111

8、00:1991. Cross-references. The British Standard which implements CECC00100 is BS9000 “General requirements for a system for electronic components of assessed quality” Part2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. NOTEThere is at present no corresp

9、onding British Standard for IEC151-24. The Committee responsible for this standard has studied this and confirms that, for the purposes of this standard, the technical requirements are acceptable. A British Standard does not purport to include all the necessary provisions of a contract. Users of Bri

10、tish Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard CECC11000:1980 BSCECC11000:1980 Harmonized system of quality assessment for electronic com

11、ponents. Generic specification:Cathode ray tubes (Identical) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, theEN title page, page2, the CECC title page, pages ii to iv, pages 1 to10, aninside back cover and a back cover. This standard has been updated (

12、see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 111100 December1991 UDC Descriptors: Quality, electronic components, tubes English version Sectional Specificatio

13、n: Display storage tubes Spcification intermdiaire: Tubes de visualisation mmoire Rahmenspezifikation: Eine deutsche Version liegt zur Zeit nicht vor* This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on20 November1991. The text of this standard consists of th

14、e text of CECC11100 Issue11984 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliograp

15、hical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German*). A version in any other language made by translation under the respo

16、nsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembo

17、urg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and UnitedKingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de N

18、ormalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Copyright reserved to CENELEC members Ref. No. EN 111100:1991E2 blankBSEN111100:1992 ii BSI 10-1999 Contents Page Foreword iii Section 1. Scope 1 Section 2. Ge

19、neral 1 2.1 Order of precedence 1 2.2 Related documents 1 2.3 Units, symbols and terminology 1 2.4 Marking 1 Section 3. Quality assessment procedures 1 Section 4. Test and measurement procedures 1 4.1 Alternative test methods 1 4.2 Standard conditions for testing 1 4.3 Visual inspection 1 4.4 Dimens

20、ions 1 4.5 Raster scan requirements 1 4.6 Clearance procedure 1 4.7 Manual erase procedure 2 4.8 Electrical test and measurement procedures 2 4.9 Mechanical test and measurement procedures 9 4.10 Environmental test and measurement procedures 9 4.11 Endurance test and measurement procedures 9BSEN1111

21、00:1992 BSI 10-1999 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of

22、 the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepte

23、d by all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for DISPLAY STORAGE TUBES. It should be read in conjunction with docu

24、ment CECC00100: Basic Rules(1974). At the date of printing of this document the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, theNetherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the UnitedKingdom. Copies of it can be obtained from

25、 the addressees shown on the blue fly-sheet. Preface This specification was prepared by CECC Working Group11: Electro-optical devices. In accordance with the requirements of document CECC00100 it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission. It

26、 is a sectional specification for display storage tubes relating to the generic specification CECC11000. The text of this specification was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification: This speci

27、fication will be supplemented by blank detail specifications applicable to each sub-family of display storage tubes. The CECC Management Committee at its meeting in Copenhagen in March1979 decided that as the German National Authorized Institution would not be implementing the requirements of this C

28、ECC sectional specification, the text should be published in the English and French versions only. Document Voting Date Report on the Voting CECC (Secretariat)1081 December1982 CECC (Secretariat) 1274iv blankBSEN111100:1992 BSI 10-1999 1 Section 1. Scope This document relates to display storage tube

29、s of assessed quality. Section 2. General 2.1 Order of precedence Where any discrepancies occur for any reason, documents shall rank in the following order of authority: 1) the detail specification 2) the sectional specification 3) the generic specification 4) document CECC00100 or any other interna

30、tional (for example IEC) documents to which reference is made. The same order of precedence shall apply to equivalent national documents. 2.2 Related documents The following document, and any other documents to which it may relate, is mandatory unless otherwise stated: For information only: 2.3 Unit

31、s, symbols and terminology See2.3 of CECC11000. 2.3.1 Terminology Terminology relevant to display storage tubes shall be taken from IEC151-24, Section2, Definitions. The following additional term is defined for display storage tubes: Backing electrode: The electrode upon which the storage surface is

32、 deposited 2.4 Marking See2.4 of CECC11000. Section 3. Quality assessment procedures See Section3 of CECC11000. Section 4. Test and measurement procedures 4.6 Clearance procedure Where the clearance procedure is required the following procedure shall be used: Remove the screen voltage, unless otherw

33、ise specified. Raise the voltage on the backing electrode to the same value as the collector voltage, or as specified. Hold for approximately half a second. Restore to former value. Restore the screen voltage. The screen will now be at maximum luminance. Allow five seconds for the storage surface po

34、tential to stabilise. CECC 11000 (Issue1)(1980) Generic specification: Cathode Tay Tubes IEC151-24, Methods of measurement of cathode-ray charge-storage tubes. Paragraph Title Reference 4.1 Alternative test methods See 4.1 of CECC11000 4.2 Standard conditions for testing See 4.2 of CECC11000 4.3 Vis

35、ual inspection See 4.3 of CECC11000 4.4 Dimensions See 4.4 of CECC11000 4.5 Raster scan requirements See 4.5 of CECC11000BSEN111100:1992 2 BSI 10-1999 4.7 Manual erase procedure Where the manual erase procedure is required, the following procedure shall be used, unless otherwise specified: Remove th

36、e screen voltage, unless otherwise specified. Raise the voltage on the backing electrode to the value found in4.8.36. Hold for one second. Restore to former value. Restore the screen voltage. The screen will now be dark. 4.8 Electrical test and measurement procedures Where the detail specification p

37、rescribes measurement of the following properties, they shall be measured in accordance with the methods listed below (seealso4.1 above). Paragraph Title Reference 4.8.1 Gas content coefficient See 4.6.1 of CECC11000 4.8.2 Intensity modulator electrode cut-off voltage See 4.6.2 of CECC11000 4.8.3 Wr

38、ite gun cathode emission See 4.6.3 of CECC11000 4.8.4 Luminance characteristics See 4.6.4 of CECC11000 4.8.5 Mechanical spot displacement See 4.6.5 of CECC11000 4.8.6 Stray emission See 4.6.6 of CECC11000 4.8.7 Flashover See 4.6.7 of CECC11000 4.8.8 Heater voltage and/or current See 4.6.8 of CECC110

39、00 4.8.9 Heater-cathode leakage See 4.6.9 of CECC11000 4.8.10 Quality of fluorescent screen and faceplate See 4.6.10 of CECC11000 4.8.11 Electrode leakage current See 4.6.11 of CECC11000 4.8.12 Intensity modulator electrode total negative current See 4.6.12 of CECC11000 4.8.13.1 Persistence (pulsed

40、intensity modulator electrode) See 4.6.13.1 of CECC11000 4.8.13.2 Persistence (pulsed line) See4.6.13.2 of CECC11000 4.8.13.3 Persistence (raster decay) See 4.6.13.3 of CECC11000 4.8.14.1 Resolution (expanded raster) See 4.6.14.1 of CECC11000 4.8.14.2 Resolution (elliptical or circular trace) See 4.

41、6.14.2 of CECC11000 4.8.14.3 Resolution (pulsed line) See 4.6.14.3 of CECC11000 4.8.14.4 Resolution (shrinking raster) See 4.6.14.4 of CECC11000 4.8.14.5 Resolution (narrow slit) See 4.6.14.5 of CECC11000 4.8.14.6 Resolution (variable slit) See 4.6.14.6 of CECC11000 4.8.14.7 Resolution (spatial freq

42、uency) See 4.6.14.7 of CECC11000 4.8.15 Beam alignment See 4.6.15 of CECC11000 4.8.16 Pattern distortion (single or multi-beam tubes) See 4.6.16 of CECC11000 4.8.17 Scan dimensions (electrostatic deflection, p.d.a tubes) See 4.6.17 of CECC11000 4.8.18 Deflection coefficient See 4.6.18 of CECC11000 4

43、8.19 Deflection beam blanking (visual cut-off) See 4.6.19 of CECC11000 4.8.20 Post deflection accelerator electrode current See 4.6.20 of CECC11000 4.8.21 Trace intermodulation (interaction factor) See 4.6.21 of CECC11000 4.8.22 Deflection linearity (uniformity factor) See 4.6.22 of CECC11000 4.8.2

44、3 Electrical spot displacement See 4.6.23 of CECC11000 4.8.24 Post deflection accelerator resistance See 4.6.24 of CECC11000 4.8.25 Focus characteristics See 4.6.25 of CECC11000 4.8.26 Scan dimensions (maximum dimensions) See 4.6.26 of CECC11000 4.8.27 External conductive coating resistance See 4.6.

45、27 of CECC11000 4.8.28 Unfocused spot diameter (magnetic focus tubes) See 4.6.28 of CECC11000BSEN111100:1992 BSI 10-1999 3 4.8.33 Flood gun electrode voltages for uniformity of pulse erasure Purpose To measure the flood gun electrode voltages and currents required to achieve collimination with unifo

46、rmity of pulse erasure (in a specified period) over the useful screen area at a specified screen voltage. NOTE 1This test is not suitable for bistable tubes. Procedure Apply electrode voltages as prescribed in the detail specification. The write gun(s) modulator electrode(s) shall be biased beyond c

47、ut-off. Deflecting fields may be applied to protect the tube in the event of flashover. Allow the specified warm up period. Adjust the pulse duration so that the screen area is darkened in approximately 50% of the specified period from the application of the erasure pulses. The clearance procedure s

48、hall be carried out before checking the effect of an adjustment to the pulse duration. Adjust the voltages applied to the flood gun modulating and other specified electrodes to achieve the specified maximum uniformity of erasure (seeNote2) over the useful screen area. The clearance procedure shall b

49、e effected between each adjustment. Measure the electrode voltages and currents specified and the pulse duration; these values may be required for use in other tests. NOTE 2Uniformity of erasure is 1) determined by maintaining the erasure pulse amplitude and repetition frequency as used above, and adjusting the pulse duration to achieve complete darkness in the specified period, for example10s; 2) defined by: Conditions to be prescribed in the detail specification Electrode voltages, as appropriate The screen voltage if applied during clearan