BS EN 117000-1992 Harmonized system of quality assessment for electronic components - Generic specification - Solid state all-or-nothing relays - Generic data and methods of test《电.pdf

1、 STD.BSI BS EN LL70OO-ENGL L777 Lb24bb9 Ob48403 789 BRITISH STANDARD Harmonized system of quality assessment for electronic components Generic specification: Solid state all-or-nothing relays of assessed quality. Generic data and methods of test * * v, The European Standard EN 117000 : 1991 has the

2、status of a British Standard ICs 29.120.70 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW 3s EN 117000 : 1997 ncorpomting Irnendmt No. 1 to 3s CECC 1 ?O00 : 1992 Tenumbers BS as 3SEN117OOO: 1997) - STD-BSI BS EN lL7000-ENGL 1997 Lb24bb7 0648404 b15 W BS EN 117000 : 1997 Issue

3、 2, October 1997 9626 This British Standard, having been prepared under the direction of the Electronic Components standards hiicy Committee, was published under the authority of the standards Board and comes into effect on 1 May l!M2 8 BSI 1997 October 1997 Adoption as a European Standard The follo

4、wing BSI references relate to the work on this Stsuidard: Committee reference ECL1 haft. for comment 0/30638 IK ISBN O MK) 204M 6 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Policy Committee (ECW-) to

5、%chnical Committee ECLI1, upon which the following bodies were represented: Association of Control Manufacturers (TACMA (BEAMA Ltd.) British the French text will follow as soon as it has been prepared. - -3- CZCC 17 O00 Issue 2 This generic specification lists the test and measurement procedures whi

6、ch may be selected for use in detail specifications for solid state relays of assessed quality. followed. It also specifies the quality assurance procedures to be Relays covered by this specification have d.c. control circuits and output Note: d.c. output devices are under consideration. ratings not

7、 exceeding 100 A. SECTIOR 2 - QsNIIBbt 2.1 2.2 Order of Precedence Where any discrepancies occur or any reason, the documents shall rank in the following order of authority :- 1. The detail specification 2. The sectional specification 3. The generic specification 4. The Internal Regulations of the F

8、EN e.V. (Association for the 5. Any other international documents (for example IEC) to which The same order of precedence shall apply to equivalent national doctmients Promotion of Electrotechnical Standardization) reference is made. Related Documents IS0 1000 (1973) IS0 8601 (1988) IEC 27-1 (1976)

9、IEC so - IEC 68 - IEC 68-1 (1982) *IEC 68-2-1 (1983) *IEC 68-2-2 (1976) IEC 68-2-3 (1969) *IEC 68-2-6 (1983) XEC 68-2-7 (1983) *IEC 68-2-10 (1972) IEC 68-2-11 (1981) IEC 68-2-13 (1983) SI units and recommendations for the use of their multiples and of certain other units. Data Elements and Interchan

10、ge Formats Letter symbols to be used in electrical technology. General. . Internatioaal Electrotechnical Vocabulary Basic environmental testing procedures. The following points are referenced : General and guidance Test A, Cold Test B, Dry Heat Test Ca, Damp heat, steady state Test Fc, Vibration (si

11、nusoidal) . Test Ga, Acceleration, steady state Test J, Mould growth Test Ka, Salt mist Test M, Low air pressure -4- CECC 17 O00 Issue 2 STD-BSI BS EN L17000-ENGL 1777 Lb2LibbS ObLiALiLZ 772 IEC 68-2-14 (1984) Test N, Change of temperature IEC 68-2-17 (1978) Test Q, Sealing IEC 68-2-20 (1979) Test T

12、, Soldering IEC 68-2-21 (1983) Test i!, Robustness of terminations and integral mounting devices. *IEC 68-2-27 (1983) Test Ea, Shock *IEC 68-2-29 (1983) Test Eb, Bump IEC 68-2-30 (1980) Test Db, Damp heat cyclic (12 + 12 hour cycle) IEC 68-2-45 (1980) Test U, Immersion in cleaning solvents *Includin

13、g all amendments or supplements issued to the year indicated. IEC 144 (1963) Degrees of protection of enclosures for low- voltage switchgear and control gear. IEC 147-5 (1977) Essential ratings and characteristics of semicondictor devices, Part 5, Test methods. IEC 745 (lg?,a voltage Resistor R is a

14、 protective resistor. The off-state voltage as measured on voltmeter V is increased to the nominal working voltage. Switch S is closed and the control voltage Increased to the must operate value. reducing the voltage source until the SSR turns on and the ammeter A indicates the flow of current. The

15、off-state voltage Is gradually decreased by The value of the off-state voltage measured oa voltmeter V, immediatly prior to the turn-on point, Is the zero turn-on vol tage. The sources are reduced to zero and the SSR removed from the test circuit. The test is repeated vith connections 1 and 2 revers

16、ed. 5.11.3 Conditions to be prescribe in the Detail Specification (1) Anbient, case or reference point temperature (2) Nominl working voltage. - 22 - CECC 17 O00 Issue 2 STD-BSI BS EN LL7000-ENGL 1997 I Lb2LibbS Ob48430 707 So12 SURGE (BON-REPETITIVE) ON-STATE CURRENT I= 5.12.1 Purpose To prove the

17、surge (norrepetitive) on-state current rating of a SSR under specified conditions. 5.12.2 Procedure With the voltage and current sources set to zero the SSR Is inserted Into the test circuit FIG. 4 and the temperature cet to the specified value. tr, FIG. 4 : Test circuit for surge (non-repetitive) o

18、wstate current A fs 8 peak reading -ter, O is a peak rudlog volmeter. 81 is the surge current setting resistor and should be large compared to R2. B2 is the surge current balancing resistor, and should approxmately equal the on-state impedance of the SSR under test with the surge current flowing. Si

19、 Is an electromechanical or electronic switch with a conduction angle of approximately 180. during the reverse half cycle. S2 ir an tlectromechanical.or electronic witch vith a conduction angle of approximately 180 during the forward (surge) half cycle. Ti is a transformer of low voltage and high cu

20、rrent supplying the surge half cycle. sine wave of aproximately 10 ms duration vith a repetition rate of approximately 50 pulses/s. The current wave shape should be essentially a half T2 io a transformer of high voltage and low current supplying (through diode D) the reverse half cycle and it fed fr

21、om a separate source &ose phase is the same as that of Ti. shall be essentially a half sine wave. The voltage shape - 23 - CECC i7 O00 Issue 2 The control voltage source Is arranged such that the SSR is turned on only during a single forward (surge) half cycle. The control voltage Is set such that t

22、he SSR will turn on and the peak reverse voltage, measured on voltmeter Va is set to the spec if ied value. The peak on-state surge current, measured on ammeter A is set to the specified value by adjustment of Ri. The specified number of cycles of on-state surge current vithin the period of the surg

23、e and peak reverse voltage are applied to the SSR under test. The voltage and current sources are reduced to zero and the SSR removed from the test circuit. Proof of the ability of the SSR to meet the on-state surge current rating is obtained from the post test measurement. S.12.3Conditlons to be pr

24、escribed in the Detail Specification (1) Peak reverse voltage (2) Peak on-state surge current (3) Transformer requirements (4) Period between surges if applicable 5) Ambient, case or reference point temperature before test (6) (7) (8) The post test end point measurement limits Frequency range of alt

25、ernating sources Haximum impedance of the reverse voltage source - 24 - CECC 17 O00 Issue 2 STD-BSI BS EN 117000-ENGL 1777 = Lb24bb7 Ob48432 58T 5.13 S-13.1 5.13-2 SUPCE (UON - EEPBTITIVE) ON-STAZK CRREUT (with rapid rate of rise of reverse voltage) lm Purpoac To prove the surge (non-repetitive) on-

26、state current rating of a SSR under specified conditions. Procedure The test circuit in FIG. S shall be used with the control voltage source arranged such that the SSR is turned on only during each forward (surge) half cycle. , With the voltage and current sources set at zero the SSR is inserted int

27、o the test circuit and the temperature set to the specified value. The control voltage source is set such that the SSR will turn on and peak reverse voltage measured on voltmeter V, is set to the specified value. The peak-on state surge current measured on ammeter A, is set to the specified value by

28、 adjustment of R1. The specified number of cycles of on-state surge current and peak reverse voltage are applied to the SSR under test. The voltage and current sources are reduced to zero and the SSR removed from the test circuit. Proof of the ability of the SSR to meet the on-state surge current ra

29、ting is obtained from the post test measurements. FIG. s : 1e.t crcut for surge (non-repetitive) oPstate current (vith r8pid rate of rise of rever- voltage). Ammeter A and voltmeter V are peak reading instruments. Ri is the surge current setting resistor an should be large compared to R2. Rz is the surge current balancing resistor md should approximately equal the forward impedance of the SSR under test. Si is an electromechanical or electronic witch with a conduction angle of approximately 180 during the reverse half cycle. - 25 - CECC 17 O00 Issue 2