BS EN 120002-1988 Specification for harmonized system of quality assessment for electronic components - Blank detail specification infrared emitting diodes infrared emitting diode .pdf

1、BRITISH STANDARD BS EN 120002:1993 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Infrared emitting diodes, infrared emitting diode arrays The European Standard EN 120002:1992 has the status of a British St

2、andard.BSEN120002:1993 BSI 02-2000 ISBN 0 580 35666 3 Amendments issued since publication Amd. No. Date of issue Comments 8001 October 1993 Indicated by a sideline in the marginBSEN120002:1993 BSI 02-2000 i Contents Page National foreword ii Foreword 2 Foreword iii Text of EN 120002 1BSEN120002:1993

3、 ii BSI 02-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)20002:1983, Issue1, “Harmonized system of quality assessment for electronic components. B

4、lank detail specification: Infrared emitting diodes, infrared emitting diode arrays”. This standard is a harmonized specification within the CECC system. In 1992 the CENELEC Electronics Components Committee (CECC) accepted CECC20002:1983 as European Standard EN120002:1992. Terminology and convention

5、s. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a d

6、ecimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC00100 is BS9000 “General requirements for a system for electronic components of assessed quality” Part2:1983 “Specificatio

7、n for national implementation of CECC basic rules and rules of procedure”. The Technical Committee has reviewed the provisions of IEC191-2, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. A related British Standard to IEC191

8、-2:1966 is BS3934:1965 “Specification for dimensions of semiconductor devices”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BSCECC20000 in any detail specification for these devices. Detail s

9、pecification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards

10、 are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard a Corresponding British Standard CECC 20000:1982 BS CECC 20000:1983 Harmonized system of quality assessment for electronic components:

11、Generic specification: Semiconductor optoelectronic and liquid crystal devices (Identical) CECC 00200d:1986 PD 9002:1987 BS 9000, BS CECC and IECQ qualified products list (Technically equivalent for UK approvals only) a Undated in the text. Summary of pages This document comprises a front cover, an

12、inside front cover, pages i and ii, theEN title page, page 2, the CECC title page, pages ii to iv, pages 1 to 10 and aback cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EURO

13、PEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 120002 July 1992 UDC: Supersedes CECC 20001 Issue 1:1983 Descriptors: Quality, electronic components, diodes; diode arrays English version Blank Detail Specification: Infrared emitting diodes, infrared emitting diode arrays Spcification Particulire Ca

14、dre: Diodes mettrices en infrarouge, rseaux de diodes mettrices en infrarouge Vordruck fr Bauartspezifikation: Infrarot emittierende Dioden und infrarot emittierende Dioden-Zeilen This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 27 January 1992. CENELEC me

15、mbers are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application

16、 to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC Genera

17、l Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom.

18、 The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Ce

19、ntral Secretariat: rue de Stassart 35, B-1050 Brussels 1992 Copyright reserved to CENELEC members Ref. No. EN 120002:1992 EEN120002:1992 BSI 02-2000 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Stan

20、dardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of

21、an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECCWG20, “Opto-Electronic Components and Liquid Crystal Devices”. The text of th

22、e draft based on document CECC20002Issue1:1983 was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)2999 the following documents were approved by CECC as EN120002 on27 January1992: CECC20002 Issue 1:1983 with

23、 Amendment 1 The following dates were fixed: latest date of announcement of the EN atnational level (doa) 1992-12-22 latest date of publication ofan identical national standard (dop) 1993-06-22 latest date of declaration ofnational standards obsolescence 1993-06-22 latest date of withdrawal ofconfli

24、cting national standards (dow) 2002-12-22EN120002:1992 ii BSI 02-2000 Contents Page Foreword iii 1 Mechanical description 1 2 Short description 1 3 Level (s) of quality assessment 1 4 Limiting values 1 5 Electrical and optical characteristics 2 6 Marking 3 7 Ordering information 3 8 Test conditions

25、and inspection requirements 4 9 Additional information 8 Appendix Endurance test conditions 10EN120002:1992 BSI 02-2000 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who w

26、ish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recogniz

27、ed Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national

28、harmonized specifications for INFRARED EMITTING DIODES, INFRARED EMITTING DIODE ARRAYS. It should be read conjunction with document CECC00100: Basic Rules(1974). Preface This blank detail specification was prepared by CECC Working20: “Semiconductor optoelectronic and liquid crystal devices”. It is o

29、ne of a series of blank detail specifications for semiconductor devices, based on the generic specification CECC20000. Voting The text of this blank detail specification was circulated to the CECC for voting in the documents indicated below, and was ratified by the President of the CECC for printing

30、 as a CECC specification. NOTEThis specification is published initially in English and French. The German text will follow as soon as it has been prepared. Document Voting date Report on the voting CECC(Secretariat)1089 november 1981 CECC(Secretariat)1217 CECC(Secretariat)1090 november 1981 CECC(Sec

31、retariat)1216iv blankEN120002:1992 BSI 02-2000 1 INFRARED EMITTING DIODES, INFRARED EMITTING DIODE ARRAYS Name (address) of responsible ONH (and possibly of body from which specification is available) e Page of CECC 20002-XXX f CECC detail specification number plus issue number and/or date ELECTRONI

32、C COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: g National number of detail spcification This box may not be used if National number includes CECC number h CECC 20000, issue . . . and national references if different 1 Mechanical description k DETAIL SPECIFICATION FOR: i Either outline reference

33、s (code A) or base and case references (codes B + C): Type number (s) of relevant device (s) and, if appropriate structurally similar devices from IEC 191-2: national if desired ORDERING INFORMATION: see clause 7 of this specification 2 Short description j OUTLINE DRAWING AND CONNECTIONS (Terminal c

34、onnected to case, if any) IR EMITTING DIODES/IR EMITTING DIODE ARRAYS The outline drawing may correspond to the device itself and/or the device with its mounting clip Semiconductor material: Ga P/. Encapsulation: metal/glass/plastic/. Application: may be transferred to, or given with more details, i

35、n clause 9 of this specification Power: ambient-rated (Tamb) case-rated(Tcase) MARKING: letters and figures/colour code see 2.5 of CECC 20000 and/or clause 6 of this specification Some important quick reference data, for example device narrow beam may be added Polarity indication if special method i

36、s used 3 Level (s) of quality assessment if relevant l 4 Limiting values (Absolute maximum rating system) m These apply per diode over the operating temperature range unless otherwise stated. X denotes that a value shall be inserted in the detail specification Clause CECC 20002 Repeat only clause nu

37、mbers used, with text. Additional values, if any, shall be given at the appropriate place without clause number (s). Curves should preferably be given in clause 9 of this document. Symbol Value min max Unit 4.1 Operating ambient or case temperatures T amb/case X X C 4.2 Storage temperature T stg X X

38、 C 4.3 Soldering temperature Soldering time and minimum distance to case shall be given Recommended mounting conditions (temperature, duration.) may be given in clause 9.1 of this document T sld X C 4.4 Reverse voltage V R X V 4.5 Continuous forward current at operating ambient or case temperature o

39、f 25 C, with temperature derating curve if necessary (see 9.2) 4.5.1 For diode arrays, where appropriate, all diodes operating I F(tot) (X) AEN120002:1992 2 BSI 02-2000 5 Electrical and optical characteristics See clause 8 of this specification for inspection requirements (Groups A and C) Signs betw

40、een brackets correspond to characteristics given as “where appropriate” or as alternatives: Those characteristics marked “where appropriate” in this clause and in the inspection section shall either be omitted or, if specified, shall then be measured. For equivalent characteristics given as alternat

41、ives, the choice should preferably be left open to allow the use of the same detail specification by different manufacturers or countries. Repeat only clause numbers used, with text. Any additional characteristics to be given at appropriate placebut without clause number. When several devices are de

42、fined in the same detail specification, the relevant values should be givenonsuccessive lines, where possible avoiding repetition of identical values. The values of specified forward current shall be the same for all tests (except for “C tot ”). Fordiodearrays,thecharacteristics apply per diode (exc

43、ept for “m”). Clause CECC 20002 Repeat only clause numbers used, with text. Additional values, if any, shall be given at the appropriate place without clause number (s). Curves should preferably be given in clause 9 of this document. Symbol Value min max Unit 4.5.2 Or per diode mandatory for single

44、diode I F (X) A 4.6 Where appropriate: Peak forward current, at operating ambient or case temperature of 25 C, under specified pulse conditions I FRM (X) A 4.7 Where appropriate: Total power dissipation at operating ambient or case temperature of 25 C, with temperature derating curve if necessary (s

45、ee9.2) P (tot) (X) W See the current CECC 00200: Qualified Products List for details of manufacturers who have components qualified to this detail specification.EN120002:1992 BSI 02-2000 3 6 Marking Information actually marked on the device and on the primary pack Any particular information other th

46、an given in box k on page 1 and/or 2.5 of CECC 20000 shall be specified here. 7 Ordering information The following minimum information is necessary to order a specific device, unless otherwise specified: precise type number CECC reference of detail specification with issue number and/or date when re

47、levant any other particulars. Clause CECC 20002 Measured Characteristic and conditions, at T ambor Tcase = 25 C unless otherwise stated Symbol Value min max Unit 5.1.1 or A2b Radiant power at specified forward current (d.c. and/or under specified pulse conditions) e X (X) mW 5.1.2 A2b Radiant intens

48、ity at specified forward current (d.c. and/or under specified pulse conditions) I e X (X) mW/sr NOTEWhere the device is used to constitute a multi device display, maximum value of eor I eis to be specified 5.1.3 A2b For arrays, Matching factor of diodes: m (X) 5.2.1 or C2b Where appropriate: Radiant

49、 power same conditions as for 5.1.1 at other specified temperatures (T 1 , T 2 ) e (T 1 ) e(T 2 ) (X) (X) (X) (X) mW mW 5.2.2 C2b Where appropriate: Radiant intensity same conditions as for 5.1.2 at other specified temperatures (T 1 , T 2 ) may also be given as a curve (see9.3) I e(T 1 ) I e(T 2 ) (X) (X) (X) (X) mW/sr mW/sr 5.3 Radiation diagram given as a curve (see 9.4) I e (T 2 ) (X) (X) mW/sr 5.4 C2a Where appropriate: Half-intensity angle F I/2 (X) (X) d 5.5 C2a Where appropriat