BS EN 120005-1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Photodiodes photodiode-arrays (not intended for.pdf

1、BRITISH STANDARD BS EN 120005:1993 Incorporating Amendment No.1 Specification for Harmonized system of quality assessment for electronic components Blankdetail specification Photodiodes, photodiode-arrays (notintended for fibre optic applications) The European Standard EN120005:1992 has the status o

2、f a British StandardBSEN120005:1993 BSI 01-2000 ISBN 0 580 35581 0 Amendments issued since publication Amd. No. Date of issue Comments 8004 October 1993 Indicated by a sideline in the marginBSEN120005:1993 BSI 01-2000 i Contents Page National foreword ii Foreword 2 Foreword ii 1 Mechanical descripti

3、on 1 2 Short description 1 3 Level (S) of quality assessment 1 4 Limiting values (Absolute maximum rating system) 1 5 Electrical and optical characteristics 2 6 Marking 3 7 Ordering information 3 8 Test conditions and inspection requirements 3 9 Additional information 7 Appendix to CECC20005 Enduran

4、ce test conditions Inside back coverBSEN120005:1993 ii BSI 01-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)20005:1986 “Harmonized system of quali

5、ty assessment for electronic components. Blank detail specification: Photodiodes, photodiode-arrays (not intended for fibre optic applications)”. This standard is a harmonized specification within the CECC system. In 1992 the CENELEC Electronics Components Committee (CECC) accepted CECC20005:1986 as

6、 European Standard EN120005:1992. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn

7、 especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC00100 is BS9000: “General requirements for electronic componen

8、ts of assessed quality” Part2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC20000 in any deta

9、il specification for these devices. Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisio

10、ns of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard a Corresponding British Standard IEC191-2:1966 BS3934:1965 Dimensions of semiconductor devi

11、ces (Technically equivalent) CECC20000:1982 BS CECC20000:1983 Harmonized system of quality assessment for electronic components. Generic specification. Semiconductor opto-electronic and liquid crystal devices (Identical) CECC00200 PD9002 BS9000, BS CECC and IECQ qualified products list (Technically

12、equivalent for UK approvals only). a Undated in text Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, theEN title page, page2, the CECC title page, page ii, pages 1 to8, aninsideback cover and a backcover. This standard has been updated (see copyright date

13、) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN120005 July1992 UDC: Supersedes CECC20005 Issue1:1986 Descriptors: Quality, electronic components, photodiodes English version Blank

14、 Detail Specification: Photodiodes, photodiode-arrays (Not intended for fibre optic applications) Spcification Particulire Cadre: Photodiodes, rseaux de photodiodes (Non destines aux applications pour les fibres optiques) Vordruck fr Bauartspezifikation: Photodioden, Photodioden-Zeilen (Nicht fr fas

15、eroptische Anwendungen) This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on27 January1992. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national stan

16、dard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A versio

17、n in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland

18、, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and UnitedKingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Commi

19、ttee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1992 Copyright reserved to CENELEC members Ref. No. EN120005:1992EEN120005:1992 BSI 01-2000 2 Foreword T

20、he CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate inter

21、national trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries withou

22、t further testing. This European Standard was prepared by CECCWG20, “Opto-Electronic Components and Liquid Crystal Devices”. The text of the draft based on document CECC20005 Issue1:1986 was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulat

23、ed as document CECC(Secretariat)3007 the following documents were approved by CECC as EN120005 on27January1992: CECC20005 Issue1:1986 with Amendment1 The following dates were fixed: latest date of announcement of the EN at national level (doa) 1992-12-22 latest date of publication ofan identical nat

24、ional standard (dop) 1993-06-22 latest date of declaration ofnational standards obsolescence 1993-06-22 latest date of withdrawal ofconflicting national standards (dow) 2002-12-22EN20005:1986 ii BSI 01-2000 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member count

25、ries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment pr

26、ocedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has

27、 been prepared for those countries taking part in the System who wish to issue national harmonized specifications for PHOTODIODES, PHOTODIODE-ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS). It should be read in conjunction with the current regulations of the CECC System. At the date of printing

28、of this document the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the UnitedKingdom. Preface This blank detail specification was prepared by the CECC Working Group20: “SEMICOND

29、UCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES”. It is one ofa series of blank detail specifications for semiconductor devices, based on the generic specification CECC20000. Voting The text of this blank detail specification was circulated to the CECC for voting in the documents indicated below, an

30、d was ratified by the President of the CECC for printing as a CECC Specification. NOTEThis specification is published initially in English and French. The German text will follow as soon as it has been prepared. Texts between square brackets give guidelines on how to fill in the blank detail specifi

31、cation Document Voting Date Report on the Voting CECC (Secretariat)1453 CECC (Secretariat)1454 2 April1984 CECC (Secretariat)1623 CECC (Secretariat)1624EN20005:1986 BSI 01-2000 1 PHOTODIODES, PHOTODIODE-ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS) Name (address) of responsible ONH (and possibl

32、y of body from which specification is available) e Page of CECC20005-XXX f CECC detail specification number plus issue number and/or date ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: CECC20000, issue .and national references if different g National number of detail specification This

33、 box may not be used if national number includes CECC number h 1 Mechanical description k Detail specification for: i Either outline references (code A) or base and case references (codes B+C): from IEC191-2: national if desired OUTLINE DRAWING AND CONNECTIONS (Terminal connected to case, if any) Th

34、e outline drawing may correspond to the device itself and/or the device with its mounting clip may be transferred to, or given with more details, in clause9 of this specification MARKING: letters and figures/colour code see2.5 of CECC20000 and/or clause6 of this specification Polarity indication if

35、special method is used Type number(s) of relevant device (s) and, if appropriate, structurally similar devices ORDERING INFORMATION: seeclause7 of this specification 2 Short description j Photodiodes/photodiode-arrays Semiconductor material: S1/. . . Encapsulation: metal/glass/plastic/. . . Applicat

36、ion: Power: ambient-rated (T amb ) Some important quick reference data may be added 3 Level (S) of quality assessment if relevant l 4 Limiting values (Absolute maximum rating system) m These apply per diode over the operating temperature range unless otherwise stated. X denotes that a value shall be

37、 inserted in the detail specification Clause CECC20005 Repeat only clause numbers used, with text. Additional values, if any, shall be given at the appropriate place without clause number(s). Curves should preferably be given in clause9 of this specification Symbol Value min. max. Unit 4.1 4.2 4.3 4

38、.4 4.5 Operating ambient temperatures Storage temperatures Soldering temperature Soldering time and minimum distance to case shall be given Recommended mounting conditions (temperature, duration. . .) may be given in clause9.1 of this specification Reverse voltage Total power dissipation at ambient

39、temperature of25 C with temperature derating curve if necessary (see9.2) T amb T stg T sld V R P (tot) X X X X X X X C C C V W Information about manufacturers who have components qualified to this detail specification is available in the current CECC00200: Qualified Products List.EN20005:1986 2 BSI

40、01-2000 5 Electrical and optical characteristics Seeclause8 of this specification for inspection requirements (Groups A and C) Signs between brackets correspond to characteristics given as “where appropriate” or as alternatives: Those characteristics marked “where appropriate” in this clause and in

41、the inspection section shall either be omitted or, if specified, shall then be measured. For equivalent characteristics given as alternatives, the choice should preferably be left open to allow the use of the same detail specification by different manufacturers or countries. Repeat only clause numbe

42、rs used, with text. Any additional characteristics to be given at appropriate place but without clause number. When several devices are defined in the same detail specification, the relevant values should be given on successive lines, where possible avoiding repetition of identical values. Clause CE

43、CC 20005 Measured Characteristics and conditions, at T amb =25 C unlessotherwisestated Symbol Value min. max. Unit 5.1.1 and/or 5.1.2 and/or 5.1.3 5.2 5.3 A2b A2b A2b C2a A2b Reverse current under irradiation at specified V Rand E eor E v (seeNote4) Responsivity at a specified wavelength in the visi

44、ble region for a given bandwidth %2 at specified V Rand E e Responsivity at a specified wavelength in the infrared region for a given bandwidth %2 at specified V Rand E e Where appropriate: Reverse current under irradiation at specified V Rand E eor E v (seeNote4) For arrays, matching factor of diod

45、es, under specified conditions: I R (H)(1) I R (e)(1) S(1) S(2) I R (H)(2) I R (e)(2) X X X (X) 4A A/W A/W 4A m= or or m X or 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 A2b A3 C2a C2a C2a Reverse dark current at specified V Rand irradiance E e =0 Reverse dark current at specified V Rirradiance E e =0 and spe

46、cified T amb Rise time under specified V, I R , 2 p , %2, R, t wand $ Fall time under specified V, I R , 2 p , %2, R, t wand $ Where appropriate: Junction capacitance at V Rspecified preferably V R =0, f to be specified, E e =0 Reverse current under irradiation versus illuminance E vor irradiance E

47、e(seeNote4) expressed as a curve at specified V R(see9.4) Responsivity diagram at specified V R(see9.4) Relative responsivity expressed as a curve at specified V Rand E e(see9.5) I R (1) I R (2) t r t f C tot X X X X (X) nA 4A 4s 4s pF Notes on page7 I R H () highest () I R H () lowest () - I R e ()

48、 highest () I R e () lowest () - S1 () highest () S1 () lowest () - S2 () highest () S2 () lowest () -EN20005:1986 BSI 01-2000 3 6 Marking Information actually marked on the device and on the primary pack. Any particular information other than given in box k on front page and/or2.5 of CECC20000 shal

49、l be specified here. 7 Ordering information The following minimum information is necessary to order a specific device, unless otherwise specified: type number CECC reference of detail specification with issue number and/or date when relevant any other particulars. 8 Test conditions and inspection requirements These are given in the followi