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本文(BS EN 136000-1978 Harmonized system of quality assessment for electronic components generic specification magnetrons《电子元器件质量评定协调体系 通用规范 磁控管》.pdf)为本站会员(sumcourage256)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

BS EN 136000-1978 Harmonized system of quality assessment for electronic components generic specification magnetrons《电子元器件质量评定协调体系 通用规范 磁控管》.pdf

1、BRITISH STANDARD BS EN 136000:1993 CECC 36000: 1977 Incorporating Amendment No. 1 Harmonized system of quality assessment for electronic components Generic specification: Magnetrons The European standard EN 136000:1992 has the status of a British StandardBSEN 136000:1993 This British Standard, havin

2、g been prepared under the directionof the Electronic Components Standards Committee, was published underthe authority of the Executive Board on 31August1978 BSI 07-1999 The following BSI references relate to the work on this standard: Committee reference ECL/5 Draft for comment 74/28990 DC ISBN 0 58

3、0 10082 0 Cooperating organizations The Electronic Components Standards Committee, under whose direction this British Standard was prepared, consists of representatives from the following Government departments and scientific, industrial and consumer organizations: British Electrical and Allied Manu

4、facturers Association (BEAMA) Electricity Supply Industry in England and Wales Electronic Components Industry Federation* Electronic Engineering Association Institution of Electronic and Radio Engineers Ministry of Defence* National Supervising Inspectorate* Post Office Society of British Aerospace

5、Companies Limited* Telecommunication Engineering and Manufacturing Association (TEMA) Trades Union Congress The organizations marked with an asterisk in the above list were directly represented on the committee entrusted with the preparation of this BritishStandard. Amendments issued since publicati

6、on Amd. No. Date of issue Comments 7581 February 1993 Indicated by a sideline in the marginBSEN 136000:1993 BSI 07-1999 i Contents Page Cooperating organizations Inside front cover National foreword ii Foreword 4 Text of EN 136000 5 Publications referred to Inside back coverBSEN 136000:1993 ii BSI 0

7、7-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)36000 “Harmonized system of quality assessment for electronic components: Generic specification: M

8、agnetrons”. In1992 the CENELEC Electronic Components Committee (CECC) accepted CECC36000:1977 as European Standard EN136000:1992. As a consequence of implementing the European Standard this British Standard is renumbered as BSEN136000and any reference to BSCECC36000should be read as a reference to B

9、SEN136000. This standard gives the terminology, quality assessment procedures and test and measurement procedures applicable to the entire family of magnetrons. Any blank detail specification dealing with a particular sub-family of magnetrons required to be used in conjunction with this standard wil

10、l select those tests which are considered appropriate to the sub-family and may also give more detailed information relative to the sub-family. This standard is a harmonized specification within the CECC system. The existing non-harmonized British Standard BS9030 “Magnetrons of assessed quality: Gen

11、eric data and methods of test” will eventually be superseded by this standard but for a period both standards will remain in force because of current approvals to BS9030. For the time being, until BSE9000 is published, specifications in the series are subject to the basic rules set down in BS9000“Ge

12、neral requirements for electronic components of assessed quality”. The British Standards Institutions prescribed layout of a detail specification is given in Part2 “Data on generic and detail specifications” of BS9000. Cross references. The British Standard harmonized with CECC00100 is BS9000 “Gener

13、al requirements for electronic components of assessed quality”. IEC117 substantially agrees in technical content with BS3939 “Graphical symbols for electrical power, telecommunications and electronics diagrams”. For each of the following references to international standards that is given in the tex

14、t, there is a corresponding British Standard; these are as listed below: Reference to international standard Corresponding British Standard ISO 1000:1973 BS5555:1976 SI units and recommendations for the use of their multiples and of certain other units IEC 27-1:1971 BS 1991 Letter symbols, signs and

15、 abbreviations Part 6:1975 Electrical science and engineering IEC 50 (Chapter 531) BS 4727 Glossary of electrotechnical, power, telecommunication, electronics, lighting and colour terms Part 1: Group 06:1973 Electronic tube terminology IEC 68 BS 2011 Basic environmental testing procedures IEC 134:19

16、61 BS 3494 Recommendations on semiconductor devices Part 1:1967 Essential electrical and mechanical ratings and characteristics IEC 410:1972 BS 6001:1972 Sampling procedures and tables for inspection by attributesBSEN 136000:1993 BSI 07-1999 iii NOTEThere is as yet no equivalent British Standard for

17、 IEC151, IEC235 or CECC00107. The committee responsible for this standard has studied these and confirms that, for the purposes of this standard, their technical requirements are acceptable. A British Standard does not purport to include all the necessary provisions of a contract. Users of British S

18、tandards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. CECC 00006:1973 BS E9006:1976 Harmonized system of quality assessment for electronic components. Basic specification: Environmental test procedures CE

19、CC 00007:1973 BS E9007:1975 Harmonized system of quality assessment for electronic components. Basic specification: Sampling plans for inspection by attributes Reference to international standard Corresponding British Standard Summary of pages This document comprises a front cover, an inside front c

20、over, pages i to iv, theENtitle page, pages 2 to 10, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on theinside front cover.iv blankEUROPEAN STANDARD NORME EUROPENNE E

21、UROPISCHE NORM EN 136000 May 1992 Descriptors: Quality, electronic components, magnetrons English version Generic Specification: Magnetrons Spcification Gnrique: Magntrons Fachgrundspezifikation: Magnetrons This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on1

22、4 January1992. The text of this standard consists of the text of CECC36000 Issue11977 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard

23、without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in

24、any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria Belgium, Denmark, Finland, Fran

25、ce, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and UnitedKingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee fo

26、r Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1992 Copyright reserved to CENELEC members Ref. No. EN 136000:1992 E2 blankEN136000:1992 4 BSI 07-1999 Foreword

27、 The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate int

28、ernational trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries withou

29、t further testing. This document has been formally approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for MAGNETRONS. It should be read in conjunction with document CECC 00100: Basic Rules (1974). At t

30、he date of printing of this document, the member countries of the CECC are Belgium, Denmark, Germany, France, Ireland, Italy, the Netherlands, Norway, Sweden, Switzerland and the UnitedKingdom, and copies of it can be obtained from the National Committees of the CENELEC in these countries. Preface T

31、his generic specification was prepared by CECC Working Group13: “Microwave Tubes”. In accordance with the requirements of document CECC00100 it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission and in particular on IEC Publication235: Measurement of

32、 the electrical properties of microwave tubes. The text of this specification was circulated to the CECC for voting in the documents below and was formally approved by the CECC for printing as a CECC Specification. This specification will be supplemented by blank detail specifications specific to ea

33、ch sub-family of magnetrons. Contents Page Foreword 4 Preface 4 Section 1. Scope Section 2. General 2.1 Order of precedence 5 2.2 Related documents 5 2.3 Units, symbols and terminology 6 2.4 Standard and preferred values 6 2.5 Marking 6 Section 3. Quality assessment procedures 3.1 Primary stage of m

34、anufacture 6 3.2 Structural similarity 6 3.3 Qualification approval procedure 7 3.4 Quality conformance inspection 7 3.5 Resubmission of rejected lots 7 3.6 Certified test records 7 3.7 Delayed delivery 7 Section 4. Test and measurement procedures 4.1 General 7 4.2 Alternative methods 7 4.3 Standard

35、 conditions for testing 8 4.4 Visual inspection and check of dimensions 8 4.5 Electrical measurement procedures 8 4.6 Mechanical measurement procedures 9 4.7 Environmental tests 9 4.8 Endurance tests 9 4.9 Additional test and measurement procedures 9 Document Voting date CECC (Secretariat) 318 10 Ap

36、ril 1975 CECC (Secretariat) 432 27 December 1975 CECC (Secretariat) 483 1 July 1976EN136000:1992 BSI 07-1999 5 Section 1. Scope This document relates to pulsed and cw magnetrons. Section 2. General 2.1 Order of precedence Where any discrepancies occur for any reason, documents shall rank in the foll

37、owing order of authority: the detail specification the generic specification the rules of procedure of document CECC00100 or any other international (for example IEC) documents to which reference is made. NOTEThe same order of precedence shall apply to equivalent national documents. 2.2 Related docu

38、ments ISO 1000 (1973) SI units and recommendations for the use of their multiples and of certain other units. IEC 27 Letter symbols to be used in electrical technology. IEC 27-1 (1971) Part 1: General. IEC 27-1A (1976) First supplement to Publication 27-1 (1971). IEC 50 International Electrotechnica

39、l Vocabulary. IEC 68 Basic environmental testing procedures. (See CECC00006.) IEC 117 Recommended graphical symbols. IEC 134 (1961) Rating systems for electronic tubes and valves and analogous semiconductor devices. IEC 151 Measurements of the electrical properties of electronic tubes. IEC 151-1 (19

40、63) Part 1: Measurement of electrode current. IEC 151-2 (1963) Part 2: Measurement of heater or filament current. IEC 151-13 (1966) Part 13: Methods of measurement of emission current from hot cathodes for high-vacuum electronic tubes and valves. IEC 151-15 (1967) Part 15: Methods of measurement of

41、spurious and unwanted electrode currents. IEC 235 Measurement of the electrical properties of microwave tubes. IEC 235-1 (1972) Part 1: Terminology. IEC 235-1A (1975) First supplement to Publication235-1 (1972). IEC 235-2 (1972) Part 2: General measurements. IEC 235-2A (1974) First supplement to Pub

42、lication 235-2 (1972). IEC 235-2B (1975) Second supplement to Publication235-2 (1972). IEC 235-2C (1976) Third supplement to Publication255-2 (1972). IEC 235-2D (1976) Fourth supplement to Publication235-2 (1972). IEC 235-4 (1972) Part 4: Magnetrons. IEC 235-4A (1975) First supplement to Publication

43、235-4 (1972). IEC 410 (1973) Sampling plans and procedures for inspection by attributes. (SeeCECC00007.) CECC 00100 (1974) Basic Rules. CECC 00107 (1974) RP 7: Quality assessment procedures.EN136000:1992 6 BSI 07-1999 2.3 Units, symbols and terminology Units, graphical symbols, letter symbols and te

44、rminology shall, whenever possible, be taken from the following documents: Where further units, symbols and terminology are required they shall be derived in accordance with the principles of the documents listed above. 2.4 Standard and preferred values Not applicable. 2.5 Marking The following shal

45、l be marked on the tube in the following order of precedence as space permits. All this information, except the terminal marking, shall appear on the primary pack: terminal identification (where this is not shown on the outline drawing) and where appropriate, any special operating conditions type de

46、signation date code and/or factory identification code manufacturers name or trade mark mark of conformity unless a certificate of conformity is used. The use of potentially hazardous material in the construction of the tubes, or other hazards associated with the operation of the tube, shall be indi

47、cated according to national requirements. Section 3. Quality assessment procedures 3.1 Primary stage of manufacture This is the process of joining together of all piece parts. The sub-contracting of this process and/or all subsequent processes is prohibited. (See7.2.2 ofCECC00107.) 3.2 Structural si

48、milarity When simultaneous or successive production is proceeding on several types of tubes having common features, those common features may be sampled from the complete range. Admissible common features and associated tests include the following: CECC 00006 (1973) Basic specification: Environmenta

49、l test procedures. CECC 00007 (1973) Basic specification: Sampling plans and procedures for inspection by attributes. ISO 1000 SI units and recommendations for the use of their multiples and certain other units. IEC 27 Letter symbols to be used in electrical technology. IEC 50 International Electrotechnical Vocabulary. IEC 117 Recommended graphical symbols IEC 235-1 Measurement of the electrical properties of microwave tubes: Terminology Tube outline: dimensions Envelope and terminations: robustness of terminations, climatic tests Heater: cur

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