BS EN 140104-1996 Harmonized system of quality assessment for electronic components - Blank detail specification fixed low power non-wirewound resistors (Assessment levels SB and S.pdf

1、BRITISH STANDARD BS EN 140104:1996 Harmonized system of quality assessment for electronic components Blank detail specification: Fixed low power non-wirewound resistors (Assessment levels SB and SC) The European Standard EN 140104:1996 has the status of a British Standard ICS 31.040.10BSEN 140104:19

2、96 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on 15September1996 BSI 11-1998 The following BSI references relate to the work on this standard: Committee reference

3、 EPL/40/2 Draft announced in BSI News Update April 1996 ISBN 0 580 26062 3 Committees responsible for this British Standard The preparation of this British Standard was entrusted by Technical Committee EPL/40, Capacitors and Resistors for Electronic Equipment, to Subcommittee EPL/40/2, Resistors, up

4、on which the following bodies were represented: BEAMA Ltd. Federation of the Electronics Industry Ministry of Defence National Supervising Inspectorate (BSI-PC) Amendments issued since publication Amd. No. Date CommentsBS EN 140104:1996 BSI 11-1998 i Contents Page Committees responsible Inside front

5、 cover National foreword ii Foreword 2 Text of EN140104 3 List of references Inside back coverBSEN 140104:1996 ii BSI 11-1998 National foreword This British Standard has been prepared by Subcommittee EPL/40/2 and is the English language version of EN140104:1996 Blank detail specification: Fixed low

6、power non-wirewound resistors (Assessment levels SB and SC), published by the Electronic Components Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). This standard supersedes BS CECC 40104:1992 which is withdrawn. This standard lists the requirements to be in

7、cluded in any detail specification for this type of resistor. The requirements of this blank detail specification and BSCECC00111 Rule of Procedure 11. Specifications Part4:1991 Regulations for CECC detail specifications apply to detail specifications. The British Standard which implements the CECC

8、Rules of Procedure is BS9000 General requirements for a system for electronic components of assessed quality Part 2:1996 Specification for the national implementation of the CECC system. Cross-references Publication referred to Corresponding British Standard EN 140000:1993 BSEN140000:1995 Harmonized

9、 system of quality assessment for electronic components. Generic specification: fixed resistors EN 100014:1991 BSEN100014:1992 Harmonized system of quality (CECC 00014:1986) assessment for electronic components. Basic specification CECC assessed process average procedure (60 % confidence limit) CECC

10、 00114-IV:1991 1)BSCECC00114 Rule of procedure 14. Quality assessment procedures Part4:1992 Procedure for enhanced assessment of quality IEC 68-2-20:1979 BS 2011 Environmental testing Part2.1 Tests Part2.1T:1981. Test T. Soldering IEC286 BS6062 Packaging of electronic components for automatic handli

11、ng IEC440:1973 BS5694:1979 Method for measurement of non-linearity in resistors Copyright BSI copyright (see back cover) does not preclude the reproduction and free use of the pro forma pages in the course of preparing detail specifications. A British Standard does not purport to include all the nec

12、essary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theE

13、N title page, pages 2 to 16, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on theinside front cover. 1) CECC00114 (RP14) PartIV has replaced CECC00107:1980 RP7 PartII.

14、EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 140104 February 1996 ICS 31.040.10 Supersedes CECC 40 104:1990 Descriptors: Electronic components, fixed low power resistors, non-wirewound resistors, blank detail specification, assessment level SB and SC English version Blank Detail Specificatio

15、n: Fixed low power non-wirewound resistors (Assessment levels SB and SC) Spcification particulire cadre: Rsistances fixes non-bobines faible dissipation (Niveaux dassurance de la qualit SB et SC) Vordruck fr Bauartspezification: Nichtdrahtgewickelte Festwiderstnde kleiner Belastbarkeit (Bewertungsst

16、ufen SB und SC) This European Standard was approved by CENELEC on 1995-11-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and

17、bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsi

18、bility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Net

19、herlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1996 Co

20、pyright reserved to CENELEC members. Ref. No. EN 140104:1996 EEN 140104:1996 BSI 11-1998 2 Foreword This European Standard was prepared by CENELEC/TC CECC/SC 40XB, Fixed resistors. The text of the draft was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN140104 on 1995-

21、11-28. This European Standard supersedes CECC40104:1990. The following dates were fixed: Contents Page Foreword 2 1 Ratings and characteristics 3 2 Marking 4 3 Related documents 4 4 Ordering information 4 5 Certified test records 4 6 Additional information (not for inspection purposes) 5 7 Inspectio

22、n requirements (see Table 2) 5 8 Assessed process average procedures 6 Table 2 7 latest date by which the EN has to be implemented at national level by publication ofan identical national standard or by endorsement (dop) 1996-06-01 latest date by which the national standards conflicting with the EN

23、have to be withdrawn (dow) 1996-12-01EN 140104:1996 BSI 11-1998 3 1 Ratings and characteristics * Resistance range 2) 1.1 Derating Resistors covered by this specification are normally derated according to the curve: The detail specification shall state the maximum allowable dissipation at temperatur

24、es other than 70C. All break points on the curve shall be verified by test. A larger area of operation may be given in the detail specification provided it includes all the areas given above. An EXAMPLE of the derating curve having a larger area of operation is given below. In the example the zero r

25、ating temperature is higher than the upper category temperature. Specification available from: (1) CECC 40 104-XXX (2) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: (3) (4) Outline and dimensions (seeTable 1) (First angle projection) (7) FIXED LOW POWER NON-WIREWOUND RESISTORS (5) (6

26、) ASSESMENT LEVELS “SB” 1,5mm or 196m/s 2(whichever is the less severe) Low air pressure 2,0kPa (20mbar) Limits of resistance change after2000hendurance test (- % R + - 7) Temperature characteristic of resistance(C to C) Maximum soldering temperature (after1000 h) electrical endurance test C Solderi

27、ng time Distance from case . . sec mm NOTEVarious parameters have been precisely specified for this component. It should not be assumed that any parameter not specified will remain unchanged from one component to another. NOTEShould, for any reason, it be necessary for further parameter(s) to be con

28、trolled, then a new fuller specification should be used. NOTEThe additional test method(s) shall be fully described, and appropriate limits, AQLs and Inspection levels specified.EN 140104:1996 4 BSI 11-1998 2 Marking Unless specified otherwise in the contract between the manufacturer and his custome

29、r, the marking of the component and package shall be in accordance with the requirements of 2.4 of EN140000. 3 Related documents National Authorised Institutions will complete this section, making reference to any documents, recommendations or specifications directly referred to in their national eq

30、uivalent of this document. 4 Ordering information Orders for resistors covered by this specification shall contain the following information: Resistance value Tolerance Style and national specification number of this detail specification Assessment level (SB or SC see7.7.1 and 7.7.2) Lot acceptance

31、level (LA1, LA2 or LA3) (see7.7.3) If not specified in the purchase order, lot acceptance level LA3 shall apply. 5 Certified test records When requested by the orderer, certified test records shall be prepared in accordance with 3.9 of EN140000.EN 140104:1996 BSI 11-1998 5 6 Additional information (

32、Not for inspection purposes) The detail specification may include information (which is not required to be verified by the inspection procedure), such as a circuit diagram, curves, drawings and notes for the clarification of the detail specification. 7 Inspection requirements (See Table 2) 7.1 Proce

33、ss identification document (P.I.D.) Resistors supplied to this specification shall be produced strictly in accordance with the relevant Process Identification Document. Each component shall be traceable to its production lot. 7.2 Special in-process controls Resistors covered by this specification sh

34、all/shall not be subject to Internal Visual Inspection in accordance with the requirements of EN140000, Annex B. 7.3 General When a range of resistance value is to be supplied, the distribution of resistance values for lot acceptance testing shall be as specified in the purchase order with quantity

35、for each one. When drying is called for, Procedure I of 4.3. of EN140000 shall be used. The sequence of all inspection and tests shall be as shown inTable 2. The procedure in case of lot failure following screening tests shall be in accordance with 7.4. 7.4 Lot failure If the number of components fa

36、iled during the screening tests exceeds the failure criteria specified at the conclusion of Group0, final production tests, the lot shall be considered as failed. When sample testing is specified a lot shall be failed if the number of allowable failures, in accordance with the relevant inspection le

37、vel and AQL is exceeded. However, in such a case the manufacturer may perform 100% testing and all failures shall count towards the failure criteria specified. If lot failure occurs, the manufacturer shall notify the National Supervising Inspectorate and the Orderer within two working days, giving d

38、etails of the number of failures, mode of failure and suspected cause. No additional tests shall be performed on the failed components except on instruction from the National Supervising Inspectorate. Failed components from acceptable lots shall be marked as such and unless specified to the contrary

39、, included in the delivery. Failure analysis of these components shall be performed by the manufacturer of requested by the National Supervising Inspectorate or the Orderer. 7.5 Qualification approval Qualification approval shall comply with the requirements of this specification, 3.4 of EN140100 an

40、d AnnexA.2 of EN140100. Qualification approval shall not be granted where the testing has been based on the quality conformance schedule given inTable 2. 7.6 Data documentation Data documentation shall be provided in accordance with the requirements of the contract between the manufacturer and his c

41、ustomer. 7.6.1 Pre-screening test data For pre-screening tests, records shall be provided for each of the following inspections and tests: a) Overload b) Non-linearity or current noise c) Dimensions checkEN 140104:1996 6 BSI 11-1998 7.6.2 Screening test data For assessment level SB, records shall be

42、 provided for each of the following inspections and tests: a) 0-hour resistance measurement b) Resistance measurement after 500 hours c) DR value d) Number of components failed during seal test and external visual inspection 7.7 Quality conformance inspection 7.7.1 General In accordance with annexB

43、of Part11 of CECC00107, resistors produced to this specification may be supplied to two assessment levels, SB and SC. The level SB requires the allocation of a serial number to each resistor which is then subjected individually to the appropriate assessment, while in the case of level SC the assessm

44、ent is performed on the entire lot. The inspections and tests corresponding to the assessment level are followed by specified in the order. There is a choice of three lot acceptance levels, LA1, LA2 and LA3. Level LA3, the least severe, normally consists of a verification of the primary electrical c

45、haracteristics. Level LA2 additionally contains the endurance tests while LA1, in addition to the tests of LA3 and and LA2, requires environmental tests. When the assessment levels and lot acceptance levels are combined together, there is a choice of six different degrees of severity: SB/LA1, SB/LA2

46、, SB/LA3, SC/LA1, SC/LA2, and SC/LA3. 7.7.2 Assessment level Components failing inspections and tests at assessment level SB shall not be supplied against any order for components of the lower level SC. For each delivery lot the manufacturer shall produce all the necessary inspection and test eviden

47、ce to show conformity to the requirements for assessment level SB or SC appropriate (Group0) and the lot acceptance level specified by the Orderer. 7.7.3 Acceptance level The lot-by-lot, lot acceptance testing for lot acceptance levels LA1, LA2 and LA3 shall comprise the following sub-groups: LA1: S

48、ub-groups A1, B1, B2 and B3 LA2: Sub-groups A1, B1 and B2 LA3: Sub-groups A1 and B1 8 Assessed process average procedures When the assessed process average procedure as specified in CECC00014 is used, the detailed specification shall give the limits as required in clause 3.12 of EN140000. The detail

49、 specification shall prescribe at relevant places that non-operatives have to be recorded.EN 140104:1996 BSI 11-1998 7 Table 2 See Notes 1, 2, 3 and 8 (Notes on pages 21-22) Clause number Conditions of test Assessment level Performance requirements and test SB SC GROUP 0 Non Destructive (FINAL PRODUCTION TESTS) To be conducted, as indicated on columns 3 and 4, lot-by-lot PRE SCREENING TESTS (see Note 4) 4.4.1 Marking IL II IL II As in 4.4.1 AQL AQL 1% 1% 4.4.3 Dimensions. IL II IL II As in 4.4.3 (Detail) AQL AQL 1% 1% 4.5 Resistanc