BS EN 16603-20-08-2014 Space engineering Photovoltaic assemblies and components《航天工程 光伏部件和组件》.pdf

1、BSI Standards PublicationBS EN 16603-20-08:2014Space engineeringPart 20-08: Photovoltaic assemblies andcomponentsBS EN 16603-20-08:2014 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of EN16603-20-08:2014.The UK participation in its preparation was entrusted to Techn

2、icalCommittee ACE/68, Space systems and operations.A list of organizations represented on this committee can beobtained on request to its secretary.This publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. The British St

3、andards Institution 2014. Published by BSI StandardsLimited 2014ISBN 978 0 580 83977 1ICS 49.140Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 30 September 2014.A

4、mendments issued since publicationDate Text affectedBS EN 16603-20-08:2014EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 16603-20-08 August 2014 ICS 49.140English version Space engineering - Part 20-08: Photovoltaic assemblies and components Ingnirie spatiale - Partie 20-08: Ensembles et compo

5、sants photovoltaque Raumfahrttechnik - Teil 20-08: Fotovoltaische Baugruppen und Komponenten This European Standard was approved by CEN on 10 February 2014. CEN and CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European S

6、tandard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN and CENELEC member. This European Standard exists in three official v

7、ersions (English, French, German). A version in any other language made by translation under the responsibility of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CEN and CENELEC members are the national s

8、tandards bodies and national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Nor

9、way, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom. CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2014 CEN/CENELEC All rights of exploitation in any form and by any means reserved worldwide for CEN national Members and for CEN

10、ELEC Members. Ref. No. EN 16603-20-08:2014 EBS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 2 Table of contents Foreword 10 Introduction 11 1 Scope. 12 2 Normative references . 13 3 Terms, definitions and abbreviated terms 14 3.1 Terms from other standards 14 3.2 Terms specific to the present standard

11、 . 14 3.3 Abbreviated terms. 19 4 General 22 4.1 Overview 22 4.1.1 Objective and organization 22 4.1.2 Interfaces with other areas 23 4.2 Physical properties . 24 4.3 Test and storage . 25 4.3.1 Test environment 25 4.3.2 Test tolerances and accuracies . 25 4.3.3 Margins . 26 4.4 Critical materials .

12、 26 5 Photovoltaic assemblies 27 5.1 Overview 27 5.1.1 Description 27 5.1.2 Purpose and objective . 27 5.2 Conditions and method of test 28 5.3 Photovoltaic assembly design . 29 5.3.1 Overview . 29 5.3.2 Parameters related to parts, materials and processes (PMP) 29 5.3.3 Parameters related to design

13、 30 5.4 PVA manufacturing . 34 5.4.1 Process validation . 34 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 3 5.4.2 Defect acceptability . 34 5.4.3 In-process testing 34 5.4.4 Identification and traceability . 35 5.4.5 Recording . 36 5.5 PVA tests 36 5.5.1 Qualification tests 36 5.5.2 Acceptance test

14、s for qualification coupons 41 5.5.3 Definition of tests and checks 42 5.6 Failure definition . 53 5.6.1 Failure criteria . 53 5.6.2 Failed qualification coupons 53 5.7 Data documentation 53 5.8 Delivery 54 5.9 Packaging, packing, handling and storage 54 6 Solar cell assemblies . 55 6.1 General . 55

15、 6.1.1 Testing 55 6.1.2 Conditions and methods of test . 55 6.1.3 Deliverable components 55 6.1.4 Identification and traceability . 55 6.2 Production control (process identification document) 56 6.3 Acceptance tests 56 6.3.1 General . 56 6.3.2 Test methods and conditions 56 6.3.3 Electrical performa

16、nce acceptance test (EPA) 57 6.4 Qualification tests . 57 6.4.1 General . 57 6.4.2 Qualification 59 6.4.3 Test methods, conditions and measurements . 60 6.5 Failure definition . 71 6.5.1 Failure criteria . 71 6.5.2 Failed SCAs 72 6.6 Data documentation 72 6.7 Delivery 72 6.8 Packing, dispatching, ha

17、ndling and storage 72 6.8.1 Overview . 72 6.8.2 ESD Sensitivity . 72 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 4 7 Bare solar cells . 73 7.1 Testing, deliverable components and marking 73 7.1.1 Testing 73 7.1.2 Deliverable components 74 7.1.3 Marking . 74 7.2 Production control (process identifi

18、cation document) 74 7.3 Acceptance tests 75 7.3.1 General . 75 7.3.2 Test methods and conditions 76 7.3.3 Documentation 76 7.4 Qualification tests . 77 7.4.1 General . 77 7.4.2 Qualification 79 7.5 Test methods, conditions and measurements . 80 7.5.1 Visual inspection (VI) 80 7.5.2 Dimensions and we

19、ight (DW) 82 7.5.3 Electrical performance (EP) 82 7.5.4 Temperature coefficients (TC) . 83 7.5.5 Spectral response (SR) . 84 7.5.6 Optical properties (OP) . 84 7.5.7 Humidity and temperature (HT) . 85 7.5.8 Coating adherence (CA) . 86 7.5.9 Contact uniformity (CU) . 87 7.5.10 Contact thickness (CT)

20、87 7.5.11 Surface finish (SF) 87 7.5.12 Pull test (PT) . 88 7.5.13 Electron irradiation (EI) . 88 7.5.14 Proton irradiation (PI) 89 7.5.15 Photon irradiation and temperature annealing (PH). 90 7.5.16 Solar cell reverse bias test (RB) 90 7.5.17 Thermal cycling (CY) . 91 7.5.18 Active-passive interfac

21、e evaluation test (IF) 91 7.5.19 Flatness test (FT) 91 7.6 Failure definition . 92 7.6.1 Failure criteria . 92 7.6.2 Failed components 92 7.7 Data documentation 92 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 5 7.8 Delivery 92 7.9 Packing, dispatching, handling and storage 93 7.9.1 Overview . 93 7.

22、9.2 ESD Sensitivity . 93 8 Coverglasses 94 8.1 Overview 94 8.1.1 Purpose 94 8.1.2 Description 94 8.2 Interfaces 94 8.3 Testing, deliverable components and marking 95 8.3.1 Testing 95 8.3.2 Deliverable components 95 8.3.3 Marking (coating orientation) . 96 8.4 Production control (Process identificati

23、on document) 96 8.5 Acceptance tests 96 8.5.1 Acceptance test samples 96 8.5.2 Acceptance test sequence 97 8.5.3 Test methods and conditions 97 8.5.4 Documentation 97 8.6 Qualification tests . 98 8.6.1 General . 98 8.6.2 Qualification 98 8.7 Test methods, conditions and measurements . 100 8.7.1 Visu

24、al inspection (VI) 100 8.7.2 Transmission into air (TA) . 101 8.7.3 Electro-optical properties (EO) 102 8.7.4 Mechanical properties . 102 8.7.5 Reflectance properties (OP) 103 8.7.6 Normal emittance (eN) (NE) . 105 8.7.7 Surface resistivity 105 8.7.8 Flatness or bow (FT) . 105 8.7.9 Transmission int

25、o adhesive (TH) . 106 8.7.10 Boiling water test (BW) 106 8.7.11 Humidity and temperature . 106 8.7.12 UV exposure (UV) . 107 8.7.13 Electron irradiation (EI) . 108 8.7.14 Proton irradiation (PI) 108 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 6 8.7.15 Breaking strength (BS) 108 8.7.16 Thermal cycl

26、ing (CY) . 109 8.7.17 Abrasion resistance (coated surface) (AE) 109 8.7.18 Coating adhesion (TD) 109 8.8 Failure definition . 109 8.8.1 Failure criteria . 109 8.8.2 Failed components 110 8.9 Data documentation 110 8.10 Delivery 110 8.11 Packing, dispatching, handling and storage 110 9 Solar cell pro

27、tection diodes .111 9.1 Overview 111 9.2 Testing, deliverable components and marking 111 9.2.1 Testing 111 9.2.2 Deliverable components 113 9.2.3 Marking . 113 9.3 Production control (process identification document) 113 9.3.1 Integral protection diodes 113 9.3.2 External protection diodes . 113 9.4

28、 Acceptance tests 114 9.4.1 General . 114 9.4.2 Integral protection diodes 114 9.4.3 External protection diodes . 114 9.4.4 External and integral diodes 115 9.4.5 Test methods and conditions 115 9.4.6 Documentation 116 9.5 Qualification tests . 116 9.5.1 General . 116 9.5.2 Integral protection diode

29、s 116 9.5.3 External protection diodes . 117 9.5.4 Integral and external protection diodes 118 9.6 Test methods, conditions and measurements . 119 9.6.1 General . 119 9.6.2 Visual inspection (VI) 119 9.6.3 Dimensions and weight (DW) 120 9.6.4 Thermal cycling (CY) . 121 9.6.5 Burn in (BI) 121 BS EN 1

30、6603-20-08:2014EN 16603-20-08:2014 (E) 7 9.6.6 Humidity and temperature (HT) . 122 9.6.7 Contact uniformity (CU) . 122 9.6.8 Contact thickness (CT) 123 9.6.9 Surface Finish (SF) . 123 9.6.10 Contact adherence (CA) . 123 9.6.11 Pull test (PT) . 124 9.6.12 Electron irradiation (EI) . 124 9.6.13 Temper

31、ature annealing (TA) . 125 9.6.14 Temperature behaviour (TB) . 125 9.6.15 Diode characterization (DC) 126 9.6.16 Human body ESD (DE) . 127 9.6.17 Switching test (DS) 128 9.6.18 Life test (DL) . 130 9.7 Failure definition . 132 9.7.1 Failure criteria . 132 9.7.2 Failed components 133 9.8 Data documen

32、tation 133 9.9 Delivery 133 9.10 Packing, despatching, handling and storage . 133 9.10.1 Overview . 133 9.10.2 ESD sensitivity 133 10 Sun simulators and calibration procedures .134 10.1 Sun simulators 134 10.1.1 Spectral distribution . 134 10.1.2 Irradiance uniformity 142 10.1.3 Irradiance stability

33、 . 142 10.2 Standard cell and Sun simulator calibration 143 10.2.1 Primary standards . 143 10.2.2 Secondary working standards (SWS) 144 10.2.3 Standards cells documentation . 145 10.2.4 Maintenance of standards . 146 10.2.5 Recalibration and intercomparation . 146 10.2.6 Sun simulator calibration an

34、d maintenance . 146 11 Capacitance measurement methods 147 11.1 Single junction solar cell capacitance measurement . 147 11.1.1 Overview . 147 11.1.2 Signal measurement method 148 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 8 11.1.3 Measurement procedure . 148 11.1.4 Measurement analysis 152 11.1.

35、5 Measurement of the capacitance of a multi-junction cell . 155 11.2 Time domain capacitance measurement 155 11.2.1 Overview . 155 11.2.2 Measurement procedure . 156 Annex A (normative) Source control drawing for photovoltaic assembly (SCD-PVA) - DRD 158 Annex B (normative) Source control drawing fo

36、r solar cell assembly (SCD-SCA) - DRD .164 Annex C (normative) Source control drawing for bare solar cell (SCD-BSC) - DRD .169 Annex D (normative) Source control drawing for coverglass (SCD-CVG) - DRD 178 Annex E (normative) Source control drawing for External Protection Diodes (SCD-EPD) - DRD 184 A

37、nnex F (normative) Process identification document (PID) - DRD .188 Annex G (normative) Data documentation package (DDP) - DRD 190 Bibliography .193 Figures Figure 4-1: Specification hierarchy . 23 Figure 6-1: Definition of cell defects 61 Figure 6-2: Test points for electrical performance measureme

38、nt 63 Figure 7-1: Definition of bare solar cell defects . 81 Figure 8-1: Methods of defining coverglass orientation . 96 Figure 8-2: Edge chip parameters 101 Figure 8-3: Corner chip parameters 101 Figure 8-4: Coverglass manufacturing tolerance limits . 103 Figure 8-5: Schematic for calculating surfa

39、ce resistivity 105 Figure 8-6: Definition of coverglass flatness . 106 Figure 9-1: Diode forward and reverse test profile 129 Figure 9-2: Diode switching test profile . 130 Figure 11-1: Solar cell impedance measurement equipment 149 Figure 11-2: Channel balancing and reduction of the parasitic induc

40、tances 150 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 9 Figure 11-3: Measurement of the resistance value of the shunt in the measuring conditions (shunt in parallel with the input of the network analyser) 151 Figure 11-4: Small signal electrical schema biased with a DC voltage associated impedanc

41、e . 153 Figure C-1 : BSC front side 171 Figure C-2 : BSC rear side . 172 Figure C-3 : BSC contact 172 Tables Table 4-1: Test tolerances on temperature . 26 Table 5-1: Qualification test plan for PVA . 37 Table 5-2: Acceptance test plan . 42 Table 6-1: Qualification test plan for SCA . 58 Table 6-2:

42、Maximum dimensions of corner chips, edge chips and surface nicks 61 Table 7-1: Acceptance test matrix 75 Table 7-2: Qualification test plan for bare solar cells 78 Table 7-3: Maximum dimensions of corner chips, edge chips and surface nicks 81 Table 8-1: Qualification test plan for coverglasses 99 Ta

43、ble 9-1: Acceptance test matrix IPD . 114 Table 9-2: Acceptance test matrix EPD 114 Table 9-3: Qualification test plan for integral protection diode. 117 Table 9-4: Qualification test plan for external protection diodes 118 Table 9-5: Diode life test parameters 132 Table 10-1: AM0 solar spectral irr

44、adiance (WRC) . 135 Table 10-2: Classes of single and multi-source solar simulators . 140 Table 10-3: Classes of solar simulators with respect to nonconformity of irradiance uniformity . 142 Table 10-4: Classes of solar simulators with respect to temporal instability of irradiance . 143 Table B-1 :

45、Minimum current requirement for solar assemblies (25 C or operating temperature) 166 Table C-1 : Electrical performance pass-fail criteria 174 BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 10 Foreword This document (EN 16603-20-08:2014) has been prepared by Technical Committee CEN/CLC/TC 5 “Space”,

46、the secretariat of which is held by DIN. This standard (EN 16603-20-08:2014) originates from ECSS-E-ST-20-08C Rev.1. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by February 2015, and conflicting

47、national standards shall be withdrawn at the latest by February 2015. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. This document ha

48、s been prepared under a mandate given to CEN by the European Commission and the European Free Trade Association. This document has been developed to cover specifically space systems and has therefore precedence over any EN covering the same scope but with a wider domain of applicability (e.g. : aero

49、space). According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 16603-20-08:2014EN 16603-20-08:2014 (E) 11 Introduction The qu