BS EN 168201-1996 Harmonized system of quality assessment for electronic components - Blank detail specification - Quartz crystal units - (Qualification approval)《电子元器件的质量评估协调体系 空白.pdf

1、BRITISH STANDARD BS EN 168201:1996 Harmonized system of quality assessment for electronic components Blank detail specification: Quartz crystal units (Qualification approval) The European Standard EN168201:1992 has the status of a BritishStandard ICS31.140BSEN 168201:1996 This BritishStandard, havin

2、g been prepared under the directionof the Electrotechnical Sector Board,was published undertheauthority of the StandardsBoard and comes intoeffect on 15April1996 BSI01-2000 The following BSI references relate to the work on this standard: Committee reference EPL/49 Draft announced in BSINews,March19

3、96 ISBN 0 580 25754 1 Committees responsible for this BritishStandard The preparation of this BritishStandard was entrusted to Technical Committee EPL/49, Piezoelectric devices for frequency control and selection, upon which the following bodies were represented: FEI (Federation of the Electronics I

4、ndustry) IEE (Institution of Electrical Engineers) Institute of Physics Ministry of Defence National Supervising Inspectorate (BSI PC) Amendments issued since publication Amd. No. Date CommentsBSEN 168201:1996 BSI 01-2000 i Contents Page Committees responsible Inside front cover National foreword ii

5、 Foreword 2 Text of EN168201 4 List of references Inside back coverBSEN 168201:1996 ii BSI 01-2000 National foreword This BritishStandard has been prepared by Technical Committee EPL/49 and is the English language version of EN168201:1992 Blank details specification: Quartz crystal units (Qualificat

6、ion approval), published by the Electronic Components Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). This Standard lists the ratings, characteristics and inspection requirements which have to be included as mandatory requirements in any detail specificatio

7、n for this type of quartz crystal unit. Detail specifications have to conform to the requirements of this blank detail specification and BS CECC00111 Rule of Procedure11. Specifications Part4:1991 Regulations for CECC detail specifications. The BritishStandard which implements the CECC Rules of Proc

8、edure is BS9000 General requirements for a system for electronic components of assessed quality Part2:1996 Specification for the national implementation of the CECC system. Copyright BSI copyright (see back cover) does not preclude the reproduction and free use of the pro forma pages in the course o

9、f preparing detail specifications. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-

10、references Publication referred to Corresponding BritishStandard EN168000:1993 (CECC68000:1989) BS EN168000:1996 aHarmonized system of quality assessment for electronic components. Generic specification: Quartz crystal units EN168200 (CECC68200:1990) BS EN168200:1996 aHarmonized system of quality as

11、sessment for electronic components. Sectional specification: Quartz crystal units (Qualification approval) a In preparation. Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, the EN title page, pages2 to10, an inside back cover and a back cover. This standa

12、rd has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN168201 May1992 Descriptors: Quality, electronic components, quartz crystal units English vers

13、ion Blank detail specification: Quartz crystal units (Qualification approval) Spcification particulire cadre: Rsonateurs quartz (Homologation) Vordruck fr Bauartspezifikation: Schwingquarze (Bauartzulassung) This European Standard was approved by CENELEC Electronic Components Committee (CECC) on14 J

14、anuary1992. The text of this standard consists of the text of CECC68201 Issue1 (with erratum)1990 of the corresponding CECC Specification. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a na

15、tional standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German

16、). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denma

17、rk, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC Eur

18、opean Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1992 Copyright reserved to CENELEC members Ref. No. EN168201:1992 EEN168201:1992 BSI 01-2000

19、2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to faci

20、litate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countr

21、ies without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for Quartz Crystal Units (Qualification approval). It should be read in conjunction with th

22、e current regulations for the CECC System. At the date of printing of this specification, the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and theUnitedKingdom, and copies of it can

23、 be obtained from the addresses shown on the blue flysheet. Preface This specification was prepared by CECC WG17: Piezoelectric devices for frequency control and selection. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC12

24、2-1: Quartz crystal units for frequency control and selection: Part1: Standard values and test conditions. The text of this specification was circulated to the CECC for voting in the document(s) indicated below and was ratified by the President of the CECC for printing as a CECC Specification. Conte

25、nts Page Foreword 2 1 Ratings 4 2 Characteristics 4 3 Related documents 5 4 Marking 5 5 Ordering information 5 6 Certified test records 5 7 Additional information (not for inspection purposes) 5 8 Inspection requirements 5 Table 1 6 Document Date of voting Report on the voting CECC (Secretariat)2431

26、 October1989 CECC (Secretariat)2522EN 168201:1992 BSI 01-2000 3 Blank detail specification A blank detail specification is a supplementary document to the sectional specification and contains requirements for style and layout and minimum content of detail specifications. In the preparation of detail

27、 specifications the content of section2 of CECC68000 shall be taken into account. This specification may be inappropriate for small batch production quartz crystal units in which case the capability approval approach is recommended. Identification of the DS and the component The first page of the DS

28、 should have the layout recommended on page4. The numbers in square brackets correspond to the indications to be completed thereunder: 1 The name of the National Standards Organization under whose authority the DS is published and, if applicable, the organization from whom the DS is available 2 The

29、CECC symbol and the number allotted to the DS by the CECC General Secretariat. 3 The number and issue number of the CECC generic and sectional specification as relevant; also national reference if different. 4 If different from the CECC number, the national number of the DS, date of issue and any fu

30、rther information required by the national system, together with any amendment numbers. 5 A brief description of the component or range of components; for example: frequency, order, cut, mode. 6 Information on typical construction (where applicable); for example: resistance welded, cold welded. For

31、5 and 6 the text to be given in the DS should be suitable for an entry in CECC00200 (QPL) and CECC00300 (Library List). 7 An outline drawing with main dimensions which are of importance for interchangeability, and/or reference to the appropriate national or international document for outlines. Alter

32、natively, this drawing may be given in an annex to the DS, but 7 should always contain an illustration of the general outer appearance of the component. 8 The level(s) of quality assessment covered by the DS. 9 Reference data giving information on the most important properties of the component which

33、 allow comparison between the various component types intended for the same, or for similar, applications.EN 168201:1992 4 BSI 01-2000 1 Ratings (see2.4 of CECC68000 for preferred ratings) Operating temperature range Circuit condition Maximum Drive level Measurement Drive level Climatic category Mec

34、hanical test severities 2 Characteristics (see2.3 of CECC68000) Nominal frequency/range Reference temperature Frequency tolerance(s) Maximum resonance resistance In addition other characteristics including the following may be stated Shunt capacitance Motional parameters or Frequency pulling range U

35、nwanted responses Ageing rate Drive level dependency. NOTEInformation on the above characteristics may be given in tabular form. Specification available from : 1 2 CECC68201-XXX Issue . . . . . . . . . Date . . . . . . . . . Page1 of . . . . . . ELECTRONIC COMPONENTS OF ASSESSED QUALITY BY QUALIFICA

36、TION APPROVAL IN ACCORDANCE WITH : 3 4 Outline and dimensions (first angle projection) : 7 QUARTZ CRYSTAL UNITS 5 ENCLOSURE 6 Dimensions in mm ASSESSMENT LEVEL 8 Information about manufacturers who have components qualified to this detail specification is available in the current CECC00200 : Qualifi

37、ed Products List.EN 168201:1992 BSI 01-2000 5 3 Related documents 4 Marking The marking of the quartz crystal unit and the primary package shall be in accordance with the requirements of2.5 of CECC68000. Full details shall be given in the detail specification. 5 Ordering information The following or

38、dering information shall be specified 1) Quantity 2) CECC or customer detail specification number, issue number and date and where applicable 3) Nominal frequency expressed in kHz or MHz and overtone order 4) Enclosure type 5) Frequency tolerance(s) and operating temperature range 6) Circuit conditi

39、on 7) Full description of any additional requirements An example of ordering information shall be given. 6 Certified test records The detail specification shall state whether certified test records are required/not required in accordance with3.11 of CECC68000. 7 Additional information (not for inspe

40、ction purposes) The detail specification may include information (which is not required to be verified by the inspection procedure) such as circuit diagrams, curves, drawings and notes for the clarification of the detail specification. 8 Inspection requirements Clause numbers of tests and performanc

41、e requirements refer to CECC68000 The ILs and AQLs given in Table 1 are selected from IEC410 In this table Generic specification CECC68000 Sectional specification CECC68200 p =periodicity (in months) n =sample size c =acceptance criterion (permitted number of defectives) D =destructive ND=non-destru

42、ctive IL =inspection level AQL =acceptable quality level.EN 168201:1992 6 BSI 01-2000 Table 1 Clause number and Test D or ND Conditions of test IL AQL % Performance requirements 100% Inspection ND 4.5.1 4.7.1 Visual test A Frequency and resonance resistance as4.5.1 as4.7.1 as4.5.1 Frequency toleranc

43、e and maximum resistance Group A Inspection To be conducted on a sampling basis, lot-by-lot Sub-Group A1 ND II 0,25 4.7.9 Insulation resistance as4.7.9 as4.7.9 Sub-Group A2 ND II 0,25 4.7.2 4.7.3 4.7.3 Drive level dependency Test A Frequency and resonance resistance as a function of temperature Test

44、 B Frequency and resonance resistance as a function of temperature as4.7.2 as4.7.3 Test A as4.7.3 Test B as2.4.6 Frequency tolerance and/or variation and maximum resonance resistance as4.7.3 Test B (except for evacuated glass enclosures) Sub-Group A3 ND II 0,25 4.7.4 4.7.5 4.7.8 Unwanted responses S

45、hunt capacitance Motional parameters Motional capacitance C 1 or Motional inductance L 1 and Motional resistance R 1 as4.7.4 as4.7.5 as4.7.8 response ratios or minimum resonance resistance of unwanted response(s) shunt capacitance limits tolerances to be specifiedEN 168201:1992 BSI 01-2000 7Table 1

46、Clause number and Test D or ND Conditions of test IL AQL % Performance requirements Group B Inspection To be conducted on a sampling basis, lot-by-lot Sub-Group B1 ND II 0,25 4.6.2 4.8.2 2) Dimensions Test B Sealing Fine leak test as4.6.2 as4.8.2 2) as4.6.2 as2.4.11 (except for evacuated glass enclo

47、sures) 4.8.2 1) Sealing Gross leak test as4.8.2 1) as4.8.2 1) (except for evacuated glass enclosures) 4.8.2 3) Vacuum test for evacuated crystal units as4.8.2 3) as4.8.2 3) (glass enclosures only) 4.7.1 Frequency and resonance resistance as4.7.1 as specified in the detail specification Sub-Group B2

48、ND II 0,25 4.8.5 Rapid change of temperature thermal shock in air as4.8.5 (except for evacuated glass enclosures) 4.8.4 Rapid change of temperature severe shock by liquid immersion as4.8.4 (glass enclosures only) Final Inspection 4.5.2 Visual test B as4.5.2 as4.5.2 4.8.2 2) Sealing Fine leak test as

49、4.8.2 2) as2.4.11 (except for evacuated glass enclosures) 4.8.2 1) Sealing Gross leak test as4.8.2 1) as4.8.2 1) (except for evacuated glass enclosures) 4.8.2 3) Vacuum test for evacuated crystal units as4.8.2 3) as4.8.2 3) (glass enclosures only)EN 168201:1992 8 BSI 01-2000Table 1 Clause number and Test D or ND Conditions of test Sample size and criterion of acceptability Performance requirements p n c Group C Inspection To be conducted on a sampling basis Sub-Group C1 D 3 8 0 4.8.16 4.8.1 1) 4.8.1 2) 4.8.1 3) Imme