BS EN 60115-1-2011 Fixed resistors for use in electronic equipment Generic specification《电子设备用的固定电阻器 总规范》.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS EN 60115-1:2011electronic equipmentPart 1: Generic specificationFixed resistors for use inCopyright European Committee for Electrotechnical Standardization Provided by IHS und

2、er license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-BS EN 60115-1:2011 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of The UK participation in its preparation was entrusted to Technical Committee EPL/40X, Capaci

3、tors and resistors for electronic equipment.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.ISBN 978 0 580 7743

4、5 5 ICS 31.040.10 Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 February 2012. Amendments/corrigenda issued since publicationDate Text affected EN 60115-1:2

5、011. It was derived by CENELEC from IEC 60115-1:2008. It supersedes BS EN 60115-1:2001+A1:2001, BS QC 390000:1992, BS QC 390100:1992, and BS QC 390101:1992, which are withdrawn. The British Standards Institution 2012Published by BSI Standards Limited 2012 The CENELEC common modifications have been i

6、mplemented at the appropriate places in the text. The start and finish of each common modification is indicated in the text by tags .Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted witho

7、ut license from IHS-,-,-EUROPEAN STANDARD EN 60115-1 NORME EUROPENNE EUROPISCHE NORM November 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B -

8、 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60115-1:2011 E ICS 31.040.10 Supersedes EN 60115-1:2001 + A1:2001 + A11:2007English version Fixed resistors for use in electronic equipment - Part 1: Generic spec

9、ification (IEC 60115-1:2008, modified) Rsistances fixes utilises dans les quipements lectroniques - Partie 1: Spcification gnrique (CEI 60115-1:2008, modifie) Festwiderstnde zur Verwendung in Gerten der Elektronik - Teil 1: Fachgrundspezifikation (IEC 60115-1:2008, modifiziert) This European Standar

10、d was approved by CENELEC on 2011-08-15. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning

11、 such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member

12、into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, H

13、ungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENEL

14、ECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 2 - Contents 1 General . 7 1.1 Scope . 7 1.2 Normative references . 7 2 Technical data 9 2.1 Units and symbols 9 2.2 Terms and definitions . 9 2.3 Preferred values . 13 2.4 Marking . 13 2.5 Coding 13 2.6 Packaging

15、. 13 2.7 Storage . 14 2.8 Transportation 14 3 Quality assessment procedures . 14 4 Test and measurement procedures . 14 4.1 General . 14 4.2 Standard atmospheric conditions . 14 4.3 Drying . 15 4.4 Visual examination and checking of dimensions 15 4.5 Resistance 16 4.6 Insulation resistance . 17 4.7

16、Voltage proof 20 4.8 Variation of resistance with temperature 20 4.9 Reactance 22 4.10 Non-linearity . 23 4.11 Voltage coefficient 23 4.12 Current Noise . 24 4.13 Short time overload 24 4.14 Temperature rise 24 4.15 Robustness of the resistor body . 25 4.16 Robustness of terminations 26 4.17 Soldera

17、bility 27 4.18 Resistance to soldering heat 28 4.19 Rapid change of temperature . 28 4.20 Bump 29 4.21 Shock 29 4.22 Vibration . 30 4.23 Climatic sequence 30 4.24 Damp heat, steady state 32 4.25 Endurance 33 4.26 Accidental overload test . 42 BS EN 60115-1:2011 EN 60115-1:2011 (E)Copyright European

18、Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 3 - 4.27 Single-pulse high-voltage overload test . 44 4.28 Periodic-pulse high-voltage overload test 47 4.29 Component solvent

19、resistance . 49 4.30 Solvent resistance of marking 50 4.31 Mounting of surface mount resistors 50 4.32 Shear test . 51 4.33 Substrate bending test . 51 4.34 Corrosion 52 4.35 Flammability . 52 4.36 Operation at low temperature . 52 4.37 Damp heat, steady state, accelerated 53 4.38 Electrostatic disc

20、harge . 53 4.39 Periodic-pulse overload test . 54 4.40 Whisker growth test 55 4.41 Hydrogen sulphide test . 55 Annex B (normative) Rules for the preparation of detail specifications for resistors and capacitors for electronic equipment for use within the IECQ system . 56 Annex C (informative) Exampl

21、e of test equipment for the periodic-pulse high-voltage overload test 57 Annex F (informative) Letter symbols and abbreviations 59 Annex G (informative) Index table for test and measurement procedures 61 Annex Q (normative) Quality assessment procedures 63 Annex ZA (informative) Example of a certifi

22、ed test record . 71 Annex ZR (normative) Failure rate level evaluation, determination and qualification . 73 Annex ZX (informative) Cross reference . 80 Figures Figure 1 Insulation resistance and voltage proof test jig for rectangular surface mount resistors 18Figure 2 Insulation resistance and volt

23、age proof test jig for cylindrical surface mount resistors 19Figure 3 Test circuit . 22Figure 4 Oscilloscope trace . 23Figure 5 Testing of resistor body robustness 26Figure 6 Derating curve with specification of a suitable test dissipation . 37Figure 7 Derating curve without specification of a suita

24、ble test dissipation 37Figure 8 Derating curve for UCT = MET 40Figure 9 Derating curve for UCT MET 41Figure 10 Gauze cylinder fixture 43Figure 11 Pulse generator 1,2/50 45Figure 12 Pulse generator 10/700 . 45Figure C.1 Block diagram of test equipment . 57Figure C.2 Tolerances on the pulse shape . 58

25、BS EN 60115-1:2011 EN 60115-1:2011 (E)Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 4 - Tables Table 1 Referee conditions 15Table 2 Measuring voltages 16T

26、able 3 Calculation of resistance value (R) and change in resistance (R) . 21Table 4 Calculation of temperature differences (T) . 21Table 5 Tensile force for wire terminations 26Table 6 Torque 27Table 7 Number of cycles 31Table 8 Severities 46Table 9 List of preferred severities 48Table 10 Periodic-p

27、ulse overload test condition 54Table ZR.1 Component hours and permitted number of non-conformances for the qualification and extension of the qualification of a failure rate level (60 % statistic confidence level) . 74Table ZR.2 Component hours, permitted number of non-conformances and periodicity f

28、or the maintenance of the qualification of a failure rate level (10 % statistic confidence level) . 76Table ZR.3 Environmental factor E79 BS EN 60115-1:2011 EN 60115-1:2011 (E)Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo

29、 reproduction or networking permitted without license from IHS-,-,- 5 - Foreword This document EN 60115-1 consists of the text of IEC 60115-1:2008 prepared by IEC TC 40, Capacitors and resistors for electronic equipment, together with the common modifications prepared by the Technical Committee CENE

30、LEC TC 40XB, Resistors. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-08-15 latest date by which the national standards conflicting with the document have to be wi

31、thdrawn (dow) 2014-08-15 This document supersedes EN 60115-1:2001 + A1:2001 + A11: 2007. European common modifications to the text of IEC 60115-1:2008 are indicated by .Clauses, subclauses, notes, tables and figures which are additional to those in IEC 60115-1:2008 are prefixed “Z”. Preceding docume

32、nts on the subject covered by this specification have been: EN 1400:193-12 CECC 40 000:1973-00, 1979:00 Compared to EN 60115-1:2001, the following changes have been implemented: revision of the terms and definitions in 2.2; removal of the property “temperature characteristics” from 4.8; revision of

33、the solderability test in 4.17; revision of the resistance to soldering heat test in 4.18; introduction of new bias voltages for the damp heat, steady-state test in 4.24; revision of Clause 4.25; introduction of new test severities for the single-pulse high-voltage overload test on 4.27; introductio

34、n of a new system of test severities for the shear test in 4.32; deletion of the seal test in 4.36; introduction of the operation at low temperature test in 4.36, as a replacement of 4.38; revision of the damp heat, steady state, accelerated test in 4.37, as a replacement of 4.39, with introduction

35、of a new test severity introduction of the electrostatic discharge test in 4.38, as a replacement of 4.40; revision of the periodic-pulse overload test in 4.39, as a replacement of 4.37; introduction of a whisker growth test in 4.40; deletion of normative Annex A; revision of normative Annex B; dele

36、tion of normative Annexes D and E; introduction of informative Annexes F and G; revision of normative Annex Q, as a replacement of Clause 3; revision of informative Annex ZA; revision of normative Annex ZR, as a replacement of Annex ZB; editorial revision. See also the cross reference of informative

37、 Annex ZX. BS EN 60115-1:2011 EN 60115-1:2011 (E)Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 6 - This document has been prepared under a mandate given t

38、o CENELEC by the European Commission and the European Free Trade Association, and supports essential requirements of EU Directive(s). Endorsement notice The text of the International Standard IEC 60115-1:2008 was approved by CENELEC as a European Standard with common modifications. _ BS EN 60115-1:2

39、011 EN 60115-1:2011 (E)Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 7 - 1 General 1.1 Scope This part of IEC 60115 is a generic specification and is appl

40、icable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. 1.2 Normative references The following referenced d

41、ocuments are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. EN 60027-1, Letter symbols to be used in electrical technology - Part 1: Ge

42、neral (IEC 60027-1) EN 60060-1:2010, High-voltage test techniques Part 1: General definitions and test requirements (IEC 60060-1:2010) EN 60062, Marking codes for resistors and capacitors (IEC 60062) EN 60068-1:1994, Environmental testing - Part 1: General and guidance (IEC 60068-1:1988 + A1:1992 +

43、corrigendum Oct. 1988) EN 60068-2-1, Environmental testing - Part 2-1: Tests - Test A: Cold (IEC 60068-2-1) EN 60068-2-2, Environmental testing - Part 2-2: Tests - Test B: Dry heat (IEC 60068-2-2) EN 60068-2-6, Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) (IEC 60068-2-6)

44、 EN 60068-2-11, Environmental testing - Part 2: Tests - Test Ka: Salt mist (IEC 60068-2-11) EN 60068-2-13, Environmental testing - Part 2: Tests - Test M: Low air pressure, (IEC 60068-2-13) EN 60068-2-14, Environmental testing - Part 2-14: Tests - Test N: Change of temperature (IEC 60068-2-14) EN 60

45、068-2-20:2008, Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads (IEC 60068-2-20:2008) EN 60068-2-21, Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices (IE

46、C 60068-2-21) EN 60068-2-27, Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock (IEC 60068-2-27) EN 60068-2-30, Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) (IEC 60068-2-30) EN 60068-2-45, Environmental testing - Part 2: Tests - Test X

47、a and guidance: Immersion in cleaning solvents (IEC 60068-2-45) EN 60068-2-54, Environmental testing - Part 2-54: Tests - Test Ta: Solderability testing of electronic components by the wetting balance method (IEC 60068-2-54) EN 60068-2-58, Environmental testing - Part 2-58: Tests - Test Td: Test met

48、hods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) (IEC 60068-2-58) EN 60068-2-67:1996, Environmental testing - Part 2: Tests - Test Cy: Damp heat, steady state, accelerated test primarily intended for components (IEC 60068-2-67:1995) EN 60068-2-69, Environmental testing - Part 2-69: Tests - Test Te: Solderability testing of electronic components for surface mounting devi