BS EN 60444-11-2010 Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency L and the effective load capacitance CLeff ur.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationMeasurement of quartz crystal unit parametersPart 11: Standard method for the determination of the load resonance frequency Land the effective load capacitance CLeffusing automat

2、ic network analyzer techniques and error correctionBS EN 60444-11:2010National forewordThis British Standard is the UK implementation of EN 60444-11:2010. It isidentical to IEC 60444-11:2010.The UK participation in its preparation was entrusted to Technical CommitteeEPL/49, Piezoelectric devices for

3、 frequency control and selection.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010 ISBN 978 0 580 62682 1

4、 ICS 31.140Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 December 2010.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 6

5、0444-11:2010EUROPEAN STANDARDEN 60444-11NORME EUROPENNEEUROPISCHE NORMNovember 2010C E N E L E C E u r o p e a n C o m m i t t e e f o r E l e c t r o t e c h n i c a l S t a n d a r d i z a t i o nComit Europen de Normalisation ElectrotechniqueE u r o p i s c h e s K o m i t e e f r E l e k t r o t

6、 e c h n i s c h e N o r m u n g Management Centre: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.Ref. No. EN 60444-11:2010 EICS 31.140English version Measurement of quartz crystal unit parameters - P

7、art 11: Standard method for the determination of the load resonancefrequency fLand the effective load capacitance CLeffusing automaticnetwork analyzer techniques and error correction (IEC 60444-11:2010) Mesure des paramtres des rsonateurs quartz -Partie 11: Mthode normalise pour la dtermination de l

8、a frquence de rsonance la charge fLet de la capacit de charge efficace CLeffutilisant des analyseurs automatiques de rseaux et correction des erreurs(CEI 60444-11:2010)Messung von Schwingquarz-Parametern -Teil 11: Standardverfahren zur Bestimmung der Lastresonanzfrequenz fLund der effektiven Lastkap

9、azitt CLeffmit automatischer Netzwerkanalysatortechnik und Fehlerkorrektur(IEC 60444-11:2010)T h i s E u r o p e a n S t a n d a r d w a s a p p r o v e d b y C E N E L E C o n 2 0 1 0 - 1 1 - 0 1 . C E N E L E C m e m b e r s a r e b o u n d t o c o m p l yw i t h t h e C E N / C E N E L E C I n t

10、e r n a l R e g u l a t i o n s w h i c h s t i p u l a t e t h e c o n d i t i o n s f o r g i v i n g t h i s E u r o p e a n S t a n d a r dthe status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained

11、onapplication to the Central Secretariat or to any CENELEC member. T h i s E u r o p e a n S t a n d a r d e x i s t s i n t h r e e o f f i c i a l v e r s i o n s ( E n g l i s h , F r e n c h , G e r m a n ) . A v e r s i o n i n a n y o t h e rlanguage made by translation under the responsibilit

12、y of a CENELEC member into its own language and notifiedto the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,the Czech Republic, Denmark, Estonia, Finland, France, Germany,

13、 Greece, Hungary, Iceland, Ireland, Italy,Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,Spain, Sweden, Switzerland and the United Kingdom. BS EN 60444-11:2010EN 60444-11:2010 - 2 - Foreword The text of document 49/852/CDV, future edition

14、 1 of IEC 60444-11, prepared by IEC TC 49, Piezoelectric, Dielectric and Electrostatic Devices and Associated Materials for Frequency Control, Selection and Detection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60444-11 on 2010-11-01. Attention is drawn to the p

15、ossibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication o

16、f an identical national standard or by endorsement (dop) 2011-08-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2013-11-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60444-11:2010 was approved

17、 by CENELEC as a European Standard without any modification. _ BS EN 60444-11:2010- 3 - EN 60444-11:2010 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of

18、this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD appl

19、ies. Publication Year Title EN/HD Year IEC 60122-1 2002 Quartz crystal units of assessed quality - Part 1: Generic specification EN 60122-1 2002 IEC/TR 60444-4 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load res

20、onance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz EN 60444-4 - IEC 60444-5 1995 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic

21、network analyzer techniques and error correction EN 60444-5 1997 BS EN 60444-11:2010 2 60444-11 IEC:2010 CONTENTS 1 Scope.5 2 Normative references .5 3 General concepts .6 3.1 Load resonance frequencies fLrand fLa.6 3.2 Effective load capacitance CLeff.6 4 Reference plane and test conditions.7 4.1 G

22、eneral .7 4.2 Principle of measurement7 4.3 Evaluation of errors .10 Bibliography14 Figure 1 Admittance of a quartz crystal unit .6 Figure 2 XCas a function of frequency (solid line) in the vicinity of fL.9 Figure 3 Level of drive of a crystal in a -network vs. frequency 9 Figure 4 Error of the load

23、 resonance frequency due to the inaccuracy of the measured voltages (dashed line) and the calibration resistances (soft line) 11 Figure 5 CL-error resulting from fLerror (due to inaccuracy of the measured voltages and the calibration resistances) for the same crystal as in Figure 4.11 Figure 6 Frequ

24、ency error due to noise of the measured voltages .12 Figure 7 Error of load resonance frequency fLat 30 pF and 10 pF for typical equivalent parameters of quartz crystal units 12 Figure 8 Error of CLefffor typical equivalent parameters of quartz crystal units 13 BS EN 60444-11:201060444-11 IEC:2010 5

25、 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 11: Standard method for the determination of the load resonance frequency fLand the effective load capacitance CLeffusing automatic network analyzer techniques and error correction 1 Scope This part of IEC 60444 defines the standard method of measu

26、ring load resonance frequency fLat the nominal value of CL, and the determination of the effective load capacitance CLeffat the nominal frequency for crystals with the figure of merit M 4. M, according to Table 1 of IEC 60122-1:2002, is expressed in the following equation: 101RCrQM= (1) This gives g

27、ood results in a frequency range up to 200 MHz. This method allows the calculation of load resonance frequency offset fL, frequency pulling range fL1,L2and pulling sensitivity S as described in 2.2.31 of IEC 60122-1:2002. In contrary to the simple method of IEC 60444-4, this measurement technique av

28、oids the use of physical load capacitors, and allows higher accuracy, better reproducibility and correlation to the application. It extends the upper frequency limit from 30MHz by the method of IEC 60444-4 to 200MHz approximately. This method is based on the error-corrected measurement technique of

29、IEC 60444-5:1995, and therefore allows the measurement of fLand CLefftogether with the determination of the equivalent crystal parameters in one sequence without changing the test fixture. With this method the frequency fLis searched where the reactance XCof the crystal has the opposite value of the

30、 reactance of the load capacitance. LLCLC1CXX= (2) Furthermore this method allows to determine the effective load capacitance CLeffat the nominal frequency fnom. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, on

31、ly the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60122-1:2002, Quartz crystal units of assessed quality Part 1: Generic specification IEC/TR 60444-4, Measurement of quartz crystal unit parameters by zero phase

32、 technique in a -network Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RLand the calculation of other derived values of quartz crystal units, up to 30 MHz IEC 60444-5:1995, Measurement of quartz crystal units parameters Part 5: Methods for the deter

33、mination of equivalent electrical parameters using automatic network analyzer techniques and error correction BS EN 60444-11:2010 6 60444-11 IEC:2010 3 General concepts 3.1 Load resonance frequencies fLrand fLaAs can be seen in Figure 1, there are two intersection frequencies where CCLXX= , fLrwith

34、high admittance (low impedance) and fLawith low admittance (high impedance). The load resonant frequency fL is one of the two frequencies of a crystal unit in association with a series or with a parallel load capacitance, at which the electrical admittance (respectively impedance) of the combination

35、 is resistive. The load resonance frequency fLis the lower of the two frequencies. In a first approximation fLcan be calculated by: 11 0 LL1()12L CC CfCC+(3) Susceptance Conductance f fmfsffLfLa fa C0 CL1R11R12R1IEC 2353/10 Figure 1 Admittance of a quartz crystal unit 3.2 Effective load capacitance

36、CLeffCLeffis defined by the reactance of the crystal at the nominal frequency BS EN 60444-11:201060444-11 IEC:2010 7 )( nomC nomLeff XC1= (4) 4 Reference plane and test conditions 4.1 General Reference plane: as in 8.4 of IEC 60444-5:1995. Test conditions: crystal case not grounded. Level of drive:

37、the output level of the generator is set, such that at its (series) resonance frequency, the crystal under test is measured at the nominal drive level. The measurement at the load resonance frequency using the method described below leads to a level of drive, which is remarkably lower than at the (s

38、eries) resonance frequency due to the relative high reactance value. Therefore a correction measurement is performed, for details see 4.2. 4.2 Principle of measurement The principles of measurement are the following. a) Calibration Due to the high impedance measurements with this method special care

39、 has to be taken in the calibration of the test set-up. Similar to IEC 60444-5:1995, use the following three known calibration elements: 1) short-circuit (0 ) or resistor with low resistance; 2) resistor of 25 or 50 nominal; 3) open circuit (infinite resistance) or capacitor of 10 pF nominal; where

40、Z1is the impedance of calibration element 1 Z2is the impedance of calibration element 2 Z3is the impedance of calibration element 3 V1is the measured voltage with calibration element 1 V2is the measured voltage with calibration element 2 V3is the measured voltage with calibration element 3 The follo

41、wing parameters are then used for the measurement of quartz crystal units: RTis the termination impedance of the -network Vsis the error-corrected “short” voltage Vois the error-corrected “open” voltage b) Calibration with three known calibration elements: 1) short-circuit calibration; 2) calibratio

42、n load (25 or 50 ); 3) open circuit calibration (or calibration capacitor of 10 pF); )()()()()()(223132321131332322121TVVZVVZVVZVVZZVVZZVVZZR+= (5) BS EN 60444-11:2010 8 60444-11 IEC:2010 )()()()()()(131332322121131323232121213SVVZZVVZZVVZZVVZZVVVZZVVVZZVV+= (6) )()()()()()(2131323212133132232110VVZ

43、VVZVVZVVVZVVVZVVVZV+= (7) NOTE If Z3is taken as infinite number (ideal open circuit), the above Equations (5), (6) and (7) result is not allowed divisions of infinite by infinite. c) Measurement of a quartz crystal unit impedance ZcFrom the measured voltage with a quartz crystal unit Vc, the impedan

44、ce Zcof the quartz crystal unit is calculated with: )()(0CCSTCVVVVRZ= (8) d) Measurement procedure for fLAt load resonance frequency, the impedance of a quartz crystal unit is CL L cZ RjX=+ (9) For the determination of the load resonance frequency, the frequency fLthe lower frequency is searched for

45、 which Equation (2) is fulfilled, i.e. CCL0XX+= (10) With network analyzers, the frequency fLis easily determined by using marker search. functions. e) Evaluation of RLThe computation of the load resonance resistance RLfrom the real part of Zcat the load resonance frequency fLby the formula: () ()()

46、LcL cLReRR Z= (11) may result in excessive inaccuracy, because especially for low frequency crystals the angle of the voltage Vcis close to 90. Only for CLL10XR this method yields reasonable results. In all other cases, the RLshould be computed from the equation given in IEC 60122-1: 20L1L1CRRC=+(12

47、) f) Measurement procedure for CLeffThe reactance Xc( nom) is measured at the nominal frequency and the effective load capacity CLeffis then calculated with the following equation: )(1nomCnomLeff XC = (13) BS EN 60444-11:201060444-11 IEC:2010 9 Figure 2 shows XCas a function of frequency (solid line

48、) in the vicinity of fL. .700 710 720 730 740 750 760 770 780 790 -500 -400 -300 -200 -1000100 200 frequency (ppm)XC()-45 -40 -35 -30 -25 -20 -15 -10 -5 0 LfVCfS fLXC() VcXCLXC= 1 CLIEC 2354/10 Figure 2 XCas a function of frequency (solid line) in the vicinity of fLg) Level of drive At the resonance

49、 frequency fr, the level of drive P of a quartz crystal unit in a -network is given by the voltage Vxracross the crystal 1 %10 %100 %-500 -400 -300 -200 -1000100 200 300 PefffL/Pmaxfsdf/fnom(ppm) PefffL/Pmaxfs fsfLIEC 2355/10 Figure 3 Level of drive of a crystal in a -network vs. frequency with 2xrrVPR= (14) and Trr gXrRRRVV+= (15) BS EN 60444-11:2010 10 60444-