BS EN 60512-16-7-2008 Connectors for nelectronic equipment – nTests and measurements –– nPart 16-7 Mechanical tests on contacts and nterminations – Test 16g Measurement of nconta.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsWB9423_BSI_StandardColCov_noK_AW:BSI FRONT COVERS 5/9/08 12:55 Page 1Connectors forelectronic equipment Tests and measurements Part 16-7: Mechanical tests on contacts and termination

2、s Test 16g: Measurement ofcontact deformation after crimpingBS EN 60512-16-7:2008NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LALicensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSINational forewordThis British Standard is the UK im

3、plementation of EN 60512-16-7:2008. Itis identical to IEC 60512-16-7:2008.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/48, Electromechanical components and mechanical structures for electronic equipment.A list of organizations represented on this committee can be o

4、btained onrequest to its secretary.This publication does not purport to include all the necessary provisionsof a contract. Users are responsible for its correct application. BSI 2009ISBN 978 0 580 55913 6ICS 31.220.10Compliance with a British Standard cannot confer immunity fromlegal obligations.Thi

5、s British Standard was published under the authority of the StandardsPolicy and Strategy Committee on Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 60512-16-7:200831 January 2009Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolle

6、d Copy, (c) BSIEUROPEAN STANDARD EN 60512-16-7 NORME EUROPENNE EUROPISCHE NORM September 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B -

7、1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60512-16-7:2008 E ICS 31.220.10 English version Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminat

8、ions - Test 16g: Measurement of contact deformation after crimping (IEC 60512-16-7:2008) Connecteurs pour quipements lectroniques - Essais et mesures - Partie 16-7: Essais mcaniques des contacts et des sorties - Essai 16g: Mesure de la dformation dun contact aprs sertissage (CEI 60512-16-7:2008) Ste

9、ckverbinder fr elektronische Einrichtungen - Mess- und Prfverfahren - Teil 16-7: Mechanische Prfungen an Kontakten und Anschlssen - Prfung 16g: Kontaktverformung nach dem Crimpen (IEC 60512-16-7:2008) This European Standard was approved by CENELEC on 2008-08-01. CENELEC members are bound to comply w

10、ith the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secreta

11、riat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the

12、 official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Por

13、tugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 60512-16-7:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSIEN 60512-16-7:2008 - 2 - Foreword The text of document 48B/1888/FDIS, future edition 1 of IEC

14、 60512-16-7, prepared by SC 48B, Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60512-16-7 on 2008-08-01. This standard is to be read in conjunction with EN 60

15、512-1 and EN 60512-1-100 which explains the structure of the EN 60512 series. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2009-05-01 latest date by which the national stan

16、dards conflicting with the EN have to be withdrawn (dow) 2011-08-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60512-16-7:2008 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography,

17、the following note has to be added for the standard indicated: IEC 60352-2 NOTE Harmonized as EN 60352-2:2006 (not modified). _ BS EN 60512-16-7:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSI- 3 - EN 60512-16-7:2008 Annex ZA (normative) Normat

18、ive references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced do

19、cument (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60512-1-1 - 1)Connectors for electronic equipment - Tests and measurements - Part 1-1: Ge

20、neral examination - Test 1a: Visual examination EN 60512-1-1 2002 2)1)Undated reference. 2)Valid edition at date of issue. BS EN 60512-16-7:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSI 4 60512-16-7 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMEN

21、T TESTS AND MEASUREMENTS Part 16-7: Mechanical tests on contacts and terminations Test 16g: Measurement of contact deformation after crimping 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of IEC technical committ

22、ee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to assess the effectiveness of contacts to resist deformation (damage) from crimping operations. Although this test is intended for cylind

23、rical contacts, especially machined contacts, it is applicable to contacts with other geometries and construction. In which case, the detail specification shall contain sufficient detail, given under clause 4, to enable the test to be done. 2 Normative references The following referenced documents a

24、re indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: G

25、eneral examination Test 1a: Visual examination 3 Preparations 3.1 Preparation of specimen The specimen shall consist of contact-wire assemblies. The length of cable protruding from the contact shall be at least 100 mm. Number of specimens: 10 specimens for each barrel size (5 for the minimum wire si

26、ze and 5 for the maximum wire size) unless otherwise specified in the detail specification. The crimping tool(s) shall be those specified in the detail specification. If none are so specified, the contact manufacturers instructions for tooling shall be followed. In any case, full details of tooling

27、shall be given in any reports supporting claims of conformance to this part of IEC 60512. Any preconditioning given in the detail specification shall be applied. BS EN 60512-16-7:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSI60512-16-7 IEC:200

28、8 5 3.2 Equipment A mounting collet shall be provided such that the contact may be rotated around its longitudinal axis to permit measurements at the specified points. The precision of the collet shall be such that the run-out of a steel gauge pin of 1,5 to 2,0 mm diameter measured 10 to 15 mm from

29、the collet face shall not exceed 0,1 % of such distance. 4 Test procedure The contact shall be held in a collet in region H as shown in Figure 1, so that the contact can be rotated around the longitudinal axis to permit measurements at the specified points. A suitable test arrangement is shown in Fi

30、gure 2. In the case of cylindrical contacts, readings (preferably with an indicator gauge) of the position of the contact shall be taken before and after crimping. The total excursion of the position when the contact is rotated is halved to give the deformation (or damage). Non-circular contacts sha

31、ll be measured in a similar manner. The deformation (or damage) may be similarly calculated. MX YHIEC 1005/08 Key X Twice the male contact diameter. Also used for corresponding female contact OR If not circular, corresponding characteristic dimension of each contact. Y Mid point between end of crimp

32、 barrel, or end of contact, and beginning of crimp indentation M Measurement points for contact deformation H (Example of) Holding area NOTE This should correspond to the area in which the contact is intended to be held in use. Figure 1 Example of holding and measurement points BS EN 60512-16-7:2008

33、Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSI 6 60512-16-7 IEC:2008 Dial indicator 0,025 mm (0,001 in) Conductor Contact Super precision collet IEC 1006/08Figure 2 Typical test arrangement for deformation measurement 5 Measurements and requiremen

34、ts 5.1 Before testing Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no defects that would impair the validity of the test. 5.2 After testing The requirements of the detail specification for deformation shall be met. Visual examination according to IEC 60512-1-1 s

35、hall be carried out. There shall be no defects, other than any found under 5.1, that would impair the normal functioning of the component. 6 Details to be specified When this test is required by the detail specification, the following details shall be specified. a) wire type and size; b) specificati

36、on of crimping tool(s) to be used; c) area(s) of contact to be held by the mounting collet; NOTE This should correspond to the housing or insert location point(s). d) points of measurement on the contact; if other than those given in 3.2; e) values of deformation permitted, for each point of measure

37、ment; f) number of specimens to be tested if different than specified in 3.1; g) any deviation from the standard test method. BS EN 60512-16-7:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSI60512-16-7 IEC:2008 7 Bibliography IEC 60352-2, Solder

38、less connections Part 2: Crimped connections General requirements, test methods and practical guidance _ BS EN 60512-16-7:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSIThis page deliberately left blankLicensed Copy: Wang Bin, ISO/EXCHANGE CHIN

39、A STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSIThis page deliberately left blankLicensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 26/05/2009 07:06, Uncontrolled Copy, (c) BSIBSI is the independent national body responsible for preparing British Standards. It presents the UK view on st

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