BS EN 60512-25-2-2002 Connectors for electronic equipment - Tests and measurements - Test 25b - Attenuation (insertion loss) - Section 2 Attenuation (insertion loss)《电子设备连接器 试验和测量 .pdf

1、BRITISH STANDARD BS EN 60512-25-2: 2002 Connectors for electronic equipment Tests and measurements Part 25-2: Test 25b: Attenuation (insertion loss) The European Standard EN 60512-25-2:2002 has the status of a British Standard ICS 31.220.10 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY CO

2、PYRIGHT LAWBS EN 60512-25-2:2002 This British Standard, having been prepared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 9 July 2002 BSI 9 July 2002 ISBN 0 580 39945 1 National f

3、oreword This British Standard is the official English language version of EN 60512-25-2:2002. It is identical with IEC 60512-25-2:2002. The UK participation in its preparation was entrusted by Technical Committee EPL/48, Electromechanical components and mechanical structures for electronic equipment

4、, to Subcommittee EPL/48/2, Connectors for electronic equipment, which has the responsibility to: A list of organizations represented on this subcommittee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instanc

5、e, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The British Standards which implement international or European publications referred to in thi

6、s document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a con

7、tract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible European committee any enquiries on the interpretation, or proposals for change, an

8、d keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 14, an inside back cover and a back cover. The BSI copyright date disp

9、layed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60512-25-2 NORME EUROPENNE EUROPISCHE NORM June 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Elect

10、rotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60512-25-2:2002 E ICS 31.220.10 English version Connector

11、s for electronic equipment - Tests and measurements Part 25-2: Test 25b: Attenuation (insertion loss) (IEC 60512-25-2:2002) Connecteurs pour quipements lectroniques - Essais et mesures Partie 25-2: Essai 25b: Attnuation (perte dinsertion) (CEI 60512-25-2:2002) Steckverbinder fr elektronische Einrich

12、tungen - Mess- und Prfverfahren Teil 25-2: Prfung 25b: Dmpfung (Einfgedmpfung) (IEC 60512-25-2:2002) This European Standard was approved by CENELEC on 2002-05-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Sta

13、ndard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, Fr

14、ench, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium

15、, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.Foreword The text of document 48B/1154/FDIS, future edition 1 of IEC 60512-25-2, prepared by SC 48B, Connectors, of IE

16、C TC 48, Electromechanical components and mechanical structures for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60512-25-2 on 2002-05-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by

17、publication of an identical national standard or by endorsement (dop) 2003-02-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-05-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “informative“ are given f

18、or information only. In this standard, annex A is normative and annex B is informative. _ Endorsement notice The text of the International Standard IEC 60512-25-2:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN60512252:2002 BSI9July2002065-2125-2 CEI:0220 3 C

19、ONTENTS 1 General 4 1.1 Scope4 1.2 Definitions.7 2 Test resources .4 2.1 Equipment.4 2.2 Fixture.5 3 Test specimen6 3.1 Description6 4 Test procedure .6 4.1 Fixture attenuation 6 4.2 Specimen attenuation measurement7 4.3 Impedance analyzer (open/short method)8 4.4 Additional measurements 8 4.5 Time

20、domain method.8 5 Details to be specified 9 6 Test documentation9 Annex A (normative) Diagrams and schematics of fixtures and equipment10 Annex B (informative) Practical guidance14 Figure A.1 Technical diagrams.10 Figure A.2 Single-ended terminations 11 Figure A.3 Differential (balanced) termination

21、s 12 Figure A.4 Example of specimen in fixture for attenuation13 Page3 EN60512252:2002 BSI9July2002065-2125-2 CEI:0220 4 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 25-2: Test 25b Attenuation (insertion loss) 1 General 1.1 Scope and object This part of IEC 60512 is applicable to

22、electrical connectors, sockets, cable assemblies or interconnection systems. This standard describes a frequency and a time domain method to measure attenuation/ insertion loss as a function of frequency. NOTE “Attenuation” is referenced throughout the document. Test professionals must use the appro

23、priate term (attenuation or insertion loss) when summarizing and reporting the test measurements according to the type of specimen and transmission line being measured. 1.2 Definitions For the purpose of this part of IEC 60512, the following definitions apply. 1.2.1 attenuation the reduction of powe

24、r during the transmission from the input to the output of the specimen, usually measured in decibels (dB) 1.2.2 insertion loss the loss of power resulting from the insertion of a connector or similar device into a transmission line, usually measured in dB 1.2.3 specimen environment impedance the imp

25、edance presented to the signal conductors by the fixture. This impedance is a result of transmission lines, termination resistors, attached receivers or signal sources, and fixture parasitics 2 Test resources 2.1 Equipment 2.1.1 Frequency domain A network analyzer is preferred. When a greater dynami

26、c range is desired, a signal generator and spectrum analyzer or vector network analyser (for measurement with full 2-port calibration) may alternatively be used. If necessary, additional equipment increasing the measurement sensitivity (e.g. broadband output amplifiers or low-noise pre-amplifiers) m

27、ay be used. For differential measurements, a multiport network analyzer with appropriate software or baluns may be used. Page4 EN60512252:2002 BSI9July2002065-2125-2 CEI:0220 5 2.1.2 Time domain A time domain reflectometer (TDR), triggered impulse generator and appropriate fast Fourier transform (FF

28、T) software are preferred. 2.2 Fixture Unless otherwise specified in the reference document, the specimen environment impedance shall match the impedance of the test equipment. Typically, this will be 50 for single-ended measurements and 100 for differential measurements. 2.2.1 Specimen conductor as

29、signments For each measurement, the line to be measured shall be fixed as indicated in the referencing document. The far end (destination) and the near end (driven) of the line shall be terminated in the specimen environment impedance specified using one of the methods in figures A.2 or A.3. In the

30、special case where the drive signal is differential and not balanced, the common mode energy shall be terminated. Signal lines adjacent to these should likewise be terminated, if possible. NOTE Electrically long adjacent signal lines may resonate adding error to the results. Unless otherwise specifi

31、ed, a 1:1 signal-to-ground ratio (2:1 if differential measurements are performed) shall be used with each end having all grounds commoned. (For an example, see figure A.4). 2.2.2 Specimen fixture and signal line terminations for specimen environment impedance Care should be taken to minimize the rea

32、ctances of the resistive terminations over the range of test frequencies. NOTE The fixture geometry and materials may impact the measurements due to the fixture parasitics. Usually, the products intended use dictates the most meaningful way to fix it. 2.2.3 Insertion technique The fixture shall be d

33、esigned to allow the measurement of attenuation with and without the specimen, see figure A.1a. If baluns are used for a measurement, or minimum loss pads used for impedance matching, these are included in the fixture. Figures A.2 and A.3 show typical configurations with minimum loss pads. 2.2.4 Ref

34、erence fixture technique In this technique, a separate fixture that combines both near end and far end is used for the fixture attenuation measurement; see figure A.1b. This fixture shall be a duplicate of the specimen fixture, only without the specimen. Traces, if used, shall include fixture connec

35、tors, vias, bends and corners. If baluns are used for a differential measurement, or minimum loss pads used for impedance matching, these are included in the fixture. Figures A.2 and A.3 show typical configurations with minimum loss pads. Page5 EN60512252:2002 BSI9July2002065-2125-2 CEI:0220 6 3 Tes

36、t specimen 3.1 Description For this test procedure, the test specimen shall be as follows: 3.1.1 Separable connectors A mated connector pair. 3.1.2 Cable assembly Assembled connectors and cables, and mating connectors. 3.1.3 Sockets A socket and test device or a socket and pluggable header adapter.

37、4 Test procedure Unless otherwise specified, all measurement results shall contain a minimum of 200 frequency points. Each fixture measurement and its associated specimen attenuation measurement shall be taken at the same frequencies. Generate a magnitude versus frequency plot; 1 dB per division ver

38、tical scale and log frequency sweep are recommended. When applicable, single frequency results shall be tabulated, as specified in the reference document. Place the specimen at a minimum of 5 cm from any objects that would affect measured results. NOTE Test professionals should be aware of the limit

39、ations of any math operation(s) performed by an instrument (e.g. normalization or software filtering). 4.1 Fixture attenuation Fixture attenuation shall be measured separately so that it can be removed from and compared to the specimen measurement. If the reference document specifies precisely the f

40、ixture so that its attenuation contribution is known, then the fixture attenuation measurement is optional. 4.1.1 Calibration 4.1.1.1 When using a network analyzer, as a minimum, a “through“ calibration at the reference plane (including analyzer cables, but not the specimen fixture) shall be perform

41、ed. Where possible, a 12 term calibration is recommended. 4.1.1.2 When using a spectrum analyzer and generator, take a reference measurement following the same procedure. The generator output shall be kept the same for both fixture and specimen-with-fixture attenuation measurements made later. NOTE

42、Results may be inaccurate when: a) The specimen attenuation is not greater than the fixture attenuation. b) The fixture electrical length is greater than 1/8 wavelength at the highest test frequency, unless special precautions are taken to ensure good impedance matching throughout the measurement pa

43、th. This can be confirmed by sweeping across a wide frequency range and observing if there are nulls due to moding, fixture or balun resonances, etc. Page6 EN60512252:2002 BSI9July2002065-2125-2 CEI:0220 7 4.1.2 Insertion technique 4.1.2.1 Assemble the fixture so that the near end is connected to th

44、e far end without the specimen in between; see figure A.1a. Connect the network analyzer ports, or the signal generator and spectrum analyzer, to the appropriate locations of the driven line fixture. 4.1.2.2 When using a network analyzer, measure the fixture attenuation (S 21 ). When using a spectru

45、m analyzer, measure the power from the generator through the fixture. Then, divide the magnitude of this signal by that of the reference measurement performed in 4.1.1.2 at each frequency (subtract in dB). This is the fixture attenuation. 4.1.3 Reference fixture technique 4.1.3.1 Construct a referen

46、ce fixture that duplicates the specimen fixture, but without the specimen. Include both near and far ends; see figure A.1b. Connect the network analyzer ports, or the signal generator and spectrum analyzer, to the appropriate locations of the driven line fixture. 4.1.3.2 When using a network analyze

47、r, measure the fixture attenuation (S 21 ). 4.1.3.3 When using a spectrum analyzer, measure the power from the generator through the fixture. Then, divide the magnitude of this signal by that of the reference measurement performed in 4.1.1.2 at each frequency (subtract in dB). This is the fixture at

48、tenuation. 4.2 Specimen attenuation measurement 4.2.1 Add specimen to fixture. 4.2.2 Network analyzer 4.2.2.1 Connect the analyzer drive port to the near end of the fixture and the receiver port of the analyzer to the far end of the fixture. 4.2.2.2 Measure the specimen-with-fixture attenuation in d

49、B. 4.2.3 Spectrum analyzer 4.2.3.1 Connect the generator output port to the near end of the fixture and the analyzer input to the far end of the fixture. 4.2.3.2 Measure the signal power (typically in dBm). Divide the magnitude of this signal by that of the reference measurement, see 4.1.1.2, at each frequency (subtract in dBm). Record specimen-with-fixture results in dB. 4.2.4 Divide the specimen-with-fixture attenuation by the fixture attenuation (s