BS EN 60679-5-1998 Quartz crystal controlled oscillators of assessed quality - Sectional specification - Qualification approval《经质量评估的石英晶体受控振荡器 分规范 合格鉴定》.pdf

1、BRITISH STANDARD BS EN 60679-5:1998 IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality Part 5: Sectional specification Qualification approval The European Standard EN 60679-5:1998 has the status of a British Standard ICS 31.140BSEN60679-5:1998 This British Standard, having be

2、en prepared under the directionof the ElectrotechnicalSector Board, was published underthe authorityof the Standards Boardand comes intoeffect on 15 November 1998 BSI 05-1999 ISBN 0 580 30404 3 National foreword This British Standard is the English language version of EN60679-5:1998. It is identical

3、 with IEC60679-5:1998. It supersedes BS EN169200:1996 which will be withdrawn on2001-05-01. The UK participation in its preparation was entrusted to Technical Committee EPL/49, Piezoelectric devices for frequency control and selection, which has the responsibility to: aid enquirers to understand the

4、 text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this comm

5、ittee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC27-1 has been renumbered as IEC60027-1. For a period of time during the change over from one numbering system to the other, publications may co

6、ntain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC standards normally include an annex which lists normative references to international publications with their corresponding European publications. The British Standards which implement these int

7、ernational or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provi

8、sions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theENtitle page,

9、 pages 2 to 11 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSEN60679-5:1998 BSI 05-1999 i Contents Pa

10、ge National foreword Inside front cover Foreword 2 Text of EN 60679-5 3ii blankEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN60679-5 August1998 ICS31.140 English version Quartz crystal controlled oscillators of assessed quality Part 5: Sectional specification Qualification approval (IEC 60679-

11、5:1998) Oscillateurs pilots par quartz sous assurance de la qualit Partie 5: Spcification intermdiaire Homologation (CEI 60679-5:1998) Quarzoszillatoren mit bewerteter Qualitt Teil 5: Rahmenspezifikation Bauartanerkennung (IEC 60679-5:1998) This European Standard was approved by CENELEC on 1998-08-0

12、1. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtain

13、ed on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Centra

14、l Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, CzechRepublic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and U

15、nitedKingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1998 CENELEC All rights of exploitation in any form and by any means

16、 reserved worldwide for CENELEC members. Ref. No. EN 60679-5:1998 EEN60679-5:1998 BSI 05-1999 2 Foreword The text of document 49/396/FDIS, future edition 1 of IEC60679-5, prepared by IEC TC49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC

17、parallel vote and was approved by CENELEC as EN60679-5 on 1998-08-01. The following dates were fixed: Annexes designated “normative” are part of the body of the standard. In this standard, Annex A, Annex B and Annex ZA are normative. Annex ZA has been added by CENELEC. Endorsement notice The text of

18、 the International Standard IEC60679-5:1998 was approved by CENELEC as a European Standard without any modification. Contents Page Foreword 2 1 General 3 1.1 Scope 3 1.2 Normative references 3 2 Preferred ratings and guidance on detail specifications 3 2.1 Preferred values for ratings and characteri

19、stics 3 2.2 Information to be prescribed in detail specifications 3 3 Quality assessment procedures 4 3.1 Eligibility for qualification approval 4 3.2 Structurally similar components 4 3.3 Certified test records 4 3.4 Qualification approval 4 3.5 Quality conformance inspection 4 Annex A (normative)

20、Test schedule for qualification approval 8 Annex B (normative) Ageing test 11 Annex ZA (normative) Normative references to international publications with their corresponding European publications 11 Table 1 Sampling plan together with numbers of permissible defectives for qualification approval tes

21、ts 5 Table 2 Lot-by-lot tests 6 Table 3 Periodic tests 7 latest date by which the ENhas to be implemented at national level by publication of an identical national standard or by endorsement (dop) 1999-05-01 latest date by which the national standards conflicting with the EN haveto be withdrawn (dow

22、) 2001-05-01EN60679-5:1998 BSI 05-1999 3 1 General 1.1 Scope This sectional specification applies to quartz crystal controlled oscillators whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring meth

23、ods contained in the generic specification IEC60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators. 1.2 Normative references The following normative documents contain provisions which, through reference in this text, co

24、nstitute provisions of this part of IEC60679. At the time of publication, the editions indicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC60679 are encouraged to investigate the possibility of applying the most recent editions of

25、 the normative documents indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 60679-1:1997, Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification. IEC 60679-5-1:1998, Quartz crystal controlled oscillators of asse

26、ssed quality Part 5-1: Blank detail specification Qualification approval. IEC QC 001002:1986, Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ). 2 Preferred ratings and guidance on detail specifications 2.1 Preferred values for ratings and characteristics The v

27、alues given in detail specifications shall preferably be selected from those stated in 2.3 of IEC60679-1. 2.2 Information to be prescribed in detail specifications Guidance on the preparation of detail specifications shall be derived from the future blank detail specification, IEC 60679-5-1. Each de

28、tail specification shall state all the tests and measurements required for inspection. This shall, as a minimum, include the relevant tests given in the blank detail specification, with methods and severities. The following information shall be given in each detail specification. 2.2.1 Outline drawi

29、ng and dimensions The detail specification shall include a dimensional drawing of the crystal controlled oscillator and/or the reference to an appropriate international standard to permit easy recognition and to provide information for dimensioning and gauging procedures. The dimensions shall includ

30、e the overall dimensions of the body of the component and the size and spacing of the terminations. All dimensions shall be stated in millimetres. Terminal connections shall be identified for all enclosures. This information may be given in more detail in an annex. 2.2.2 Mounting of the component Th

31、e detail specification shall define any assembly restrictions on the use of the crystal controlled oscillator. Where these restrictions apply special mounting fixtures may be required for the bump, shock, vibration and acceleration tests. Such fixtures shall be described in the detail specification.

32、 Where no special mounting fixtures are indicated, then the above tests shall be carried out as specified in clause 4 of IEC60679-1. 2.2.3 Severities for environmental tests The detail specification shall state the method of testing and the appropriate severities selected from clause 4 of IEC60679-1

33、. 2.2.4 Marking The detail specification shall state the required marking on the crystal controlled oscillator and on the primary package in accordance with2.4 of IEC60679-1. 2.2.5 Ordering information The detail specification shall prescribe that the following information is required when ordering

34、a crystal controlled oscillator: a) quantity; b) detail specification number, issue number and date; and where applicable; c) nominal frequency expressed in kilohertz (kHz) or megahertz (MHz); d) enclosure type; e) frequency tolerance(s) and operating temperature range; f) full description of any ad

35、ditional requirement.EN60679-5:1998 4 BSI 05-1999 2.2.6 Additional information (not for inspection purposes) The detail specification may include information which is not normally required to be verified by the inspection procedure, such as circuit diagrams, curves, drawings and notes needed for cla

36、rification. 3 Quality assessment procedures 3.1 Eligibility for qualification approval Prior to making an application for qualification approval a manufacturer shall first obtain manufacturers inspection approval in accordance with11.1 of IECQC001002. The primary stage of manufacture shall be as def

37、ined in3.1 of IEC60679-1. 3.2 Structurally similar components Structural similarity exists where a range of quartz crystal controlled oscillators covered by a single detail specification and having similar electrical characteristics, incorporate the same materials and method of sealing the enclosure

38、. 3.3 Certified test records Certified test records shall comply with3.12 of IEC60679-1. They shall be made available when prescribed in the detail specification and when requested by the customer. 3.4 Qualification approval The procedures for qualification approval testing are defined in3.8 of IEC6

39、0679-1. Qualification approval can be obtained either by using a fixed, sample drawn from current production (see3.4.1), or on the basis of lot-by-lot tests on three inspection lots with periodic tests on a sample taken from at least one of these lots (see3.4.2). 3.4.1 Fixed sample size procedure fo

40、r initial approval The manufacturer shall produce test evidence to show conformance to the requirements of the test schedule given in Table 1 of this specification. Table 1 gives the number of samples to be tested in each group or subgroup together with the permissible number of defectives for quali

41、fication approval tests. If additional groups are introduced into the test schedule the number of specimens required for Group “0” shall be increased by the same number as that required for the additional groups. The complete series of tests given in Table 1 and Annex A, which together form the fixe

42、d sample size test schedule, are required for the qualification approval of quartz crystal controlled oscillators covered by one detail specification. The tests in each group shall be carried out in the order given. The whole sample shall be subjected to the tests of Group “0” and then divided for t

43、he other groups. “One defective” is counted when a quartz crystal controlled oscillator has not satisfied the whole or a part of the tests of a group. 3.4.2 Lot-by-lot procedure for initial approval The manufacturer shall produce test evidence to show conformance to the requirements of Table 2 and T

44、able 3 and the detail specification. Tests in each group shall be carried out in the given order. A minimum of three inspection lots, taken in the shortest possible period, shall be subjected to the tests given in Table 2 and at least one sample taken from one of these lots shall be subjected to the

45、 periodic tests given in Table 3. When additional groups are introduced into the test schedule the number of specimens shall be increased by the same number as that required for the additional groups. “One defective” is counted when a quartz crystal controlled oscillator has not satisfied the whole

46、or a part of the tests of a group. 3.4.3 Approval For both procedures 3.4.1 and 3.4.2 approval may be granted when the number of defectives does not exceed the specified number of permitted defectives for each group or the total number of defectives allowed. The maintenance of approval shall be in a

47、ccordance with11.5 of IEC QC001002. 3.5 Quality conformance inspection Quality conformance inspection shall be carried out in accordance with clause12 of IECQC001002. The blank detail specification shall prescribe the minimum test schedule which shall be included in each detail specification for qua

48、lity conformance inspection. 3.5.1 Formation of inspection lots a) Groups A and B inspection These tests shall be carried out on a lot-by-lot basis according to Table 2 of this specification. The inspection lot shall consist of structurally similar quartz crystal controlled oscillators formed from c

49、urrent production. b) Group C inspection These tests shall be carried out periodically according to Table 3 of this specification.EN60679-5:1998 BSI 05-1999 5 The samples shall be representative of the current production over the specified periods. Table 1 Sampling plan together with numbers of permissible defectives for qualificationapproval tests Group number Clause number of IEC 60679-1 and test Sample size Permissible defectives Per group Total for groups 1 to 8 0 4.3.1 4.6.2 4.5.4 4.5.5.1 4.5.11 4.5.23 Visual test A Sealing Output