BS EN 60749-32-2003+A1-2010 Semiconductor devices Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)《半导体器件 机械和气候试验方法 塑料密封器件的易燃性(.pdf

1、Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled Copy, (c) BSIg49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58m

2、ethods Part 32: Flammability of plastic-encapsulated devices (externally induced)ICS 31.080.01Semiconductor devices Mechanical and climatic test BRITISH STANDARDBS EN 60749-32:2003+A1:2010BS EN 60749-32:2003+A1:2010Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled

3、 Copy, (c) BSIThis British Standard was published under the authority of the Standards Policy and Strategy Committee on7 July 2003 BSI 2011ISBN 978 0 580 68754 9application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments/corrigenda issued since publication

4、Date Comments 31 March 2011 Implementation of IEC amendment 1:2010 with CENELEC endorsement A1amendment 1 is indicated by !“.The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on re

5、quest to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct National forewordThis British Standard is the UK implementation of EN 60749-32:2003+A1:2010. It is identical to IEC 60749-32:2002, incorporating amend

6、ment 1:2010. It supersedes BS EN 60749-32:2003,which will be withdrawn on 1 September 2013.The start and finish of text introduced or altered by amendment is in-dicated in the text by tags. Tags indicating changes to IEC text carry the number of the IEC amendment. For example, text altered by IEC EU

7、ROPEAN STANDARD EN 60749-32:2003+A1 NORME EUROPENNE EUROPISCHE NORM September 2010CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussel

8、s 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-32:2003 E ICS 31.080.01 English version Semiconductor devices - Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices (externally in

9、duced) (IEC 60749-32:2002) Dispositifs semiconducteurs - Mthodes dessais mcaniques et climatiques Partie 32: Inflammabilit des dispositifs encapsulation plastique (cas dune cause extrieure dinflammation)(CEI 60749-32:2002) Halbleiterbauelemente - Mechanische und klimatische PrfverfahrenTeil 31: Entf

10、lammbarkeit von Bauelementen in Kunststoffgehusen (Selbstentzndung) (IEC 60749-32:2002) This European Standard was approved by CENELEC on 2002-09-24. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the sta

11、tus of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German)

12、. A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Repub

13、lic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled Copy, (c) BSIForeword The

14、 text of the International Standard IEC 60749-32:2002 was approved by CENELEC as EN 60749-32 on 2002-09-24. The text of this International Standard was reproduced from IEC 60749:1996, chapter 4, subclause 1.2 without change. Therefore, it has not been submitted to vote a second time and is still bas

15、ed on document 47/1394/FDIS. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-01-01 latest date by which the national standards conflicting with the EN have to be withdraw

16、n (dow) 2005-10-01 Each test method governed by this standard and which is part of the series is a stand-alone document, numbered EN 60749-2, EN 60749-3, etc. The numbering of these test methods is sequential, and there is no relationship between the number and the test method (i.e. no grouping of t

17、est methods). The list of these tests will be available in the CENELEC internet site and in the catalogue. Updating of any of the individual test methods is independent of any other part. Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA normative. Annex

18、 ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60749-32:2002 was approved by CENELEC as a European Standard without any modification. _ Page 2Foreword to amendment A1The text of document 47/2018/CDV, future amendment 1 to IEC 60749-32:2002, prepared by

19、 IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 60749-32:2003 on 2010-09-01. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall

20、 not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2011-06-01 latest date by which the national sta

21、ndards conflicting with the amendment have to be withdrawn (dow) 2013-09-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of amendment 1:2010 to the International Standard IEC 60749-2:2002 was approved by CENELEC as an amendment to the European Standard without any modification.

22、_ BS EN 60749-32:2003+A1:2010EN 60749-32:2003+A1:2010 (E)Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled Copy, (c) BSIINTRODUCTION Activity within IEC technical committee 47, working group 2, includes the generation, coordination and review of climatic, electric

23、al (of which only ESD, latch-up and electrical conditions for life tests are considered), mechanical test methods, and associated inspection techniques needed to assess the quality and reliability of the design and manufacture of semiconductor products and processes. Page 3BS EN 60749-32:2003+A1:201

24、0EN 60749-32:2003+A1:2010 (E)Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled Copy, (c) BSISEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 32: Flammability of plastic-encapsulated devices (externally induced) 1 Scope and object This part of IEC 60

25、749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipme

26、nt containing the device. NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to clauses 2 and 3 and renumbering. 2 Normative references The following referenced documents are indispensable f

27、or the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. 3 Test procedure This test shall be in accordance with the needle-flame test, with the following specif

28、ic requirements: a) preconditioning: none; b) number of test specimens: three, unless otherwise stated in the detail specification; c) position of the specimen: according to Figure 1b of IEC 60695-11-5:2004; d) surface to be tested and point of application: according to Figure 1b of IEC 60695-11-5:2

29、004; e) underlying layer: paper on pinewood, according to 5.4 of IEC 60695-11-5:2004; f) duration of application of the flame (ta): 10 s; g) duration of burning: 10 s; h) extent of burning: it shall not extend over a surface significantly greater than that touched by the flame during its application

30、. _ Page 4IEC 60695-11-5:2004, Fire hazard testing Part 11-5: Test flames Needle-flame test method Apparatus, confirmatory test arrangement and guidance !“!“BS EN 60749-32:2003+A1:2010EN 60749-32:2003+A1:2010 (E)Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled Co

31、py, (c) BSIAnnex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in t

32、he text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to

33、applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year Page 5IEC 60695-11-5 2004 Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Appa

34、ratus, confirmatory test arrangement and guidance EN 60695-11-5 2005 BS EN 60749-32:2003+A1:2010EN 60749-32:2003+A1:2010 (E)Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 21/06/2011 04:00, Uncontrolled Copy, (c) BSIBSI GroupHeadquarters 389 Chiswick High Road, London, W4 4AL, UK BS EN Licens

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