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本文(BS EN 60931-2-1996 Shunt power capacitors of the non-self-healing type for a c systems having a rated voltage up to and including 1000 V Ageing test and destruction test《额定电压达1000V.pdf)为本站会员(bowdiet140)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

BS EN 60931-2-1996 Shunt power capacitors of the non-self-healing type for a c systems having a rated voltage up to and including 1000 V Ageing test and destruction test《额定电压达1000V.pdf

1、BRITISH STANDARD BS EN 60931-2:1996 IEC 931-2: 1995 Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including1kV Part 2: Ageing test and destruction test The European Standard EN 60931-2:1996 has the status of a British Standard ICS 31.060.70BS E

2、N 60931-2:1996 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on 15 September 1996 BSI 11-1998 First published March 1994 Second edition September 1996 The following

3、BSI references relate to the work on this standard: Committee reference PEL/33 Draft for comment 95/210545 DC ISBN 0 580 26164 6 Committees responsible for this British Standard The preparation of this British Standard was entrusted to Technical Committee PEL/33, Power capacitors, upon which the fol

4、lowing bodies were represented: Association of Consulting Engineers BEAMA Capacitor Manufacturers Association Electricity Association Microwave Association Rotating Electrical Machines Association (BEAMA Ltd.) Amendments issued since publication Amd. No. Date CommentsBS EN 60931-2:1996 BSI 11-1998 i

5、 Contents Page Committees responsible Inside front cover National foreword ii Foreword 2 Text of EN 60931-2 3 List of references Inside back coverBS EN 60931-2:1996 ii BSI 11-1998 National foreword This British Standard has been prepared by Technical Committee PEL/33 and is the English language vers

6、ion of EN 60931-2:1996 Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including1kV Part 2: Ageing test and destruction test, published by the European Committee for Electrotechnical Standardization (CENELEC). It is identical with IEC 931-2:1995

7、published by the International Electrotechnical Commission (IEC). The foreword of the EN makes reference to the “date of withdrawal”, dow, of the relevant national standard. In this case the relevant national standard isBSEN60931-2:1994 which will be withdrawn on 1996-12-01. Certificates and marks w

8、ill not be awarded after this date with respect to the withdrawn British Standard. However such certificates and marks, already awarded, may continue to apply to production until 2001-12-01. A British Standard does not purport to include all the necessary provisions of a contract. Users of British S

9、tandards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references Publication referred to Corresponding British Standard IEC 593:1977 BS 7631:1993 Internal fuses and internal overpressure disconnecto

10、rs for shunt capacitors EN 60931-1:1993 (IEC 931-1:1989) BS EN 60931 Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V Part 1:1994 General. Performance, testing and rating. Safety requirements. Guide for installation and operation

11、Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theEN title page, pages 2 to 8, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment

12、table on theinside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 60931-2 March 1996 ICS 31.060.70 Supersedes EN 60931-2:1993 Descriptors: Power capacitors, shunt capacitors, non-self-healing capacitors, tests English version Shunt power capacitors of the non-self-healing type for

13、a.c. systems having a rated voltage up to and including 1 kV Part 2: Ageing test and destruction test (IEC 931-2:1995) Condensateurs shunt de puissance non autorgnrateurs destins tre utiliss sur des rseaux courant alternatif de tension assigne infrieure ou gale 1 kV Partie 2: Essais de vieillissemen

14、t, et de destruction (CEI 931-2:1995) Nichtselbstheilende Leistungs-Parallelkondensatoren fr Wechselstromanlagen mit einer Nennspannung bis 1 kV Teil 2: Alterungs- und Zerstrungsprfung (IEC 931-2:1995) This European Standard was approved by CENELEC on 1996-03-05. CENELEC members are bound to comply

15、with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secret

16、ariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as th

17、e official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrot

18、echnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1996 Copyright reserved to CENELEC members Ref. No. EN 60931-2:1996 EEN 60931-2:1996 2 BSI 11-1998 Foreword The text of d

19、ocument 33/207/DIS, future edition 2 ofIEC 931-2, prepared by IEC TC 33, Power capacitors, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC asEN60931-2 on 1996-03-05. This European Standard supersedes EN60931-2:1993. The following dates were fixed: For products which have c

20、omplied with EN60931-2:1993 before 1996-12-01, as shown by the manufacturer or by a certification body, this previous standard may continue to apply for production until 2001-12-01. Annexes designated “normative” are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA

21、 has been added by CENELEC. Contents Page Foreword 2 Section 1. General 1 Scope 3 2 Normative references 3 Section 2. Quality requirements and tests 17 Ageing test 4 18 Self-healing test 5 19 Destruction test 5 Annex ZA (normative) Normative references tointernational publications with their corresp

22、onding European publications 7 Figure 1 Circuit to perform the destruction test 6 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 1996-12-01 latest date by which the national standards conflicting with the E

23、N haveto be withdrawn (dow) 1996-12-01EN 60931-2:1996 BSI 11-1998 3 Section 1. General 1 Scope This part of IEC 931 applies to capacitors according to IEC 931-1 and gives the requirements for the ageing test and destruction test for these capacitors. NOTEThe numbering of the clauses and subclauses i

24、n this part corresponds to that of IEC 931-1. 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of IEC 931. At the time of publication, the editions indicated were valid. All normative documents are s

25、ubject to revision, and parties to agreements based on this part of IEC 931 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 241:196

26、8, Fuses for domestic and similar purposes. IEC 593:1977, Internal fuses and internal overpressure disconnectors for shunt capacitors. IEC 931-1:1989, Shunt power capacitors of the non-self-healing type for a.c. system having a rated voltage up to and including 660 V Part1:General Performance, testi

27、ng and rating Safety requirements Guide for installation and operation. Amendment No. 1 (1991)EN 60931-2:1996 4 BSI 11-1998 Section 2. Quality requirements and tests 17 Ageing test 17.1 Conditioning The temperature of the case during the ageing test shall be the highest mean temperature in 24 h (see

28、IEC 931-1, Table 1) plus the difference between the measured temperature of the case and the cooling air temperature recorded at the end of the thermal stability test carried out on an identical unit. The two test methods indicated below are intended to ensure that the capacitor case temperature is

29、maintained constant during the test. The two methods are considered as being equivalent. The units that are not sealed shall be tested in air, with forced circulation. 17.1.1 Testing in air with forced circulation The capacitor unit is mounted in an enclosure in which heated air is circulated with a

30、n air velocity such that temperature variations at any point of the enclosure do not exceed 2 C. The sensitive element of the thermostat regulating the temperature in the capacitor enclosure shall be located on the surface of the capacitor container, three-quarters of the way up. The capacitor shall

31、 be placed in a vertical position with the terminals upright. When many capacitors are tested together, they shall be placed with sufficient clearance between them in order to have sufficient temperature uniformity. After placing the capacitor in the unheated enclosure, the thermostat shall be set a

32、t a temperature equal to that indicated in 17.1. Then, without energizing the capacitor, the enclosure shall be brought to thermal stability, which shall be deemed to have been reached when the container temperature of the capacitor has reached the stated temperature with a tolerance of2 C. The capa

33、citor shall then be energized at the voltage stated in 17.2 a). 17.1.2 Testing in a liquid bath The capacitor unit is immersed in a container filled with a liquid which, by appropriate heating, is kept at the temperature indicated in 17.1 during the whole test. This temperature is maintained with a

34、permissible change of 2 C. Care shall be taken to ensure that the temperature in the neighbourhood of the capacitor is within these limits. The capacitor is not energized until it has reached the temperature of the liquid bath. The capacitor shall then be energized at the voltage stated in 17.2 a).

35、NOTEWhere the terminal insulation, or the insulation of cables permanently attached to the capacitor, is of material that might be damaged by the heating liquid, it is permissible for the capacitors to be positioned in such a manner that these terminals or cables are just above the surface of the li

36、quid. 17.2 Test sequence Before the test, the capacitance shall be measured as prescribed in 7.1 (IEC 931-1). The test sequence is in three parts as follows: a) The capacitor shall be energized at a voltage equal to 1,25 U Nfor 750 h. b) The capacitor shall then be subjected to 1 000 discharge cycle

37、s consisting of: charging the capacitor to a d.c. voltage of2U N ; discharging the capacitor through an inductance of: In which C is the measured capacitance in microfarads (mF) The cables used for the external circuit and the inductance shall have a cross-section appropriate to the maximum permissi

38、ble current (see IEC 931-1, clause 21). The duration of each cycle shall be 30 s minimum. c) Repetition of item a). During the whole test sequence the temperature of the case shall be maintained equal to that indicated in 17.1. In the case of three-phase capacitors, the first and the third parts of

39、the test sequence (items a) and c) shall be carried out with all the phases energized at1,25 U N . This can be obtained either by using a three-phase source, or by using a monophase source and modifying the internal capacitor connections. The second part (item b) of the test sequence, however, shall

40、 be carried out on two phases only. In the case of a star connection, modification of the internal connections are necessary or the charging voltage shall be increased from 2 U Nup to 2,31 U N . 17.3 Test requirements During the test no permanent breakdown, interruption or flashover shall occur. At

41、the end of the test the capacitor shall cool down freely to the ambient temperature and the capacitance shall then be measured under the same conditions as before the test. L1 000 C - 20 % in microhenrys (mH ) =EN 60931-2:1996 BSI 11-1998 5 The maximum permitted variation of capacitance compared to

42、the values measured before the test shall be 3 % averaged over all the phases and 5 % on one phase. The voltage test between terminals and container shall be carried out with the same procedures as prescribed in 10.1 of IEC 931-1. The sealing test shall be repeated as prescribed in clause 12 of IEC

43、931-1. 18 Self-healing test Not applicable. 19 Destruction test This test is performed to evaluate the behaviour of the capacitor at the end of its life. If the capacitor is protected by internal fuses, these fuses shall comply with IEC 593. If no internal fuses are provided, the destruction test sh

44、all be carried out according to the following procedure. 19.1 Test sequence The test shall be carried out on a capacitor unit. If necessary the discharge resistors shall be disconnected in order to avoid burning. A capacitor which has passed the ageing test may be used. For polyphase units the test

45、shall be carried out between two terminals only. In the case of three-phase delta connection two terminals shall be short-circuited. For star connection no terminals shall be short-circuited. The principle of the test is to promote failure in the elements by d.c. voltage and subsequently to check th

46、e behaviour of the capacitor when an a.c. voltage is applied. The capacitor shall be mounted in a circulating air oven having a temperature equal to the maximum ambient air temperature of the temperature category of the capacitor. When all the parts of the capacitor have reached the temperature of t

47、he oven the following test sequence shall be performed with the circuit given inFigure 1. a) With the selector switches H and K in position1 and a respectively, the a.c. voltage source is set to 1,3 U Nand the capacitor current is recorded. b) The d.c. source is set to 10 U N . The switch H is then

48、set to position 2 and the variable resistor is adjusted to give a d.c. short-circuit current of300mA. c) Switch H is set to position 3 and switch K to position b in order to apply the d.c. test voltage to the capacitor which is maintained until the voltmeter indicates approximately zero for3sto5 s.

49、d) Switch K is then set to position a again in order to apply the a.c. test voltage to the capacitor for a period of 3 min when the current is again noted. The following conditions may be obtained: the ammeter I and the voltmeter U both indicate zero. In this case the fuse shall be checked. If it has blown it shall be replaced. Then the a.c. voltage is applied to the capacitor and if the fuse blows again the procedure is interrupted. If the fuse does not blow, the procedure consisting in the application

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