BS EN 61000-4-24-1997 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Test methods for protective devices for HEMP conducted disturbance - Basic EMC publ.pdf

1、 STD.BS1 BS EN b1000-i-24-ENGL 1777 Lb24bb Ob24713 777 = BS EN 1997 1997 61000-4-24 : IEC 61000-4-24 : BRITISH STANDARD Electromagnetic compatibility (EMC) - Part 4. Testing and measurement techniques - Section 24. Test methods for protective devices for HEMP conducted disturbance Basic EMC publicat

2、ion 3 3 m The European Standard EN 61000-4-24 : 1997 has the status of a British Standard ICs 33.100 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo rep

3、roduction or networking permitted without license from IHS-,-BS EN 61000424 : 1997 Amd. No. National foreword Date Text affected This British Standard is the English language version of EN 61000-4-24 : 1997. It is identical with IEC 61000424 : 1997. The UK participation in its preparation was entrus

4、ted to Technical Committee GEM 10, Electromagnetic compatibility, which has the responsibility to: - aid enquirers to understand the text; - present to the responsible internationaUEuropean committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; -

5、monitor related intemational and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its secretaqy. Cross-references Attention is drawn to the fact that annex ZA lists normative references to international publicati

6、ons with their corresponding European publications. The British Standards which implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled Intedonal Standards Correspondence Index, or using the facility of the BSI Standards Electroni

7、c Catalogue. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 12, an inside back cover and a back cover. This British Standard, having been prepar

8、ed under the direction of the Eectrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on 15 July 1997 O BSI 1997 ISBN O 680 27780 1 Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for

9、 ResaleNo reproduction or networking permitted without license from IHS-,-EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 6 1000-4-24 May 1997 ICs 33.1 O0 Descriptors: Environments, pulses, electromagnetism, explosions, nuclear reaction, nuclear energy, electromagnetic immunity, electromagnetic

10、 interference, safety devices English version Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 24: Test methods for protective devices for HEMP conducted disturbance Basic EMC publication (IEC 6 1000-4-24: 1 997) Compatibilit lectromagntique (CEM) Partie 4: Tech

11、niques dessai et de mesure Section 24: Mthodes dessais pour les dispositifs de protection pour perturbations conduites IEMN-HA Publication fondamentale en CEM (CE1 61000-4-24: 1997) Elektromagnetische Vertrglichkeit (EMV) Teil 4: Prf- und Meverfahren Hauptabschnitt 24: Prfverfahren fr Einrichtungen

12、zum Schutz gegen leitungsgefhrte HEMP-Strgren EMV Grundnorm (IEC 61000-4-24:1997) This European Standard was approved by CENELEC on 1997-03-1 1. CENELEC members are bound to comply with the CENICENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status o

13、f a national standard without any alteration. Up-todate lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions English, French, German). A ver

14、sion in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national eiectrotechnical committees of Austria, Belgium, Denmark, Finland,

15、France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung

16、 Central Secretariat: rue de Stassart 35, B - 1050 Brussels 1997 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. NO. EN 61000-4-24:1997 E Copyright European Committee for Electrotechnical Standardization Provided by IHS under license wit

17、h CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-Page 2 EN 61000-4-24 : 1997 Foreword The text of document 77C/37/FDIs8 future edition 1 of IEC 61000-4-24, prepared by SC 77C, Immunity to high altitude nuclear electromagnetic pulse (HEMP), of IEC TC 77, Elect

18、romagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 6 1000-4-24 on 1997-03-1 1. The following dates were fixed: - latest date by which the EN has to be implemented at national levei by publication of an identical national standard or by endorsem

19、ent (dop) 1997-1 2-01 - latest date by which the national standards conflicting with the EN have to be withdrawn (daw) 1997-1 2-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “informative“ are given for information only. In this standard, annex ZA is norma

20、tive and annex A is informative. Annex ZA has been added by CENELEC. Endorsement notice The text of the International Standard IEC 61 000-4-24: 1 997 was approved by CENELEC as a European Standard without any modification. In the official version, for annex A, Bibliography, the following note has to

21、 be added for the standard indicated: IEC 1000-5-5 NOTE Harmonized as EN 6 1000-5-5: 1 996 (not modified). Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-* *

22、VI Page 3 EN 61000-4-24 : 1997 CONTENTS INTRODUCTION . Clause 1 Scope . 2 Normative references 3 Definitions . 4 Test methods for protective devices for conducted disturbanc 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 General Test Set-up . . Pulse generator Launching line Test fixture . 4.5.1 General . 4.5.

23、2 Type A fixtures 4.5.3 Type B fixtures Termination . Test procedure . 4.8.1 Adjustment of the pulse generator 4.8.3 Test . 4.8.4 Final examination of the DUT . Referring to this standard . . Oscilloscope . 4.8.2 Verification procedures . . Annex A . Bibliography . Annex ZA (normative) Normative ref

24、erences to international publications with their corresponding European publications . Page 4 5 5 5 5 5 6 6 7 7 7 7 7 9 9 9 9 10 10 10 11 a 12 Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permi

25、tted without license from IHS-,-Page 4 EN 61000-4-24 : 1997 INTRODUCTION The IEC has initiated the preparation of standardized methods to protect civilian society from the effects of high-altitude nuclear bursts. Such effects could disrupt sy.stems for communications, electric power, information tec

26、hnology, etc. This section of IEC 61000-4 is part of a complete set of standards that covers the entire category of immunity to high-altitude nuclear electromagnetic pulse. The appropriate acronym is either HA-NEMP or more simply HEMP. The application of this standard is, however, not dependent on a

27、ccess to other sections and parts of the IEC 1000 and IEC 61000, except for those specifically referred to. Attention is drawn to IEC 1000-5-5. Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking perm

28、itted without license from IHS-,- STD.BS1 BS EN b1000-Y-2Y-ENGL 1777 W 1b2Ybb Ob2LiL 195 Page 5 EN 61000-4-24 : 1997 -. ELECTROMAGNETIC COMPATIBILITY (EMC) - Part 4: Testing and measurement techniques - Section 24: Test methods for protective devices for HEMP conducted disturbance Basic EMC publicat

29、ion 1 Scope This section of IEC 61000-4 deals with methods for testing protective devices for HEMP conducted disturbance. It primarily covers testing of voltage breakdown and voltage-limiting characteristics but also methods to measure the residual voltage under HEMP conditions for the case of very

30、fast changes of voltage (u) and current (i) as a function of time. 2 Normative references The following normative document contains provisions which, through reference in this text, constitute provisions of this section of IEC 61000-4. At the time of publication, the edition indicated was valid. All

31、 normative documents are subject to revision, and parties to agreements based on this section of IEC 61000-4 are encouraged to investigate the possibility of applying the most recent edition of the normative document indicated below. Members of IEC and IS0 maintain registers of currently valid Inter

32、national Standards. - I = - m - magnetic compatibility * 3 Definitions IEC 50( 161): 1990, Intemational Eiectrotechnical Vocabulary (IEV) - Chapter 767: Electro- 1 - IB * For the purposes of this section of IEC 61000-4, the foliowing definitions apply: 3.1 DUT: Device under test 3.2 gas discharge tu

33、be: A gap, or several gaps with two or three metal electrodes hermetically sealed so that gas mixture and pressure are under control, designed to protect apparatus or personnel from high transient voltages. 3.3 primary protection element: First protective element seen from the unprotected side of a

34、protection measure, diverting the main part of the surge current. 3.4 protected side: The side of a protection measure where the equipment is situated that has to be protected. 3.5 unprotected side: The side of a protection measure from which the surge event is expected. 4 Test methods for protectiv

35、e devices for conducted disturbance 4.1 General The actual behaviour of a protective device under HEMP conditions depends very much on how it is integrated in its place of use and other attendant circumstances (e.g. quality of shielding between protected and unprotected side of a protection element)

36、 The following test methods take this into account. They are defined so that the results obtained are as far as possible related to the qualities of the device under test (DUT), and the test arrangement does not differ too much from practical protection arrangements. In order to keep this test Copy

37、right European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,- - - STD.BS1 BS EN bL000-4-24-ENGL 1777 Lb24bb Ob24920 707 = Page 6 EN 61000-4-24 : 1997 standard simple and as uni

38、versally applicable as possible, the performer is allowed to optimize the test Set-up within certain limits but without leaving the range of practical protection arrangements. 4.2 Test Set-up The test Set-up consists of pulse generator (G), launching line, test fixture for the DUT, and termination w

39、ith connecting line and oscilloscope (see figure 1 ). The characteristic impedance shall be the same throughout the test Set-up. If impedances other than 50 R are used, they shall be specified. U - - - Oscilloscope 1 2.- Termination Connecting line Pulsegenerator 2 50 R 50 - . Launching line (0 - z

40、Launching line U Test b) if the DUT, or the primary protection element of a four-terminal DUT, is a voltage-limiting device (e.g. protective diode or varistor), the highest tangential steepness of the leading front of the prospective pulse shall be duldt = (1/2) x Zc x dildt where Zc is the characte

41、ristic impedance and dildt is the specified value.1) 4.8.2 Verification procedures The launching line (see figure 1) is then connected to the test fixture. If a test fixture type B is used, the internal connection between the protected and the unprotected connector shall be tested for its transmissi

42、on characteristics. For this purpose the DUT is removed and the same pulse as under 4.8.1 (adjustment of the pulse generator) is applied. The signal measured shall not differ from the one measured under 4.8.1 by more than 10%. If it differs more than lo%, the diameter of the connecting wire should b

43、e increased (a higher capacity to ground will lower the characteristic impedance and improve the match between the pulse generator and the load). To make sure that no undesired coupling between the unprotected and the protected side of the test Set-up is present, verification tests shall be made wit

44、h the following modifications on the test Set-up: If the DUT is a two-lead device, it shall be replaced by a short-circuit connection of the same length and form as the current path through the DUT. The connection between P, and the centre-pin of the protected connector (see figure 2) shall be remov

45、ed. One test shall be made with the centre-pin of the protected connector left open and another one with this pin connected to the ground (within the protected shell). l) Note that the specified dildt corresponds to the actual dildt in the DUT during the test. As the DUT has a very low impedance com

46、pared with 50 R or the specified impedance, the current i and therefore also dildt is doubled during the test. Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-

47、Page 10 EN 61000-4-24 : 1997 If the DUT is a feed-through device, it shall be replaced by a device of the same dimensions (dummy DUT) made entirely of well-conducting metal and thus representing an ideal short circuit. The centre-pin of the protected connector shall be connected to the output pin of

48、 the dummy DUT. The peak value of the residual voltage measured under these conditions shall be less than 5% of the peak value measured in the final test. 4.8.3 Test The dummy DUT is replaced by the DUT, and the residual voltage is measured. 4.8.4 Final examination of the DUT After the test, the DUT

49、 shall be examined for visible damage and its further conformance with the functional and HEMP-relevant specifications. The results of the test shall only be valid if no significant changes occurred. 4.9 Referring to this standard When reference is made to this standard, the following additional information shall be given. Standard procedure - for gas discharge tubes: - for measurem