BS EN 61000-4-29-2001 Electromagnetic compatibility (EMC) Testing and measurement techniques Testing and measurement techniques Voltage dips short interruptions and voltage variatig.pdf

1、BRITISH STANDARD BS EN 61000-4-29: 2001 IEC 61000-4-29: 2000 Electromagnetic compatibility (EMC) Part 4-29: Testing and measurement techniques Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests The European Standard EN 61000-4-29:2000 has the status of a

2、 British Standard ICS 33.100.20 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBS EN 61000-4-29:2001 This British Standard, having been prepared under the direction of the Electrotechnical Sector Committee, was published under the authority of the Standards Committee and comes

3、 into effect on 15 July 2001 BSI 07-2001 ISBN 0 580 37205 7 National foreword This British Standard is the official English language version of EN 61000-4-29:2000. It is identical with IEC 61000-4-29:2000. The UK participation in its preparation was entrusted by Technical Committee GEL/210, EMC-Poli

4、cy, to Subcommittee GEL 1210/8, Low frequency disturbances, which has the responsibility to: A list of organizations represented on this subcommittee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IE

5、C 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists

6、normative references to international publications with their corresponding European publications. The British Standards which implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”,

7、 or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confe

8、r immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgat

9、e them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 19, and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Commen

10、ts(8523($167$1$5 (1 1250(8523e(11( (8523b,6 the test generator; the test set-up; the test procedure. The test described hereinafter applies to electrical and electronic equipment and systems. It also applies to modules or subsystems whenever the EUT (equipment under test) rated power is greater than

11、 the test generator capacity specified in clause 6. The ripple at the d.c. input power port is not included in the scope of this part of IEC 61000. It is covered by IEC 61000-4-17 1) This standard does not specify the tests to be applied to particular apparatus or systems. Its main aim is to give a

12、general basic reference to IEC product committees. These product committees (or users and manufacturers of equipment) remain responsible for the appropriate choice of the tests and the severity level to be applied to their equipment. 1) IEC 61000-4-17, Electromagnetic compatibility (EMC) Part 4-17:

13、Testing and measurement techniques Ripple on d.c. input power port immunity test Page5 EN61000429:2000 BSI 07-2001 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of IEC 61000. For dated references,

14、 subsequent amendments to, or revisions of, any of these publications do not apply. However, parties to agreements based on this part of IEC 61000 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, th

15、e latest edition of the normative document referred to applies. Members of ISO and IEC maintain registers of currently valid International Standards. IEC 60050(161), International Electrotechnical Vocabulary (IEV) Chapter 161: Electro- magnetic compatibility IEC 61000-4-11, Electromagnetic compatibi

16、lity (EMC) Part 4: Testing and measuring techniques Section 11: Voltage dips, short interruptions and voltage variations immunity tests 3 Definitions For the purposes of this part of IEC 61000 the definitions of IEC 60050(161) and the following definitions and terms apply. 3.1 EUT equipment under te

17、st 3.2 immunity (to a disturbance) the ability of a device, equipment or system to perform without degradation in the presence of an electromagnetic disturbance IEV 161-01-20 3.3 voltage dip a sudden reduction of the voltage at a point in the low voltage d.c. distribution system, followed by voltage

18、 recovery after a short period of time, from a few milliseconds up to a few seconds IEV 161-08-10, modified 3.4 short interruption the disappearance of the supply voltage at a point of the low voltage d.c. distributed system for a period of time typically not exceeding 1 min. In practice, a dip with

19、 amplitude at least 80 % of the rated voltage may be considered as an interruption. 3.5 voltage variation a gradual change of the supply voltage to a higher or lower value than the rated voltage. The duration of the change can be short or long. 3.6 malfunction the termination of the ability of an eq

20、uipment to carry out intended functions, or the execution of unintended functions by the equipment. Page6 EN61000429:2000 BSI 07-2001 4 General The operation of electrical or electronic equipment may be affected by voltage dips, short interruptions or voltage variations of the power supply. Voltage

21、dips and short interruptions are mainly caused by faults in the d.c. distribution system, or by sudden large changes of load. Is also possible for two or more consecutive dips or interruptions to occur. Faults in the d.c. distribution system may inject transient overvoltages into the distribution ne

22、twork; this particular phenomenon is not covered by this standard. Voltage interruptions are primarily caused by the switching of mechanical relays when changing from one source to another (e.g. from generator set to battery). During a short interruption, the d.c. supply network may present either a

23、 “high impedance“ or “low impedance“ condition. The first condition can be due to switching from one source to another; the second condition can be due to the clearing of an overload or fault condition on the supply bus. The latter can cause reverse current (negative peak inrush current) from the lo

24、ad. These phenomena are random in nature and can be characterised in terms of the deviation from the rated voltage, and duration. Voltage dips and short interruptions are not always abrupt. The primary cause of voltage variations is the discharging and recharging of battery systems; however they are

25、 also created when there are significant changes to the load condition of the d.c. network. 5 Test levels The rated voltage for the equipment (U T ) shall be used, as a reference for the specification of the voltage test level. The following shall be applied for equipment with a rated voltage range:

26、 if the voltage range does not exceed 20 % of its own lower limit, a single voltage from the range may be used as a basis for test level specification (U T ); in all other cases, the test procedure shall be applied for both the lower and upper limits of the rated voltage range. The following voltage

27、 test levels (in % U T ) are used: 0 %, corresponding to interruptions; 40 % and 70 %, corresponding to 60 % and 30 % dips; 80 % and 120 %, corresponding to 20 % variations. The change of the voltage is abrupt, in the range of s (see generator specification in clause 6). The preferred test levels an

28、d durations are given in tables 1a, 1b and 1c. The levels and durations shall be selected by the product committee. Page7 EN61000429:2000 BSI 07-2001 The test conditions of “high impedance” and “low impedance” reported in table 1b refer to the output impedance of the test generator as seen by the EU

29、T during the voltage interruption; additional information is given in the definition of the test generator and test procedures. Table 1a Preferred test levels and durations for voltage dips Test Test level % U T Duration s Voltage dips 40 and 70 or x 0,01 0,03 0,1 0,3 1 x Table 1b Preferred test lev

30、els and durations for short interruptions Test Test condition Test level % U T Duration s Short interruptions High impedance and/or Low impedance 0 0,001 0,003 0,01 0,03 0,1 0,3 1 x Table 1c Preferred test levels and durations for voltage variations Test Test level % U T Duration s Voltage variation

31、s 85 and 120 or 80 and 120 or x 0,1 0,3 1 3 10 x NOTE 1 “x” is an open value. NOTE 2 One or more of the test levels and durations specified in each table may be chosen. NOTE 3 If the EUT is tested for short interruptions, it is unnecessary to test for other levels of the same duration, unless the immunity of the equipment is detrimentally affected by voltage dips of less than 70 % U T. NOTE 4 Shorter duration in the tables, in particular the shortest one, should be tested to be sure that the EUT operates as intended. Page8 EN61000429:2000